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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 199 occurrences of 154 keywords
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Results
Found 896 publication records. Showing 896 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Freddy Forero, Michel Renovell, Víctor H. Champac |
B-open: A New Defect in Nanometer Technologies due to SADP Process.  |
ETS  |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Xijiang Lin, Sudhakar M. Reddy |
On Generating Fault Diagnosis Patterns for Designs with X Sources. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nimisha Limaye, Muhammad Yasin, Ozgur Sinanoglu |
Revisiting Logic Locking for Reversible Computing. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar |
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jung-Geun Park, Minsu Kim, Soo-Mook Moon, Sungyeol Kim, Insu Yang, Hyunsoo Jung |
PaTran: Translation Platform for Test Pattern Program. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | |
24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019 |
ETS |
2019 |
DBLP BibTeX RDF |
|
| 1 | Rezgar Sadeghi, Nooshin Nosrati, Katayoon Basharkhah, Zainalabedin Navabi |
Back-annotation of Interconnect Physical Properties for System-Level Crosstalk Modeling. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu Huang 0005, Jakub Janicki, Szczepan Urban |
Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Luciano Bonaria, Maurizio Raganato, Matteo Sonza Reorda, Giovanni Squillero |
A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy |
A supervised machine learning application in volume diagnosis. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik |
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Vaishali H. Dhare, Usha Mehta |
Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Foisal Ahmed, Michihiro Shintani, Michiko Inoue |
Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Dominik Sisejkovic, Farhad Merchant, Rainer Leupers, Gerd Ascheid, Sascha Kegreiss |
Inter-Lock: Logic Encryption for Processor Cores Beyond Module Boundaries. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Huhn 0001, Daniel Tille, Rolf Drechsler |
Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Michele Portolan, Riccardo Cantoro, Ernesto Sánchez 0001 |
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Fernando Fernandes dos Santos, Philippe O. A. Navaux, Luigi Carro, Paolo Rech |
Impact of Reduced Precision in the Reliability of Deep Neural Networks for Object Detection. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev |
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi |
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Corrado De Sio, Sarah Azimi, Luca Sterpone |
On the Evaluation of the PIPB Effect within SRAM-based FPGAs. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Fotis Foukalas, Paul Pop, Fabrice Theoleyre, Carlo Alberto Boano, Chiara Buratti |
Dependable Wireless Industrial IoT Networks: Recent Advances and Open Challenges. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Aleksa Damljanovic, Artur Jutman, Giovanni Squillero, Anton Tsertov |
Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Utkarsh Gupta, Priyank Kalla, Irina Ilioaea, Florian Enescu |
Exploring Algebraic Interpolants for Rectification of Finite Field Arithmetic Circuits with Gröbner Bases. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Görschwin Fey, Alberto García Ortiz |
Symbolic Circuit Analysis under an Arc Based Timing Model. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Panagiotis Georgiou, Iakovos Theodosopoulos, Xrysovalantis Kavousianos |
K3 TAM Optimization for Testing 3D-SoCs using Non-Regular Time-Division-Multiplexing. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui |
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Alessandro Savino, Michele Portolan, Régis Leveugle, Stefano Di Carlo |
Approximate computing design exploration through data lifetime metrics. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Stefan Katzenbeisser 0001, Ilia Polian, Francesco Regazzoni 0001, Marc Stöttinger |
Security in Autonomous Systems. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Hani Malloug, Manuel J. Barragán, Salvador Mir |
A 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal BIST applications in 28 nm FDSOI technology. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff |
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Michele Portolan, Alessandro Savino, Régis Leveugle, Stefano Di Carlo, Alberto Bosio, Giorgio Di Natale |
Alternatives to Fault Injections for Early Safety/Security Evaluations. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Benjamin Thiemann, Linus Feiten, Pascal Raiola, Bernd Becker 0001, Matthias Sauer 0002 |
On Integrating Lightweight Encryption in Reconfigurable Scan Networks. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Imed Jani, Didier Lattard, Pascal Vivet, Jean Durupt, Sébastien Thuries, Edith Beigné |
Test Solutions for High Density 3D-IC Interconnects - Focus on SRAM-on-Logic Partitioning. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Soumya Mittal, R. D. Shawn Blanton |
LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre |
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Leon M. A. van de Logt, Vladimir A. Zivkovic, Ingrid H. A. van Baast |
Model-driven AMS Test Setup Validation Tool prepared for IEEE P1687.2. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Dhruv Patel 0002, Derek Wright, Manoj Sachdev |
Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yasamin Moradi, Krishnendu Chakrabarty, Ulf Schlichtmann |
An efficient fault-tolerant valve-based microfluidic routing fabric for single-cell analysis. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy |
Recycled IC detection through aging sensor. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xuanle Ren, R. D. (Shawn) Blanton, Vítor Grade Tavares |
Detection of IJTAG attacks using LDPC-based feature reduction and machine learning. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Sukanta Bhattacharjee, Jack Tang, Mohamed Ibrahim 0002, Krishnendu Chakrabarty, Ramesh Karri |
Locking of biochemical assays for digital microfluidic biochips. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima |
Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaotong Cui, Kaijie Wu 0001, Ramesh Karri |
Hardware Trojan detection using path delay order encoding with process variation tolerance. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Johanna Sepúlveda, Damian Aboul-Hassan, Georg Sigl, Bernd Becker 0001, Matthias Sauer 0002 |
Towards the formal verification of security properties of a Network-on-Chip router. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Imed Jani, Didier Lattard, Pascal Vivet, Lucile Arnaud, Edith Beigné |
BISTs for post-bond test and electrical analysis of high density 3D interconnect defects. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Haralampos-G. D. Stratigopoulos |
Machine learning applications in IC testing. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tong-Yu Hsieh, Shang-En Chan, Chi-Hsuan Ho |
On no-reference on-line error-tolerability testing for videos. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel |
Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jan Schat |
ADC test methods using an impure stimulus: A survey. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Shreyas Pramod Dixit, Divyeshkumar Dhanjibhai Vora, Ke Peng |
Challenges in Cell-Aware Test. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
Device aging: A reliability and security concern. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmed Atteya, Michael A. Kochte, Matthias Sauer 0002, Pascal Raiola, Bernd Becker 0001, Hans-Joachim Wunderlich |
Online prevention of security violations in reconfigurable scan networks. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
Covering hard-to-detect defects by thermal quorum sensing. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ciprian V. Pop, Andi Buzo, Georg Pelz, Horia Cucu, Corneliu Burileanu |
Methodology for determining the influencing factors of lifetime variation for power devices. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Fatemeh Eslami, Eddie Hung, Steven J. E. Wilton |
Extending post-silicon coverage measurement using time-multiplexed FPGA overlays. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | |
23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018 |
ETS |
2018 |
DBLP BibTeX RDF |
|
| 1 | Stefan Holst, Ruijun Ma, Xiaoqing Wen |
The impact of production defects on the soft-error tolerance of hardened latches. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Josep Balasch, Florent Bernard, Viktor Fischer, Milos Grujic, Marek Laban, Oto Petura, Vladimir Rozic, Gerard van Battum, Ingrid Verbauwhede, Marnix Wakker, Bohan Yang 0001 |
Design and testing methodologies for true random number generators towards industry certification. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Covering undetected transition fault sites with optimistic unspecified transition faults under multicycle tests. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Mengyun Liu, Lixue Xia, Yu Wang 0002, Krishnendu Chakrabarty |
Design of fault-tolerant neuromorphic computing systems. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz, Srikanth Venkataraman |
Interconnect-aware tests to complement gate-exhaustive tests. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen |
Automatic generation of in-circuit tests for board assembly defects. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Krzysztof Jurga, Stephen Sunter |
Measuring mixed-signal test stimulus quality. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yumin Zhou, Sebastian Burg, Oliver Bringmann 0001, Wolfgang Rosenstiel |
A software reconfigurable assertion checking unit for run-time error detection. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Sarah Azimi, Boyang Du, Luca Sterpone |
On the mitigation of single event transients on flash-based FPGAs. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu Li 0007, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen |
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jan Peleska 0001 |
Model-based avionic systems testing for the airbus family. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Li-Wei Deng, Jin-Fu Li 0001, Yong-Xiao Chen |
Modeling and testing comparison faults of memristive ternary content addressable memories. |
ETS |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Elena Ioana Vatajelu, Rosa Rodríguez-Montañés, Michel Renovell, Joan Figueras |
Mitigating read & write errors in STT-MRAM memories under DVS. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo |
Scan chain encryption for the test, diagnosis and debug of secure circuits. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
Automatic testing of analog ICs for latent defects using topology modification. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ciprian V. Pop, Corneliu Burileanu, Andi Buzo, Georg Pelz |
Application-aware lifetime estimation of power devices. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Bernd Becker 0001, Adit D. Singh |
Best paper. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh |
Bridge over troubled waters: Critical area based pattern generation. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
ROM fault diagnosis for O(n2) test algorithms. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Yiorgos Tsiatouhas |
Periodic Bias-Temperature Instability monitoring in SRAM cells. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Satyadev Ahlawat, Darshit Vaghani, Virendra Singh |
An efficient test technique to prevent scan-based side-channel attacks. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Suvadeep Banerjee, Abhijit Chatterjee |
Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Jan Schat |
ISO26262-compliant soft-error mitigation in register banks. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li 0001 |
A built-in self-test scheme for classifying refresh periods of DRAMs. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcus Wagner, Hans-Joachim Wunderlich |
Probabilistic sensitization analysis for variation-aware path delay fault test evaluation. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada |
Extension of power supply impedance emulation method on ATE for multiple power domain. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ioannis Voyiatzis |
SIC pair generation in optimal time using rotatable counters. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Tong Guan, Zhaobo Zhang, Wen Dong 0001, Chunming Qiao, Xinli Gu |
Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ingrid Kovacs, Marina Dana Topa, Andi Buzo, Georg Pelz |
Integrated circuits' characterization for non-normal data in semiconductor quality analysis. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh |
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Michele Portolan, Manuel J. Barragán, Rshdee Alhakim, Salvador Mir |
Mixed-signal BIST computation offloading using IEEE 1687. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Wu-Tung Cheng, Yue Tian, Sudhakar M. Reddy |
Volume diagnosis data mining. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Angelos Antonopoulos 0002, Christiana Kapatsori, Yiorgos Makris |
Security and trust in the analog/mixed-signal/RF domain: A survey and a perspective. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori |
Aging-aware coding scheme for memory arrays. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | |
22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017 |
ETS |
2017 |
DBLP BibTeX RDF |
|
| 1 | Hani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Hervé Le Gall |
Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Simon, Deeksha Bhat, Alexander W. Rath, Jérôme Kirscher, Linus Maurer |
Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Andreina Zambrano, Hans G. Kerkhoff |
Improving the dependability of AMR sensors used in automotive applications. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael A. Kochte, Matthias Sauer 0002, Laura Rodríguez Gómez, Pascal Raiola, Bernd Becker 0001, Hans-Joachim Wunderlich |
Specification and verification of security in reconfigurable scan networks. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Mauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi 0001 |
Low power probabilistic online monitoring of systematic erroneous behaviour. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Tareq Muhammad Supon, Rashid Rashidzadeh |
A phase locking test solution for MEMS devices. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamed A. Abufalgha, Alex Bystrov |
Derivation of the reliability metric for digital circuits. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
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