Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
13 | Arighna Deb, Debesh K. Das, Hafizur Rahaman 0001, Robert Wille, Rolf Drechsler, Bhargab B. Bhattacharya |
Reversible Synthesis of Symmetric Functions with a Simple Regular Structure and Easy Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM J. Emerg. Technol. Comput. Syst. ![In: ACM J. Emerg. Technol. Comput. Syst. 12(4), pp. 34:1-34:29, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz |
Design-for-Testability for Functional Broadside Tests under Primary Input Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 21(2), pp. 35:1-35:18, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Morgan C. Benton, Nicole M. Radziwill |
Improving Testability and Reuse by Transitioning to Functional Programming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1606.06704, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
|
13 | Vladimir Rozic, Bohan Yang 0001, Nele Mentens, Ingrid Verbauwhede |
Canary Numbers: Design for Light-weight Online Testability of True Random Number Generators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2016, pp. 386, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
|
13 | Saleh Almugrin, Waleed Albattah, Austin Melton |
Using indirect coupling metrics to predict package maintainability and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Syst. Softw. ![In: J. Syst. Softw. 121, pp. 298-310, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Mohammad Mahdi Hassan, Wasif Afzal, Birgitta Lindström, Syed Muhammad Ali Shah, Sten F. Andler, Martin Blom |
Testability and software performance: a systematic mapping study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 31st Annual ACM Symposium on Applied Computing, Pisa, Italy, April 4-8, 2016, pp. 1566-1569, 2016, ACM, 978-1-4503-3739-7. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Toni Mäki, Patrick Zwickl, Martín Varela 0001 |
Network quality differentiation: Regional effects, market entrance, and empirical testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Networking ![In: 2016 IFIP Networking Conference, Networking 2016 and Workshops, Vienna, Austria, May 17-19, 2016, pp. 476-484, 2016, IEEE Computer Society, 978-3-9018-8283-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Sayandeep Saha, Rajat Subhra Chakraborty, Debdeep Mukhopadhyay |
Testability Based Metric for Hardware Trojan Vulnerability Assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016, pp. 503-510, 2016, IEEE Computer Society, 978-1-5090-2817-7. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Jun Nishimaki, Toshinori Hosokawa, Hideo Fujiwara |
A scheduling method for hierarchical testability based on test environment generation results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016, pp. 1-2, 2016, IEEE, 978-1-4673-9659-2. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Tingting Yu, Wei Wen, Xue Han, Jane Huffman Hayes |
Predicting Testability of Concurrent Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: 2016 IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, Chicago, IL, USA, April 11-15, 2016, pp. 168-179, 2016, IEEE Computer Society, 978-1-5090-1827-7. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Sergey Mosin |
An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MECO ![In: 5th Mediterranean Conference on Embedded Computing, MECO 2016, Bar, Montenegro, June 12-16, 2016, pp. 211-214, 2016, IEEE, 978-1-5090-2222-9. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Sergei Kostin, Elmet Orasson, Raimund Ubar |
A tool set for teaching design-for-testability of digital circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWME ![In: 11th European Workshop on Microelectronics Education, EWME 2016, Southampton, UK, May 11-13, 2016, pp. 1-6, 2016, IEEE, 978-1-4673-8584-8. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Prateek Karandikar, Manfred Kufleitner, Philippe Schnoebelen |
On the index of Simon's congruence for piecewise testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Process. Lett. ![In: Inf. Process. Lett. 115(4), pp. 515-519, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | M. H. Khan Abdullah, Reena Srivastava |
Testability Measurement Model for Object Oriented Design (TMMOOD). ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1503.05493, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
13 | Michael Viderman |
A combination of testability and decodability by tensor products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Random Struct. Algorithms ![In: Random Struct. Algorithms 46(3), pp. 572-598, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Weifeng Xu, Omar el Ariss |
A JVM-based Testing Harness for Improving Component Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEKE ![In: The 27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015, Wyndham Pittsburgh University Center, Pittsburgh, PA, USA, July 6-8, 2015, pp. 421-426, 2015, KSI Research Inc. and Knowledge Systems Institute Graduate School, 1-891706-35-7. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah |
Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWDTS ![In: 2015 IEEE East-West Design & Test Symposium, EWDTS 2015, Batumi, Georgia, September 26-29, 2015, pp. 1-4, 2015, IEEE Computer Society, 978-1-4673-7776-8. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Jane Huffman Hayes, Wenbin Li 0009, Tingting Yu, Xue Han, Mark Hays, Clinton Woodson |
Measuring Requirement Quality to Predict Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AIRE ![In: 2015 IEEE Second International Workshop on Artificial Intelligence for Requirements Engineering, AIRE 2015, Ottawa, ON, Canada, August 24, 2015, pp. 1-8, 2015, IEEE Computer Society, 978-1-5090-0125-5. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | David Callele, Philip Dueck, Krzysztof Wnuk, Peitsa Hynninen |
Experience requirements in video games definition and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RE ![In: 23rd IEEE International Requirements Engineering Conference, RE 2015, Ottawa, ON, Canada, August 24-28, 2015, pp. 324-333, 2015, IEEE Computer Society, 978-1-4673-6905-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson |
On the testability of IEEE 1687 networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015, pp. 211-216, 2015, IEEE Computer Society, 978-1-4673-9739-1. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Joyati Mondal, Debesh K. Das, Bhargab B. Bhattacharya |
Design-for-testability in reversible logic circuits based on bit-swapping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015, pp. 217-222, 2015, IEEE Computer Society, 978-1-4673-9739-1. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Miroslav Bures |
Framework for assessment of web application automated testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RACS ![In: Proceedings of the 2015 Conference on research in adaptive and convergent systems, RACS 2015, Prague, Czech Republic, October 9-12, 2015, pp. 512-514, 2015, ACM, 978-1-4503-3738-0. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Miroslav Bures |
Metrics for automated testability of web applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CompSysTech ![In: Proceedings of the 16th International Conference on Computer Systems and Technologies, CompSysTech, Dublin, Ireland, June 25 - 26, 2015, pp. 83-89, 2015, ACM, 978-1-4503-3357-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Tomás Masopust, Michaël Thomazo |
On the Complexity of k-Piecewise Testability and the Depth of Automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DLT ![In: Developments in Language Theory - 19th International Conference, DLT 2015, Liverpool, UK, July 27-30, 2015, Proceedings., pp. 364-376, 2015, Springer, 978-3-319-21499-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Peng Lin, Xu Tian, Xiaojuan Wang, Jingmin Liu, Jianli Li, Jian Le |
An applicable testability framework for small satellite under the operational response space. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCC Workshops ![In: 2015 IEEE/CIC International Conference on Communications in China - Workshops (CIC/ICCC), Shenzhen, China, November 2-4, 2015, pp. 83-87, 2015, IEEE, 978-1-4673-9701-8. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Mohammad Mahdi Hassan, Wasif Afzal, Martin Blom, Birgitta Lindström, Sten F. Andler, Sigrid Eldh |
Testability and Software Robustness: A Systematic Literature Review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO-SEAA ![In: 41st Euromicro Conference on Software Engineering and Advanced Applications, EUROMICRO-SEAA 2015, Madeira, Portugal, August 26-28, 2015, pp. 341-348, 2015, IEEE Computer Society, 978-1-4673-7585-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Saleh Almugrin, Austin Melton |
Estimation of Responsibility Metrics to Determine Package Maintainability and Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TSA ![In: 2015 Second International Conference on Trustworthy Systems and Their Applications, TSA 2015, Hualien, Taiwan, July 8-9, 2015, pp. 100-109, 2015, IEEE, 978-1-4673-9581-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Priyanksha Khanna |
Metrics Selection for Testability of Object-Oriented Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WorldCIST (1) ![In: New Contributions in Information Systems and Technologies - Volume 1 [WorldCIST'15, Azores, Portugal, April 1-3, 2015]., pp. 885-896, 2015, Springer, 978-3-319-16485-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Michael Winikoff, Stephen Cranefield |
On the Testability of BDI Agent Systems (Extended Abstract). ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCAI ![In: Proceedings of the Twenty-Fourth International Joint Conference on Artificial Intelligence, IJCAI 2015, Buenos Aires, Argentina, July 25-31, 2015, pp. 4217-4221, 2015, AAAI Press, 978-1-57735-738-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
13 | Piotr Kmon, Piotr Otfinowski, Pawel Grybos, Robert Szczygiel, Miroslaw Zoladz, Agnieszka Lisicka |
Design for the testability of the multichannel neural recording and stimulating integrated circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIXDES ![In: 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015, pp. 305-308, 2015, IEEE, 978-8-3635-7807-7. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Toral Shah, Anzhela Yu. Matrosova, Virendra Singh |
PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015, pp. 1-2, 2015, IEEE Computer Society, 978-1-4799-1743-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Samta D. Talatule, Pravin Zode, Pradnya Zode |
A secure architecture for the design for testability structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015, pp. 1-6, 2015, IEEE Computer Society, 978-1-4799-1743-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Simone Hanazumi, Ana Cristina Vieira de Melo |
On the Testability of Properties Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEFM ![In: Software Engineering and Formal Methods - 13th International Conference, SEFM 2015, York, UK, September 7-11, 2015. Proceedings, pp. 148-155, 2015, Springer, 978-3-319-22968-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
13 | Krishnendu Chakrabarty, Mukesh Agrawal 0001, Sergej Deutsch, Brandon Noia, Ran Wang 0002, Fangming Ye |
Test and Design-for-Testability Solutions for 3D Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPSJ Trans. Syst. LSI Des. Methodol. ![In: IPSJ Trans. Syst. LSI Des. Methodol. 7, pp. 56-73, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Samah Mohamed Saeed, Ozgur Sinanoglu |
Design for Testability Support for Launch and Capture Power Reduction in Launch-Off-Shift and Launch-Off-Capture Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 22(3), pp. 516-521, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Hao-Chiao Hong, Yung-Shun Chen, Wei-Chieh Fang |
14 GSps Four-Bit Noninterleaved Data Converter Pair in 90 nm CMOS With Built-In Eye Diagram Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 22(6), pp. 1238-1247, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Michael Winikoff, Stephen Cranefield |
On the Testability of BDI Agent Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Artif. Intell. Res. ![In: J. Artif. Intell. Res. 51, pp. 71-131, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Guohua Wang, Qiang Li, Xiaomei Chen, Xiaofeng Meng 0002 |
Research on the Efficiency Improvement of Design for Testability Using Test Point Allocation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 30(3), pp. 371-376, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Ismael Rodríguez, Luis Llana, Pablo Rabanal |
A General Testability Theory: Classes, Properties, Complexity, and Testing Reductions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 40(9), pp. 862-894, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz |
Design-for-testability for multi-cycle broadside tests by holding of state variables. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 19(2), pp. 19:1-19:20, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Tomás Masopust, Michaël Thomazo |
On $k$-piecewise testability (preliminary report). ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1412.1641, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
13 | Amjed Tahir, Stephen G. MacDonell, Jim Buchan |
Understanding Class-level Testability Through Dynamic Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1410.1155, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
13 | Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß |
Automated formal verification of X propagation with respect to testability issues. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IDT ![In: 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014, pp. 106-111, 2014, IEEE, 978-1-4799-8200-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Yier Jin |
Design-for-Security vs. Design-for-Testability: A Case Study on DFT Chain in Cryptographic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014, pp. 19-24, 2014, IEEE Computer Society, 978-1-4799-3763-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Saif-Ur Rehman, Adrien Blanchardon, Arwa Ben Dhia, Mounir Benabdenbi, Roselyne Chotin-Avot, Lirida A. B. Naviner, Lorena Anghel, Habib Mehrez, Emna Amouri, Zied Marrakchi |
Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014, pp. 553-558, 2014, IEEE Computer Society, 978-1-4799-3763-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Kazuo Iwama, Yuichi Yoshida |
Parameterized testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITCS ![In: Innovations in Theoretical Computer Science, ITCS'14, Princeton, NJ, USA, January 12-14, 2014, pp. 507-516, 2014, ACM, 978-1-4503-2698-8. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Antonio J. Ginés, Gildas Léger |
Sigma-delta testability for pipeline A/D converters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014, pp. 1-6, 2014, European Design and Automation Association, 978-3-9815370-2-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Amjed Tahir, Stephen G. MacDonell, Jim Buchan |
A Study of the Relationship Between Class Testability and Runtime Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ENASE (Selected Papers) ![In: Evaluation of Novel Approaches to Software Engineering - 9th International Conference, ENASE 2014, Lisbon, Portugal, April 28-30, 2014. Revised Selected Papers, pp. 63-78, 2014, Springer, 978-3-319-27217-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Amjed Tahir, Stephen G. MacDonell, Jim Buchan |
Understanding Class-level Testability Through Dynamic Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ENASE ![In: ENASE 2014 - Proceedings of the 9th International Conference on Evaluation of Novel Approaches to Software Engineering, Lisbon, Portugal, 28-30 April, 2014, pp. 38-47, 2014, SciTePress, 978-989-758-030-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Eberhard Böhl, Matthew Lewis 0003, S. Galkin |
A true random number generator with on-line testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Chandan Kumar, Fadi Maamari, Kiran Vittal, Wilson Pradeep, Rajesh Tiwari, Srivaths Ravi 0001 |
Methodology for Early RTL Testability and Coverage Analysis and Its Application to Industrial Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014, pp. 125-130, 2014, IEEE Computer Society, 978-1-4799-6030-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Kun-Han Tsai |
Testability-Driven Fault Sampling for Deterministic Test Coverage Estimation of Large Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014, pp. 119-124, 2014, IEEE Computer Society, 978-1-4799-6030-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Brownson Obaridoa Obele, Donyul Kim |
On an Embedded Software Design Architecture for Improving the Testability of In-vehicle Multimedia Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: Seventh IEEE International Conference on Software Testing, Verification and Validation, ICST 2014 Workshops Proceedings, March 31 - April 4, 2014, Cleveland, Ohio, USA, pp. 349-352, 2014, IEEE Computer Society, 978-0-7695-5194-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Mike Li, Gordon W. Roberts |
Testability and reliability enhancement techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014, pp. 1, 2014, IEEE. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Kai Hu 0003, Tsung-Yi Ho, Krishnendu Chakrabarty |
Test generation and design-for-testability for flow-based mVLSI microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014, pp. 1-6, 2014, IEEE Computer Society, 978-1-4799-2611-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Thomas W. Knych, Ashwin Baliga |
Android application development and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MOBILESoft ![In: Proceedings of the 1st International Conference on Mobile Software Engineering and Systems, MOBILESoft 2014, Hyderabad, India, June 2-3, 2014, pp. 37-40, 2014, ACM, 978-1-4503-2878-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Samah Mohamed Saeed |
DfST: Design for secure testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014, pp. 1-10, 2014, IEEE Computer Society, 978-1-4799-4722-5. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Megha Joshi, Neetu Sardana |
An enhanced marking target statement strategy of E-PIE for testability estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IC3 ![In: Seventh International Conference on Contemporary Computing, IC3 2014, Noida, India, August 7-9, 2014, pp. 346-350, 2014, IEEE Computer Society, 978-1-4799-5172-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Seyedhamidreza Motaman, Swaroop Ghosh |
Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014, pp. 66:1-66:2, 2014, ACM, 978-1-4503-2730-5. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
13 | Karthika Mohan, Judea Pearl |
On the Testability of Models with Missing Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AISTATS ![In: Proceedings of the Seventeenth International Conference on Artificial Intelligence and Statistics, AISTATS 2014, Reykjavik, Iceland, April 22-25, 2014, pp. 643-650, 2014, JMLR.org. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
13 | Mukesh Agrawal 0001 |
Optimization of Test and Design-for-Testability Solutions for Many-Core System-on-Chip Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2014 |
RDF |
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13 | Elena Grigorescu, Tali Kaufman, Madhu Sudan 0001 |
2-Transitivity is Insufficient for Local Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Complex. ![In: Comput. Complex. 22(1), pp. 137-158, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Prateek Karandikar, Philippe Schnoebelen |
On the index of Simon's congruence for piecewise testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1310.1278, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP BibTeX RDF |
|
13 | Judea Pearl |
On the Testability of Causal Models with Latent and Instrumental Variables ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1302.4976, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP BibTeX RDF |
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13 | Sujata Khatri, Rajender Singh Chhillar, V. B. Singh |
Improving the Testability of Object-oriented Software during Testing and Debugging Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1308.3320, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP BibTeX RDF |
|
13 | Stefano Crespi-Reghizzi, Pierluigi San Pietro |
Strict Local Testability with Consensus Equals Regularity, and Other Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Found. Comput. Sci. ![In: Int. J. Found. Comput. Sci. 24(6), pp. 747-764, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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13 | Freddy Muñoz, Benoit Baudry, Romain Delamare, Yves Le Traon |
Usage and testability of AOP: An empirical study of AspectJ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Softw. Technol. ![In: Inf. Softw. Technol. 55(2), pp. 252-266, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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13 | Charles McCarty |
Brouwer's Weak Counterexamples and Testability: further Remarks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Rev. Symb. Log. ![In: Rev. Symb. Log. 6(3), pp. 513-523, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Anzhela Yu. Matrosova, Ekaterina Nikolaeva, Dmitry Kudin, Virendra Singh |
PDF testability of the circuits derived by special covering ROBDDs with gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWDTS ![In: East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013, pp. 1-5, 2013, IEEE Computer Society, 978-1-4799-2095-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Joyati Mondal, Debesh K. Das, Dipak Kumar Kole, Hafizur Rahaman 0001 |
A design for testability technique for quantum reversible circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWDTS ![In: East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013, pp. 1-4, 2013, IEEE Computer Society, 978-1-4799-2095-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Sergey G. Mosin |
Methodology to design-for-testability automation for mixed-signal integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWDTS ![In: East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4799-2095-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Yuki Yoshikawa |
A binding algorithm in high-level synthesis for path delay testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013, pp. 546-551, 2013, IEEE, 978-1-4673-3029-9. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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13 | Takao Nomura, Ryo Mori, Munehiro Ito, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Kazuo Otsuga, Koji Nii, Sadayuki Morita, Tomoaki Hashimoto, Tsuyoshi Kida, Junichi Yamada, Hideki Tanaka |
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013, San Jose, CA, USA, September 22-25, 2013, pp. 1-4, 2013, IEEE. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Sying-Jyan Wang, Cheng-Hao Lin, Katherine Shu-Min Li |
Synthesis of 3D clock tree with pre-bond testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013, pp. 2654-2657, 2013, IEEE, 978-1-4673-5760-9. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Sergey G. Mosin |
Design-for-testability automation of mixed-signal integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoCC ![In: 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013, pp. 244-249, 2013, IEEE, 978-1-4799-1166-0. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Saghir A. Shaikh |
Innovative practices session 3C: Harnessing the challenges of testability and debug of high speed I/Os. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-5542-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Kun-Han Tsai, Shuo Sheng |
Design rule check on the clock gating logic for testability and beyond. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013, pp. 1-8, 2013, IEEE Computer Society, 978-1-4799-0859-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Salvador Manich, Markus S. Wamser, Oscar M. Guillen, Georg Sigl |
Differential scan-path: A novel solution for secure design-for-testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013, pp. 1-9, 2013, IEEE Computer Society, 978-1-4799-0859-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
13 | Dunwei Gong, Xiangjuan Yao |
Testability transformation based on equivalence of target statements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Neural Comput. Appl. ![In: Neural Comput. Appl. 21(8), pp. 1871-1882, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Christopher Umerah Ngene |
Ensuring a High Quality Digital Device through Design for Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Inf. Technol. ![In: J. Comput. Inf. Technol. 20(4), pp. 235-246, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas |
Evaluation of testability enhancement using software prototype. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 6(3), pp. 166-172, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Jun-Ru Chang, Chin-Yu Huang, Chao-Jung Hsu, Tsung-Han Tsai |
Comparative performance evaluation of applying extended PIE technique to accelerate software testability analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Syst. Sci. ![In: Int. J. Syst. Sci. 43(12), pp. 2314-2333, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Cecilia Metra, Martin Omaña 0001, T. M. Mak, Simon Tam 0001 |
New Design for Testability Approach for Clock Fault Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 61(4), pp. 448-457, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Noopur Goel, Manjari Gupta |
Empirical evaluation of the effect of flexibility upon testability of framework based application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 37(6), pp. 1-6, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
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13 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham |
Testability-Driven Statistical Path Selection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(8), pp. 1275-1287, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Yuming Zhou, Hareton Leung, Qinbao Song, Jianjun Zhao 0001, Hongmin Lu, Lin Chen 0015, Baowen Xu |
An in-depth investigation into the relationships between structural metrics and unit testability in object-oriented systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. China Inf. Sci. ![In: Sci. China Inf. Sci. 55(12), pp. 2800-2815, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Marianna Bolla, Tamás Kói, András Krámli |
Testability of minimum balanced multiway cut densities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Discret. Appl. Math. ![In: Discret. Appl. Math. 160(7-8), pp. 1019-1027, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Sabrina Rathgeber, R. Bauer, Andreas Otto, Erik Peter, Jürgen Wilde |
Harsh environment application of electronics - Reliability of copper wiring and testability thereof. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 52(9-10), pp. 2452-2456, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Yogesh Singh, Anju Saha |
Prediction of testability using the design metrics for object-oriented software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Comput. Appl. Technol. ![In: Int. J. Comput. Appl. Technol. 44(1), pp. 12-22, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Vijay Anand, Jafar Saniie |
Superdistribution: Testability, security and management of digital applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EIT ![In: 2012 IEEE International Conference on Electro/Information Technology, Indianapolis, IN, USA, May 6-8, 2012, pp. 1-5, 2012, IEEE, 978-1-4673-0819-9. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Andrea Bonacchi 0001, Alessandro Fantechi, Stefano Bacherini, Matteo Tempestini, Leonardo Cipriani |
A GUI Testability Problem: A Case Study in the Railway Signaling Domain. ![Search on Bibsonomy](Pics/bibsonomy.png) |
QUATIC ![In: 8th International Conference on the Quality of Information and Communications Technology, QUATIC 2012, Lisbon, Portugal, 2-6 September 2012, Proceedings, pp. 103-107, 2012, IEEE Computer Society, 978-0-7695-4777-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Viacheslav Izosimov, Urban Ingelsson, Andreas Wallin |
Requirement Decomposition and Testability in Development of Safety-Critical Automotive Components, . ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAFECOMP ![In: Computer Safety, Reliability, and Security - 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings, pp. 74-86, 2012, Springer, 978-3-642-33677-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Robin S. Poston, Jignya Patel, Jasbir Singh Dhaliwal |
A Software Testing Assessment to Manage Project Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECIS ![In: 20th European Conference on Information Systems, ECIS 2012, Barcelona, Spain, June 10-13, 2012, pp. 219, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
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13 | Nankai Pan, Eunjee Song |
An aspect-oriented testability framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RACS ![In: Research in Applied Computation Symposium, RACS '12, San Antonio, TX, USA, October 23-26, 2012, pp. 356-363, 2012, ACM, 978-1-4503-1492-3. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Stefano Crespi-Reghizzi, Pierluigi San Pietro |
Strict Local Testability with Consensus Equals Regularity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIAA ![In: Implementation and Application of Automata - 17th International Conference, CIAA 2012, Porto, Portugal, July 17-20, 2012. Proceedings, pp. 113-124, 2012, Springer, 978-3-642-31605-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Mark Huffman Hays, Jane Hayes |
The Effect of Testability on Fault Proneness: A Case Study of the Apache HTTP Server. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE Workshops ![In: 23rd IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Dallas, TX, USA, November 27-30, 2012, pp. 153-158, 2012, IEEE Computer Society, 978-1-4673-5048-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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13 | Brian Miller, Derek Brasili, Tim Kiszely, Rob Kuhn, Rahul Mehrotra, Manan Salvi, Mandar Kulkarni, Anand Varadharajan, Shi-Huang Yin, William Lin, Adam Hughes, Bill Stysiack, Vasu Kandadi, Ilan Pragaspathi, Dan Hartman, David Carlson, Vishnu Yalala, Thucydides Xanthopoulos, Scott E. Meninger, Ethan Crain, Mark Spaeth, Akin Aina, Suresh Balasubramanian, Joe Vulih, Pragati Tiwary, David Lin, Richard Kessler, Bruce Fishbein, Anil Jain |
A 32-core RISC microprocessor with network accelerators, power management and testability features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: 2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012, pp. 58-60, 2012, IEEE, 978-1-4673-0376-7. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Mutum Zico Meetei |
Aspect-oriented software for testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BMEI ![In: 5th International Conference on BioMedical Engineering and Informatics, BMEI 2012, Chongqing, China, October 16-18, 2012, pp. 1326-1331, 2012, IEEE, 978-1-4673-1183-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Gang Wang, Jian Wang, Zi-Chu Qi |
A testability-aware low power architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoCC ![In: IEEE 25th International SOC Conference, SOCC 2012, Niagara Falls, NY, USA, September 12-14, 2012, pp. 184-189, 2012, IEEE, 978-1-4673-1294-3. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede |
A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, pp. 43-48, 2012, IEEE Computer Society, 978-1-4673-3043-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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