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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 199 occurrences of 154 keywords
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Results
Found 896 publication records. Showing 896 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
A very low cost and highly parallel DfT method for analog and mixed-signal circuits.  |
ETS  |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein |
Automated area and coverage optimization of minimal latency checkers. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis |
Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Maria K. Michael, Rolf Drechsler, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken |
Foreword. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
Exploiting STT-MRAM for approximate computing. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcelino Seif, Emna Farjallah, Franck Badets, Emna Chabchoub, Christophe Layer, Jean-Marc Armani, Francis Joffre, Costin Anghel, Luigi Dilillo, Valentin Gherman |
Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, Alex Orailoglu |
Detecting hardware Trojans without a Golden IC through clock-tree defined circuit partitions. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Rasool Sharifi, Zainalabedin Navabi |
Online Profiling for cluster-specific variable rate refreshing in high-density DRAM systems. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ondrej Novák |
Extended binary nonlinear codes and their application in testing and compression. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
Multiple-defect diagnosis for Logic Characterization Vehicles. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Ilia Polian, Francesco Regazzoni 0001 |
Counteracting malicious faults in cryptographic circuits. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Naghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley |
Impact of the switching activity on the aging of delay-PUFs. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Maryam Shafiee, Sule Ozev |
Contact-less near-field measurement of RF phased array antenna mismatches. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Enrico Fraccaroli, Luca Piccolboni, Franco Fummi |
A homogeneous framework for AMS languages instrumentation, abstraction and simulation. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda |
An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Panagiotis Georgiou, Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
Two-dimensional time-division multiplexing for 3D-SoCs. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Te-Hui Chen, David C. Keezer |
A 40Gbps economic extension board and FPGA-based testing platform. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Satish Grandhi, Elsa Dupraz, Christian Spagnol, Valentin Savin, Emanuel M. Popovici |
CPE: Codeword Prediction Encoder. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Shaofu Yang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
Testing of small delay faults in a clock network. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Michele Portolan |
A novel test generation and application flow for functional access to IEEE 1687 instruments. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Illani Mohd Nawi, Basel Halak, Mark Zwolinski |
The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda, Guillaume Renaud, Manuel J. Barragán, Salvador Mir |
Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter Sarson |
Group delay filter measurement using a chirp. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Niels Thole, Lorena Anghel, Görschwin Fey |
A hybrid algorithm to conservatively check the robustness of circuits. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael A. Kochte, Rafal Baranowski, Matthias Sauer 0002, Bernd Becker 0001, Hans-Joachim Wunderlich |
Formal verification of secure reconfigurable scan network infrastructure. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmed Ibrahim 0001, Hans G. Kerkhoff |
Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski |
Transistor stuck-on fault detection tests for digital CMOS circuits. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Amin Vali, Nicola Nicolici |
Bit-flip detection-driven selection of trace signals. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Jing Zhang, Lars-Johan Fritz, Liang Liu 0002, Erik Larsson |
Compressor design for silicon debug. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Boyang Du, Luca Sterpone, David Merodio Codinachs |
A new EDA flow for the mitigation of SEUs in dynamic reconfigurable FPGAs. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard 0001, Matteo Sonza Reorda |
A low-cost susceptibility analysis methodology to selectively harden logic circuits. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Nasim Pour Aryan, Christian Funke, Jens Bargfrede, Cenk Yilmaz, Doris Schmitt-Landsiedel, Georg Georgakos |
In situ measurement of aging-induced performance degradation in digital circuits. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Weida Chen, Yongxin Zhu 0001, Xinyi Liu, Xinyang Li, Dongyu Ou |
Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson |
On the diagnostic analysis of IEEE 1687 networks. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Seetal Potluri, Satya Trinadh, Siddhant Saraf, Kamakoti Veezhinathan |
Component fault localization using switching current measurements. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Subhasish Mitra |
Cross-layer resilience. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
Read path degradation analysis in SRAM. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Gildas Léger, Manuel J. Barragán |
Questioning the reliability of Monte Carlo simulation for machine learning test validation. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Ran Wang 0002, Krishnendu Chakrabarty |
A design-for-test solution for monolithic 3D integrated circuits. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Huhn 0001, Stephan Eggersglüß, Rolf Drechsler |
VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Salem Abdennadher, Saghir A. Shaikh |
Practices in High-Speed IO testing. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Varadan Savulimedu Veeravalli, Andreas Steininger |
Study of a delayed single-event effect in the Muller C-element. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Stavros Hadjitheophanous, Stelios N. Neophytou, Maria K. Michael |
Utilizing shared memory multi-cores to speed-up the ATPG process. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Friedrich Hapke, Huaxing Tang |
Cell-aware diagnosis: Defective inmates exposed in their cells. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Han-Yu Wu, Yong-Xiao Chen, Jin-Fu Li 0001 |
A built-in method for measuring the delay of TSVs in 3D ICs. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheng-Wen Wu |
Is IoT coming to the rescue of semiconductor? |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
Measuring defect tolerance within mixed-signal ICs. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Lars Reger |
Securely connected vehicles - what it takes to make self-driving cars a reality. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang 0001, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes |
IoT: Source of test challenges. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Jun Nishimaki, Toshinori Hosokawa, Hideo Fujiwara |
A scheduling method for hierarchical testability based on test environment generation results. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
Addressing transient routing errors in fault-tolerant Networks-on-Chips. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Francisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac |
Behavior and test of open-gate defects in FinFET based cells. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Phil Nigh |
Testing in the year 2024 - big changes are coming. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Ithihasa Reddy Nirmala, Deepak Vontela, Swaroop Ghosh, Anirudh Iyengar |
A novel threshold voltage defined switch for circuit camouflaging. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue |
Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu |
A fast sweep-line-based failure pattern extractor for memory diagnosis. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian |
Failure mechanisms and test methods for the SRAM TVC write-assist technique. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen |
SAT-based post-processing for regional capture power reduction in at-speed scan test generation. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson |
A self-reconfiguring IEEE 1687 network for fault monitoring. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Erik Jan Marinissen, Teresa L. McLaurin, Hailong Jiao |
IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Jean Durupt, Pascal Vivet, Juergen Schloeffel |
IJTAG supported 3D DFT using chiplet-footprints for testing multi-chips active interposer system. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos |
ETS 2016 foreword. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Adit D. Singh |
Cell Aware and stuck-open tests. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Koneru, Krishnendu Chakrabarty |
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhout, Bryan Bolt |
Test-station for flexible semi-automatic wafer-level silicon photonics testing. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Artur Jutman, Igor Aleksejev, Sergei Devadze |
On coverage of timing related faults at board level. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | |
21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016 |
ETS |
2016 |
DBLP BibTeX RDF |
|
| 1 | Paolo Gai, Massimo Violante |
Automotive embedded software architecture in the multi-core age. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Hans-Joachim Wunderlich, Peter C. Maxwell |
ETS 2015 best paper. |
ETS |
2016 |
DBLP DOI BibTeX RDF |
|
| 1 | Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park |
Efficient diagnosis technique for aging defects on automotive semiconductor chips. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Mario Schölzel, Patryk Skoncej |
Software-based repair for memories in tiny embedded systems. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Elena I. Vatajelu, Rosa Rodríguez-Montañés, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras |
Power-aware voltage tuning for STT-MRAM reliability. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Stelios N. Neophytou, Maria K. Michael |
Tackling the complexity of exact path delay fault grading for path intensive circuits. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez 0001, Alessandro Sansonetti |
Software-based self-test techniques of computational modules in dual issue embedded processors. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Vasileios Tenentes, Daniele Rossi 0001, S. Saqib Khursheed, Bashir M. Al-Hashimi |
Diagnosis of power switches with power-distribution-network consideration. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Ioannis Voyiatzis |
Symmetric transparent on-line BIST of word-organized memories with binary adders. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Linus Feiten, Tobias Martin, Matthias Sauer 0002, Bernd Becker 0001 |
Improving RO-PUF quality on FPGAs by incorporating design-dependent frequency biases. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Yukiya Miura, Tatsunori Ikeda |
LSI aging estimation using ring oscillators. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001 |
An effective hybrid fault-tolerant architecture for pipelined cores. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato |
An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Alessandro Vallero, Alessandro Savino, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Gianfranco Politano, Dimitris Gizopoulos, Stefano Di Carlo |
A Bayesian model for system level reliability estimation. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui |
On resistive open defect detection in DRAMs: The charge accumulation effect. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre |
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Bram Kruseman |
Testing of Analog/Mixed Signal ICs: Past, present and future. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Karsten Scheibler, Dominik Erb, Bernd Becker 0001 |
Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Douglas Goodman |
Expanding the boundaries of test and diagnostics: Prognostics and Health Management (PHM) for complex systems. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Jinbo Wan, Hans G. Kerkhoff |
New drain current model for nano-meter MOS transistors on-chip threshold voltage test. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Florence Azaïs |
Analog test: Why still "à la mode" after more than 25 years of research? |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue |
A practical approach for logic simplification based on fault acceptability for error tolerant application. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu Huang 0005, Wu Yang, Wu-Tung Cheng |
Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt |
Protecting caches against multi-bit errors using embedded erasure coding. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai |
A low capture power test generation method using capture safe test vectors. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre |
Session-less based thermal-aware 3D-SIC test scheduling. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Ismail Emre Araci, Paul Pop, Krishnendu Chakrabarty |
Microfluidic very large-scale integration for biochips: Technology, testing and fault-tolerant design. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Marco Gaudesi, Matteo Sonza Reorda, Irith Pomeranz |
On test program compaction. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
Robust amplitude measurement for RF BIST applications. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo |
An FPGA-based ATE extension module for low-cost multi-GHz memory test. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou |
Improve the compression ratios for code-based test vector compressions by decomposing. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
|
| 1 | Tsuyoshi Iwagaki, Yutaro Ishimori, Hideyuki Ichihara, Tomoo Inoue |
Designing area-efficient controllers for multi-cycle transient fault tolerant systems. |
ETS |
2015 |
DBLP DOI BibTeX RDF |
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