Search results for "LATW"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
60	Luigi Carro	Adding value to design and test through education: What are the challenges?	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	LATW, education, universities, industry, design and test
52		15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014	LATW	2014	DBLP BibTeX RDF
52	Werner Nedel, Fernanda Lima Kastensmidt, José Rodrigo Azambuja	Implementation and experimental evaluation of a CUDA core under single event effects.	LATW	2014	DBLP DOI BibTeX RDF
52	Omar Abdelmalek, David Hély, Vincent Beroulle	Fault tolerance evaluation of RFID tags.	LATW	2014	DBLP DOI BibTeX RDF
52	Wassim Mansour, Pablo Ramos, Rafic A. Ayoubi, Raoul Velazco	SEU fault-injection at system level: Method, tools and preliminary results.	LATW	2014	DBLP DOI BibTeX RDF
52	Victor M. Goncalves Martins, Frederico Ferlini, Djones Vinicius Lettnin, Eduardo Augusto Bezerra	Low cost fault detector guided by permanent faults at the end of FPGAs life cycle.	LATW	2014	DBLP DOI BibTeX RDF
52	S. Ben Krit, Wenceslas Rahajandraibe, Karine Castellani-Coulié, Gilles Micolau, Alexandre Levisse, A. Lyoussi	Development of a digital tool for the simulation of a readout system dedicated for neutrons discrimination.	LATW	2014	DBLP DOI BibTeX RDF
52	Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez, Eduardo Chielle, Fernanda Lima Kastensmidt	Efficient metric for register file criticality in processor-based systems.	LATW	2014	DBLP DOI BibTeX RDF
52	Hsun-Cheng Lee, Jacob A. Abraham	Harmonic distortion correction for 8-bit delay line ADC using gray code.	LATW	2014	DBLP DOI BibTeX RDF
52	Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac	Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies.	LATW	2014	DBLP DOI BibTeX RDF
52	Alan Carlos Junior Rossetto, Gilson Inácio Wirth, Ricardo Vanni Dallasen	Performance analysis of a clock generator PLL under TID effects.	LATW	2014	DBLP DOI BibTeX RDF
52	Ricardo A. Guazzelli, Guilherme Heck, Matheus T. Moreira, Ney Laert Vilar Calazans	Schmitt trigger on output inverters of NCL gates for soft error hardening: Is it enough?	LATW	2014	DBLP DOI BibTeX RDF
52	Karine Coulié-Castellani, Wenceslas Rahajandraibe, Gilles Micolau, Hassen Aziza, Jean-Michel Portal	Improvement of a VCO concept for low energy particule detection and recognition.	LATW	2014	DBLP DOI BibTeX RDF
52	Arwa Ben Dhia, Mariem Slimani, Lirida A. B. Naviner	Improving the robustness of a switch box in a mesh of clusters FPGA.	LATW	2014	DBLP DOI BibTeX RDF
52	Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik	Software-based self-test generation for microprocessors with high-level decision diagrams.	LATW	2014	DBLP DOI BibTeX RDF
52	Evaldo Carlos Fonseca Pereira, Odair Lelis Goncalez, Rafael Galhardo Vaz, Claudio Antonio Federico, Thiago Hanna Both, Gilson Inácio Wirth	The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory.	LATW	2014	DBLP DOI BibTeX RDF
52	Filipe de Aguiar Geissler, Fernanda Lima Kastensmidt, Jose Eduardo Pereira Souza	Soft error injection methodology based on QEMU software platform.	LATW	2014	DBLP DOI BibTeX RDF
52	Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell	Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing.	LATW	2014	DBLP DOI BibTeX RDF
52	Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas 0001, Letícia Maria Bolzani Poehls, Thiago Santos Copetti	Hierarchical identification of NBTI-critical gates in nanoscale logic.	LATW	2014	DBLP DOI BibTeX RDF
52	Nicola Bombieri, Franco Fummi, Valerio Guarnieri, Graziano Pravadelli, Francesco Stefanni, Tara Ghasempouri, Michele Lora, Giovanni Auditore, Mirella Negro Marcigaglia	On the reuse of RTL assertions in SystemC TLM verification.	LATW	2014	DBLP DOI BibTeX RDF
52	Anna Vaskova, A. Fabregat, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Matteo Sonza Reorda	Reducing SEU sensitivity in LIN networks: Selective and collaborative hardening techniques.	LATW	2014	DBLP DOI BibTeX RDF
52	Stefan Weidling, Michael Gössel	Fault tolerant linear state machines.	LATW	2014	DBLP DOI BibTeX RDF
52	Pablo Briff, Ariel Lutenberg, Leonardo Rey Vega, Fabian Vargas 0001, Mohammad N. Patwary	A novel control strategy for fail-safe cyclic data exchange in wireless sensor networks.	LATW	2014	DBLP DOI BibTeX RDF
52	Sonia Ben Dhia, Alexandre Boyer	Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.	LATW	2014	DBLP DOI BibTeX RDF
52	Petr Pfeifer, Zdenek Plíva, Pieter Weckx, Ben Kaczer	On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs.	LATW	2014	DBLP DOI BibTeX RDF
52	Luca Piccolboni, Graziano Pravadelli	Simplified stimuli generation for scenario and assertion based verification.	LATW	2014	DBLP DOI BibTeX RDF
52	Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen	Design diversity redundancy with spatial-temporal voting applied to data acquisition systems.	LATW	2014	DBLP DOI BibTeX RDF
52	Jörg Behrend, Alexander Grünhage, Douglas Schroeder, Djones Lettnin, Jürgen Ruf, Thomas Kropf, Wolfgang Rosenstiel	Optimized hybrid verification of embedded software.	LATW	2014	DBLP DOI BibTeX RDF
52	Suraj Sindia, Vishwani D. Agrawal	Specification test minimization for given defect level.	LATW	2014	DBLP DOI BibTeX RDF
52	Alisson J. C. Lanot, Tiago R. Balen	Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution.	LATW	2014	DBLP DOI BibTeX RDF
52	Salma Bergaoui, Pierre Vanhauwaert, Régis Leveugle	IDSM: An improved disjoint signature monitoring scheme for processor behavioral checking.	LATW	2014	DBLP DOI BibTeX RDF
52	Lucas A. Tambara, Jorge L. Tonfat, Ricardo Reis 0001, Fernanda Lima Kastensmidt, Evaldo Carlos Fonseca Pereira, Rafael Galhardo Vaz, Odair Lelis Goncalez	Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects.	LATW	2014	DBLP DOI BibTeX RDF
52	Iuri A. C. Gomes, Mayler G. A. Martins, Fernanda Lima Kastensmidt, André Inácio Reis, Renato P. Ribas, Sylvain P. Novales	Methodology for achieving best trade-off of area and fault masking coverage in ATMR.	LATW	2014	DBLP DOI BibTeX RDF
52	Shih-Yi Yuan	Recent progress of software-related electromagnetic compatibility.	LATW	2014	DBLP DOI BibTeX RDF
52	Carlos Ivan Castro Marquez, Marius Strum, Jiang Chau Wang	A unified sequential equivalence checking approach to verify high-level functionality and protocol specification implementations in RTL designs.	LATW	2014	DBLP DOI BibTeX RDF
52		14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013	LATW	2013	DBLP BibTeX RDF
52	Carlos Ivan Castro Marquez, Marius Strum, Jiang Chau Wang	Formal equivalence checking between high-level and RTL hardware designs.	LATW	2013	DBLP DOI BibTeX RDF
52	Pablo A. Petrashin, Carlos Dualibe, Walter J. Lancioni, Luis E. Toledo	Low-cost DC BIST for analog circuits: A case study.	LATW	2013	DBLP DOI BibTeX RDF
52	Joel Ivan Munoz Quispe, Marius Strum, Jiang Chau Wang	PrOCov: Probabilistic output coverage model.	LATW	2013	DBLP DOI BibTeX RDF
52	Luis Francisco, Manuel Jiménez	Parametric model calibration and measurement extraction for LFN using virtual instrumentation.	LATW	2013	DBLP DOI BibTeX RDF
52	Ozgur Sinanoglu	Embedded tutorial: Regaining hardware security and trust.	LATW	2013	DBLP DOI BibTeX RDF
52	Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang 0018, Ilia Polian, Bernd Becker 0001	Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays.	LATW	2013	DBLP DOI BibTeX RDF
52	Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas 0001, Enrico Macii	Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs.	LATW	2013	DBLP DOI BibTeX RDF
52	Rolf Drechsler, Melanie Diepenbeck, Stephan Eggersglüß, Robert Wille	PASSAT 2.0: A multi-functional SAT-based testing framework.	LATW	2013	DBLP DOI BibTeX RDF
52	Jorge H. Meza Escobar, Jörg Sachße, Steffen Ostendorff, Heinz-Dietrich Wuttke	ISA configurability of an FPGA test-processor used for board-level interconnection testing.	LATW	2013	DBLP DOI BibTeX RDF
52	Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee	Predicting die-level process variations from wafer test data for analog devices: A feasibility study.	LATW	2013	DBLP DOI BibTeX RDF
52	Sandeep Miryala, Andrea Calimera, Enrico Macii, Massimo Poncino, Letícia Maria Veiras Bolzani Poehls	Investigating the behavior of physical defects in pn-junction based reconfigurable graphene devices.	LATW	2013	DBLP DOI BibTeX RDF
52	Mario Schölzel, Tobias Koal, Stephanie Roder, Heinrich Theodor Vierhaus	Towards an automatic generation of diagnostic in-field SBST for processor components.	LATW	2013	DBLP DOI BibTeX RDF
52	Wesley Silva, Eduardo Augusto Bezerra, Markus Winterholer, Djones Lettnin	Automatic property generation for formal verification applied to HDL-based design of an on-board computer for space applications.	LATW	2013	DBLP DOI BibTeX RDF
52	Martin Kohlík, Hana Kubátová	Markov chains hierarchical dependability models: Worst-case computations.	LATW	2013	DBLP DOI BibTeX RDF
52	Arwa Ben Dhia, Lirida A. B. Naviner, Philippe Matherat	Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs.	LATW	2013	DBLP DOI BibTeX RDF
52	D. Changdao, Mariagrazia Graziano, Ernesto Sánchez 0001, Matteo Sonza Reorda, Maurizio Zamboni, N. Zhifan	On the functional test of the BTB logic in pipelined and superscalar processors.	LATW	2013	DBLP DOI BibTeX RDF
52	Alon Ascoli, Ronald Tetzlaff, Fernando Corinto, Miroslav Mirchev, Marco Gilli	Memristor-based filtering applications.	LATW	2013	DBLP DOI BibTeX RDF
52	Pierre-Emmanuel Gaillardon, Hassan Ghasemzadeh 0002, Giovanni De Micheli	Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study.	LATW	2013	DBLP DOI BibTeX RDF
52	Guilherme Freire Roberto, Kalinka R. L. J. Castelo Branco, José Marcio Machado, Alex R. Pinto	Local data fusion algorithm for fire detection through mobile robot.	LATW	2013	DBLP DOI BibTeX RDF
52	Raimund Ubar	Diagnostic modeling of digital systems with low- and high-level decision diagrams.	LATW	2013	DBLP DOI BibTeX RDF
52	Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee	Low cost signal reconstruction based testing of RF components using incoherent undersampling.	LATW	2013	DBLP DOI BibTeX RDF
52	Alexandre Boyer, Sonia Ben Dhia	Effect of aging on power integrity of digital integrated circuits.	LATW	2013	DBLP DOI BibTeX RDF
52	Paolo Rech, Caroline Aguiar, Christopher Frost 0002, Luigi Carro	Neutron sensitivity of integer and floating point operations executed in GPUs.	LATW	2013	DBLP DOI BibTeX RDF
52	Santiago Martin Sondón, Alfredo Falcon, Pablo Sergio Mandolesi, Pedro Julián, Nahuel Vega, Francisco Nesprias, Jorge Davidson, Felix Palumbo, Mario Debray	Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam.	LATW	2013	DBLP DOI BibTeX RDF
52	Worawit Somha, Hiroyuki Yamauchi	A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions.	LATW	2013	DBLP DOI BibTeX RDF
52	Praveen Venkataramani, Suraj Sindia, Vishwani D. Agrawal	A test time theorem and its applications.	LATW	2013	DBLP DOI BibTeX RDF
52	Luis Entrena	Fast fault injection techniques using FPGAs.	LATW	2013	DBLP DOI BibTeX RDF
52	Eduardo Chielle, José Rodrigo Azambuja, Raul S. Barth, Fernanda Lima Kastensmidt	Improving error detection with selective redundancy in software-based techniques.	LATW	2013	DBLP DOI BibTeX RDF
52	Sybille Hellebrand	Analyzing and quantifying fault tolerance properties.	LATW	2013	DBLP DOI BibTeX RDF
52	Wenceslas Rahajandraibe, Fayrouz Haddad, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal	Built-in tuning of the local oscillator for open loop modulation of low cost, low power RF transceiver.	LATW	2013	DBLP DOI BibTeX RDF
52	Valentin Tihhomirov, Anton Tsepurov, Maksim Jenihhin, Jaan Raik, Raimund Ubar	Assessment of diagnostic test for automated bug localization.	LATW	2013	DBLP DOI BibTeX RDF
52	Karine Castellani-Coulié, Marc Bocquet, Hassen Aziza, Jean-Michel Portal, Wenceslas Rahajandraibe, Christophe Muller	SPICE level analysis of Single Event Effects in an OxRRAM cell.	LATW	2013	DBLP DOI BibTeX RDF
52	Hector Villacorta, Jose Luis Garcia-Gervacio, Víctor H. Champac, Sebastià A. Bota, Jaime Martínez-Castillo, Jaume Segura 0001	Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias.	LATW	2013	DBLP DOI BibTeX RDF
52		13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012	LATW	2012	DBLP BibTeX RDF
52	Jefferson Paulo Koppe, Elias P. Duarte Jr., Luis C. E. Bona	MoDiVHA: A hierarchical strategy for distributed test assignment.	LATW	2012	DBLP DOI BibTeX RDF
52	Walter E. Calienes Bartra, Fernanda Lima Kastensmidt, Ricardo Reis 0001	Simulation of SET faults in a voltage controlled oscillator.	LATW	2012	DBLP DOI BibTeX RDF
52	Maksim Jenihhin, Samary Baranov, Jaan Raik, Valentin Tihhomirov	PSL assertion checkers synthesis with ASM based HLS tool ABELITE.	LATW	2012	DBLP DOI BibTeX RDF
52	Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas 0001	Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM.	LATW	2012	DBLP DOI BibTeX RDF
52	Alejandro Cook, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, Hans-Joachim Wunderlich	Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test.	LATW	2012	DBLP DOI BibTeX RDF
52	Wassim Mansour, Raoul Velazco	SEU fault-injection in VHDL-based processors: A case study.	LATW	2012	DBLP DOI BibTeX RDF
52	Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal	Built-in tuning of RFIC Passive Polyphase Filter by process and thermal monitoring.	LATW	2012	DBLP DOI BibTeX RDF
52	Hanno Hantson, Urmas Repinski, Jaan Raik, Maksim Jenihhin, Raimund Ubar	Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis.	LATW	2012	DBLP DOI BibTeX RDF
52	Aleksandar Simevski, Rolf Kraemer, Milos Krstic	Platform for automated HW/SW co-verification, testing and simulation of microprocessors.	LATW	2012	DBLP DOI BibTeX RDF
52	Karine Castellani-Coulié, Hassen Aziza, Wenceslas Rahajandraibe, Gilles Micolau, Jean-Michel Portal	Investigation of a CMOS oscillator concept for particle detection and diagnosis.	LATW	2012	DBLP DOI BibTeX RDF
52	Kwanyeob Chae, Minki Cho, Saibal Mukhopadhyay	Low-power design under variation using error prevention and error tolerance (invited paper).	LATW	2012	DBLP DOI BibTeX RDF
52	Jangjoon Lee, Srikar Bhagavatula, Kaushik Roy 0001, Byunghoo Jung	Variation-aware and self-healing design methodology for a system-on-chip.	LATW	2012	DBLP DOI BibTeX RDF
52	Lars Schor, Iuliana Bacivarov, Hoeseok Yang, Lothar Thiele	Fast worst-case peak temperature evaluation for real-time applications on multi-core systems.	LATW	2012	DBLP DOI BibTeX RDF
52	Gilles Micolau, Karine Castellani-Coulié, Hassen Aziza, Jean-Michel Portal	SITARe: A simulation tool for analysis and diagnosis of radiation effects.	LATW	2012	DBLP DOI BibTeX RDF
52	Rodolfo Adamshuk Silva, Simone do Rócio Senger de Souza, Paulo Sergio Lopes de Souza	Mutation operators for concurrent programs in MPI.	LATW	2012	DBLP DOI BibTeX RDF
52	Raimund Ubar, Sergei Kostin, Jaan Raik	About robustness of test patterns regarding multiple faults.	LATW	2012	DBLP DOI BibTeX RDF
52	Mohamed Ben Jrad, Régis Leveugle	Pattern-based injections in processors implemented on SRAM-based FPGAs.	LATW	2012	DBLP DOI BibTeX RDF
52	Frederico Ferlini, Felipe A. da Silva, Eduardo Augusto Bezerra, Djones Vinicius Lettnin	Non-intrusive fault tolerance in soft processors through circuit duplication.	LATW	2012	DBLP DOI BibTeX RDF
52	Samuel Nascimento Pagliarini, Lirida A. B. Naviner, Jean-François Naviner	Selective hardening methodology for combinational logic.	LATW	2012	DBLP DOI BibTeX RDF
52	András Timár, Márta Rencz	Acquiring real-time heating of cells in standard cell designs.	LATW	2012	DBLP DOI BibTeX RDF
52	Jose Eduardo Pereira Souza, Fernanda Lima Kastensmidt	Applying adaptive temporal filtering for SET mitigation based on the propagation-delay of every logical path.	LATW	2012	DBLP DOI BibTeX RDF
52	Eduardo Chielle, Raul Sergio Barth, Angelo Cardoso Lapolli, Fernanda Lima Kastensmidt	Configurable tool to protect processors against SEE by software-based detection techniques.	LATW	2012	DBLP DOI BibTeX RDF
52	Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez	Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.	LATW	2012	DBLP DOI BibTeX RDF
52	Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet	Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy.	LATW	2012	DBLP DOI BibTeX RDF
52	Ivan Beretta, Francisco J. Rincón, Nadia Khaled, Paolo Roberto Grassi, Vincenzo Rana, David Atienza, Donatella Sciuto	Model-based design for wireless body sensor network nodes.	LATW	2012	DBLP DOI BibTeX RDF
52	Ozgur Sinanoglu, Vishwani D. Agrawal	Retiming scan circuit to eliminate timing penalty.	LATW	2012	DBLP DOI BibTeX RDF
52	Jesús Moreno, Víctor H. Champac, Michel Renovell	Low voltage testing for interconnect opens under process variations.	LATW	2012	DBLP DOI BibTeX RDF
52	A. Wecxsteen, Salma Bergaoui, Régis Leveugle	Detailed analysis of compilation options for robust software-based embedded systems.	LATW	2012	DBLP DOI BibTeX RDF
52	Raul Chipana, Fernanda Lima Kastensmidt, Jorge L. Tonfat, Ricardo Reis 0001	SET susceptibility estimation of clock tree networks from layout extraction.	LATW	2012	DBLP DOI BibTeX RDF
52	Jose A. Rodriguez, Manuel Jiménez, William Morales, Fan-Chi Hou, Lucianne Millan, Rogelio Palomera	Parametric DC and noise measurements in a unified test & characterization software tool framework.	LATW	2012	DBLP DOI BibTeX RDF