|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 15 occurrences of 13 keywords
|
|
|
Results
Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
183 | Debesh K. Das, Uttam K. Bhattacharya, Bhargab B. Bhattacharya |
Isomorph-redundancy in sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 463-469, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
isomorph-redundancy, reduced sequential machine, infinite family, VLSI, logic testing, redundancy, integrated circuit testing, design for testability, logic design, sequential circuits, sequential circuits, DFT, state diagram |
157 | Debesh K. Das, Uttam K. Bhattacharya, Bhargab B. Bhattacharya |
Isomorph-Redundancy in Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(9), pp. 992-997, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
testing, redundancy, ATPG, DFT, stuck-at faults, sequential machines |
Displaying result #1 - #2 of 2 (100 per page; Change: )
|
|