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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 5 occurrences of 5 keywords
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Results
Found 25 publication records. Showing 25 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
106 | Ismet Bayraktaroglu, Olivier Caty, Yickkei Wong |
Highly Configurable Programmable Built-In Self Test Architecture for High-Speed Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 21-26, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
84 | Markus Seuring |
Combining Scan Test and Built-in Self Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(3), pp. 297-299, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
MBIST, BIST, scan test, production test, stress test |
61 | R. K. Sharma, Aditi Sood |
Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSAP ![In: 2010 International Conference on Signal Acquisition and Processing, ICSAP 2010, Bangalore, India, February 9-10, 2010, pp. 8-12, 2010, IEEE Computer Society, 978-0-7695-3960-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Defect-Per Million (DPM), Memory Built-in Self Test (MBIST), Microcoded MBIST, MUT (Memory Under Test), Built-In Self Test (BIST) |
30 | Darakshan Jamal, Ratheesh T. Veetil |
Efficient MBIST Area and Test Time Estimator Using Machine Learning Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSID ![In: 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, VLSID 2023, Hyderabad, India, January 8-12, 2023, pp. 223-228, 2023, IEEE, 979-8-3503-4678-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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30 | Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022, pp. 1-7, 2022, IEEE, 978-1-6654-1060-1. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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30 | Mohammed Altaf Ahmed, Ali Ma Abuagoub |
MBIST Controller Based on March-ee Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 30(9), pp. 2150160:1-2150160:18, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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30 | Nisha O. S., Sivasankar K. |
Architecture for an efficient MBIST using modified March-y algorithms to achieve optimized communication delay and computational speed. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Pervasive Comput. Commun. ![In: Int. J. Pervasive Comput. Commun. 17(1), pp. 135-147, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
30 | Ashwani Kumar |
Assertion Based Functional Verification of March Algorithm Based MBIST Controller. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2106.11461, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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30 | Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1849-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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30 | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa |
MBIST Support for Reliable eMRAM Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-4312-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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30 | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda |
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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30 | Shrikanth Ganapathy, John Kalamatianos, Bradford M. Beckmann, Steven Raasch, Lukasz G. Szafaryn |
Killi: Runtime Fault Classification to Deploy Low Voltage Caches without MBIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCA ![In: 25th IEEE International Symposium on High Performance Computer Architecture, HPCA 2019, Washington, DC, USA, February 16-20, 2019, pp. 304-316, 2019, IEEE, 978-1-7281-1444-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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30 | Teresa McLaurin, Rob Knoth |
The Challenges of Implementing an MBIST Interface: A Practical Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-4823-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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30 | Andrzej A. Wojciechowski, Krzysztof Marcinek, Witold A. Pleskacz |
Configurable MBIST Processor for Embedded Memories Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIXDES ![In: 26th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2019, Rzeszów, Poland, June 27-29, 2019, pp. 341-344, 2019, IEEE, 978-83-63578-16-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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30 | Alan Becker |
Short burst software transparent on-line MBIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016, pp. 1-6, 2016, IEEE Computer Society, 978-1-4673-8454-4. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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30 | Insik Yoon, Ashwin Chintaluri, Arijit Raychowdhury |
EMACS: Efficient MBIST architecture for test and characterization of STT-MRAM arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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30 | Yasha Jyothi M. Shirur, Bilure Chetana Bhimashankar, Veena S. Chakravarthi |
Performance analysis of low power microcode based asynchronous P-MBIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICACCI ![In: 2015 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2015, Kochi, India, August 10-13, 2015, pp. 555-560, 2015, IEEE, 978-1-4799-8790-0. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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30 | Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor |
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015, pp. 1-6, 2015, IEEE Computer Society, 978-1-4799-7597-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
30 | Yasha Jyothi M. Shirur, Lakshmi H. R., Veena S. Chakravarthi |
Implementation of Area Efficient Hybrid MBIST for Memory Clusters in Asynchronous SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISED ![In: 2014 Fifth International Symposium on Electronic System Design, Surathkal, Mangalore, India, December 15-17, 2014, pp. 226-227, 2014, IEEE Computer Society, 978-1-4799-6965-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
30 | Andrej Kincel, Marcel Baláz |
MBIST for LEON3 processor core cache. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013, pp. 287-288, 2013, IEEE Computer Society, 978-1-4673-6135-4. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
30 | Ad J. van de Goor, Christian Jung, Said Hamdioui, Georgi Gaydadjiev |
Low-cost, customized and flexible SRAM MBIST engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010, pp. 382-387, 2010, IEEE Computer Society, 978-1-4244-6612-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
30 | Ad J. van de Goor, Said Hamdioui |
MBIST architecture framework based on orthogonal constructs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IDT ![In: 5th International Design and Test Workshop, IDT 2010, Abu Dhabi, UAE, 14-15 December 2010, pp. 128-133, 2010, IEEE, 978-1-61284-291-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
30 | NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof |
Programmable MBIST Merging FSM and Microcode Techniques Using Macro Commands. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010, pp. 115-121, 2010, IEEE Computer Society, 978-1-4244-8447-8. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
26 | Jing Wang, Shengbing Zhang, Zhang Meng |
Testing of a 32-bit High Performance Embedded Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIES ![In: IEEE Second International Symposium on Industrial Embedded Systems, SIES 2007, Hotel Costa da Caparica, Lisbon, Portugal, July 4-6, 2007, pp. 288-292, 2007, IEEE, 1-4244-0840-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
26 | Sanjiv Taneja |
DFT Aware Layout - Layout Aware DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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