Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | Nazrul Islam |
Trends in Nanotechnology Knowledge Creation and Dissemination. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 3(4), pp. 47-64, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Darryl Stuart Jarvis, Noah Richmond |
Regulation and Governance of Nanotechnology in China: Regulatory Challenges and Effectiveness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eur. J. Law Technol. ![In: Eur. J. Law Technol. 2(3), 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
17 | David Berube |
Decision Ethics and Emergent Technologies: The Case of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eur. J. Law Technol. ![In: Eur. J. Law Technol. 2(3), 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
17 | Shilpanjali Deshpande Sarma |
How Resilient is India to Nanotechnology Risks? Examining Current Developments, Capacities and an Approach for Effective Risk Governance and Regulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eur. J. Law Technol. ![In: Eur. J. Law Technol. 2(3), 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
17 | Dmitri B. Strukov |
Nanotechnology: Smart connections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Nat. ![In: Nat. 476(7361), pp. 403-405, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | John H. Lau |
Recent advances and new trends in nanotechnology and 3D integration for semiconductor industry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
3DIC ![In: 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31 - February 2, 2012, pp. 1-23, 2011, IEEE, 978-1-4673-2189-1. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Preethu Rose Anish, Anand Gole, Smita Ghaisas |
A semantic regulatory framework for nanotechnology application in agri-food domain. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RELAW ![In: Fourth International Workshop on Requirements Engineering and Law, RELAW 2011, Trento, Italy, August 30, 2011, pp. 60-66, 2011, IEEE Computer Society, 978-1-4577-0947-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | In-Seok Jung, Elizabeth R. Kim, Minsu Choi |
Learning nanotechnology through crossbar-based architecture and Carbon Nanotube(CNT) FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MSE ![In: 2011 IEEE International Conference on Microelectronic Systems Education, MSE 2011, San Diego, CA, USA, June 5-6, 2011, pp. 60-63, 2011, IEEE Computer Society, 978-1-4577-0548-9. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Ben Pelleg, Manuel Figueroa, Matthew VanKouwenberg, Adam K. Fontecchio, Eli Fromm |
Implementing nanotechnology education in the high school classroom. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FIE ![In: 2011 Frontiers in Education Conference, FIE 2011, Rapid City, SD, USA, October 12-15, 2011, pp. 4, 2011, IEEE Computer Society, 978-1-61284-468-8. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | P. Somasundaran, P. Purohit |
Nanotechnology for sensing: emerging applications of aptamers based sensors for societal welfare. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACWR ![In: Proceedings of the 1st International Conference on Wireless Technologies for Humanitarian Relief, ACWR '11, Amritapuri, Kollam, Kerala, India, December 18-21, 2011, pp. 299, 2011, ACM, 978-1-4503-1011-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | |
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-4577-1713-0 The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
17 | Berna Beyhan |
Who interacts with whom? Individual and organizational aspects of university-industry interactions in nanotechnology: the turkish case ; Kim kiminle ilişki kurar? Nano teknoloji alanında üniversite-sanayi ilişkilerinin kişisel ve örgütsel yönleri: Türkiye örneği. (PDF / PS) ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2011 |
RDF |
|
17 | Li Tang 0005 |
The US - China scientific collaboration, knowledge moderation, and China's rise in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2011 |
RDF |
|
17 | Luca Amati, Cristiana Bolchini, Fabio Salice |
Optimal Test Set Selection for Fault Diagnosis Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 93-99, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Uljana Reinsalu, Jaan Raik, Raimund Ubar, Peeter Ellervee |
Fast RTL Fault Simulation Using Decision Diagrams and Bitwise Set Operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 164-170, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Hossein Neishaburi, Zeljko Zilic |
Hierarchical Embedded Logic Analyzer for Accurate Root-Cause Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 120-128, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Daniele Rossi 0001, Martin Omaña 0001, Cecilia Metra, Alessandro Paccagnella |
Impact of Aging Phenomena on Soft Error Susceptibility. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 18-24, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Khalid Latif 0002, Amir-Mohammad Rahmani, Ethiopia Nigussie, Hannu Tenhunen, Tiberiu Seceleanu |
A Novel Topology-Independent Router Architecture to Enhance Reliability and Performance of Networks-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 454-462, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Mario Schölzel |
Fine-Grained Software-Based Self-Repair of VLIW Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 41-49, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Hao Chen, Jie Han 0001, Fabrizio Lombardi |
A Transistor-Level Stochastic Approach for Evaluating the Reliability of Digital Nanometric CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 60-67, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Rance Rodrigues, Israel Koren, Sandip Kundu |
An Architecture to Enable Life Cycle Testing in CMPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 341-348, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Costas Argyrides, Ronaldo Rodrigues Ferreira, Carlos Arthur Lang Lisbôa, Luigi Carro |
Decimal Hamming: A Software-Implemented Technique to Cope with Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 11-17, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Hossein Neishaburi, Zeljko Zilic |
A Fault Tolerant Hierarchical Network on Chip Router Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 445-453, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Behnam Ghavami, Mohsen Raji, Hossein Pedram, Omid Naghshineh Arjmand |
CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 86-92, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Muhammad Aamir Khan 0002, Hans G. Kerkhoff |
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 374-381, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Gabriel L. Nazar, Luigi Carro |
An Area Effective Parity-Based Fault Detection Technique for FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 27-33, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy |
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 217-225, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Joon-Sung Yang, Rudrajit Datta |
Efficient Function Mapping in Nanoscale Crossbar Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 190-196, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel |
Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 294-301, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Tobias Koal, Daniel Scheit, Mario Schölzel, Heinrich Theodor Vierhaus |
On the Feasibility of Built-In Self Repair for Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 316-324, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Nachiket Rajderkar, Marco Ottavi, Salvatore Pontarelli, Jie Han 0001, Fabrizio Lombardi |
On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 309-315, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Masoud Zamani, Mehdi Baradaran Tahoori |
Online Missing/Repeated Gate Faults Detection in Reversible Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 435-442, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Hossein Neishaburi, Zeljko Zilic |
Debug Aware AXI-based Network Interface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 399-407, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Jongho Seol, Noh-Jin Park, K. M. George, Nohpill Park |
Modeling Yield of Self-Healing Carbon Nanotubes/Silicon-Nanowire FET-based Nanoarray. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 197-205, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Chiara Sandionigi |
A Reliability-Aware Partitioner for Multi-FPGA Platforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 34-40, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Zahra Lak, Nicola Nicolici |
A New Algorithm for Post-Silicon Clock Measurement and Tuning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 53-59, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Sven Eisenhardt, Anja Küster, Thomas Schweizer, Tommy Kuhn, Wolfgang Rosenstiel |
Spatial and Temporal Data Path Remapping for Fault-Tolerant Coarse-Grained Reconfigurable Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 382-388, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Jinghang Liang, Jie Han 0001, Fabrizio Lombardi |
On the Reliable Performance of Sequential Adders for Soft Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 3-10, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Paolo Roberto Grassi, Mariagiovanna Sami, Ettore Speziale, Michele Tartara |
Analyzing the Sensitivity to Faults of Synchronization Primitives. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 349-355, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Noor M. Nayeem, Jacqueline E. Rice |
Online Fault Detection in Reversible Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 426-434, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor |
NBTI Monitoring and Design for Reliability in Nanoscale Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 68-76, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Antonio Miele |
An Application-Level Dependability Analysis Framework for Embedded Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 171-178, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Bonnie L. Gray, Vijay K. Jain |
Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 181-189, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Md. Muwyid U. Khan, Pritish Narayanan, Priyamvada Vijayakumar, Israel Koren, C. Mani Krishna 0001, Csaba Andras Moritz |
Biased Voting for Improved Yield in Nanoscale Fabrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 79-85, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Masashi Imai, Tomohiro Yoneda |
Duplicated Execution Method for NoC-based Multiple Processor Systems with Restricted Private Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 463-471, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui |
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 139-145, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Javier Carretero, Jaume Abella 0001, Xavier Vera, Pedro Chaparro |
Control-Flow Recovery Validation Using Microarchitectural Invariants. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 209-216, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 302-308, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Rudrajit Datta, Nur A. Touba |
Generating Burst-Error Correcting Codes from Orthogonal Latin Square Codes - A Graph Theoretic Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 367-373, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Jorge Luis Lagos-Benites, Michelangelo Grosso, Matteo Sonza Reorda, G. Audisio, M. Pipponzi, Marco Sabatini, V. A. Avantaggiati |
An FPGA-Emulation-Based Platform for Characterization of Digital Baseband Communication Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 391-398, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Erik MacLean, Vijay K. Jain |
A Power Transmission Line Fault Distance Estimation VLSI Chip: Design and Defect Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 243-251, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Chandra Babu Dara, Spyros Tragoudas, Themistoklis Haniotakis |
A Metric for Weight Assignment to Optimize the Performance of MOBILE Threshold Logic Gate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 131-138, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Mehran Mozaffari Kermani, Arash Reyhani-Masoleh |
Reliable Hardware Architectures for the Third-Round SHA-3 Finalist Grostl Benchmarked on FPGA Platform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 325-331, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch |
On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 226-232, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Amlan Ganguly, Partha Pratim Pande, Benjamin Belzer, Alireza Nojeh |
A Unified Error Control Coding Scheme to Enhance the Reliability of a Hybrid Wireless Network-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 277-285, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Rudrajit Datta, Nur A. Touba |
X-Stacking - A Method for Reducing Control Data for Output Compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 332-338, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Hiroshi Kutami, Yusuke Fukushima, Masaru Fukushi, Ikuko Eguchi Yairi, Takeshi Hattori |
Route-Aware Task Mapping Method for Fault-Tolerant 2D-Mesh Network-on-Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 472-480, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Masato Inoue, Haruhiko Kaneko |
Deletion/Insertion/Reversal Error Correcting Codes for Bit-Patterned Media Recording. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 286-293, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Masoud Zamani, Hossein Pedram, Fabrizio Lombardi |
Templated-Based Asynchronous Design for Testable and Fail-Safe Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 146-152, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Shuai Wang |
Characterizing System-Level Vulnerability for Instruction Caches against Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 356-363, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Masayoshi Yoshimura, Yusuke Akamine, Yusuke Matsunaga |
A Soft Error Tolerance Estimation Method for Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 268-276, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Ahmed Awad, Abdallatif S. Abu-Issa, Said Hamdioui |
Reducing Test Power for Embedded Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 112-119, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Vijay K. Jain, Glenn H. Chapman |
Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 235-242, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis |
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 155-163, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Daniele Giaffreda, Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra |
Model for Thermal Behavior of Shaded Photovoltaic Cells under Hot-Spot Condition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 252-258, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Daniel B. Limbrick, Suge Yue, William H. Robinson, Bharat L. Bhuva |
Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 103-111, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Geunho Cho, Fabrizio Lombardi |
On the Delay Analysis of Defective CNTFETs with Undeposited CNTs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 419-425, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Sreenivas Gangadhar, Spyros Tragoudas |
A Probabilistic Approach to Diagnose SETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 261-267, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren |
Predicting Pixel Defect Rates Based on Image Sensor Parameters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, pp. 408-416, 2011, IEEE Computer Society, 978-1-4577-1713-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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17 | Haizheng Zhang, Baojun Qiu, Kristinka Ivanova, C. Lee Giles, Henry C. Foley, John Yen |
Locality and attachedness-based temporal social network growth dynamics analysis: A case study of evolving nanotechnology scientific collaboration networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Assoc. Inf. Sci. Technol. ![In: J. Assoc. Inf. Sci. Technol. 61(5), pp. 964-977, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Rachel Armstrong |
Systems Architecture: A New Model for Sustainability and the Built Environment using Nanotechnology, Biotechnology, Information Technology, and Cognitive Science with Living Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Artif. Life ![In: Artif. Life 16(1), pp. 73-87, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
17 | Edward L. Wolf |
Nanophysics and nanotechnology applied to sensors, part 1. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 13(3), pp. 26-32, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
17 | Edward L. Wolf |
Nanophysics and nanotechnology applied to sensors Part 2: Part 26 in a series of tutorials on instrumentation and measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 13(5), pp. 28-36, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
17 | Cindy K. Harnett |
Nanotechnology in environmental sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 13(2), pp. 8-12, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Gangbo Wang, Jiancheng Guan |
The role of patenting activity for scientific research: A study of academic inventors from China's nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Informetrics ![In: J. Informetrics 4(3), pp. 338-350, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Kiran Gupta, T. R. Gopalakrishnan Nair |
A Study of VLSI Technology, Wafers and Impact on Nanotechnology ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1001.3771, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
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17 | Md. Saiful Islam 0003 |
A Novel Quantum Cost Efficient Reversible Full Adder Gate in Nanotechnology ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1008.3533, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
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17 | Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Zerina Begum, Mohd. Zulfiquar Hafiz |
Realization of a Novel Fault Tolerant Reversible Full Adder Circuit in Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. Arab J. Inf. Technol. ![In: Int. Arab J. Inf. Technol. 7(3), pp. 317-323, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
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17 | Philip Shapira, Jan L. Youtie, Alan L. Porter |
The emergence of social science research on nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 85(2), pp. 595-611, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Jiancheng Guan, Gangbo Wang |
A comparative study of research performance in nanotechnology for China's inventor-authors and their non-inventing peers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 84(2), pp. 331-343, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Erik Fisher, Catherine P. Slade, Derrick Anderson, Barry Bozeman |
The public value of nanotechnology? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 85(1), pp. 29-39, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Guang Yu, Ming-Yang Wang, Daren Yu |
Characterizing knowledge diffusion of Nanoscience & Nanotechnology by citation analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 84(1), pp. 81-97, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Scott D. Bass, Lukasz A. Kurgan |
Discovery of factors influencing patent value based on machine learning in patents in the field of nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 82(2), pp. 217-241, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Chwee Teck Lim, Jongyoon Han, Jochen R. Guck, Horacio Espinosa |
Micro and nanotechnology for biological and biomedical applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Medical Biol. Eng. Comput. ![In: Medical Biol. Eng. Comput. 48(10), pp. 941-943, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Anees A. Ansari, Mansour Alhoshan, Mohamad S. Alsalhi, Abdull S. Aldwayyan |
Prospects of Nanotechnology in Clinical Immunodiagnostics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 10(7), pp. 6535-6581, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Young-Eun Choi, Ju-Won Kwak, Joon Won Park |
Nanotechnology for Early Cancer Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 10(1), pp. 428-455, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Masami Hagiya, Fumiaki Tanaka, Ibuki Kawamata |
IT for synthetic biology and DNA nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
XRDS ![In: XRDS 17(1), pp. 16-21, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Nazrul Islam 0002 |
Nanotechnology Innovation Systems: A Regional Comparison. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 2(2), pp. 65-84, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Adolfo Nemirovsky, Fernando Audebert, Osvaldo N. Oliveira Jr., Carlos J. L. Constantino, Lorena Barrientos, Guillermo González, Elder de la Rosa |
Nanoscience and Nanotechnology in Latin America. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Nanotechnol. Mol. Comput. ![In: Int. J. Nanotechnol. Mol. Comput. 2(4), pp. 38-76, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Lyria Bennett Moses |
Regulating beyond nanotechnology do nano-specific problems require nano-specific solutions? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISTAS ![In: 2010 IEEE International Symposium on Technology and Society, ISTAS 2010, Wollongong, NSW, Australia, June 7-9, 2010, pp. 68-75, 2010, IEEE, 978-1-4244-7777-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Costas Argyrides, Nikolaos Mavrogiannakis, Dhiraj K. Pradhan |
Improved Yield in Nanotechnology Circuits Using Non-square Meshes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2010, 5-7 July 2010, Lixouri Kefalonia, Greece, pp. 410-415, 2010, IEEE Computer Society, 978-0-7695-4076-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Eyal Cohen, Shlomi Dolev, Sergey Frenkel, Rami Puzis, Michael Rosenblit |
Nanotechnology Based Optical Solution for NP-Hard Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OSC ![In: Optical Supercomputing - Third International Workshop, OSC 2010, Bertinoro, Italy, November 17-19, 2010, Revised Selected Papers, pp. 86-99, 2010, Springer, 978-3-642-22493-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Abdoul Rjoub, Hassan Almanasrah |
Low leakage multi-Vth technique for sequential circuits at transistor level in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECS ![In: 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010, pp. 974-977, 2010, IEEE, 978-1-4244-8155-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Mary Mehrnoosh Eshaghian-Wilner, Adam LeWinter |
A Survey of Nanotechnology Principles in Modern Computing Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CDES ![In: Proceedings of the 2010 International Conference on Computer Design, CDES 2010, July 12-15, 2010, Las Vegas Nevada, USA, pp. 176-181, 2010, CSREA Press, 1-60132-135-X. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
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17 | Sílvia Alcaraz Domínguez, Narcís Parés Burguès, Joan Mora Guiard |
Interactive learning experience on nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITS ![In: ACM International Conference on Interactive Tabletops and Surfaces, ITS 2010, Saarbrücken, Germany, November 7-10, 2010, pp. 301, 2010, ACM, 978-1-4503-0399-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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17 | Roderick V. N. Melnik |
Nanoscale Processes, Modeling Coupled and Transport Phenomena in Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Encyclopedia of Complexity and Systems Science ![In: Encyclopedia of Complexity and Systems Science, pp. 5912-5925, 2009, Springer, 978-0-387-75888-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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17 | Craig Cormick |
Piecing Together the Elephant: Public Engagement on Nanotechnology Challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 15(4), pp. 439-442, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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17 | Elena Jubete, Oscar A. Loaiza, Estibaliz Ochoteco, José A. Pomposo, Hans Grande, Javier Rodríguez |
Nanotechnology: A Tool for Improved Performance on Electrochemical Screen-Printed (Bio)Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Sensors ![In: J. Sensors 2009, pp. 842575:1-842575:13, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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17 | Shun-dong Zhu, Yu-Ming Chu 0001, Song-Liang Qiu |
The homotopy perturbation method for discontinued problems arising in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Math. Appl. ![In: Comput. Math. Appl. 58(11-12), pp. 2398-2401, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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17 | Abdullah Abdulaziz Al-Tameem |
Nanotechnology Development and Sub-Technologies Effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Digit. Inf. Manag. ![In: J. Digit. Inf. Manag. 7(1), pp. 45-53, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
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