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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3 occurrences of 3 keywords
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Results
Found 7 publication records. Showing 7 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton |
Multiple-detect ATPG based on physical neighborhoods. |
DAC |
2006 |
DBLP DOI BibTeX RDF |
N-detect, multiple-detect, ATPG, defects, neighborhoods |
24 | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
Impact of Multiple-Detect Test Patterns on Product Quality. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
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20 | R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah |
Analyzing the Effectiveness of Multiple-Detect Test Sets. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
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12 | Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward |
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
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4 | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
Silicon Evaluation of Static Alternative Fault Models. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
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4 | Kameshwar Chandrasekar, Michael S. Hsiao |
Decision Selection and Learning for an All-Solutions ATPG Engine. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
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4 | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
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