|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
Results
Found 3 publication records. Showing 2 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Widianto, Masaki Hashizume, Shohei Suenaga, Hiroyuki Yotsuyanagi, Akira Ono, Shyue-Kung Lu, Zvi Roth |
A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs. |
IEICE Trans. Inf. Syst. |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Widianto, Hiroyuki Yotsuyanagi, Akira Ono, Masao Takagi, Masaki Hashizume |
A built-in test circuit for open defects at interconnects between dies in 3D ICs. |
3DIC |
2011 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #2 of 2 (100 per page; Change: )
|
|