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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 18 occurrences of 17 keywords
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Results
Found 6 publication records. Showing 6 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
83 | Arani Sinha, Sandeep K. Gupta 0001, Melvin A. Breuer |
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 174-177, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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64 | Wei-Yu Chen, Sandeep K. Gupta 0001, Melvin A. Breuer |
Test generation for crosstalk-induced faults: framework and computational result. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 305-310, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
2-vector test generation, crosstalk-induced faults, noise effects, design effort, debugging effort, pulses, signal speedup, signal slowdown, digital combinational circuits, mixed-signal test generator, XGEN, static values, dynamic signals, signal arrival times, rise times, fall times, integrated circuit testing, automatic test pattern generation, combinational circuits, accuracy, vectors, circuit analysis computing, crosstalk, transitions, integrated logic circuits, technology scaling, SPICE simulations, gate delay, circuit performance, timing information, clock frequency |
40 | Erik Nijkamp, Tian Xie, Hiroaki Hayashi, Bo Pang, Congying Xia, Chen Xing, Jesse Vig, Semih Yavuz, Philippe Laban, Ben Krause, Senthil Purushwalkam, Tong Niu, Wojciech Kryscinski, Lidiya Murakhovs'ka, Prafulla Kumar Choubey, Alexander R. Fabbri, Ye Liu, Rui Meng, Lifu Tu, Meghana Bhat, Chien-Sheng Wu, Silvio Savarese, Yingbo Zhou, Shafiq Joty, Caiming Xiong |
XGen-7B Technical Report. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2309.03450, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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40 | Xiaofeng Li, Bin Ren, Xipeng Shen, Yanzhi Wang |
CoCoPIE XGen: A Full-Stack AI-Oriented Optimizing Framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2206.10620, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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40 | Thomas V. Thompson II, Ernest J. Petti, Chuck Tappan |
XGen: arbitrary primitive generator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGGRAPH ![In: Proceedings of the SIGGRAPH 2003 Conference on Sketches & Applications: in conjunction with the 30th annual conference on Computer graphics and interactive techniques, 2003, San Diego, California, USA, July 27-31, 2003, 2003, ACM, 978-1-4503-7466-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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28 | Wei-Yu Chen, Sandeep K. Gupta 0001, Melvin A. Breuer |
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(1), pp. 17-28, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
time-based test generation, fault modeling, crosstalk, mixed-signal test |
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