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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 47 occurrences of 40 keywords
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Results
Found 1100 publication records. Showing 1100 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
44 | |
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013 ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE, 978-1-4799-0662-8 The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP BibTeX RDF |
|
44 | Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Sánchez 0001 |
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 79-84, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | SinNyoung Kim, Akira Tsuchiya, Hidetoshi Onodera |
Perturbation-immune radiation-hardened PLL with a switchable DMR structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 128-132, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Yier Jin, Dzmitry Maliuk, Yiorgos Makris |
A post-deployment IC trust evaluation architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 224-225, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Debdeep Mukhopadhyay |
On-line testing for differential fault attacks in cryptographic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 226-227, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Dan Alexandrescu, Enrico Costenaro, Adrian Evans |
State-aware single event analysis for sequential logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 151-156, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Nikos Foutris, Dimitris Gizopoulos, John Kalamatianos, Vilas Sridharan |
Measuring the performance impact of permanent faults in modern microprocessor architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 181-184, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Nikolaos Eftaxiopoulos-Sarris, Georgios Zervakis 0001, Kostas Tsoumanis, Kiamal Z. Pekmestzi |
A radiation tolerant and self-repair memory cell. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 210-215, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
Variability-aware and fault-tolerant self-adaptive applications for many-core chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 37-42, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura |
Accurate alpha soft error rate evaluation in SRAM memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 205-209, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Shyue-Kung Lu, Ming-Chang Chen, Yen-Chi Chen |
Error-tolerance evaluation and design techniques for motion estimation computing arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 167-168, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Fabian Oboril, Ilias Sagar, Mehdi Baradaran Tahoori |
A-SOFT-AES: Self-adaptive software-implemented fault-tolerance for AES. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 104-109, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Gaurang Upasani, Xavier Vera, Antonio González 0001 |
Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 85-91, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Assia Tria |
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 110-115, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Paolo Prinetto |
Ef3S: An evaluation framework for flash-based systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 199-204, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Julian J. H. Pontes, Ney Calazans, Pascal Vivet |
Parity check for m-of-n delay insensitive codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 157-162, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
Increasing the robustness of CUDA Fermi GPU-based systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 234-235, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas 0001, Yervant Zorian |
Integrating embedded test infrastructure in SRAM cores to detect aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 25-30, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Jeyavijayan Rajendran, Huan Zhang, Ozgur Sinanoglu, Ramesh Karri |
High-level synthesis for security and trust. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 232-233, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis |
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 7-12, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Sotiris Tselonis, Vasilis Dimitsas, Dimitris Gizopoulos |
The functional and performance tolerance of GPUs to permanent faults in registers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 236-239, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Mohamed Ben Jrad, Régis Leveugle |
Evaluating a low cost robustness improvement in SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 173-174, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Chiara Sandionigi, Olivier Héron, Clement Bertolini, Raphaël David |
When processors get old: Evaluation of BTI and HCI effects on performance and reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 185-186, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Georgios Panagopoulos, Phillipp Riess, Peter Baumgartner 0002 |
Challenges of RF and mixed signal design under process variability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 251, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Anna Vaskova, Marta Portela-García, Matteo Sonza Reorda |
Hardening of serial communication protocols for potentially critical systems in automotive applications: LIN bus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 13-18, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Anand Raghunathan, Kaushik Roy 0001 |
Approximate computing: Energy-efficient computing with good-enough results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 258, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | José Rodrigo Azambuja, Gustavo Brown, Fernanda Lima Kastensmidt, Luigi Carro |
Algorithm transformation methods to reduce software-only fault tolerance techniques' overhead. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 1-6, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham |
Real-time checking of linear control systems using analog checksums. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 122-127, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Manolis Kaliorakis, Nikos Foutris, Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis |
Online error detection in multiprocessor chips: A test scheduling study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 169-172, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Georgios Karakonstantis, David Atienza, Andy Burg |
Exploiting application resiliency for energy-efficient and adequately-reliable operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 249, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Loic Welter, Philippe Dreux, Jean-Michel Portal, Hassen Aziza |
Embedded high-precision frequency-based capacitor measurement system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 116-121, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné |
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 145-150, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Brice Ekobo Akoa, Emmanuel Simeu, Fritz Lebowsky |
Video decoder monitoring using non-linear regression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 175-178, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Adrian Evans, Dan Alexandrescu, Enrico Costenaro, Liang Chen |
Hierarchical RTL-based combinatorial SER estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 139-144, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Arkady Bramnik, Andrei Sherban, Norbert Seifert |
Timing vulnerability factors of sequential elements in modern microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 55-60, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Rech, Luigi Carro |
Experimental evaluation of GPUs radiation sensitivity and algorithm-based fault tolerance efficiency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 244-247, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Qais Al-Gayem, Hong Liu, Haroon Khan, Andrew Richardson 0001 |
Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 133-138, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Hans-Joachim Wunderlich, Claus Braun, Sebastian Halder 0002 |
Efficacy and efficiency of algorithm-based fault-tolerance on GPUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 240-243, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Michail Maniatakos, Maria K. Michael, Yiorgos Makris |
Investigating the limits of AVF analysis in the presence of multiple bit errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 49-54, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Enshan Yang, Keheng Huang, Yu Hu 0001, Xiaowei Li 0001, Jian Gong, Hongjin Liu, Bo Liu 0018 |
HHC: Hierarchical hardware checkpointing to accelerate fault recovery for SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 193-198, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Ioannis Voyiatzis, Costas Efstathiou, Cleo Sgouropoulou |
A low-cost input vector monitoring concurrent BIST scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 179-180, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Bao Le, Dipanjan Sengupta, Andreas G. Veneris, Zissis Poulos |
Accelerating post silicon debug of deep electrical faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 61-66, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Nikos Andrikos, Massimo Violante, David Merodio Codinachs |
A fully-automated flow for ITAR-free rad-hard Atmel FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 187-192, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Zissis Poulos, Yu-Shen Yang, Andreas G. Veneris |
A failure triage engine based on error trace signature extraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 73-78, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Michael Nicolaidis, Panagiota Papavramidou |
Transparent BIST for ECC-based memory repair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 216-223, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri |
Scan attack in presence of mode-reset countermeasure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 230-231, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Ijeoma Anarado, Mohammad Ashraful Anam, Davide Anastasia, Fabio Verdicchio, Yiannis Andreopoulos |
Highly-reliable integer matrix multiplication via numerical packing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 19-24, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez 0001, Matteo Sonza Reorda, Oscar Ballan |
Increasing fault coverage during functional test in the operational phase. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 43-48, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Boyang Du, Matteo Sonza Reorda, Luca Sterpone, Luis Parra, Marta Portela-García, Almudena Lindoso, Luis Entrena |
Exploiting the debug interface to support on-line test of control flow errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 98-103, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Kedar Karmarkar, Spyros Tragoudas |
Error detection encoding for multi-threshold capture mechanism. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 92-97, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
A smart test controller for scan chains in secure circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 228-229, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Katerina Katsarou, Yiorgos Tsiatouhas, Angela Arapoyanni |
NBTI aging tolerance in pipeline based designs NBTI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 31-36, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng |
At-speed BIST for interposer wires supporting on-the-spot diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 67-72, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Alaa Aldin Al Hariri, Fabrice Monteiro, Loïc Siéler, Abbas Dandache |
A high throughput configurable parallel encoder architecture for Quasi-Cyclic Low-Density Parity-Check Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 163-166, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | Kwanyeob Chae, Saibal Mukhopadhyay |
Error resilient logic circuits under dynamic variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 250, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
44 | |
18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012 ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE Computer Society, 978-1-4673-2082-5 The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
44 | Clement Bertolini, Olivier Héron, Nicolas Ventroux, François Marc |
Relation between HCI-induced performance degradation and applications in a RISC processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 67-72, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Antonio Sanchez-Clemente, Luis Entrena, Mario García-Valderas, Celia López-Ongil |
Logic masking for SET Mitigation Using Approximate Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 176-181, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Gao 0001, Wenhui Yang, Xiang Chen 0007, Ming Zhao 0001, Jing Wang 0001 |
Fault missing rate analysis of the arithmetic residue codes based fault-tolerant FIR filter design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 130-133, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Atieh Lotfi, Arash Bayat, Saeed Safari |
Architectural vulnerability aware checkpoint placement in a multicore processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 118-120, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Ameya Chaudhari, Jacob A. Abraham |
Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 162-167, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Mohammed Shayan, Virendra Singh, Adit D. Singh, Masahiro Fujita |
SEU tolerant robust memory cell design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 13-18, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang 0004, Jörg Henkel, Hans-Joachim Wunderlich |
Transparent structural online test for reconfigurable systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 37-42, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Celia López-Ongil, Marta Portela-García, Mario García-Valderas, Anna Vaskova, Luis Entrena, Joaquín Rivas-Abalo, Alberto Martín-Ortega, Javier Martinez-Oter, S. Rodriguez-Bustabad, Ignacio Arruego |
SEU sensitivity of robust communication protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 188-193, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Michael Nicolaidis, Vladimir Pasca, Lorena Anghel |
Through-silicon-via built-in self-repair for aggressive 3D integration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 91-96, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Glenn H. Chapman, Israel Koren, Zahava Koren |
Do more camera pixels result in a better picture? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 73-78, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Pedro Reviriego, Alfonso Sánchez-Macián, Juan Antonio Maestro |
Low Power embedded DRAM caches using BCH code partitioning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 79-83, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné |
Evaluation of test algorithms stress effect on SRAMs under neutron radiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 121-122, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi |
Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 49-54, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Rakesh Kumar |
Algorithmic techniques for robust applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 168, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Norhuzaimin Julai, Alexandre Yakovlev, Alexandre V. Bystrov |
Error detection and correction of single event upset (SEU) tolerant latch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 1-6, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Esteve Amat, A. Asenov, Ramon Canal, Binjie Cheng, J.-Ll. Cruz, Zoran Jaksic, Miguel Miranda, Antonio Rubio 0001, Paul Zuber |
Analysis of FinFET technology on memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 169, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Wang 0001, Mark G. Karpovsky |
Reliable and secure memories based on algebraic manipulation correction codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 146-149, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Ariel Burg, Osnat Keren |
Functional level embedded self testing for Walsh transform based adaptive hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 134-135, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Liang Chen 0014, Mehdi Baradaran Tahoori |
An efficient probability framework for error propagation and correlation estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 170-175, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Sujan Pandey, Klaas Brink |
Soft-errors resilient logic optimization for low power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 19-24, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Miguel Vilchis, Ramnath Venkatraman, Enrico Costenaro, Dan Alexandrescu |
A real-case application of a synergetic design-flow-oriented SER analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 43-48, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Eberhard Böhl, Markus Ihle |
A fault attack robust TRNG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 114-117, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Josep Altet, Diego Mateo, Didac Gómez |
On line monitoring of RF power amplifiers with embedded temperature sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 109-113, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost 0002, Luigi Carro |
Neutron radiation test of graphic processing units. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 55-60, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira 0001 |
The influence of clock-gating on NBTI-induced delay degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 61-66, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee |
Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 142-145, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro |
RIIF - Reliability information interchange format. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 103-108, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Mikhail Baklashov |
Event-driven on-line co-simulation with fault diagnostic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 123-126, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Arwa Ben Dhia, Lirida A. B. Naviner, Philippe Matherat |
Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 31-36, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Yang Lin, Mark Zwolinski |
SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 7-12, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi 0001, Masahiko Yoshimoto |
Neutron-induced soft error rate estimation for SRAM using PHITS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 138-141, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Ozgur Sinanoglu |
Test access mechanism for chips with spare identical cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 97-102, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Cinzia Bernardeschi, Luca Cassano, Andrea Domenici |
SEU-X: A SEu un-excitability prover for SRAM-FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 25-30, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Yaara Neumeier, Osnat Keren |
Punctured Karpovsky-Taubin binary robust error detecting codes for cryptographic devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 156-161, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Victor Tomashevich, Sudarshan Srinivasan, Fabian Foerg, Ilia Polian |
Cross-level protection of circuits against faults and malicious attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 150-155, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Julian Wolf 0002, Bernhard Fechner, Theo Ungerer |
Fault coverage of a timing and control flow checker for hard real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 127-129, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Dan Alexandrescu, Enrico Costenaro |
Towards optimized functional evaluation of SEE-induced failures in complex designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 182-187, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Michele Riga, Ernesto Sánchez 0001, Matteo Sonza Reorda |
On the functional test of L2 caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 84-90, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | Francisco R. Fernandes, Ricardo J. Machado 0001, José M. Ferreira 0001, Manuel G. Gericota |
Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, pp. 136-137, 2012, IEEE Computer Society, 978-1-4673-2082-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
44 | |
17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE Computer Society, 978-1-4577-1053-7 The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
44 | Valentin Gherman, Samuel Evain, Nathaniel Seymour, Yannick Bonhomme |
Generalized parity-check matrices for SEC-DED codes with fixed parity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 198-201, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Jorge O. M. Esteves, Tiago H. Moita, Carlos B. Almeida, Marcelino B. Santos |
ICT: Interface software for the characterization and test of mixed-signal power cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 202-205, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Tomoo Inoue, Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara |
High-level synthesis for multi-cycle transient fault tolerant datapaths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 13-18, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Nahid Farhady Ghalaty, Mahdi Fazeli, Hossein Izadi Rad, Seyed Ghassem Miremadi |
Software-based control flow error detection and correction using branch triplication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 214-217, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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