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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 13 occurrences of 13 keywords
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Results
Found 6 publication records. Showing 6 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
79 | Farzan Fallah, Pranav Ashar, Srinivas Devadas |
Functional vector generation for sequential HDL models under an observability-based code coverage metric. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 10(6), pp. 919-923, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
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69 | Farzan Fallah, Srinivas Devadas, Kurt Keutzer |
OCCOM: Efficient Computation of Observability-Based Code Coverage Metrics for Functional Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 35th Conference on Design Automation, Moscone center, San Francico, California, USA, June 15-19, 1998., pp. 152-157, 1998, ACM Press, 0-89791-964-5. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
high-level synthesis, telecommunication |
53 | Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou |
Observability Analysis on HDL Descriptions for Effective Functional Validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8), pp. 1509-1521, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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42 | Farzan Fallah, Srinivas Devadas, Kurt Keutzer |
OCCOM-efficient computation of observability-based code coveragemetrics for functional verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(8), pp. 1003-1015, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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36 | Indradeep Ghosh, Srivaths Ravi 0001 |
On automatic generation of RTL validation test benches using circuit testing techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003, pp. 289-294, 2003, ACM, 1-58113-677-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
OCCOM, RTL ATPG, RTL testing, path coverage, small validation, toggle coverage, test, testing, generation, ATPG, fault coverage, code coverage, test sets, design validation, coverage metrics, universal test sets, testbench, branch coverage |
26 | Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou |
An observability measure to enhance statement coverage metric for proper evaluation of verification completeness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 323-326, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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