Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Jose Moreira, Bernhard Roth, Hubert Werkmann, Lars Klapproth, Michael Howieson, Mark Broman, Wend Ouedraogo, Mitchell Lin |
An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013, pp. 271-276, 2013, IEEE Computer Society, 978-0-7695-5080-0. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Yuki Mori, Shoichi Akagi, Yasuyuki Nogami, Masaaki Shirase |
Pseudo 8-Sparse Multiplication for Efficient Ate-Based Pairing on Barreto-Naehrig Curve. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2013 - 6th International Conference, Beijing, China, November 22-24, 2013, Revised Selected Papers, pp. 186-198, 2013, Springer, 978-3-319-04872-7. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Panagiotis Sismanoglou, Dimitris Nikolos |
Enhancing dictionary based test data compression using the ATE repeat instruction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECS ![In: 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, UAE, December 8-11, 2013, pp. 401-404, 2013, IEEE. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Kyungho Ryu, Dong-Hoon Jung, Seong-Ook Jung |
All-digital process-variation-calibrated timing generator for ATE with 1.95-ps resolution and a maximum 1.2-GHz test rate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSCIRC ![In: ESSCIRC 2013 - Proceedings of the 39th European Solid-State Circuits Conference, Bucharest, Romania, September 16-20, 2013, pp. 41-44, 2013, IEEE, 978-1-4799-0643-7. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Ming Lu |
An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013, pp. 1-10, 2013, IEEE Computer Society, 978-1-4799-0859-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Praveen Venkataramani, Vishwani D. Agrawal |
ATE test time reduction using asynchronous clock period. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013, pp. 1-10, 2013, IEEE Computer Society, 978-1-4799-0859-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid |
Practical methods for extending ATE to 40 and 50Gbps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013, pp. 1-10, 2013, IEEE Computer Society, 978-1-4799-0859-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta 0001, Rohit Kapur |
An ATE assisted DFD technique for volume diagnosis of scan chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013, pp. 31:1-31:6, 2013, ACM, 978-1-4503-2071-9. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
18 | Masayuki Kimishima |
Introduction to Latest RF ATE with Low Test Cost Solutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 95-C(7), pp. 1147-1153, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Anthony Estrada |
The vector network analyzer - an essential tool in modern ATE measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 15(4), pp. 22-26, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Ashish Gupta, Gaurav Verma |
Bridging Validation and Automatic Test Equipment (ATE) Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISED ![In: International Symposium on Electronic System Design, ISEDs 2012, Kolkata, India, December 19-22, 2012, pp. 148-150, 2012, IEEE, 978-1-4673-4704-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Jose Moreira |
Design of a High Bandwidth Interposer for Performance Evaluation of ATE Test Fixtures at the DUT Socket. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, pp. 191-195, 2012, IEEE Computer Society, 978-1-4673-4555-2. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Jose Moreira, Bernhard Roth, Callum McCowan |
An Active Test Fixture Approach for Testing 28 Gbps Applications Using a Lower Data Rate ATE System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, pp. 264-269, 2012, IEEE Computer Society, 978-1-4673-4555-2. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Shan Chen, Kunpeng Wang, Dongdai Lin |
An Improved Twisted Ate Pairing over KSS Curves with k = 18. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2012 - 5th International Conference, Cologne, Germany, May 16-18, 2012, Revised Selected Papers, pp. 35-45, 2012, Springer, 978-3-642-36333-7. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Santosh Ghosh, Ingrid Verbauwhede, Dipanwita Roy Chowdhury |
Core Based Architecture to Speed Up Optimal Ate Pairing on FPGA Platform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2012 - 5th International Conference, Cologne, Germany, May 16-18, 2012, Revised Selected Papers, pp. 141-159, 2012, Springer, 978-3-642-36333-7. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Dominik Strohmeier, Satu Jumisko-Pyykkö, Alexander Raake |
Toward task-dependent evaluation of web-QoE: Free exploration vs. "Who Ate What?". ![Search on Bibsonomy](Pics/bibsonomy.png) |
GLOBECOM Workshops ![In: Workshops Proceedings of the Global Communications Conference, GLOBECOM 2012, 3-7 December 2012, Anaheim, California, USA, pp. 1309-1313, 2012, IEEE, 978-1-4673-4942-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Janez Trontelj Jr., Blaz Smid, Janez Trontelj 0001 |
Single pass temperature calibration of the ASIC on a general purpose ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECS ![In: 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012, pp. 276-279, 2012, IEEE, 978-1-4673-1261-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Manuel Corregedor, Sebastiaan H. von Solms |
ATE: Anti-malware technique evaluator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSA ![In: 2012 Information Security for South Africa, Balalaika Hotel, Sandton, Johannesburg, South Africa, August 15-17, 2012, pp. 1-8, 2012, IEEE, 978-1-4673-2160-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Florence Azaïs, Laurent Latorre |
Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). ![Search on Bibsonomy](Pics/bibsonomy.png) |
NEWCAS ![In: 10th IEEE International NEWCAS Conference, Montreal, QC, Canada, June 17-20, 2012, pp. 197-200, 2012, IEEE, 978-1-4673-0857-1. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Duc-Phong Le, Chik How Tan |
Speeding Up Ate Pairing Computation in Affine Coordinates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICISC ![In: Information Security and Cryptology - ICISC 2012 - 15th International Conference, Seoul, Korea, November 28-30, 2012, Revised Selected Papers, pp. 262-277, 2012, Springer, 978-3-642-37681-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Jose Moreira, Marc Moessinger, Koji Sasaki, Takayuki Nakamura |
Driver sharing challenges for DDR4 high-volume testing with ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1-10, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada |
Power integrity control of ATE for emulating power supply fluctuations on customer environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1-10, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage |
Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1-7, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Ken Lanier |
Test/ATE vision 2020 - Entrepreneurship in test CEO panel. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Takahiro Nakajima, Takeshi Yaguchi, Hajime Sugimura |
An ATE architecture for implementing very high efficiency concurrent testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1-10, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Yumi Sakemi, Yasuyuki Nogami, Shoichi Takeuchi, Yoshitaka Morikawa |
An Improvement of Twisted Ate Pairing Efficient for Multi-Pairing and Thread Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(6), pp. 1356-1367, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Christoph Wolf, Steffen Zeidler 0001, Milos Krstic, Rolf Kraemer |
Overview on ATE Test and Debugging Methods for Asynchronous Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTV ![In: 12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011, pp. 16-21, 2011, IEEE Computer Society, 978-1-4577-2101-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer |
Reduced ATE Interface for High Test Data Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 99-104, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs |
18 | J. M. Howard, Sudhakar M. Reddy, Irith Pomeranz, Bernd Becker 0001 |
Fault diagnosis aware ATE assisted test response compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011, pp. 812-817, 2011, IEEE, 978-1-4244-7516-2. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Aldo Baccigalupi, Umberto Cesaro, Mauro D'Arco, Annalisa Liccardo |
Web-based networking protocol for expanding IEEE-488 ATE capabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
M&N ![In: IEEE International Workshop on Measurement and Networking, M&N 2011, Anacapri, Italy, October 10-11, 2011, pp. 100-104, 2011, IEEE, 978-1-4577-0455-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Vasileios Tenentes, Xrysovalantis Kavousianos |
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011, San Jose, California, USA, November 7-10, 2011, pp. 747-754, 2011, IEEE Computer Society, 978-1-4577-1399-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Dongsoo Lee, Sang Phill Park, Ashish Goel, Kaushik Roy 0001 |
Memory-based embedded digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA, pp. 266-271, 2011, IEEE Computer Society, 978-1-61284-657-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Mitchell Lin, Tyler Tolman |
Analyzing ATE interconnect performance for serial links of 10 Gbps and above. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-8, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Ivo Koren, Ben Schuffenhauer, Frank Demmerle, Frank Neugebauer, Gert Pfahl, Dirk Rautmann |
Multi-site test of RF transceivers on low-cost digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-10, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Jose Moreira |
Development of an ATE test cell for at-speed characterization and production testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-10, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | A. M. Majid, David C. Keezer |
Multi-function multi-GHz ATE extension using state-of-the-art FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-10, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Dhruva Acharyya, Kosuke Miyao, David Ting, Daniel Lam, Robert Smith, Pete Fitzpatrick, Brian Buras, John Williamson |
Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-10, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
18 | Susannah Kirby, William D. Davies, Stanley Dubinsky |
Up to D[eb]ate on Raising and Control Part 1: Properties and Analyses of the Constructions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Lang. Linguistics Compass ![In: Lang. Linguistics Compass 4(6), pp. 390-400, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Susannah Kirby, William D. Davies, Stanley Dubinsky |
Up to D[eb]ate on Raising and Control Part 2: The Empirical Range of the Constructions and Research on their Acquisition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Lang. Linguistics Compass ![In: Lang. Linguistics Compass 4(6), pp. 401-416, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Fangguo Zhang |
Twisted Ate pairing on hyperelliptic curves and applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. China Inf. Sci. ![In: Sci. China Inf. Sci. 53(8), pp. 1528-1538, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam |
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 26(4), pp. 405-417, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Jean-Luc Beuchat, Jorge Enrique González-Díaz, Shigeo Mitsunari, Eiji Okamoto, Francisco Rodríguez-Henríquez, Tadanori Teruya |
High-Speed Software Implementation of the Optimal Ate Pairing over Barreto-Naehrig Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2010, pp. 354, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
18 | Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou |
Automatic Test Wrapper Synthesis for a Wireless ATE Platform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 27(3), pp. 31-41, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Yumi Sakemi, Hidehiro Kato, Shoichi Takeuchi, Yasuyuki Nogami, Yoshitaka Morikawa |
Two Improvements of Twisted Ate Pairing with Barreto-Naehrig Curve by Dividing Miller's Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Adv. Inf. Sci. Serv. Sci. ![In: Adv. Inf. Sci. Serv. Sci. 2(4), pp. 1-13, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
18 | Yumi Sakemi, Kazushi Nishii, Tetsuya Izuta, Yasuyuki Nogami, Yoshitaka Morikawa |
Accelerating Cross Twisted Ate Pairing with Ordinary Pairing Friendly Curve of Composite Order That Has Two Large Prime Factors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NBiS ![In: The 13th International Conference on Network-Based Information Systems, NBiS 2010, Takayama, Gifu, Japan, 14-16 September 2010, pp. 552-557, 2010, IEEE Computer Society, 978-0-7695-4167-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | A. M. Majid, David C. Keezer |
Stretching the limits of FPGA SerDes for enhanced ATE performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010, pp. 202-207, 2010, IEEE Computer Society, 978-1-4244-7054-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Sachin Dileep Dasnurkar, Jacob A. Abraham |
Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 15th European Test Symposium, ETS 2010, Prague, Czech Republic, May 24-28, 2010, pp. 119-124, 2010, IEEE Computer Society, 978-1-4244-5833-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir |
On the use of standard digital ATE for the analysis of RF signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 15th European Test Symposium, ETS 2010, Prague, Czech Republic, May 24-28, 2010, pp. 43-48, 2010, IEEE Computer Society, 978-1-4244-5833-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Jean-Luc Beuchat, Jorge Enrique González-Díaz, Shigeo Mitsunari, Eiji Okamoto, Francisco Rodríguez-Henríquez, Tadanori Teruya |
High-Speed Software Implementation of the Optimal Ate Pairing over Barreto-Naehrig Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2010 - 4th International Conference, Yamanaka Hot Spring, Japan, December 2010. Proceedings, pp. 21-39, 2010, Springer, 978-3-642-17454-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Gong-Han Chen, Po-Han Wu, Jiann-Chyi Rau |
Multi-chains encoding scheme in low-cost ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France, pp. 1587-1590, 2010, IEEE, 978-1-4244-5308-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Sachin Dileep Dasnurkar, Jacob A. Abraham |
Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA, pp. 562-569, 2010, IEEE, 978-1-4244-6455-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Kenneth Spargo |
AXIe® 2.0 and MVP-C: Open ATE software standards. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, pp. 802, 2010, IEEE Computer Society, 978-1-4244-7206-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Sadok Aouini, Kun Chuai, Gordon W. Roberts |
A low-cost ATE phase signal generation technique for test applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, pp. 29-38, 2010, IEEE Computer Society, 978-1-4244-7206-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Suri Basharapandiyan, Yi Cai |
Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, pp. 599-605, 2010, IEEE Computer Society, 978-1-4244-7206-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
18 | Apala Lahiri Chavan, Douglas Gorney, Beena Prabhu, Sarit Arora |
Cover Story - The washing machine that ate my sari---mistakes in cross-cultural design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Interactions ![In: Interactions 16(1), pp. 26-31, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Yasuyuki Nogami, Yumi Sakemi, Takumi Okimoto, Kenta Nekado, Masataka Akane, Yoshitaka Morikawa |
Scalar Multiplication Using Frobenius Expansion over Twisted Elliptic Curve for Ate Pairing Based Cryptography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(1), pp. 182-189, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Yasuyuki Nogami, Yumi Sakemi, Hidehiro Kato, Masataka Akane, Yoshitaka Morikawa |
Integer Variable chi-Based Cross Twisted Ate Pairing and Its Optimization for Barreto-Naehrig Curve. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(8), pp. 1859-1867, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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18 | Masataka Akane, Yasuyuki Nogami, Yoshitaka Morikawa |
Fast Ate Pairing Computation of Embedding Degree 12 Using Subfield-Twisted Elliptic Curve. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(2), pp. 508-516, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Masaaki Shirase |
Universally Constructing 12-th Degree Extension Field for Ate Pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2009, pp. 623, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
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18 | David Wiese, Gennadi Rabinovitch, Michael Reichert, Stephan Arenswald |
ATE: Workload-Oriented DB2 Tuning in Action. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BTW ![In: Datenbanksysteme in Business, Technologie und Web (BTW 2009), 13. Fachtagung des GI-Fachbereichs `Datenbanken und Informationssysteme` (DBIS), Proceedings, 2.-6. März 2009, Münster, Germany, pp. 620-623, 2009, GI, 978-3-88579-238-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
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18 | Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir |
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan, pp. 261-266, 2009, IEEE Computer Society, 978-0-7695-3864-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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18 | Yumi Sakemi, Shoichi Takeuchi, Yasuyuki Nogami, Yoshitaka Morikawa |
Accelerating Twisted Ate Pairing with Frobenius Map, Small Scalar Multiplication, and Multi-pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICISC ![In: Information, Security and Cryptology - ICISC 2009, 12th International Conference, Seoul, Korea, December 2-4, 2009, Revised Selected Papers, pp. 47-64, 2009, Springer, 978-3-642-14422-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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18 | Xibin Lin, Changan Zhao, Fangguo Zhang, Yanming Wang |
Computing the Ate Pairing on Elliptic Curves with Embedding Degree k = 9. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(9), pp. 2387-2393, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Zhitu Su, Hui Li 0006, Jianfeng Ma 0001 |
Polynomials for Ate Pairing and Atei Pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2008, pp. 202, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
18 | Fangguo Zhang |
Twisted Ate Pairing on Hyperelliptic Curves and Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2008, pp. 274, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
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18 | Mustafa Badaroglu, Guy Decabooter, Francois Laulanet, Olivier Charlier |
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 873-878, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | William Fritzsche, Asim E. Haque |
Low cost testing of multi-GBit device pins with ATE assisted loopback instrument. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-8, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler |
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-9, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Bethany Van Wagenen, Jon Vollmar, Dan Thornton |
Leveraging IEEE 1641 for Tester-Independent ATE Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-10, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, Rakesh Mehta, Tim Alton |
An Integrated Environment for Design Verification of ATE Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 56(5), pp. 1734-1743, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Bernd Laquai, Michael Braun, S. Walther, Guido Schulze |
Flexible and scalable methodology for testing high-speed source synchronous interfaces on automated test equipment (ATE) with multiple fixed phase capture and compare. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 1(3), pp. 154-158, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Erik Larsson, Stina Edbom |
Test data truncation for test quality maximisation under ATE memory depth constraint. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 1(1), pp. 27-37, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Xibin Lin, Changan Zhao, Fangguo Zhang, Yanming Wang |
Computing the Ate Pairing on Elliptic Curves with Embedding Degree k=9. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2007, pp. 434, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP BibTeX RDF |
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18 | Changan Zhao, Fangguo Zhang, Jiwu Huang |
A Note on the Ate Pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2007, pp. 247, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP BibTeX RDF |
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18 | Dan Zhao, Ronghua Huang, Hideo Fujiwara |
Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring Multi-Port ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007, pp. 107-110, 2007, IEEE, 0-7695-2890-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Yasuharu Kohiyama, C. P. Ravikumar, Yasuo Sato, Laung-Terng Wang, Yervant Zorian |
Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007, pp. 207, 2007, IEEE, 0-7695-2890-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Tongdan Jin, Fethi Belkhouche, Chen-Han Sung |
A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CASE ![In: IEEE Conference on Automation Science and Engineering, CASE 2007, September 22-25, 2007. Scottsdale, Arizona, USA, pp. 188-193, 2007, IEEE, 978-1-4244-1154-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Yongquan Fan, Yi Cai, Zeljko Zilic |
A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-10, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | William J. Bowhers |
Management of common-mode currents in semiconductor ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-9, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Jose Moreira, Heidi Barnes, Guenter Hoersch |
Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-10, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Andrew C. Evans |
The new ATE: Protocol aware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-10, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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18 | Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi |
Evaluating the Yield of Repairable SRAMs for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 55(5), pp. 1704-1712, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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18 | Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer |
Measuring the timing jitter of ATE in the frequency domain. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 55(1), pp. 280-289, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Ryuichi Harasawa, Yutaka Sueyoshi, Aichi Kudo |
Ate pairing for y2=x5-αx in characteristic five. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2006, pp. 202, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP BibTeX RDF |
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18 | Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee |
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 658-663, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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18 | Jinkyu Lee 0005, Nur A. Touba |
Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006, pp. 237-244, 2006, IEEE, 0-7695-2628-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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18 | Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe |
1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: 2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006, pp. 2122-2131, 2006, IEEE, 1-4244-0079-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Susan Postma |
A great big robot from outer space ate my homework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGGRAPH Computer Animation Festival ![In: International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2006, Boston, Massachusetts, USA, July 30 - August 3, 2006, Computer Animation Festival, pp. 182, 2006, ACM, 978-1-59593-364-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Sverre Wichlund, Frank Berntsen, Einar J. Aas |
Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 119-127, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Sadok Aouini, Gordon W. Roberts |
A Predictable Robust Fully Programmable Analog Gaussian Noise Source for Mixed-Signal/Digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-10, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Fengming Zhang, Warren Necoechea |
ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-7, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Jochen Rivoir |
Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-10, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar |
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-10, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Rochit Rajsuman, Masuda Noriyuki, Kazuhiro Yamashita |
Architecture and design of an open ATE to incubate the development of third-party instruments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 54(5), pp. 1678-1698, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Katsuhito Nagano |
CAD navigation and diagnostics by linking ATE and EDA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 54(5), pp. 1699-1707, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Brian Arkin |
Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 6, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Eric Kushnick |
The PXI carrier: a novel approach to ATE instrument development. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 7, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Dan Proskauer |
"Driver on a floppy" delivery of ATE instrumentation software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 8, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Ralf Arnold, Andreas Leininger |
Evaluating ATE-equipment for volume diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 9, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | William Fritzsche |
Development of a software framework for open architecture ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 8, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|