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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 16 occurrences of 16 keywords
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Results
Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
49 | R. D. (Shawn) Blanton, John P. Hayes |
Design of a fast, easily testable ALU. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 9-16, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
ALU, adder design, L-testable design, level-testable, carry-lookahead addition, fault diagnosis, logic testing, integrated circuit testing, automatic testing, digital arithmetic, integrated circuit design, adders, logic arrays, test patterns, area overhead, functional faults, carry logic, arithmetic-logic unit, 8 bit |
18 | Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian |
Easily Testable Cellular Carry Lookahead Adders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(3), pp. 285-298, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
cellular carry lookahead adders, linear-testability, design-for-testability, cell fault model |
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