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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 7 occurrences of 7 keywords
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Results
Found 2 publication records. Showing 2 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
114 | Nur A. Touba, Edward J. McCluskey |
Applying two-pattern tests using scan-mapping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 393-399, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests |
15 | Jorge L. Martínez, Jesús Morales, Anthony Mandow, Alfonso García-Cerezo |
Incremental closed-form solution to globally consistent 2D range scan mapping with two-step pose estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AMC ![In: 11th IEEE International Workshop on Advanced Motion Control, AMC 2010, Nagaoka University of Technology, Nagaoka, Niigata, Japan, March 21st - 24th, 2010, pp. 252-257, 2010, IEEE, 978-1-4244-6669-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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