Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
44 | Piotr Gawkowski, Tomasz Rutkowski, Janusz Sosnowski |
Improving fault handling software techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 197-199, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda |
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 29-34, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee |
Error resilient video encoding using Block-Frame Checksums. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 289-294, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria |
How to flip a bit? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 235-239, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas 0001, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Investigating the Use of BICS to detect resistive-open defects in SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 200-201, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Anna Vaskova, Celia López-Ongil, Alejandro Jiménez-Horas, Enrique San Millán, Luis Entrena |
Robust cryptographic ciphers with on-line statistical properties validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 208-210, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michelangelo Grosso, Matteo Sonza Reorda, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Luis Entrena |
An on-line fault detection technique based on embedded debug features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 167-172, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Navid Farazmand, Masoud Zamani, Mehdi Baradaran Tahoori |
Online fault testing of reversible logic using dual rail coding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 204-205, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | |
15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE Computer Society, 978-1-4244-4596-7 The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
|
44 | Xavier Vera, Jaume Abella 0001, Javier Carretero, Pedro Chaparro, Antonio González 0001 |
Online error detection and correction of erratic bits in register files. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 81-86, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Eberhard Böhl, Paul Duplys |
Nonlinear compression functions using the MISR approach for security purposes in automotive applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 55-60, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Michelangelo Grosso, Matteo Sonza Reorda |
Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 95-100, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Elie Maricau, Georges G. E. Gielen |
A methodology for measuring transistor ageing effects towards accurate reliability simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 21-26, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker 0001 |
ATPG-based grading of strong fault-secureness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 269-274, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Massimo Violante, M. L. Esposti |
A low-cost solution for developing reliable Linux-based space computers for on-board data handling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 49-54, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Steffen Zeidler 0001, Marcus Ehrig, Milos Krstic, Michael Augustin, Christoph Wolf, Rolf Kraemer |
Ultra low cost asynchronous handshake checker. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 262-268, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Vikas Chandra |
Designing dependable multicore system with unreliable components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 154, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Samary Baranov, Ilya Levin, Osnat Keren, Mark G. Karpovsky |
Designing fault tolerant FSM by nano-PLA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 229-234, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas 0001, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 223-228, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Pedro Reviriego, Juan Antonio Maestro, Anne O'Donnell, Chris J. Bleakley |
Soft error detection and correction for FFT based convolution using different block lengths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 138-143, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | José F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira 0001 |
Controllability and observability in mixed signal cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 198-200, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schäfer, Cyrille Beltrando |
Highs and lows of radiation testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 179, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Xavier Vera |
DFx for massively multiprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 153, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar 0002, Christos A. Papachristou |
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 129, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Rodrigo Possamai Bastos, Yannick Monnet, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis 0001 |
Comparing transient-fault effects on synchronous and on asynchronous circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 29-34, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Amit Dutta, Malav Shah, G. Swathi, Rubin A. Parekhji |
Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 237-242, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis |
An Input Vector Monitoring Concurrent BIST scheme exploiting . ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 206-207, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Niccolò Battezzati, Filomena Decuzzi, Massimo Violante, Michel Briet |
Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 89-94, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Guillaume Hubert, Raoul Velazco, Paul Peronnard |
A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 180, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis |
Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 155, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi |
An I-IP based approach for the monitoring of NBTI effects in SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 15-20, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Michael Richter 0002, Michael Gössel |
Concurrent checking with split-parity codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 159-163, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Junfeng Fan, Miroslav Knezevic, Dusko Karaklajic, Roel Maes, Vladimir Rozic, Lejla Batina, Ingrid Verbauwhede |
FPGA-based testing strategy for cryptographic chips: A case study on Elliptic Curve Processor for RFID tags. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 189-191, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou |
SRAM cell design using tri-state devices for SEU protection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 114-119, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Houssein Jaber, Fabrice Monteiro, Abbas Dandache |
An effective fast and small-area parallel-pipeline architecture for OTM-convolutional encoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 257-261, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Kenneth M. Zick, John P. Hayes |
On-line characterization and reconfiguration for single event upset variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 243-248, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Mario García-Valderas, Marta Portela-García, Celia López-Ongil, Luis Entrena |
In-depth analysis of digital circuits against soft errors for selective hardening. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 144-149, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Hafizur Rahaman 0001, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan |
C-testable S-box implementation for secure advanced encryption standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 210-211, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano |
Error detection in addition chain based ECC Point Multiplication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 192-194, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac |
Enhanced self-configurability and yield in multicore grids. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 75-80, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Fabian Vargas 0001, Claudia A. Rocha, Bernardo Pianta, Marta Portela-García, Celia López-Ongil, Mario García-Valderas, Luis Entrena |
Briefing power/reliability optimization in embedded software design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 185-186, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Antonin Bougerol, Florent Miller, Nadine Buard |
Novel DRAM mitigation technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 109-113, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Costas Argyrides, Carlos Arthur Lang Lisbôa, Dhiraj K. Pradhan, Luigi Carro |
A fast error correction technique for matrix multiplication algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 133-137, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann |
Aging analysis of circuit timing considering NBTI and HCI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 3-8, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Abbas Ramazani, Mohsin Amin, Fabrice Monteiro, Camille Diou, Abbas Dandache |
A fault tolerant journalized stack processor architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 201-202, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | José Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt |
Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 101-106, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Jose Luis Garcia-Gervacio, Víctor H. Champac |
Detectability analysis of small delays due to resistive opens considering process variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 195-197, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Alejandro Jiménez-Horas, Enrique San Millán, Celia López-Ongil, Marta Portela-García, Mario García-Valderas, Luis Entrena |
Pseudo-random number generation applied to robust modern cryptography: A new technique for block ciphers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 203-205, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé |
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 61-66, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | André V. Fidalgo, Gustavo R. Alves, Manuel C. Felgueiras, Manuel G. Gericota |
Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 181, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
Evaluating Alpha-induced soft errors in embedded microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 69-74, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda |
Critical charge characterization in 6-T SRAMs during read mode. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 120-125, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis 0001, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira 0001 |
Built-in aging monitoring for safety-critical applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 9-14, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali |
A low-cost fault-tolerant technique for Carry Look-Ahead adder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 217-222, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Wang 0001, Mark G. Karpovsky, Berk Sunar |
Multilinear codes for robust error detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 164-169, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Paul Duplys, Eberhard Böhl |
Linear and nonlinear MISR operations for safety and security in automotive applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 187-188, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Shih-Hsin Hu, Jacob A. Abraham |
Error detection in 2-D Discrete Wavelet lifting transforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 170-175, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Ashkan Eghbal, Pooria M. Yaghini, Hossein Pedram, Hamid R. Zarandi |
Fault injection-based evaluation of a synchronous NoC router. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 212-214, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Maistri, Régis Leveugle |
Towards automated fault pruning with Petri Nets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 41-46, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee |
Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 249-254, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Pablo Maqueda, Josep Rius 0001 |
Analysis of the extra delay on interconnects caused by resistive opens and shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 208-209, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | Carmela Noro Grando, Carlos Arthur Lang Lisbôa, Álvaro Freitas Moreira, Luigi Carro |
Invariant checkers: An efficient low cost technique for run-time transient errors detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 35-40, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
44 | |
14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE Computer Society, 978-0-7695-3264-6 The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
44 | Rob Aitken |
Special Session 4: Reliability and Circuit Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 195-196, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Kiamal Z. Pekmestzi, Nicholas Axelos, Isidoros Sideris, Nikos K. Moshopoulos |
A BISR Architecture for Embedded Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 149-154, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | M. Kiran Kumar Reddy, Bharadwaj S. Amrutur, Rubin A. Parekhji |
False Error Study of On-line Soft Error Detection Mechanisms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 53-58, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Costas Argyrides, Fabian Vargas 0001, Marlon Moraes, Dhiraj K. Pradhan |
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 155-160, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Muhammad Mudassar Nisar, Abhijit Chatterjee |
Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 239-244, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Shi-Jie Wen, Dan Alexandrescu, Renaud Perez |
A Systematical Method of Quantifying SEU FIT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 109-114, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante |
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 135-140, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Tino Heijmen |
Soft-Error Vulnerability of Sub-100-nm Flip-Flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 247-252, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Michael Nicolaidis |
Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 105-106, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Ashish Darbari, Bashir M. Al-Hashimi, Peter Harrod, Daryl Bradley |
A New Approach for Transient Fault Injection Using Symbolic Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 93-98, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche |
Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 46-48, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Jimson Mathew, Jawar Singh, Anas Abu Taleb, Dhiraj K. Pradhan |
Fault Tolerant Reversible Finite Field Arithmetic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 188-189, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Michel Pignol, Thierry Parrain, Vincent Claverie, Christian Boléat, Guy Estaves |
Development of a Testbench for Validation of DMT and DT2 Fault-Tolerant Architectures on SOI PowerPC7448. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 182-184, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Piotr Gawkowski, Janusz Sosnowski |
Developing Fault Injection Environment for Complex Experiments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 179-181, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Maistri, Cyril Excoffon, Régis Leveugle |
Software Self-Testing of a Symmetric Cipher with Error Detection Capability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 79-84, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Nachiketa Das, Pranab Roy, Hafizur Rahaman 0001 |
On Line Testing of Single Feedback Bridging Fault in Cluster Based FPGA by Using Asynchronous Element. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 190-191, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Fatemeh Refan, Homa Alemzadeh, Saeed Safari, Paolo Prinetto, Zainalabedin Navabi |
Reliability in Application Specific Mesh-Based NoC Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 207-212, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi |
A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 173-174, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Tobias Koal, Heinrich Theodor Vierhaus |
Basic Architecture for Logic Self Repair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 177-178, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Marc Hunger, Sybille Hellebrand |
Verification and Analysis of Self-Checking Properties through ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 25-30, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano |
Totally Fault Tolerant RNS Based FIR Filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 192-194, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Yang Zhao 0001, Krishnendu Chakrabarty |
On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 213-218, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou |
SRAM Cell Design Protected from SEU Upsets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 169-170, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Andreas Merentitis, George Theodorou, Mihalis Giorgaras, Nektarios Kranitis |
Directed Random SBST Generation for On-Line Testing of Pipelined Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 273-279, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Ramtilak Vemu, Jacob A. Abraham |
Budget-Dependent Control-Flow Error Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 73-78, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Michael Richter 0002, Klaus Oberländer, Michael Gössel |
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 37-42, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Samara Sudireddy, Jayawant Kakade, Dimitri Kagaris |
Deterministic Built-in TPG with Segmented FSMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 261-266, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Richard Ruzicka, Lukás Sekanina, Roman Prokop |
Physical Demonstration of Polymorphic Self-Checking Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 31-36, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Subhasish Mitra |
Soft Error Protection Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 45, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin |
Integrating Scan Design and Soft Error Correction in Low-Power Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 59-64, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell |
On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 233-238, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco |
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 295-301, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Norbert Seifert |
Special Session 1: Radiation Hardening Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 43-44, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Alodeep Sanyal, Syed M. Alam, Sandip Kundu |
A Built-In Self-Test Scheme for Soft Error Rate Characterization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 65-70, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Claudia Rusu, Cristian Grecu, Lorena Anghel |
Communication Aware Recovery Configurations for Networks-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 201-206, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Nikolaos G. Bartzoudis, Vasileios Tantsios, Klaus D. McDonald-Maier |
Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 185-187, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
44 | Antonin Bougerol, Florent Miller, Nadine Buard |
SDRAM Architecture & Single Event Effects Revealed with Laser. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece, pp. 283-288, 2008, IEEE Computer Society, 978-0-7695-3264-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|