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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 10 occurrences of 7 keywords
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Results
Found 29 publication records. Showing 29 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
86 | Jari Hannu, Markku Moilanen |
Methods of Testing Discrete Semiconductors in the 1149.4 Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(6), pp. 581-592, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
1149.4, Discrete semiconductors, Boundary scan |
77 | Uros Kac, Franc Novak, Srecko Macek, Marina Santo Zarnik |
Alternative Test Methods Using IEEE 1149.4. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France, pp. 463-467, 2000, IEEE Computer Society / ACM, 0-7695-0537-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
63 | Juha Häkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen |
A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 551-559, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
63 | John E. McDermid |
Limited access testing: IEEE 1149.4-instrumentation and methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 388-395, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
59 | Teuvo Saikkonen, Markku Moilanen |
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(6), pp. 569-579, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
IEEE 1149.4, Loading effect, Mixed-signal test |
50 | Pekka Syri, Juha Häkkinen, Markku Moilanen |
IEEE 1149.4 Compatible ABMs for Basic RF Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 172-173, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
45 | Jose M. M. Ferreira, Manuel G. O. Gericota, Antonio M. Cardoso |
An integrated framework to support remote IEEE 1149.1 / 1149.4 design for test experiments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Online Eng. ![In: Int. J. Online Eng. 2(3), 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP BibTeX RDF |
|
45 | Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts |
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, pp. 1184-1191, 2004, IEEE Computer Society, 0-7695-2085-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
41 | Stephen K. Sunter, Benoit Nadeau-Dostie |
Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 446-455, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
36 | Gladys Omayra Ducoudray, Jaime Ramírez-Angulo |
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(1), pp. 21-28, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
iDD analysis, built-in self-test, mixed-signal test |
36 | Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell |
Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 20(2), pp. 32-39, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
36 | Chauchin Su, Chih-Hu Wang, Wei-Juo Wang, I. S. Tseng |
1149.4 Based On-Line Quiescent State Monitoring Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 197-202, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
36 | G. O. D. Acevedo, Jaime Ramírez-Angulo |
Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (1) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 149-152, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
27 | Hari Vijay Venkatanarayanan, Michael L. Bushnell |
An Area Efficient Mixed-Signal Test Architecture for Systems-on-a-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India, pp. 161-168, 2006, IEEE Computer Society, 0-7695-2502-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
27 | Chauchin Su, Yue-Tsang Chen |
Intrinsic response extraction for the removal of the parasiticeffects in analog test buses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(4), pp. 437-445, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Andrzej Rucinski 0002, Barbara Dziurla-Rucinska |
Boundary Scan as a Test Solution in Microelectronics Curricula. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 214-218, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
IEEE 1149.4 standard, Education, Boundary scan |
23 | Jari Hannu, Juha Häkkinen, Juha-Veikko Voutilainen, Heli Jantunen, Markku Moilanen |
Current State of the Mixed-Signal Test Bus 1149.4. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 28(6), pp. 857-863, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
23 | Manuel C. Felgueiras, Gustavo R. Alves, José Manuel Martins Ferreira |
An embedded 1149.4 extension to support mixed-signal debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 42(1), pp. 218-232, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Wimol San-Um, Masayoshi Tachibana |
A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Inf. Syst. ![In: IEICE Trans. Inf. Syst. 93-D(1), pp. 33-42, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
23 | Juha-Veikko Voutilainen, Jussi Putaala, Markku Moilanen, Heli Jantunen |
A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 40(7), pp. 1069-1080, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Pekka Syri, Juha Häkkinen, Markku Moilanen |
IEEE 1149.4 Compatible ABMs for Basic RF Measurements ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/0710.4721, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP BibTeX RDF |
|
23 | Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall |
Low cost automatic mixed-signal board test using IEEE 1149.4. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-9, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Gladys Omayra Ducoudray Acevedo, Jaime Ramírez-Angulo |
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001., pp. 131-134, 2001, IEEE. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP BibTeX RDF |
|
23 | Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh |
A general purpose 1149.4 IC with HF analog test capabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, pp. 38-45, 2001, IEEE Computer Society, 0-7803-7169-0. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski |
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 1st Latin American Test Workshop, LATW 2000, Rio de Janeiro, RJ, Brazil, March 13-15, 2000., pp. 84-87, 2000, IEEE. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP BibTeX RDF |
|
14 | Carl Jeffrey, Reuben Cutajar, Stephen Prosser, M. Lickess, Andrew Richardson 0001, Stephen Riches |
The Integration of On-Line Monitoring and Reconfiguration Functions using IEEE1149.4 Into a Safety Critical Automotive Electronic Control Unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 153-158, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
14 | Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar |
On-Chip Mixed-Signal Test Structures Re-used for Board Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 375-383, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Stephen K. Sunter |
Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 228-235, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
14 | José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski |
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 201-206, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
BIST, design for test, analog test, mixed-signal test |
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