Search results for "ATE"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Jose Moreira, Bernhard Roth, Hubert Werkmann, Lars Klapproth, Michael Howieson, Mark Broman, Wend Ouedraogo, Mitchell Lin	An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System.	Asian Test Symposium	2013	DBLP DOI BibTeX RDF
18	Yuki Mori, Shoichi Akagi, Yasuyuki Nogami, Masaaki Shirase	Pseudo 8-Sparse Multiplication for Efficient Ate-Based Pairing on Barreto-Naehrig Curve.	Pairing	2013	DBLP DOI BibTeX RDF
18	Panagiotis Sismanoglou, Dimitris Nikolos	Enhancing dictionary based test data compression using the ATE repeat instruction.	ICECS	2013	DBLP DOI BibTeX RDF
18	Kyungho Ryu, Dong-Hoon Jung, Seong-Ook Jung	All-digital process-variation-calibrated timing generator for ATE with 1.95-ps resolution and a maximum 1.2-GHz test rate.	ESSCIRC	2013	DBLP DOI BibTeX RDF
18	Ming Lu	An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE.	ITC	2013	DBLP DOI BibTeX RDF
18	Praveen Venkataramani, Vishwani D. Agrawal	ATE test time reduction using asynchronous clock period.	ITC	2013	DBLP DOI BibTeX RDF
18	David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid	Practical methods for extending ATE to 40 and 50Gbps.	ITC	2013	DBLP DOI BibTeX RDF
18	Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta 0001, Rohit Kapur	An ATE assisted DFD technique for volume diagnosis of scan chains.	DAC	2013	DBLP DOI BibTeX RDF
18	Masayuki Kimishima	Introduction to Latest RF ATE with Low Test Cost Solutions.	IEICE Trans. Electron.	2012	DBLP DOI BibTeX RDF
18	Anthony Estrada	The vector network analyzer - an essential tool in modern ATE measurements.	IEEE Instrum. Meas. Mag.	2012	DBLP DOI BibTeX RDF
18	Ashish Gupta, Gaurav Verma	Bridging Validation and Automatic Test Equipment (ATE) Environment.	ISED	2012	DBLP DOI BibTeX RDF
18	Jose Moreira	Design of a High Bandwidth Interposer for Performance Evaluation of ATE Test Fixtures at the DUT Socket.	Asian Test Symposium	2012	DBLP DOI BibTeX RDF
18	Jose Moreira, Bernhard Roth, Callum McCowan	An Active Test Fixture Approach for Testing 28 Gbps Applications Using a Lower Data Rate ATE System.	Asian Test Symposium	2012	DBLP DOI BibTeX RDF
18	Shan Chen, Kunpeng Wang, Dongdai Lin	An Improved Twisted Ate Pairing over KSS Curves with k = 18.	Pairing	2012	DBLP DOI BibTeX RDF
18	Santosh Ghosh, Ingrid Verbauwhede, Dipanwita Roy Chowdhury	Core Based Architecture to Speed Up Optimal Ate Pairing on FPGA Platform.	Pairing	2012	DBLP DOI BibTeX RDF
18	Dominik Strohmeier, Satu Jumisko-Pyykkö, Alexander Raake	Toward task-dependent evaluation of web-QoE: Free exploration vs. "Who Ate What?".	GLOBECOM Workshops	2012	DBLP DOI BibTeX RDF
18	Janez Trontelj Jr., Blaz Smid, Janez Trontelj 0001	Single pass temperature calibration of the ASIC on a general purpose ATE.	ICECS	2012	DBLP DOI BibTeX RDF
18	Manuel Corregedor, Sebastiaan H. von Solms	ATE: Anti-malware technique evaluator.	ISSA	2012	DBLP DOI BibTeX RDF
18	Florence Azaïs, Laurent Latorre	Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE).	NEWCAS	2012	DBLP DOI BibTeX RDF
18	Duc-Phong Le, Chik How Tan	Speeding Up Ate Pairing Computation in Affine Coordinates.	ICISC	2012	DBLP DOI BibTeX RDF
18	Jose Moreira, Marc Moessinger, Koji Sasaki, Takayuki Nakamura	Driver sharing challenges for DDR4 high-volume testing with ATE.	ITC	2012	DBLP DOI BibTeX RDF
18	Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada	Power integrity control of ATE for emulating power supply fluctuations on customer environment.	ITC	2012	DBLP DOI BibTeX RDF
18	Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage	Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction.	ITC	2012	DBLP DOI BibTeX RDF
18	Ken Lanier	Test/ATE vision 2020 - Entrepreneurship in test CEO panel.	ITC	2012	DBLP DOI BibTeX RDF
18	Takahiro Nakajima, Takeshi Yaguchi, Hajime Sugimura	An ATE architecture for implementing very high efficiency concurrent testing.	ITC	2012	DBLP DOI BibTeX RDF
18	Yumi Sakemi, Yasuyuki Nogami, Shoichi Takeuchi, Yoshitaka Morikawa	An Improvement of Twisted Ate Pairing Efficient for Multi-Pairing and Thread Computing.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2011	DBLP DOI BibTeX RDF
18	Christoph Wolf, Steffen Zeidler 0001, Milos Krstic, Rolf Kraemer	Overview on ATE Test and Debugging Methods for Asynchronous Circuits.	MTV	2011	DBLP DOI BibTeX RDF
18	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer	Reduced ATE Interface for High Test Data Compression.	ETS	2011	DBLP DOI BibTeX RDF	channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
18	J. M. Howard, Sudhakar M. Reddy, Irith Pomeranz, Bernd Becker 0001	Fault diagnosis aware ATE assisted test response compaction.	ASP-DAC	2011	DBLP DOI BibTeX RDF
18	Aldo Baccigalupi, Umberto Cesaro, Mauro D'Arco, Annalisa Liccardo	Web-based networking protocol for expanding IEEE-488 ATE capabilities.	M&N	2011	DBLP DOI BibTeX RDF
18	Vasileios Tenentes, Xrysovalantis Kavousianos	Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs.	ICCAD	2011	DBLP DOI BibTeX RDF
18	Dongsoo Lee, Sang Phill Park, Ashish Goel, Kaushik Roy 0001	Memory-based embedded digital ATE.	VTS	2011	DBLP DOI BibTeX RDF
18	Mitchell Lin, Tyler Tolman	Analyzing ATE interconnect performance for serial links of 10 Gbps and above.	ITC	2011	DBLP DOI BibTeX RDF
18	Ivo Koren, Ben Schuffenhauer, Frank Demmerle, Frank Neugebauer, Gert Pfahl, Dirk Rautmann	Multi-site test of RF transceivers on low-cost digital ATE.	ITC	2011	DBLP DOI BibTeX RDF
18	Jose Moreira	Development of an ATE test cell for at-speed characterization and production testing.	ITC	2011	DBLP DOI BibTeX RDF
18	A. M. Majid, David C. Keezer	Multi-function multi-GHz ATE extension using state-of-the-art FPGAs.	ITC	2011	DBLP DOI BibTeX RDF
18	Dhruva Acharyya, Kosuke Miyao, David Ting, Daniel Lam, Robert Smith, Pete Fitzpatrick, Brian Buras, John Williamson	Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current.	ITC	2011	DBLP DOI BibTeX RDF
18	Susannah Kirby, William D. Davies, Stanley Dubinsky	Up to D[eb]ate on Raising and Control Part 1: Properties and Analyses of the Constructions.	Lang. Linguistics Compass	2010	DBLP DOI BibTeX RDF
18	Susannah Kirby, William D. Davies, Stanley Dubinsky	Up to D[eb]ate on Raising and Control Part 2: The Empirical Range of the Constructions and Research on their Acquisition.	Lang. Linguistics Compass	2010	DBLP DOI BibTeX RDF
18	Fangguo Zhang	Twisted Ate pairing on hyperelliptic curves and applications.	Sci. China Inf. Sci.	2010	DBLP DOI BibTeX RDF
18	Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam	Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.	J. Electron. Test.	2010	DBLP DOI BibTeX RDF
18	Jean-Luc Beuchat, Jorge Enrique González-Díaz, Shigeo Mitsunari, Eiji Okamoto, Francisco Rodríguez-Henríquez, Tadanori Teruya	High-Speed Software Implementation of the Optimal Ate Pairing over Barreto-Naehrig Curves.	IACR Cryptol. ePrint Arch.	2010	DBLP BibTeX RDF
18	Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou	Automatic Test Wrapper Synthesis for a Wireless ATE Platform.	IEEE Des. Test Comput.	2010	DBLP DOI BibTeX RDF
18	Yumi Sakemi, Hidehiro Kato, Shoichi Takeuchi, Yasuyuki Nogami, Yoshitaka Morikawa	Two Improvements of Twisted Ate Pairing with Barreto-Naehrig Curve by Dividing Miller's Algorithm.	Adv. Inf. Sci. Serv. Sci.	2010	DBLP BibTeX RDF
18	Yumi Sakemi, Kazushi Nishii, Tetsuya Izuta, Yasuyuki Nogami, Yoshitaka Morikawa	Accelerating Cross Twisted Ate Pairing with Ordinary Pairing Friendly Curve of Composite Order That Has Two Large Prime Factors.	NBiS	2010	DBLP DOI BibTeX RDF
18	A. M. Majid, David C. Keezer	Stretching the limits of FPGA SerDes for enhanced ATE performance.	DATE	2010	DBLP DOI BibTeX RDF
18	Sachin Dileep Dasnurkar, Jacob A. Abraham	Calibration-enabled scalable built-in current sensor compatible with very low cost ATE.	ETS	2010	DBLP DOI BibTeX RDF
18	Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir	On the use of standard digital ATE for the analysis of RF signals.	ETS	2010	DBLP DOI BibTeX RDF
18	Jean-Luc Beuchat, Jorge Enrique González-Díaz, Shigeo Mitsunari, Eiji Okamoto, Francisco Rodríguez-Henríquez, Tadanori Teruya	High-Speed Software Implementation of the Optimal Ate Pairing over Barreto-Naehrig Curves.	Pairing	2010	DBLP DOI BibTeX RDF
18	Gong-Han Chen, Po-Han Wu, Jiann-Chyi Rau	Multi-chains encoding scheme in low-cost ATE.	ISCAS	2010	DBLP DOI BibTeX RDF
18	Sachin Dileep Dasnurkar, Jacob A. Abraham	Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM.	ISQED	2010	DBLP DOI BibTeX RDF
18	Kenneth Spargo	AXIe® 2.0 and MVP-C: Open ATE software standards.	ITC	2010	DBLP DOI BibTeX RDF
18	Sadok Aouini, Kun Chuai, Gordon W. Roberts	A low-cost ATE phase signal generation technique for test applications.	ITC	2010	DBLP DOI BibTeX RDF
18	Suri Basharapandiyan, Yi Cai	Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs.	ITC	2010	DBLP DOI BibTeX RDF
18	Apala Lahiri Chavan, Douglas Gorney, Beena Prabhu, Sarit Arora	Cover Story - The washing machine that ate my sari---mistakes in cross-cultural design.	Interactions	2009	DBLP DOI BibTeX RDF
18	Yasuyuki Nogami, Yumi Sakemi, Takumi Okimoto, Kenta Nekado, Masataka Akane, Yoshitaka Morikawa	Scalar Multiplication Using Frobenius Expansion over Twisted Elliptic Curve for Ate Pairing Based Cryptography.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2009	DBLP DOI BibTeX RDF
18	Yasuyuki Nogami, Yumi Sakemi, Hidehiro Kato, Masataka Akane, Yoshitaka Morikawa	Integer Variable chi-Based Cross Twisted Ate Pairing and Its Optimization for Barreto-Naehrig Curve.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2009	DBLP DOI BibTeX RDF
18	Masataka Akane, Yasuyuki Nogami, Yoshitaka Morikawa	Fast Ate Pairing Computation of Embedding Degree 12 Using Subfield-Twisted Elliptic Curve.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2009	DBLP DOI BibTeX RDF
18	Masaaki Shirase	Universally Constructing 12-th Degree Extension Field for Ate Pairing.	IACR Cryptol. ePrint Arch.	2009	DBLP BibTeX RDF
18	David Wiese, Gennadi Rabinovitch, Michael Reichert, Stephan Arenswald	ATE: Workload-Oriented DB2 Tuning in Action.	BTW	2009	DBLP BibTeX RDF
18	Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir	Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
18	Yumi Sakemi, Shoichi Takeuchi, Yasuyuki Nogami, Yoshitaka Morikawa	Accelerating Twisted Ate Pairing with Frobenius Map, Small Scalar Multiplication, and Multi-pairing.	ICISC	2009	DBLP DOI BibTeX RDF
18	Xibin Lin, Changan Zhao, Fangguo Zhang, Yanming Wang	Computing the Ate Pairing on Elliptic Curves with Embedding Degree k = 9.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2008	DBLP DOI BibTeX RDF
18	Zhitu Su, Hui Li 0006, Jianfeng Ma 0001	Polynomials for Ate Pairing and Atei Pairing.	IACR Cryptol. ePrint Arch.	2008	DBLP BibTeX RDF
18	Fangguo Zhang	Twisted Ate Pairing on Hyperelliptic Curves and Applications.	IACR Cryptol. ePrint Arch.	2008	DBLP BibTeX RDF
18	Mustafa Badaroglu, Guy Decabooter, Francois Laulanet, Olivier Charlier	Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment.	DATE	2008	DBLP DOI BibTeX RDF
18	William Fritzsche, Asim E. Haque	Low cost testing of multi-GBit device pins with ATE assisted loopback instrument.	ITC	2008	DBLP DOI BibTeX RDF
18	Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler	Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms.	ITC	2008	DBLP DOI BibTeX RDF
18	Bethany Van Wagenen, Jon Vollmar, Dan Thornton	Leveraging IEEE 1641 for Tester-Independent ATE Software.	ITC	2008	DBLP DOI BibTeX RDF
18	Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, Rakesh Mehta, Tim Alton	An Integrated Environment for Design Verification of ATE Systems.	IEEE Trans. Instrum. Meas.	2007	DBLP DOI BibTeX RDF
18	Bernd Laquai, Michael Braun, S. Walther, Guido Schulze	Flexible and scalable methodology for testing high-speed source synchronous interfaces on automated test equipment (ATE) with multiple fixed phase capture and compare.	IET Comput. Digit. Tech.	2007	DBLP DOI BibTeX RDF
18	Erik Larsson, Stina Edbom	Test data truncation for test quality maximisation under ATE memory depth constraint.	IET Comput. Digit. Tech.	2007	DBLP DOI BibTeX RDF
18	Xibin Lin, Changan Zhao, Fangguo Zhang, Yanming Wang	Computing the Ate Pairing on Elliptic Curves with Embedding Degree k=9.	IACR Cryptol. ePrint Arch.	2007	DBLP BibTeX RDF
18	Changan Zhao, Fangguo Zhang, Jiwu Huang	A Note on the Ate Pairing.	IACR Cryptol. ePrint Arch.	2007	DBLP BibTeX RDF
18	Dan Zhao, Ronghua Huang, Hideo Fujiwara	Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring Multi-Port ATE.	ATS	2007	DBLP DOI BibTeX RDF
18	Yasuharu Kohiyama, C. P. Ravikumar, Yasuo Sato, Laung-Terng Wang, Yervant Zorian	Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides.	ATS	2007	DBLP DOI BibTeX RDF
18	Tongdan Jin, Fethi Belkhouche, Chen-Han Sung	A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime.	CASE	2007	DBLP DOI BibTeX RDF
18	Yongquan Fan, Yi Cai, Zeljko Zilic	A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata.	ITC	2007	DBLP DOI BibTeX RDF
18	William J. Bowhers	Management of common-mode currents in semiconductor ATE.	ITC	2007	DBLP DOI BibTeX RDF
18	Jose Moreira, Heidi Barnes, Guenter Hoersch	Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications.	ITC	2007	DBLP DOI BibTeX RDF
18	Andrew C. Evans	The new ATE: Protocol aware.	ITC	2007	DBLP DOI BibTeX RDF
18	Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi	Evaluating the Yield of Repairable SRAMs for ATE.	IEEE Trans. Instrum. Meas.	2006	DBLP DOI BibTeX RDF
18	Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer	Measuring the timing jitter of ATE in the frequency domain.	IEEE Trans. Instrum. Meas.	2006	DBLP DOI BibTeX RDF
18	Ryuichi Harasawa, Yutaka Sueyoshi, Aichi Kudo	Ate pairing for y2=x5-αx in characteristic five.	IACR Cryptol. ePrint Arch.	2006	DBLP BibTeX RDF
18	Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee	Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.	DATE	2006	DBLP DOI BibTeX RDF
18	Jinkyu Lee 0005, Nur A. Touba	Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition.	ATS	2006	DBLP DOI BibTeX RDF
18	Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe	1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications.	ISSCC	2006	DBLP DOI BibTeX RDF
18	Susan Postma	A great big robot from outer space ate my homework.	SIGGRAPH Computer Animation Festival	2006	DBLP DOI BibTeX RDF
18	Sverre Wichlund, Frank Berntsen, Einar J. Aas	Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor.	DFT	2006	DBLP DOI BibTeX RDF
18	Sadok Aouini, Gordon W. Roberts	A Predictable Robust Fully Programmable Analog Gaussian Noise Source for Mixed-Signal/Digital ATE.	ITC	2006	DBLP DOI BibTeX RDF
18	Fengming Zhang, Warren Necoechea	ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE.	ITC	2006	DBLP DOI BibTeX RDF
18	Jochen Rivoir	Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration.	ITC	2006	DBLP DOI BibTeX RDF
18	Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar	An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.	ITC	2006	DBLP DOI BibTeX RDF
18	Rochit Rajsuman, Masuda Noriyuki, Kazuhiro Yamashita	Architecture and design of an open ATE to incubate the development of third-party instruments.	IEEE Trans. Instrum. Meas.	2005	DBLP DOI BibTeX RDF
18	Katsuhito Nagano	CAD navigation and diagnostics by linking ATE and EDA.	IEEE Trans. Instrum. Meas.	2005	DBLP DOI BibTeX RDF
18	Brian Arkin	Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers.	ITC	2005	DBLP DOI BibTeX RDF
18	Eric Kushnick	The PXI carrier: a novel approach to ATE instrument development.	ITC	2005	DBLP DOI BibTeX RDF
18	Dan Proskauer	"Driver on a floppy" delivery of ATE instrumentation software.	ITC	2005	DBLP DOI BibTeX RDF
18	Ralf Arnold, Andreas Leininger	Evaluating ATE-equipment for volume diagnosis.	ITC	2005	DBLP DOI BibTeX RDF
18	William Fritzsche	Development of a software framework for open architecture ATE.	ITC	2005	DBLP DOI BibTeX RDF