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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3 occurrences of 3 keywords
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Results
Found 7 publication records. Showing 7 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton |
Multiple-detect ATPG based on physical neighborhoods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 1099-1102, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
N-detect, multiple-detect, ATPG, defects, neighborhoods |
24 | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
Impact of Multiple-Detect Test Patterns on Product Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1031-1040, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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20 | R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah |
Analyzing the Effectiveness of Multiple-Detect Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 876-885, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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12 | Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward |
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009, pp. 1-10, 2009, IEEE Computer Society, 978-1-4244-4868-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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4 | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
Silicon Evaluation of Static Alternative Fault Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 265-270, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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4 | Kameshwar Chandrasekar, Michael S. Hsiao |
Decision Selection and Learning for an All-Solutions ATPG Engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 607-616, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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4 | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 184-193, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
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