Search results for "single-event"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
9	Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski	Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC.	ISVLSI	2013	DBLP DOI BibTeX RDF
9	Kris V. Parag, Glenn Vinnicombe	Single event molecular signalling for estimation and control.	ECC	2013	DBLP DOI BibTeX RDF
9	Samuel N. Pagliarini, Lirida A. B. Naviner, Jean-François Naviner	Single event transient mitigation through pulse quenching: Effectiveness at circuit level.	ICECS	2013	DBLP DOI BibTeX RDF
9	Federico Baronti, Cinzia Bernardeschi, Luca Cassano, Andrea Domenici, Roberto Roncella, Roberto Saletti	Mitigation of Single Event Upsets in the control logic of a charge equalizer for Li-ion batteries.	IECON	2013	DBLP DOI BibTeX RDF
9	Dan Alexandrescu, Enrico Costenaro, Adrian Evans	State-aware single event analysis for sequential logic.	IOLTS	2013	DBLP DOI BibTeX RDF
9	Santiago Martin Sondón, Alfredo Falcon, Pablo Sergio Mandolesi, Pedro Julián, Nahuel Vega, Francisco Nesprias, Jorge Davidson, Felix Palumbo, Mario Debray	Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam.	LATW	2013	DBLP DOI BibTeX RDF
9	Karine Castellani-Coulié, Marc Bocquet, Hassen Aziza, Jean-Michel Portal, Wenceslas Rahajandraibe, Christophe Muller	SPICE level analysis of Single Event Effects in an OxRRAM cell.	LATW	2013	DBLP DOI BibTeX RDF
9	Bin Liang, Yankang Du	Two sides of pulse quenching effect on the single-event transient pulse width at circuit-level.	ASICON	2013	DBLP DOI BibTeX RDF
9	Kaikai Liu, Hao Cai, Ting An, Lirida A. B. Naviner, Jean-François Naviner, Hervé Petit	Reliability analysis of combinational circuits with the influences of noise and single-event transients.	DFTS	2013	DBLP DOI BibTeX RDF
9	Luca Cassano	Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs.		2013	RDF
9	Baojun Liu, Li Cai	Reliability Evaluation for Single Event Transients on Digital Circuits.	IEEE Trans. Reliab.	2012	DBLP DOI BibTeX RDF
9	Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta	Analysis of double-gate FinFET-based address decoder for radiation-induced single-event-transients.	IET Circuits Devices Syst.	2012	DBLP DOI BibTeX RDF
9	Nigel F. Reuel, Peter Bojo, Jingqing Zhang, Ardemis A. Boghossian, Jin-Ho Ahn, Jong-Ho Kim, Michael S. Strano	NoRSE: noise reduction and state evaluator for high-frequency single event traces.	Bioinform.	2012	DBLP DOI BibTeX RDF
9	Yi Ren, L. Fan, Li Chen 0001, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva	Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.	J. Electron. Test.	2012	DBLP DOI BibTeX RDF
9	Baojun Liu, Li Cai, Xiaokuo Yang, Hongtu Huang, Peng Bai, Weidong Peng	The impact of Miller and coupling effects on single event transient in logical circuits.	Microelectron. J.	2012	DBLP DOI BibTeX RDF
9	Farouk Smith	Single event upset mitigation by means of a sequential circuit state freeze.	Microelectron. Reliab.	2012	DBLP DOI BibTeX RDF
9	Baojun Liu, Li Cai, Peng Bai, Weidong Peng	Reliability evaluation for single event crosstalk via probabilistic transfer matrix.	Microelectron. Reliab.	2012	DBLP DOI BibTeX RDF
9	Jianjun Chen, Shuming Chen, Bin Liang, Biwei Liu, Fanyu Liu	Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism.	Microelectron. Reliab.	2012	DBLP DOI BibTeX RDF
9	Guohe Zhang, Jun Shao, Feng Liang 0001, Dongxuan Bao	A novel single event upset hardened CMOS SRAM cell.	IEICE Electron. Express	2012	DBLP DOI BibTeX RDF
9	Julian J. H. Pontes, Ney Calazans, Pascal Vivet	An accurate Single Event Effect digital design flow for reliable system level design.	DATE	2012	DBLP DOI BibTeX RDF
9	Varadan Savulimedu Veeravalli, Thomas Polzer, Andreas Steininger, Ulrich Schmid 0001	Architecture and Design Analysis of a Digital Single-Event Transient/Upset Measurement Chip.	DSD	2012	DBLP DOI BibTeX RDF
9	Julian J. H. Pontes, Ney Calazans, Pascal Vivet	Adding Temporal Redundancy to Delay Insensitive Codes to Mitigate Single Event Effects.	ASYNC	2012	DBLP DOI BibTeX RDF
9	Jakob Lechner, Martin Lampacher	Protecting pipelined asynchronous communication channels against single event upsets.	ICCD	2012	DBLP DOI BibTeX RDF
9	Norhuzaimin Julai, Alexandre Yakovlev, Alexandre V. Bystrov	Error detection and correction of single event upset (SEU) tolerant latch.	IOLTS	2012	DBLP DOI BibTeX RDF
9	Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni, Adrian Evans	Single event upset tolerance in flip-flop based microprocessor cores.	DFT	2012	DBLP DOI BibTeX RDF
9	Yang Lu, Fabrizio Lombardi, Salvatore Pontarelli, Marco Ottavi	On the design of two single event tolerant slave latches for scan delay testing.	DFT	2012	DBLP DOI BibTeX RDF
9	Yike Zhang, Junpei Ono, Takashi Ogata	Single Event and Scenario Generation Based on Advertising Rhetorical Techniques Using the Conceptual Dictionary in Narrative Generation System.	DIGITEL	2012	DBLP DOI BibTeX RDF
9	Hiroshi Hatano	A Fundamental Analysis of Single Event Effects on Clocked CVSL Circuits with Gated Feedback.	IEICE Trans. Electron.	2011	DBLP DOI BibTeX RDF
9	Joaquín Alvarado, Valeria Kilchytska, El Hafed Boufouss, Denis Flandre	Characterization and modelling of single event transients in LDMOS-SOI FETs.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
9	Giovanni Busatto, D. Bisello, Giuseppe Currò, Piero Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss	A new test methodology for an exhaustive study of single-event-effects on power MOSFETs.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
9	Wenyao Xu, Jia Wang, Yu Hu 0002, Ju-Yueh Lee, Fang Gong, Lei He 0001, Majid Sarrafzadeh	In-Place FPGA Retiming for Mitigation of Variational Single-Event Transient Faults.	IEEE Trans. Circuits Syst. I Regul. Pap.	2011	DBLP DOI BibTeX RDF
9	Mohammad Hosseinabady, Pejman Lotfi-Kamran, Jimson Mathew, Saraju P. Mohanty, Dhiraj K. Pradhan	Single-Event Transient Analysis in High Speed Circuits.	ISED	2011	DBLP DOI BibTeX RDF
9	Uros Legat, Anton Biasizzo, Franc Novak	Self-reparable system on FPGA for single event upset recovery.	ReCoSoC	2011	DBLP DOI BibTeX RDF
9	Sheng Lin 0006, Yong-Bin Kim, Fabrizio Lombardi	Modeling and design of a nanoscale memory cell for hardening to a single event with multiple node upset.	ICCD	2011	DBLP DOI BibTeX RDF
9	Yike Zhang, Junpei Ono, Takashi Ogata	An advertising rhetorical mechanism for single event combined with conceptual dictionary in narrative generation system.	NLPKE	2011	DBLP DOI BibTeX RDF
9	Ramin Rajaei, Mahmoud Tabandeh, Bizhan Rashidian	Single event upset immune latch circuit design using C-element.	ASICON	2011	DBLP DOI BibTeX RDF
9	Meng Yang, Gengsheng Chen	Single event upset mitigation for FDP2008.	ASICON	2011	DBLP DOI BibTeX RDF
9	Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis	A Practical Approach to Single Event Transients Analysis for Highly Complex Designs.	DFT	2011	DBLP DOI BibTeX RDF
9	Jyothi Velamala, Robert LiVolsi, Myra Torres, Yu Cao 0001	Design sensitivity of single event transients in scaled logic circuits.	DAC	2011	DBLP DOI BibTeX RDF
9	Kazuteru Namba, Kengo Nakashima, Hideo Ito	Single-Event-Upset Tolerant RS Flip-Flop with Small Area.	IEICE Trans. Inf. Syst.	2010	DBLP DOI BibTeX RDF
9	Hiroshi Hatano	A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits.	IEICE Trans. Electron.	2010	DBLP DOI BibTeX RDF
9	X. She, N. Li	Low-overhead single-event upset hardened latch using programmable resistance cells.	IET Comput. Digit. Tech.	2010	DBLP DOI BibTeX RDF
9		Scheme to minimise short effects of single-event upsets in triple-modular redundancy.	IET Comput. Digit. Tech.	2010	DBLP DOI BibTeX RDF
9	Giovanni Busatto, Giuseppe Currò, Francesco Iannuzzo, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi	Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
9	Joaquín Alvarado, El Hafed Boufouss, Valeria Kilchytska, Denis Flandre	Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
9	Bradley F. Dutton, Charles E. Stroud	On-Line Single Event Upset Detection and Correction in Field Programmable Gate Array Configuration Memories.	Int. J. Comput. Their Appl.	2010	DBLP BibTeX RDF
9	S. Sharanyan, Arvind Kumar	An Optimized Checkpointing Based Learning Algorithm for Single Event Upsets.	COMPSAC	2010	DBLP DOI BibTeX RDF
9	Xiaoyin Yao, Lawrence T. Clark, Dan W. Patterson, Keith E. Holbert	Single event transient mitigation in cache memory using transient error checking circuits.	CICC	2010	DBLP DOI BibTeX RDF
9	Hamed Abrishami, Safar Hatami, Massoud Pedram	Analysis and optimization of sequential circuit element to combat single-event timing upsets.	ISCAS	2010	DBLP DOI BibTeX RDF
9	Mahta Haghi, Jeff Draper	A single-event upset hardening technique for high speed MOS Current Mode Logic.	ISCAS	2010	DBLP DOI BibTeX RDF
9	Kazuteru Namba, Masatoshi Sakata, Hideo Ito	Single Event Induced Double Node Upset Tolerant Latch.	DFT	2010	DBLP DOI BibTeX RDF
9	Zhichao Zhang, Tao Wang, Li Chen 0001, Jinsheng Yang	A new Bulk Built-In Current Sensing circuit for single-event transient detection.	CCECE	2010	DBLP DOI BibTeX RDF
9	Selahattin Sayil, Abhishek B. Akkur, Nelson Gaspard III	Single Event crosstalk shielding for CMOS logic.	Microelectron. J.	2009	DBLP DOI BibTeX RDF
9	Francesco Abate, Luca Sterpone, Massimo Violante, Fernanda Lima Kastensmidt	A study of the Single Event Effects impact on functional mapping within Flash-based FPGAs.	DATE	2009	DBLP DOI BibTeX RDF
9	Lei Wang 0003, Lei Chen 0010, Zhiping Wen 0001, Huabo Sun, Shuo Wang	A Novel High-Density Single-Event Upset Hardened Configurable SRAM Applied to FPGA.	ReConFig	2009	DBLP DOI BibTeX RDF	Heavy ion, CSRAM, Medici, FPGA, HSPICE
9	Bradley F. Dutton, Charles E. Stroud	Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs.	CATA	2009	DBLP BibTeX RDF
9	Brian H. Pratt, Michael J. Wirthlin, Michael P. Caffrey, Paul S. Graham, Keith Morgan	Noise impact of single-event upsets on an FPGA-based digital filter.	FPL	2009	DBLP DOI BibTeX RDF
9	Kenneth M. Zick, John P. Hayes	On-line characterization and reconfiguration for single event upset variations.	IOLTS	2009	DBLP DOI BibTeX RDF
9		Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation.	AHS	2009	DBLP DOI BibTeX RDF
9	Paolo Maistri	Pruning single event upset faults with petri nets.	LATW	2009	DBLP DOI BibTeX RDF
9	Thiago Assis, Fernanda Lima Kastensmidt, Gilson I. Wirth, Ricardo Reis 0001	Measuring the effectiveness of symmetric and asymmetric transistor sizing for Single Event Transient mitigation in CMOS 90nm technologies.	LATW	2009	DBLP DOI BibTeX RDF
9	Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt	Single-event-upset and alpha-particle emission rate measurement techniques.	IBM J. Res. Dev.	2008	DBLP DOI BibTeX RDF
9	Henry H. K. Tang	SEMM-2: A new generation of single-event-effect modeling tools.	IBM J. Res. Dev.	2008	DBLP DOI BibTeX RDF
9	Gilson I. Wirth	Bulk built in current sensors for single event transient detection in deep-submicron technologies.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
9	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt	Modeling the sensitivity of CMOS circuits to radiation induced single event transients.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
9	Rajesh Garg, Peng Li 0001, Sunil P. Khatri	Modeling dynamic stability of SRAMS in the presence of single event upsets (SEUs).	ISCAS	2008	DBLP DOI BibTeX RDF
9	Antonin Bougerol, Florent Miller, Nadine Buard	SDRAM Architecture & Single Event Effects Revealed with Laser.	IOLTS	2008	DBLP DOI BibTeX RDF
9	Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh	Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs.	IOLTS	2008	DBLP DOI BibTeX RDF
9	Gilson I. Wirth, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt	Accurate and computer efficient modelling of single event transients in CMOS circuits.	IET Circuits Devices Syst.	2007	DBLP DOI BibTeX RDF
9	Afzel Noore	An improved SRAM cell design for tolerating radiation-induced single-event effects.	IEICE Electron. Express	2007	DBLP DOI BibTeX RDF
9	Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone	Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions.	IOLTS	2007	DBLP DOI BibTeX RDF
9	Monica Alderighi, Fabio Casini, Sergio D'Angelo, Marcello Mancini, Sandro Pastore, Giacomo R. Sechi, Roland Weigand	Evaluation of Single Event Upset Mitigation Schemes for SRAM Based FPGAs Using the FLIPPER Fault Injection Platform.	DFT	2007	DBLP DOI BibTeX RDF
9	Gilson I. Wirth, Christian Fayomi	The Bulk Built In Current Sensor Approach for Single Event Transient Detection.	SoC	2007	DBLP DOI BibTeX RDF
9	Shahin Golshan, Elaheh Bozorgzadeh	Single-Event-Upset (SEU) Awareness in FPGA Routing.	DAC	2007	DBLP DOI BibTeX RDF
9	Sajid Baloch	Single event upset hardened embedded domain specific reconfigurable architecture.		2007	RDF
9	Mohamed Abbas, Makoto Ikeda, Kunihiro Asada	On-Chip Detector for Single-Event Noise Sensing with Voltage Scaling Function.	IEICE Trans. Electron.	2006	DBLP DOI BibTeX RDF
9	A. M. Albadri, Ronald D. Schrimpf, Kenneth F. Galloway, D. Greg Walker	Single event burnout in power diodes: Mechanisms and models.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
9	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt	Generation and Propagation of Single Event Transients in CMOS Circuits.	DDECS	2006	DBLP DOI BibTeX RDF
9	Hossein Asadi 0001, Vilas Sridharan, Mehdi Baradaran Tahoori, David R. Kaeli	Vulnerability analysis of L2 cache elements to single event upsets.	DATE	2006	DBLP DOI BibTeX RDF
9	Katrine Stemland Skjelsvik, Anna K. Lekova, Vera Goebel, Ellen Munthe-Kaas, Thomas Plagemann, Norun Sanderson	Supporting multiple subscription languages by a single event notification overlay in sparse MANETs.	MobiDE	2006	DBLP DOI BibTeX RDF	subscription language, middleware, publish/subscribe
9	S. Torrellas, Bogdan Nicolescu, Raul Velazco, Mario García-Valderas, Yvon Savaria	Validation by Fault Injection of a Software Error Detection Technique Dealing with Critical Single Event Upsets.	LATW	2006	DBLP BibTeX RDF
9	Massimiliano Schillaci, Matteo Sonza Reorda, Massimo Violante	A New Approach to Cope with Single Event Upsets in Processor-based Systems.	LATW	2006	DBLP BibTeX RDF
9	David F. Heidel	Single-Event-Upset Trends in Advanced CMOS Technologies.	DFT	2006	DBLP BibTeX RDF
9	Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasman	A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity.	VLSI Design	2006	DBLP DOI BibTeX RDF
9	Praveen Elakkumanan, Kishan Prasad, Ramalingam Sridhar	Low Power SER Tolerant Design to Mitigate Single Event Transients in Nanoscale Circuits.	J. Low Power Electron.	2005	DBLP DOI BibTeX RDF
9	P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion	Single event transient effects in a voltage reference.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
9	Anton Bougaev, Brian Mariner, Joshua Walter	Estimation of Architectural Vulnerability Factors for Discrimination of Single Event Upsets in Cache Memory.	CDES	2005	DBLP BibTeX RDF
9	Michael Nicolaidis	Design for Mitigation of Single Event Effects.	IOLTS	2005	DBLP DOI BibTeX RDF
9	Lorena Anghel, Michael Nicolaidis	Simulation and Mitigation of Single Event Effects.	IOLTS	2005	DBLP DOI BibTeX RDF
9	Kartik Mohanram	Simulation of transients caused by single-event upsets in combinational logic.	ITC	2005	DBLP DOI BibTeX RDF
9	Matteo Sonza Reorda, Massimo Violante	Efficient analysis of single event transients.	J. Syst. Archit.	2004	DBLP DOI BibTeX RDF
9	Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière	Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.	Microelectron. Reliab.	2003	DBLP DOI BibTeX RDF
9	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis	Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.	LATW	2002	DBLP BibTeX RDF
9	Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu	Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.	Microelectron. Reliab.	2001	DBLP DOI BibTeX RDF
9	Giovanni Busatto, Francesco Iannuzzo, Francesco Velardi, Jeffery Wyss	Non-destructive tester for single event burnout of power diodes.	Microelectron. Reliab.	2001	DBLP DOI BibTeX RDF
9	D. Greg Walker, T. S. Fisher, J. Liu, Ronald D. Schrimpf	Thermal modeling of single event burnout failure in semiconductor power devices.	Microelectron. Reliab.	2001	DBLP DOI BibTeX RDF
9	Dmitriy Melkonian, Evian Gordon, Homayoun Bahramali	Single-event-related potential analysis by means of fragmentary decomposition.	Biol. Cybern.	2001	DBLP DOI BibTeX RDF
9	Pablo A. Ferreyra, Carlos A. Marqués, Javier P. Gaspar, Ricardo T. Ferreyra	A Software Tool for Simulating Single Event Upsets in a Digital Signal Processor.	LATW	2001	DBLP BibTeX RDF
9	Ammar Assoum	Etude de la tolérance aux aléas logiques des réseaux de neurones artificiels. (Tolerance of artificial neural networks against single event upsets).		1997	RDF
9	Ching Ping Wu, Chung Len Lee 0001, Wen-Zen Shen	SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence.	EURO-DAC	1992	DBLP DOI BibTeX RDF