Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | Yu-Wei Lee, Nur A. Touba |
Unified 3D test architecture for variable test data bandwidth across pre-bond, partial stack, and post-bond test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 184-189, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | J.-Y. Hung, Noh-Jin Park, K. M. George, Nohpill Park |
Modeling and analysis of repair and maintenance processes in Fault Tolerant Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 261-265, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Classes of difficult-to-diagnose transition fault clusters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 1-6, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria |
Differential analysis of Round-Reduced AES faulty ciphertexts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 204-211, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Gustavo K. Contreras, Md. Tauhidur Rahman 0001, Mohammad Tehranipoor |
Secure Split-Test for preventing IC piracy by untrusted foundry and assembly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 196-203, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Stefano Campitelli, Marco Ottavi, Salvatore Pontarelli, Alessandro Marchioro, Daniele Felici, Fabrizio Lombardi |
F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 107-111, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Elisa Quintarelli, Fabio Salice, Paolo Garza |
A data mining approach to incremental adaptive functional diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 13-18, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Matteo Carminati, Antonio Miele, Anup Das 0001, Akash Kumar 0001, Bharadwaj Veeravalli |
Run-time mapping for reliable many-cores based on energy/performance trade-offs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 58-64, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Chandra Babu Dara, Themistoklis Haniotakis, Spyros Tragoudas |
Low power and high speed current-mode memristor-based TLGs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 89-94, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik |
Impact of mid-bond testing in 3D stacked ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 178-183, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Hassan Salmani, Mohammad Tehranipoor |
Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFTS ![In: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, pp. 190-195, 2013, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
17 | Katherine A. McComas |
Researcher Views About Funding Sources and Conflicts of Interest in Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 18(4), pp. 699-717, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Ellen-Marie Forsberg |
Standardisation in the Field of Nanotechnology: Some Issues of Legitimacy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 18(4), pp. 719-739, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Mario Coccia |
Evolutionary trajectories of the nanotechnology research across worldwide economic players. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technol. Anal. Strateg. Manag. ![In: Technol. Anal. Strateg. Manag. 24(10), pp. 1029-1050, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Dovev Lavie, Israel Drori |
Collaborating for Knowledge Creation and Application: The Case of Nanotechnology Research Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Organ. Sci. ![In: Organ. Sci. 23(3), pp. 704-724, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Hossein Moaiyeri, Reza Chavoshisani, Ali Jalali, Keivan Navi, Omid Hashemipour |
High-Performance Mixed-Mode Universal Min-Max Circuits for Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Circuits Syst. Signal Process. ![In: Circuits Syst. Signal Process. 31(2), pp. 465-488, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Smita Kolhe, Khushali Parikh |
Application of nanotechnology in cancer: a review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Bioinform. Res. Appl. ![In: Int. J. Bioinform. Res. Appl. 8(1/2), pp. 112-125, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Stasa Milojevic |
Multidisciplinary Cognitive Content of Nanoscience and Nanotechnology ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1204.0127, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
17 | Goio Etxebarria, Mikel Gomez-Uranga, Jon Barrutia |
Tendencies in scientific output on carbon nanotubes and graphene in global centers of excellence for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 91(1), pp. 253-268, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Sujit Bhattacharya 0001, Shilpa, Madhulika Bhati |
China and India: The two new players in the nanotechnology race. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 93(1), pp. 59-87, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Jiancheng Guan, Yuan Shi |
Transnational citation, technological diversity and small world in global nanotechnology patenting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 93(3), pp. 609-633, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Xianwen Wang, Shenmeng Xu, Di Liu, Yongxia Liang |
The role of Chinese-American scientists in China-US scientific collaboration: a study in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 91(3), pp. 737-749, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Aashish Mehta, Patrick Herron, Yasuyuki Motoyama, Richard Appelbaum, Timothy Lenoir |
Globalization and de-globalization in nanotechnology research: the role of China. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 93(2), pp. 439-458, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Qingjun Zhao, Jiancheng Guan |
Modeling the dynamic relation between science and technology in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 90(2), pp. 561-579, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Gamal S. Ahmed |
Modern Concepts in the Curriculum and the Teaching of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Inf. Commun. Technol. Educ. ![In: Int. J. Inf. Commun. Technol. Educ. 8(3), pp. 55-63, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Jang Hyun Kim 0001 |
A Hyperlink and Semantic Network Analysis of the Triple Helix (University-Government-Industry): The Interorganizational Communication Structure of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Mediat. Commun. ![In: J. Comput. Mediat. Commun. 17(2), pp. 152-170, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Abdoul Rjoub, Muna M. Al-Durrah |
The performance and behaviour of dual edge triggered flip-flops in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Comput. Aided Eng. Technol. ![In: Int. J. Comput. Aided Eng. Technol. 4(1), pp. 49-71, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Xuanting Ye, Yun Liu, Alan L. Porter |
International collaborative patterns in China's nanotechnology publications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Technol. Manag. ![In: Int. J. Technol. Manag. 59(3/4), pp. 255-272, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Yan Dang 0001, Yulei Zhang 0001, Hsinchun Chen, Susan A. Brown, Paul Jen-Hwa Hu, Jay F. Nunamaker Jr. |
Theory-Informed Design and Evaluation of an Advanced Search and Knowledge Mapping System in Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Manag. Inf. Syst. ![In: J. Manag. Inf. Syst. 28(4), pp. 99-128, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Piotr Dziubecki, Piotr Grabowski, Michal Krysinski, Tomasz Kuczynski, Krzysztof Kurowski, Tomasz Piontek, Dawid Szejnfeld |
Online Web-Based Science Gateway for Nanotechnology Research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PL-Grid ![In: Building a National Distributed e-Infrastructure - PL-Grid - Scientific and Technical Achievements, pp. 205-216, 2012, Springer, 978-3-642-28266-9. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Zachary W. Ulissi, Mark C. Molaro, Michael S. Strano, Richard D. Braatz |
Systems nanotechnology: Identification, estimation, and control of nanoscale systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACC ![In: American Control Conference, ACC 2012, Montreal, QC, Canada, June 27-29, 2012, pp. 1-7, 2012, IEEE, 978-1-4577-1095-7. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Jack H. Lutz |
The Computer Science of DNA Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATA ![In: Language and Automata Theory and Applications - 6th International Conference, LATA 2012, A Coruña, Spain, March 5-9, 2012. Proceedings, pp. 57, 2012, Springer, 978-3-642-28331-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Benjamin Schrempf, Petra Ahrweiler |
Modelling innovation networks of general purpose technologies: the case of nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WSC ![In: Winter Simulation Conference, WSC '12, Berlin, Germany, December 9-12, 2012, pp. 101:1-101:8, 2012, WSC, 978-1-4673-4779-2. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Milan Perkovac |
Maxwell's equations for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIPRO ![In: 2012 Proceedings of the 35th International Convention, MIPRO 2012, Opatija, Croatia, May 21-25, 2012, pp. 429-436, 2012, IEEE, 978-1-4673-2577-6. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
17 | |
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-4673-3043-5 The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
17 | Tomas Markevicus, Nina Olsson, Monica Carfagni, Rocco Furferi, Lapo Governi, Luca Puggelli |
IMAT Project: From Innovative Nanotechnology to Best Practices in Art Conservation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EuroMed ![In: Progress in Cultural Heritage Preservation - 4th International Conference, EuroMed 2012, Limassol, Cyprus, October 29 - November 3, 2012. Proceedings, pp. 784-792, 2012, Springer, 978-3-642-34233-2. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Richard A. Guinee |
A novel pseudonoise tester for transmission line fault location and identification using pseudorandom binary sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 225-232, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni, Adrian Evans |
Single event upset tolerance in flip-flop based microprocessor cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 79-84, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Sreenivas Gangadhar, Spyros Tragoudas |
Accurate calculation of SET propagation probability for hardening. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 104-108, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Linus Feiten, Matthias Sauer 0002, Tobias Schubert 0001, Alexander Czutro, Eberhard Böhl, Ilia Polian, Bernd Becker 0001 |
#SAT-based vulnerability analysis of security components - A case study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 49-54, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Oscar Acevedo, Dimitri Kagaris |
Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 233-238, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Yang Lu, Fabrizio Lombardi, Salvatore Pontarelli, Marco Ottavi |
On the design of two single event tolerant slave latches for scan delay testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 67-72, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Tomohiro Yoneda, Masashi Imai |
Dependable routing in multi-chip NoC platforms for automotive applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 217-224, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Ali Arabi M. Shahi, Payman Zarkesh-Ha |
Prediction of gate delay variation for CNFET under CNT density variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 140-145, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Alireza Rohani, Hans G. Kerkhoff |
An on-line soft error mitigation technique for control logic of VLIW processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 85-91, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Maghsoudloo, Hamid R. Zarandi |
Dirty data vulnerability mitigation by means of sharing management in cache coherence protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 205-210, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Juan Carlos Martínez Santos, Yunsi Fei |
Designing and implementing a Malicious 8051 processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 63-66, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren |
Relating digital imager defect rates to pixel size, sensor area and ISO. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 164-169, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Built-in generation of multi-cycle broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 146-151, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Jianping Gong, Yong-Bin Kim, Fabrizio Lombardi, Jie Han 0001 |
Hardening a memory cell for low power operation by gate leakage reduction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 73-78, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Maintaining proximity to functional operation conditions under enhanced-scan tests based on functional broadside tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 239-244, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Generation and compaction of mixed broadside and skewed-load n-detection test sets for transition faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 37-42, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Vadim Geurkov |
Optimal choice of arithmetic compactors for mixed-signal systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 182-186, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Yifat Manzor, Osnat Keren |
Amalgamated q-ary codes for multi-level flash memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 98-103, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor |
Path-delay fingerprinting for identification of recovered ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 13-18, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Kyu-Nam Shim, Jiang Hu |
A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 170-177, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Adam Watkins, Spyros Tragoudas |
Transient pulse propagation using the Weibull distribution function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 109-114, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Rance Rodrigues, Israel Koren, Sandip Kundu |
A mechanism to verify cache coherence transactions in multicore systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 211-216, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Muhammad Tauseef Rab, Asad Amin Bawa, Nur A. Touba |
Implementing defect tolerance in 3D-ICs by exploiting degrees of freedom in assembly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 178-181, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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17 | Kazuteru Namba, Takashi Katagiri, Hideo Ito |
Dual-edge-triggered FF with timing error detection capability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 187-192, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Gabriel L. Nazar, Luigi Carro |
Fast single-FPGA fault injection platform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 152-157, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella |
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 121-125, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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17 | Fabrizio Lombardi, Nohpill Park, Haider A. F. Almurib, T. Nandha Kumar |
On the multiple fault detection of a nano crossbar. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 134-139, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Chuanlei Zheng, Parijat Shukla, Shuai Wang 0006, Jie S. Hu |
Exploring hardware transaction processing for reliable computing in chip-multiprocessors against soft errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 92-97, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Marcelo de Souza Moraes, Marcos Barcellos Hervé, Marcelo Lubaszewski |
Low pin count DfT technique for RFID ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 31-36, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Xinmu Wang, Tatini Mal-Sarkar, Aswin Raghav Krishna, Seetharam Narasimhan, Swarup Bhunia |
Software exploitable hardware Trojans in embedded processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 55-58, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Da Cheng, Sandeep K. Gupta 0001 |
A systematic methodology to improve yield per area of highly-parallel CMPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 126-133, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 158-163, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Mehryar Rahmatian, Hessam Kooti, Ian G. Harris, Elaheh Bozorgzadeh |
Minimization of Trojan footprint by reducing Delay/Area impact. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 59-62, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Wenpo Zhang, Kazuteru Namba, Hideo Ito |
Improving small-delay fault coverage for on-chip delay measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 193-198, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Mafalda Cortez, Apurva Dargar, Said Hamdioui, Geert Jan Schrijen |
Modeling SRAM start-up behavior for Physical Unclonable Functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 1-6, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Martin Omaña 0001, Daniele Rossi 0001, G. Collepalumbo, Cecilia Metra, Fabrizio Lombardi |
Faults affecting the control blocks of PV arrays and techniques for their concurrent detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 199-204, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Ke Huang 0001, John M. Carulli Jr., Yiorgos Makris |
Parametric counterfeit IC detection via Support Vector Machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 7-12, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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17 | Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede |
A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 43-48, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Cinzia Bernardeschi, Luca Cassano, Andrea Domenici, Luca Sterpone |
Accurate simulation of SEUs in the configuration memory of SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 115-120, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Asad Amin Bawa, Muhammad Tauseef Rab, Nur A. Touba |
Using partial masking in X-chains to increase output compaction for an X-canceling MISR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 19-24, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
17 | Davide Sabena, Matteo Sonza Reorda, Luca Sterpone |
On the development of Software-Based Self-Test methods for VLIW processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 25-30, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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17 | René von Schomberg |
On Identifying Plausibility and Deliberative Public Policy - Commentary on: "Negotiating Plausibility: Intervening in the Future of Nanotechnology". ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 17(4), pp. 739-742, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Cynthia Selin |
Negotiating Plausibility: Intervening in the Future of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 17(4), pp. 723-737, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Xuan Liu 0004, Siddharth Kaza, Pengzhu Zhang, Hsinchun Chen |
Determining inventor status and its effect on knowledge diffusion: A study on nanotechnology literature from China, Russia, and India. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Assoc. Inf. Sci. Technol. ![In: J. Assoc. Inf. Sci. Technol. 62(6), pp. 1166-1176, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Christine Shea, Roger Grinde, Bruce Elmslie |
Nanotechnology as general-purpose technology: empirical evidence and implications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technol. Anal. Strateg. Manag. ![In: Technol. Anal. Strateg. Manag. 23(2), pp. 175-192, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Harry Rudin |
Building a Building for Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ERCIM News ![In: ERCIM News 2011(86), 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
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17 | Mohammad Hossein Moaiyeri, Akbar Doostaregan, Keivan Navi |
Design of energy-efficient and robust ternary circuits for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 5(4), pp. 285-296, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Yocheved Dotan, Nadav Levison, David J. Lilja |
Fault tolerance for nanotechnology devices at the bit and module levels with history index of correct computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 5(4), pp. 221-230, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Ehsan Pour Ali Akbar, Majid Haghparast, Keivan Navi |
Novel design of a fast reversible Wallace sign multiplier circuit in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 42(8), pp. 973-981, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Md. Saiful Islam 0003, Mohd. Zulfiquar Hafiz, Zerina Begum |
Quantum Cost Efficient Reversible BCD Adder for Nanotechnology Based Systems ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1112.0727, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
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17 | Loet Leydesdorff |
An Evaluation of Impacts in "Nanoscience & nanotechnology:" Steps towards standards for citation analysis ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1109.2306, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
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17 | Li Tang 0005, Philip Shapira |
Regional development and interregional collaboration in the growth of nanotechnology research in China. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 86(2), pp. 299-315, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Jue Wang 0009, Philip Shapira |
Funding acknowledgement analysis: an enhanced tool to investigate research sponsorship impacts: the case of nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 87(3), pp. 563-586, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | R. Karpagam, S. Gopalakrishnan, M. Natarajan, B. Ramesh Babu |
Mapping of nanoscience and nanotechnology research in India: a scientometric analysis, 1990-2009. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 89(2), pp. 501-522, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Li Tang 0005, Philip Shapira |
China-US scientific collaboration in nanotechnology: patterns and dynamics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 88(1), pp. 1-16, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Selen Onel, Abe Zeid, Sagar V. Kamarthi |
The structure and analysis of nanotechnology co-author and citation networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 89(1), pp. 119-138, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Morteza Maghrebi, Ali Abbasi 0003, Saeid Amiri, Reza Monsefi, Ahad Harati |
A collective and abridged lexical query for delineation of nanotechnology publications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 86(1), pp. 15-25, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Daniel Russo 0003, Randal D. Fagan, Thorsten Hesjedal |
An Undergraduate Nanotechnology Engineering Laboratory Course on Atomic Force Microscopy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Educ. ![In: IEEE Trans. Educ. 54(3), pp. 428-441, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Welchy Cavalcanti, Michael Hoffmann 0006, Marc Amkreutz, Peter Schiffels |
Computational nanotechnology for functional coatings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Cheminformatics ![In: J. Cheminformatics 3(S-1), pp. 24, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Dennis G. Thomas, Rohit V. Pappu, Nathan A. Baker |
NanoParticle Ontology for cancer nanotechnology research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Biomed. Informatics ![In: J. Biomed. Informatics 44(1), pp. 59-74, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Lyria Bennett Moses |
Regulating Beyond Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Technol. Soc. Mag. ![In: IEEE Technol. Soc. Mag. 30(3), pp. 42-48, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Michael D. Mehta |
Understanding Advances in Nanotechnology: Minimizing Risks and Maximizing Benefits with Application of the Appropriate Governance Framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 3(2), pp. 1-11, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Ndubuisi Ekekwe |
Nanotechnology and Microelectronics: The Science, Trends and Global Diffusion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 3(4), pp. 1-23, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Silvanus J. Udoka, Chi Anyansi-Archibong |
Emerging Exposure Risks and Ethics of the Nanotechnology Workplace. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 3(4), pp. 38-46, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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