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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 4 occurrences of 4 keywords
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Results
Found 3 publication records. Showing 3 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
44 | Srivathsan Krishnamohan, Nihar R. Mahapatra |
Analysis and design of soft-error hardened latches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005, pp. 328-331, 2005, ACM, 1-59593-057-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
multiple-upset, single-event, soft errors, single-event upset, latch, radiation hardening |
23 | Ramin Rajaei, Bahar Asgari, Mahmoud Tabandeh, Mahdi Fazeli |
Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Turkish J. Electr. Eng. Comput. Sci. ![In: Turkish J. Electr. Eng. Comput. Sci. 25, pp. 1035-1047, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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23 | Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli |
Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 24(1), pp. 1550007:1-1550007:30, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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