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Found 2 publication records. Showing 2 according to the selection in the facets
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Authors |
Title |
Venue |
Year |
Link |
Author keywords |
76 | Dirk W. Hoffmann, Thomas Kropf |
Automatic Error Correction of Tri-State Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design, VLSI in Computers and Processors, ICCD '99, Austin, Texas, USA, October 10-13, 1999, pp. 51-, 1999, IEEE Computer Society, 0-7695-0406-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Automatic error correction, tri-states, fault diagnosis, BDDs, equivalence checking |
14 | Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel |
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), New Frontiers in VLSI Design, 11-12 May 2005, Tampa, FL, USA, pp. 212-217, 2005, IEEE Computer Society, 0-7695-2365-X. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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