|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 7 occurrences of 7 keywords
|
|
|
Results
Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu |
Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 58-64, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electron beam testing, multiple fault diagnosis, sensitized paths, EB testing, TP-1, TP-2, TP-3, TP-4, electron-beam tester, internal lines, VLSI, fault diagnosis, logic testing, combinational circuits, combinational circuits, fault location, fault location, stuck-at faults, diagnostic resolution |
Displaying result #1 - #1 of 1 (100 per page; Change: )
|
|