|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 392 occurrences of 204 keywords
|
|
|
Results
Found 660 publication records. Showing 660 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
133 | Subhasish Mitra, Pia N. Sanda, Norbert Seifert |
Soft Errors: Technology Trends, System Effects, and Protection Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 4, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Memory soft errors, Logic soft errors, timing derating, logic derating, architectural derating, Built-In Soft Error Resilience, reliability, data integrity, availability, Error Correcting Codes, error detection, recovery, Soft errors, FITs, radiation hardening |
95 | Shlomi Dolev, Yinnon A. Haviv |
Self-Stabilizing Microprocessor: Analyzing and Overcoming Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(4), pp. 385-399, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Self-stabilization, microprocessor, soft errors, single event upset |
79 | Jun Yan 0008, Wei Zhang 0002 |
Compiler-guided register reliability improvement against soft errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EMSOFT ![In: EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings, pp. 203-209, 2005, ACM, 1-59593-091-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
register lifetime, reliability, soft errors, register file |
79 | Ismail Kadayif, Mahmut T. Kandemir |
Modeling and improving data cache reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGMETRICS ![In: Proceedings of the 2007 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2007, San Diego, California, USA, June 12-16, 2007, pp. 1-12, 2007, ACM, 978-1-59593-639-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
vulnerability factors, reliability, data integrity, soft errors, data caches |
78 | Giacinto Paolo Saggese, Nicholas J. Wang, Zbigniew Kalbarczyk, Sanjay J. Patel, Ravishankar K. Iyer |
An Experimental Study of Soft Errors in Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Micro ![In: IEEE Micro 25(6), pp. 30-39, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Soft error sensitivity, Assessment and Protection Techniques, Fault Injection, Soft errors, Microprocessor Architecture |
73 | Greg Bronevetsky, Bronis R. de Supinski |
Soft error vulnerability of iterative linear algebra methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICS ![In: Proceedings of the 22nd Annual International Conference on Supercomputing, ICS 2008, Island of Kos, Greece, June 7-12, 2008, pp. 155-164, 2008, ACM, 978-1-60558-158-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
fault tolerance, parallel, iterative methods, linear algebra, soft errors |
67 | Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, Xun Tang, Bernd Becker 0001 |
On Reducing Circuit Malfunctions Caused by Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 245-253, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
65 | Aviral Shrivastava, Jongeun Lee, Reiley Jeyapaul |
Cache vulnerability equations for protecting data in embedded processor caches from soft errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LCTES ![In: Proceedings of the ACM SIGPLAN/SIGBED 2010 conference on Languages, compilers, and tools for embedded systems, LCTES 2010, Stockholm, Sweden, April 13-15, 2010, pp. 143-152, 2010, ACM, 978-1-60558-953-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
cache vulnerability, static analysis, embedded processors, soft errors, code transformation, compiler technique |
64 | Shlomi Dolev, Yinnon A. Haviv |
Self-Stabilizing Microprocessor - Analyzing and Overcoming Soft-Errors (Extended Abstract). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARCS ![In: Organic and Pervasive Computing - ARCS 2004, International Conference on Architecture of Computing Systems, Augsburg, Germany, March 23-26, 2004, Proceedings, pp. 31-46, 2004, Springer, 3-540-21238-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
63 | Alan Messer, Philippe Bernadat, Guangrui Fu, DeQing Chen, Zoran Dimitrijevic, David Jeun Fung Lie, Durga Mannaru, Alma Riska, Dejan S. Milojicic |
Susceptibility of Commodity Systems and Software to Memory Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 53(12), pp. 1557-1568, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
commodity, Java, operating systems, recovery, Soft errors, memory errors |
61 | Alodeep Sanyal, Sandip Kundu |
On Derating Soft Error Probability Based on Strength Filtering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 152-160, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
soft error rate, logic switching threshold voltage, Soft error, single event upset, single event transient |
61 | Vilas Sridharan, Hossein Asadi 0001, Mehdi Baradaran Tahoori, David R. Kaeli |
Reducing Data Cache Susceptibility to Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 3(4), pp. 353-364, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
refresh, refetch, Fault tolerance, reliability, cache memories, soft errors, error modeling |
57 | Kyoungwoo Lee, Aviral Shrivastava, Ilya Issenin, Nikil D. Dutt, Nalini Venkatasubramanian |
Mitigating soft error failures for multimedia applications by selective data protection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CASES ![In: Proceedings of the 2006 International Conference on Compilers, Architecture, and Synthesis for Embedded Systems, CASES 2006, Seoul, Korea, October 22-25, 2006, pp. 411-420, 2006, ACM, 1-59593-543-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
horizontally partitioned caches, multimedia embedded systems, selective data protection, soft errors |
55 | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
An Improved Soft-Error Rate Measurement Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4), pp. 596-600, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
53 | Ilia Polian, Bernd Becker 0001, Masato Nakasato, Satoshi Ohtake, Hideo Fujiwara |
Low-Cost Hardening of Image Processing Applications Against Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 274-279, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
50 | Jianjun Xu, Rui Shen, Qingping Tan |
PRASE: An Approach for Program Reliability Analysis with Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 14th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2008, 15-17 December 2008, Taipei, Taiwan, pp. 240-247, 2008, IEEE Computer Society, 978-0-7695-3448-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
49 | Yoichi Sasaki 0001, Kazuteru Namba, Hideo Ito |
Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(1-3), pp. 11-19, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Masking circuit, Pass transistor, Schmitt trigger circuit, Soft error, Latch |
49 | Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang |
Logic soft errors in sub-65nm technologies design and CAD challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005, pp. 2-4, 2005, ACM, 1-59593-058-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
architectural vulnerability factor, built-in soft error resilience, derating, error blocking, error detection, recovery, soft error |
48 | Shuangyu Ruan, Kazuteru Namba, Hideo Ito |
Soft Error Hardened FF Capable of Detecting Wide Error Pulse. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 272-280, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
47 | Vijay Degalahal, Lin Li 0002, Narayanan Vijaykrishnan, Mahmut T. Kandemir, Mary Jane Irwin |
Soft errors issues in low-power caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 13(10), pp. 1157-1166, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
47 | Narayanan Vijaykrishnan, Yuan Xie 0001, Mary Jane Irwin |
Designing reliable circuit in the presence of soft errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 1, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
47 | Srivathsan Krishnamohan, Nihar R. Mahapatra |
A Highly-Efficient Technique for Reducing Soft Errors in Static CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings, pp. 126-131, 2004, IEEE Computer Society, 0-7695-2231-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
46 | Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff |
Soft Delay Error Effects in CMOS Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 325-334, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Soft delay, single event upsets (SEUs), soft error rate (SER), soft errors |
44 | Jason A. Blome, Shantanu Gupta, Shuguang Feng, Scott A. Mahlke |
Cost-efficient soft error protection for embedded microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CASES ![In: Proceedings of the 2006 International Conference on Compilers, Architecture, and Synthesis for Embedded Systems, CASES 2006, Seoul, Korea, October 22-25, 2006, pp. 421-431, 2006, ACM, 1-59593-543-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
reliability, embedded processors, soft errors |
44 | Chong Zhao, Xiaoliang Bai, Sujit Dey |
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004, pp. 894-899, 2004, ACM, 1-58113-828-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
compound noise effect, nano-meter technology, softness distribution, robustness |
43 | Fan Wang, Vishwani D. Agrawal |
Single Event Upset: An Embedded Tutorial. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 429-434, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
43 | Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff |
Interactive presentation: A new asymmetric SRAM cell to reduce soft errors and leakage power in FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 1460-1465, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
43 | Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. Rivers |
SoftArch: An Architecture Level Tool for Modeling and Analyzing Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings, pp. 496-505, 2005, IEEE Computer Society, 0-7695-2282-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
41 | Daniel Skarin, Johan Karlsson |
Software Implemented Detection and Recovery of Soft Errors in a Brake-by-Wire System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDCC ![In: Seventh European Dependable Computing Conference, EDCC-7 2008, Kaunas, Lithuania, 7-9 May 2008, pp. 145-154, 2008, IEEE Computer Society, 978-0-7695-3138-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
41 | Gulay Yalcin, Oguz Ergin |
Using Tag-Match Comparators for Detecting Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Comput. Archit. Lett. ![In: IEEE Comput. Archit. Lett. 6(2), pp. 53-56, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Koustav Bhattacharya, Nagarajan Ranganathan |
RADJAM: A Novel Approach for Reduction of Soft Errors in Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, pp. 453-458, 2009, IEEE Computer Society, 978-0-7695-3506-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
40 | Guangyu Chen, Feihui Li, Mahmut T. Kandemir, I. Demirkiran |
Increasing FPGA resilience against soft errors using task duplication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 924-927, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |
An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany, pp. 10602-10607, 2003, IEEE Computer Society, 0-7695-1870-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
40 | Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro, Oscar Ruano |
Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Signal Process. Syst. ![In: J. Signal Process. Syst. 52(3), pp. 231-247, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
single event upsets (SEUs), multiple bit upsets (MBUs), fault tolerance, redundancy, soft errors, interleaving |
40 | Srivathsan Krishnamohan, Nihar R. Mahapatra |
Analysis and design of soft-error hardened latches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005, pp. 328-331, 2005, ACM, 1-59593-057-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
multiple-upset, single-event, soft errors, single-event upset, latch, radiation hardening |
40 | Colin D. Walter |
Data Integrity in Hardware for Modular Arithmetic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CHES ![In: Cryptographic Hardware and Embedded Systems - CHES 2000, Second International Workshop, Worcester, MA, USA, August 17-18, 2000, Proceedings, pp. 204-215, 2000, Springer, 3-540-41455-X. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
checker circuit, fault tolerance, testing, cryptography, data integrity, RSA, Computer arithmetic, correctness, error correction, soft errors, Montgomery multiplication, modular multiplication, modular exponentiation |
39 | Nicholas J. Wang, Sanjay J. Patel |
ReStore: Symptom-Based Soft Error Detection in Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 3(3), pp. 188-201, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Simulation, fault tolerance, fault injection, redundant design |
39 | Makoto Sugihara, Tohru Ishihara, Masanori Muroyama, Koji Hashimoto |
A Simulation-Based Soft Error Estimation Methodology for Computer Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA, pp. 196-203, 2006, IEEE Computer Society, 0-7695-2523-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Reliability, Estimation, Soft Error, Computer Systems, Instruction-Set Simulation |
39 | Nicholas J. Wang, Sanjay J. Patel |
ReStore: Symptom Based Soft Error Detection in Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings, pp. 30-39, 2005, IEEE Computer Society, 0-7695-2282-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
38 | Shubhendu S. Mukherjee, Joel S. Emer, Steven K. Reinhardt |
The Soft Error Problem: An Architectural Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCA ![In: 11th International Conference on High-Performance Computer Architecture (HPCA-11 2005), 12-16 February 2005, San Francisco, CA, USA, pp. 243-247, 2005, IEEE Computer Society, 0-7695-2275-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
37 | Darshan D. Thaker, Diana Franklin, John Y. Oliver, Susmit Biswas, Derek Lockhart, Tzvetan S. Metodi, Frederic T. Chong |
Characterization of Error-Tolerant Applications when Protecting Control Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IISWC ![In: Proceedings of the 2006 IEEE International Symposium on Workload Characterization, IISWC 2006, October 25-27, 2006, San Jose, California, USA, pp. 142-149, 2006, IEEE Computer Society, 1-4244-0508-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
37 | Mohammad Hossein Neishaburi, Masoud Daneshtalab, Mohammad Reza Kakoee, Saeed Safari |
Improving Robustness of Real-Time Operating Systems (RTOS) Services Related to Soft-Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AICCSA ![In: 2007 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2007), 13-16 May 2007, Amman, Jordan, pp. 528-534, 2007, IEEE Computer Society, 1-4244-1030-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
37 | Niti Madan, Rajeev Balasubramonian |
Leveraging 3D Technology for Improved Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 40th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-40 2007), 1-5 December 2007, Chicago, Illinois, USA, pp. 223-235, 2007, IEEE Computer Society, 0-7695-3047-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
redundant multi-threading, 3D die-stacking, dynamic timing errors, power-efficient microarchitecture, on-chip temperature, reliability, soft errors, parameter variation |
36 | Yoichi Sasaki 0001, Kazuteru Namba, Hideo Ito |
Soft Error Masking Circuit and Latch Using Schmitt Trigger Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 327-335, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
36 | Kyoungwoo Lee, Aviral Shrivastava, Nikil D. Dutt, Nalini Venkatasubramanian |
Data Partitioning Techniques for Partially Protected Caches to Reduce Soft Error Induced Failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DIPES ![In: Distributed Embedded Systems: Design, Middleware and Resources, IFIP 20th World Computer Congress, TC10 Working Conference on Distributed and Parallel Embedded Systems (DIPES 2008), September 7-10, 2008, Milano, Italy, pp. 213-225, 2008, Springer, 978-0-387-09660-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
36 | Oguz Ergin, Osman S. Unsal, Xavier Vera, Antonio González 0001 |
Exploiting Narrow Values for Soft Error Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Comput. Archit. Lett. ![In: IEEE Comput. Archit. Lett. 5(2), 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
35 | Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
Improving testability and soft-error resilience through retiming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 508-513, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
testability, soft errors, retiming |
35 | Cung Nguyen, G. Robert Redinbo |
Fault Tolerance Design in JPEG 2000 Image Compression System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 2(1), pp. 57-75, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Fault-tolerant source coding, JPEG 2000 standard, hardware reliability, weighted sum parity, data compression, Discrete Wavelet Transform (DWT), Soft errors, concurrent error detection, Huffman coding, error control codes, algorithm-based fault tolerance, error-checking |
35 | Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis 0001 |
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2006, Ouro Preto, MG, Brazil, August 28 - September 1, 2006, pp. 196-201, 2006, ACM. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
fault-tolerant microprocessor, soft errors, single event upsets, single event transients |
35 | Teruaki Sakata, Teppei Hirotsu, Hiromichi Yamada, Takeshi Kataoka |
A Cost-Effective Dependable Microcontroller Architecture with Instruction-Level Rollback for Soft Error Recovery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: The 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2007, 25-28 June 2007, Edinburgh, UK, Proceedings, pp. 256-265, 2007, IEEE Computer Society, 0-7695-2855-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
34 | Wangyuan Zhang, Xin Fu, Tao Li 0006, José A. B. Fortes |
An Analysis of Microarchitecture Vulnerability to Soft Errors on Simultaneous Multithreaded Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPASS ![In: 2007 IEEE International Symposium on Performance Analysis of Systems and Software, April 25-27, 2007, San Jose, California, USA, Proceedings, pp. 169-178, 2007, IEEE Computer Society, 1-4244-1081-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
thread-aware reliability optimization, microarchitecture vulnerability, simultaneous multithreaded architecture, semiconductor transient fault, microprocessor reliability, processor throughput, soft error vulnerability analysis, SPEC CPU 2000 benchmark, microarchitecture structure, microarchitecture reliability profile, fetch policy, thread-level parallelism, multithreading architecture |
34 | Vijay Degalahal, Narayanan Vijaykrishnan, Mary Jane Irwin |
Analyzing Soft Errors in Leakage Optimized SRAM Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India, pp. 227-233, 2003, IEEE Computer Society, 0-7695-1868-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
34 | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
On Accelerating Soft-Error Detection by Targeted Pattern Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 723-728, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
33 | Hossein Asadi 0001, Mehdi Baradaran Tahoori |
Analytical Techniques for Soft Error Rate Modeling and Mitigation of FPGA-Based Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(12), pp. 1320-1331, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
33 | Patrick Ndai, Amit Agarwal 0001, Qikai Chen, Kaushik Roy 0001 |
A Soft Error Monitor Using Switching Current Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA, pp. 185-192, 2005, IEEE Computer Society, 0-7695-2451-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
33 | Hai Yu, Fan Xiaoya |
Mitigating Soft Errors in System-on-Chip Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICYCS ![In: Proceedings of the 9th International Conference for Young Computer Scientists, ICYCS 2008, Zhang Jia Jie, Hunan, China, November 18-21, 2008, pp. 1260-1265, 2008, IEEE Computer Society, 978-0-7695-3398-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
33 | Sandip Kundu, Ilia Polian |
An Improved Technique for Reducing False Alarms Due to Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, pp. 105-110, 2006, IEEE Computer Society, 0-7695-2620-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
33 | Srivathsan Krishnamohan, Nihar R. Mahapatra |
Combining Error Masking and Error Detection Plus Recovery to Combat Soft Errors in Static CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings, pp. 40-49, 2005, IEEE Computer Society, 0-7695-2282-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
33 | Krishnan Ramakrishnan, R. Rajaraman, Narayanan Vijaykrishnan, Yuan Xie 0001, Mary Jane Irwin, Kenan Unlu |
Hierarchical Soft Error Estimation Tool (HSEET). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 680-683, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Reliability, Soft Errors, Flip-Flop, Combinational Logic |
33 | Michael Nicolaidis, Renaud Perez, Dan Alexandrescu |
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 371-376, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
radiation hardened cells, soft errors, SEUs |
33 | Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
On the role of timing masking in reliable logic circuit design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 924-929, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
timing, soft errors, SEUs |
33 | Franz X. Ruckerbauer, Georg Georgakos |
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 203-204, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
NSER, ASER, multi-bit upset, soft errors and radiation, CMOS, SRAM, SEU |
32 | Saihua Lin, Huazhong Yang, Rong Luo |
A New Family of Sequential Elements With Built-in Soft Error Tolerance for Dual-VDD Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 16(10), pp. 1372-1384, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
32 | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh |
Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 14(5), pp. 514-524, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
31 | Sri Hari Krishna Narayanan, Seung Woo Son 0001, Mahmut T. Kandemir, Feihui Li |
Using loop invariants to fight soft errors in data caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 1317-1320, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
31 | Jie S. Hu, Feihui Li, Vijay Degalahal, Mahmut T. Kandemir, Narayanan Vijaykrishnan, Mary Jane Irwin |
Compiler-assisted soft error detection under performance and energy constraints in embedded systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Embed. Comput. Syst. ![In: ACM Trans. Embed. Comput. Syst. 8(4), pp. 27:1-27:30, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
instruction duplication, reliability, Embedded systems, compilers, energy consumption, soft errors |
30 | Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott A. Mahlke |
Shoestring: probabilistic soft error reliability on the cheap. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASPLOS ![In: Proceedings of the 15th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2010, Pittsburgh, Pennsylvania, USA, March 13-17, 2010, pp. 385-396, 2010, ACM, 978-1-60558-839-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
error detection, fault injection, compiler analysis |
30 | Roystein Oliveira, Aditya Jagirdar, Tapan J. Chakraborty |
A TMR Scheme for SEU Mitigation in Scan Flip-Flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 905-910, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Koustav Bhattacharya, Soontae Kim, Nagarajan Ranganathan |
Improving the reliability of on-chip L2 cache using redundancy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 25th International Conference on Computer Design, ICCD 2007, 7-10 October 2007, Lake Tahoe, CA, USA, Proceedings, pp. 224-229, 2007, IEEE, 1-4244-1258-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Ming Zhang 0017, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu |
Design for Resilience to Soft Errors and Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 23-28, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Andrew J. Ricketts, Madhu Mutyam, Narayanan Vijaykrishnan, Mary Jane Irwin |
Investigating Simple Low Latency Reliable Multiported Register Files. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil, pp. 375-382, 2007, IEEE Computer Society, 0-7695-2896-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
29 | Jianjun Xu, Qingping Tan, Rui Shen |
A Novel Optimum Data Duplication Approach for Soft Error Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APSEC ![In: 15th Asia-Pacific Software Engineering Conference (APSEC 2008), 3-5 December 2008, Beijing, China, pp. 161-168, 2008, IEEE Computer Society, 978-0-7695-3446-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
29 | Jun Won Choi, Byonghyo Shim, Andrew C. Singer, Nam Ik Cho |
Low-Power Filtering Via Minimum Power Soft Error Cancellation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 55(10), pp. 5084-5096, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
29 | Soong Hyun Shin, Sung Woo Chung, Chu Shik Jhon |
On the Reliability of Drowsy Instruction Caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asia-Pacific Computer Systems Architecture Conference ![In: Advances in Computer Systems Architecture, 11th Asia-Pacific Conference, ACSAC 2006, Shanghai, China, September 6-8, 2006, Proceedings, pp. 445-451, 2006, Springer, 3-540-40056-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | Pooya Jannaty, Florian C. Sabou, R. Iris Bahar, Joseph L. Mundy, William R. Patterson, Alexander Zaslavsky |
Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 281-286, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
CMOS logic devices, reliability, Markov process, monte carlo method, poisson distribution, laplace transform |
28 | Aditya Jagirdar, Roystein Oliveira, Tapan J. Chakraborty |
A Robust Architecture for Flip-Flops Tolerant to Soft-Errors and Transients from Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 39-44, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
28 | G. Chen, Mahmut T. Kandemir, Mary Jane Irwin, Gokhan Memik |
Compiler-directed selective data protection against soft errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 713-716, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
28 | Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel |
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 76-81, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
28 | Yves Crouzet, Jacques Henri Collet, Jean Arlat |
Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France, pp. 295-298, 2005, IEEE Computer Society, 0-7695-2406-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
28 | Matteo Sonza Reorda, Massimo Violante |
Emulation-Based Analysis of Soft Errors in Deep Sub-micron Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: Field Programmable Logic and Application, 13th International Conference, FPL 2003, Lisbon, Portugal, September 1-3, 2003, Proceedings, pp. 616-626, 2003, Springer, 3-540-40822-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
28 | Niranjan Soundararajan, Anand Sivasubramaniam, Vijay Narayanan |
Characterizing the soft error vulnerability of multicores running multithreaded applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGMETRICS ![In: SIGMETRICS 2010, Proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, New York, USA, 14-18 June 2010, pp. 379-380, 2010, ACM, 978-1-4503-0038-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
fit rate, multicore, soft errors |
28 | Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra |
Latch Susceptibility to Transient Faults and New Hardening Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 56(9), pp. 1255-1268, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Static Latch, Hardened Latch, Soft Errors, Transient Faults, Robust Design |
28 | Niti Madan, Rajeev Balasubramonian |
Power Efficient Approaches to Redundant Multithreading. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 18(8), pp. 1066-1079, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
redundant multi-threading (RMT), dynamic frequency scaling, Reliability, power, soft errors, transient faults, heterogeneous chip multiprocessors |
28 | Mohamed A. Gomaa, T. N. Vijaykumar |
Opportunistic Transient-Fault Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Micro ![In: IEEE Micro 26(1), pp. 92-99, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Transient-fault detection, redundancy, soft errors, CMOS scaling |
28 | Subhasish Mitra, Ondrej Novák, Hana Kubátová, Bashir M. Al-Hashimi, Erik Jan Marinissen, C. P. Ravikumar |
Conference Reports. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(4), pp. 262-265, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Logic Soft Errors, conference report |
28 | Mojtaba Mehrara, Todd M. Austin |
Reliability-aware data placement for partial memory protection in embedded processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Memory System Performance and Correctness ![In: Proceedings of the 2006 workshop on Memory System Performance and Correctness, San Jose, California, USA, October 11, 2006, pp. 11-18, 2006, ACM, 1-59593-578-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
memory lifetime, partial memory protection, selective data placement, embedded systems, soft errors |
28 | Maurizio Rebaudengo, Matteo Sonza Reorda, Marco Torchiano, Massimo Violante |
Soft-Error Detection through Software Fault-Tolerance Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings, pp. 210-218, 1999, IEEE Computer Society, 0-7695-0325-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Code Redundancy, Fault Detection, Fault Injection, Soft Errors, Software Fault-Tolerance |
28 | Narayanan Vijaykrishnan |
Soft errors: is the concern for soft-errors overblown? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 2, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
28 | Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, Raoul Velazco |
Soft Errors and Tolerance for Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 279-280, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
28 | Weiguang Sheng, Liyi Xiao, Zhigang Mao |
An Automated Fault Injection Technique Based on VHDL Syntax Analysis and Stratified Sampling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008, pp. 587-591, 2008, IEEE Computer Society, 978-0-7695-3110-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
simulated fault injection, reliability, VLSI, soft error, stratified sampling |
28 | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
Accelerating Soft Error Rate Testing Through Pattern Selection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 191-193, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
soft error rate (SER), simulation, automatic test pattern generation (ATPG), Soft error |
28 | Hossein Asadi 0001, Mehdi Baradaran Tahoori |
Soft error derating computation in sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2006 International Conference on Computer-Aided Design, ICCAD 2006, San Jose, CA, USA, November 5-9, 2006, pp. 497-501, 2006, ACM, 1-59593-389-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
27 | Anurag Tiwari, Karen A. Tomko |
Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 54(3), pp. 459-467, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
27 | Wei Zhang 0002 |
Computing Cache Vulnerability to Transient Errors and Its Implication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 427-435, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
27 | Bianca Schroeder, Eduardo Pinheiro, Wolf-Dietrich Weber |
DRAM errors in the wild: a large-scale field study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGMETRICS/Performance ![In: Proceedings of the Eleventh International Joint Conference on Measurement and Modeling of Computer Systems, SIGMETRICS/Performance 2009, Seattle, WA, USA, June 15-19, 2009, pp. 193-204, 2009, ACM, 978-1-60558-511-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
dimm, dram reliability, ecc, hard error, empirical study, memory, soft error, dram, large-scale systems, data corruption |
26 | Koustav Bhattacharya, Nagarajan Ranganathan |
A unified gate sizing formulation for optimizing soft error rate, cross-talk noise and power under process variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 388-393, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
26 | Premkishore Shivakumar, Michael Kistler, Stephen W. Keckler, Doug Burger, Lorenzo Alvisi |
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2002 International Conference on Dependable Systems and Networks (DSN 2002), 23-26 June 2002, Bethesda, MD, USA, Proceedings, pp. 389-398, 2002, IEEE Computer Society, 0-7695-1597-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
26 | Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale |
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 205-206, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
26 | Tanay Karnik, Peter Hazucha, Jagdish Patel |
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 1(2), pp. 128-143, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
reliability, High performance, soft error, error tolerance, single event upset |
25 | Xin Fu, Tao Li, José A. B. Fortes |
Soft error vulnerability aware process variation mitigation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCA ![In: 15th International Conference on High-Performance Computer Architecture (HPCA-15 2009), 14-18 February 2009, Raleigh, North Carolina, USA, pp. 93-104, 2009, IEEE Computer Society, 978-1-4244-2932-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #100 of 660 (100 per page; Change: ) Pages: [ 1][ 2][ 3][ 4][ 5][ 6][ 7][ >>] |
|