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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 47 occurrences of 40 keywords
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Results
Found 1100 publication records. Showing 1100 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
44 | Hyunmin Kim, Seokhie Hong, Bart Preneel, Ingrid Verbauwhede |
Binary decision diagram to design balanced secure logic styles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 239-244, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Yumin Zhou, Oliver Bringmann 0001, Wolfgang Rosenstiel |
Flexible in-silicon checking of run-time programmable assertions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 78-83, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Maha Kooli, Giorgio Di Natale, Alberto Bosio |
Cache-aware reliability evaluation through LLVM-based analysis and fault injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 19-22, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain 0003, C. R. Parthasarathy, Lorena Anghel |
Activity profiling: Review of different solutions to develop reliable and performant design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 47-50, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Zeinab Mahdavi, Zahra Shirmohammadi, Seyed Ghassem Miremadi |
ACM: Accurate crosstalk modeling to predict channel delay in Network-on-Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 7-8, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Patryk Skoncej, Felix Mühlbauer, Felix Kubicek, Lukas Schröder, Mario Schölzel |
Feasibility of software-based repair for program memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 199-202, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Jaime Espinosa, Carles Hernández 0001, Jaume Abella 0001 |
Modeling RTL fault models behavior to increase the confidence on TSIM-based fault injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 60-65, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Erol Koser, Walter Stechele |
Tackling long duration transients in sequential logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 137-142, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | Ghislain Takam Tchendjou, Rshdee Alhakim, Emmanuel Simeu, Fritz Lebowsky |
Evaluation of machine learning algorithms for image quality assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016, pp. 193-194, 2016, IEEE, 978-1-5090-1507-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
44 | |
21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015 ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE, 978-1-4673-7905-2 The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
44 | Chiara Sandionigi, Olivier Héron |
Identifying aging-aware representative paths in processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 32-33, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Amr Haggag, Nik Sumikawa, Aamer Shaukat |
Reliability/yield trade-off in mitigating "no trouble found" field returns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 174-175, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Daniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 194-199, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Jing Ye 0001, Yu Hu 0001, Xiaowei Li 0001 |
OPUF: Obfuscation logic based physical unclonable function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 156-161, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Adrian Evans, Enrico Costenaro, Arkady Bramnik |
Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF). ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 162-167, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Zissis Poulos, Andreas G. Veneris |
Mining simulation metrics for failure triage in regression testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 182-187, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah |
Simplification of fully delay testable combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 44-45, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Ijeoma Anarado, Yiannis Andreopoulos |
Mitigation of fail-stop failures in integer matrix products via numerical packing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 101-107, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Miho Ueno, Masanori Hashimoto, Takao Onoye |
Real-time on-chip supply voltage sensor and its application to trace-based timing error localization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 188-193, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Jaime Espinosa, Carles Hernández 0001, Jaume Abella 0001 |
Characterizing fault propagation in safety-critical processor designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 144-149, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Alessandro Vallero, Alessandro Savino, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Gianfranco Politano, Dimitris Gizopoulos, Stefano Di Carlo |
Bayesian network early reliability evaluation analysis for both permanent and transient faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 7-12, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Gontran Sion, Yves Blaquière, Yvon Savaria |
Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 83-88, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Joseph Lenox, Spyros Tragoudas |
Towards Trojan circuit detection with maximum state transition exploration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 50-52, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Anis Souari, Claude Thibeault, Yves Blaquière, Raoul Velazco |
Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 36-39, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Andreina Zambrano, Hans G. Kerkhoff |
Fault-tolerant system for catastrophic faults in AMR sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 65-70, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee |
Self-awareness and self-learning for resiliency in real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 128-131, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Nikolaos Eftaxiopoulos-Sarris, Nicholas Axelos, Kiamal Z. Pekmestzi |
Low leakage radiation tolerant CAM/TCAM cell. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 206-211, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Diane Tchuani Tchakonte, Emmanuel Simeu, Maurice Tchuenté |
Adaptive healing procedure for lifetime improvement in Wireless Sensor Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 59-64, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi 0001, Masahiko Yoshimoto |
An accurate soft error propagation analysis technique considering temporal masking disablement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 23-25, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos |
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 150-155, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Katerina Katsarou, Yiorgos Tsiatouhas |
Soft error immune latch under SEU related double-node charge collection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 46-49, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener |
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 13-18, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Lake Bu, Mark G. Karpovsky, Zhen Wang 0001 |
New byte error correcting codes with simple decoding for reliable cache design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 200-205, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Gurgen Harutunyan, Yervant Zorian |
An effective embedded test & diagnosis solution for external memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 168-170, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Serhiy Avramenko, Stefano Esposito, Massimo Violante, Marco Sozzi, Massimo Traversone, Marco Binello, Marco Terrone |
An Hybrid Architecture for consolidating mixed criticality applications on multicore systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 26-29, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Alexandros Panteloukas, Anastasios Psarras, Chrysostomos Nicopoulos, Giorgos Dimitrakopoulos |
Timing-resilient Network-on-Chip architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 77-82, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Monir Zaman, Ali Ahmadi, Yiorgos Makris |
Workload characterization and prediction: A pathway to reliable multi-core systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 116-121, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Chang Liu 0010, Michael A. Kochte, Hans-Joachim Wunderlich |
Efficient observation point selection for aging monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 176-181, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Tong-Yu Hsieh, Yi-Han Peng |
Filtering-based error-tolerability evaluation of image processing circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 132-137, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Imran Wali, Arnaud Virazel, Alberto Bosio, Patrick Girard 0001, Matteo Sonza Reorda |
Design space exploration and optimization of a Hybrid Fault-Tolerant Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 89-94, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Alexander Schöll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich |
Efficient on-line fault-tolerance for the preconditioned conjugate gradient method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 95-100, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu |
Power analysis attacks on ARX: An application to Salsa20. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 40-43, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff |
On the maximization of the sustained switching activity in a processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 34-35, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Nektarios Kranitis, Antonis Tsigkanos, George Theodorou, Ioannis Sideris, Antonis M. Paschalis |
A single chip dependable and adaptable payload Data Processing Unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 138-143, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian |
The future of fault tolerant computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 108-109, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee |
Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 53-58, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux |
A call for cross-layer and cross-domain reliability analysis and management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 19-22, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos |
Fault modeling and testing of through silicon via interconnections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 30-31, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 71-76, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Panagiota Papavramidou, Michael Nicolaidis |
Low-power memory repair for high defect densities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 171-173, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Michael A. Skitsas, Chrysostomos Nicopoulos, Maria K. Michael |
Toward efficient check-pointing and rollback under on-demand SBST in chip multi-processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 110-115, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria |
Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 1-6, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | Mohammad Ashraful Anam, Yiannis Andreopoulos |
Failure mitigation in linear, sesquilinear and bijective operations on integer data streams via numerical entanglement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 122-127, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
44 | |
2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014 ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE, 978-1-4799-5323-3 The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
44 | Dan Alexandrescu, Nematollah Bidokhti, Andy Yu, Adrian Evans, Enrico Costenaro |
Managing SER costs of complex systems through Linear Programming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 216-219, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson |
Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 170-175, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Stefano Di Carlo, Giulio Gambardella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta, Alessandro Vallero |
A novel methodology to increase fault tolerance in autonomous FPGA-based systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 87-92, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Tiago A. O. Alves, Sandip Kundu, Leandro A. J. Marzulo, Felipe Maia Galvão França |
Online error detection and recovery in dataflow execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 9-12, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Boyang Du, Matteo Sonza Reorda, Luca Sterpone, Luis Parra, Marta Portela-García, Almudena Lindoso, Luis Entrena |
A new solution to on-line detection of Control Flow Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 105-110, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Samuel N. Pagliarini, Dhiraj K. Pradhan |
A placement strategy for reducing the effects of multiple faults in digital circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 69-74, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Christian Badack, Thomas Kern, Michael Gössel |
Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 116-121, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Antonio Sanchez-Clemente, Luis Entrena, Mario García-Valderas |
Error masking with approximate logic circuits using dynamic probability estimations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 134-139, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Vanessa Vargas, Pablo Ramos, Wassim Mansour, Raoul Velazco, Nacer-Eddine Zergainoh, Jean-François Méhaut |
Preliminary results of SEU fault-injection on multicore processors in AMP mode. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 194-197, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Christelle Hobeika, Simon Pichette, M. A. Leonard, Claude Thibeault, Jean-François Boland, Yves Audet |
Multi-abstraction level signature generation and comparison based on radiation single event upset. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 212-215, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
Power-aware optimization of software-based self-test for L1 caches in microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 154-159, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
Customized cell detector for laser-induced-fault detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 37-42, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Arwa Ben Dhia, Mariem Slimani, Lirida A. B. Naviner |
Comparative study of defect-tolerant multiplexers for FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 7-12, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Gulay Yalcin, Emrah Islek, Oyku Tozlu, Pedro Reviriego, Adrián Cristal, Osman S. Unsal, Oguz Ergin |
Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Stefano Di Carlo, Alessandro Vallero, Dimitris Gizopoulos, Giorgio Di Natale, Antonio González 0001, Ramon Canal, Riccardo Mariani, M. Pipponzi, Arnaud Grasset, Philippe Bonnot 0001, Frank Reichenbach, Gulzaib Rafiq, Trond Loekstad |
Cross-layer early reliability evaluation: Challenges and promises. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 228-233, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Hao Xie, Li Chen 0001, Rui Liu 0011, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong |
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 62-68, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Nicholas Axelos, Nikolaos Eftaxiopoulos-Sarris, Georgios Zervakis 0001, Kostas Tsoumanis, Kiamal Z. Pekmestzi |
FF-DICE: An 8T soft-error tolerant cell using Independent Dual Gate SOI FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 200-201, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Antonis M. Paschalis, Harald Michalik, Nektarios Kranitis, Celia López-Ongil, Pedro Reviriego Vasallo |
Dependable reconfigurable space systems: Challenges, new trends and case studies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 222-227, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Sébastien Sarrazin, Samuel Evain, Ivan Miro Panades, Lirida Alves de Barros Naviner, Valentin Gherman |
Flip-flop selection for in-situ slack-time monitoring based on the activation probability of timing-critical paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 160-163, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Samuel N. Pagliarini, Lirida A. B. Naviner, Jean-François Naviner, Dhiraj K. Pradhan |
A hybrid reliability assessment method and its support of sequential logic modelling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 182-183, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
Multivariate outlier modeling for capturing customer returns - How simple it can be. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 164-169, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Anna Vaskova, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Matteo Sonza Reorda |
Permanent faults on LIN networks: On-line test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 176-181, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Nasim Pour Aryan, A. Listl, Leonhard Heiß, Cenk Yilmaz, Georg Georgakos, Doris Schmitt-Landsiedel |
From an analytic NBTI device model to reliability assessment of complex digital circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 19-24, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Prakash Narayanan, Satish Ravichandran, Balaji Ramayanam |
Novel self-test methods to reduce on-chip memory requirements and improved test coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 198-199, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Phaninder Alladi, Spyros Tragoudas |
Aging-aware critical paths in deep submicron. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 184-185, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Loic Welter, Philippe Dreux, Hassen Aziza, Jean-Michel Portal |
An innovative standard cells remapping method for in-circuit critical parameters monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 206-209, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | David May 0003, Walter Stechele |
Improving the significance of probabilistic circuit fault emulations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 128-133, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Wassim Mansour, Miguel A. Aguirre, Hipólito Guzmán-Miranda, Javier Barrientos Rojas, Raoul Velazco |
Two complementary approaches for studying the effects of SEUs on HDL-based designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 220-221, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Sophie Dupuis, Papa-Sidi Ba, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
A novel hardware logic encryption technique for thwarting illegal overproduction and Hardware Trojans. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 49-54, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Luca Cassano, Hipólito Guzmán-Miranda, Miguel A. Aguirre |
Early assessment of SEU sensitivity through untestable fault identification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 186-189, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Pre-bond testing of weak defects in TSVs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 31-36, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Raghavan Kumar, Philipp Jovanovic, Ilia Polian |
Precise fault-injections using voltage and temperature manipulation for differential cryptanalysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 43-48, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Álvaro Gómez-Pau, Suvadeep Banerjee, Abhijit Chatterjee |
Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 25-30, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Nikos Foutris, Manolis Kaliorakis, Sotiris Tselonis, Dimitris Gizopoulos |
Versatile architecture-level fault injection framework for reliability evaluation: A first report. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 140-145, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Honorio Martín, Anna Vaskova, Celia López-Ongil, Enrique San Millán, Marta Portela-García |
Effect of ionizing radiation on TRNGs for safe telecommunications: Robustness and randomness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 202-205, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Katerina Katsarou, Yiorgos Tsiatouhas |
Double node charge sharing SEU tolerant latch design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 122-127, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Sebastian Müller 0005, Tobias Koal, Mario Schölzel, Heinrich Theodor Vierhaus |
Timing for virtual TMR in logic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 190-193, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Saif-Ur Rehman, Mounir Benabdenbi, Lorena Anghel |
Cost-efficient of a cluster in a mesh SRAM-based FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 75-80, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich |
Area-efficient synthesis of fault-secure NoC switches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 13-18, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos |
Solutions for the self-adaptation of communicating systems in operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 234-239, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Gaurang Upasani, Xavier Vera, Antonio González 0001 |
Framework for economical error recovery in embedded cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 146-153, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Marco Desogus, Luca Sterpone, David Merodio Codinachs |
Validation of a tool for estimating the effects of soft-errors on modern SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 111-115, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Michael Frischke, Andreas J. Rohatschek, Walter Stechele |
Towards low-cost fault detection strategy of FPGA configuration memory in real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 81-86, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | M. De Carvalho, Davide Sabena, Matteo Sonza Reorda, Luca Sterpone, Paolo Rech, Luigi Carro |
Fault injection in GPGPU cores to validate and debug robust parallel applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 210-211, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Milos Krstic, Stefan Weidling, Vladimir Petrovic, Michael Gössel |
Improved circuitry for soft error correction in combinational logic in pipelined designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 93-98, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
44 | Yukiya Miura, Yoshihiro Ohkawa |
A noise-tolerant master-slave flip-flop. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014, pp. 55-61, 2014, IEEE, 978-1-4799-5323-3. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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