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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 220 occurrences of 191 keywords
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Results
Found 5411 publication records. Showing 5411 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Kai-Min Chung, Tai-Ning Liao, Luowen Qian |
Lower Bounds for Function Inversion with Quantum Advice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 8:1-8:15, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Badih Ghazi, Noah Golowich, Ravi Kumar 0001, Pasin Manurangsi, Rasmus Pagh, Ameya Velingker |
Pure Differentially Private Summation from Anonymous Messages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 15:1-15:23, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Amos Beimel, Aleksandra Korolova, Kobbi Nissim, Or Sheffet, Uri Stemmer |
The Power of Synergy in Differential Privacy: Combining a Small Curator with Local Randomizers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 14:1-14:25, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Naty Peter, Rotem Tsabary, Hoeteck Wee |
One-One Constrained Pseudorandom Functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 13:1-13:22, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Peter Michael Reichstein Rasmussen, Amit Sahai |
Expander Graphs Are Non-Malleable Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 6:1-6:10, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Claude Crépeau, Arnaud Massenet, Louis Salvail, Lucas Shigeru Stinchcombe, Nan Yang 0010 |
Practical Relativistic Zero-Knowledge for NP. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 4:1-4:18, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | |
Front Matter, Table of Contents, Preface, Conference Organization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 0:1-0:14, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Gil Segev 0001, Ido Shahaf |
Hardness vs. (Very Little) Structure in Cryptography: A Multi-Prover Interactive Proofs Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 10:1-10:23, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Fuchun Lin, Mahdi Cheraghchi, Venkatesan Guruswami, Reihaneh Safavi-Naini, Huaxiong Wang |
Leakage-Resilient Secret Sharing in Non-Compartmentalized Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 7:1-7:24, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Jeremiah Blocki, Shubhang Kulkarni, Samson Zhou |
On Locally Decodable Codes in Resource Bounded Channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 16:1-16:23, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Yael Tauman Kalai, Adam D. Smith, Daniel Wichs (eds.) |
1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1 The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
1 | Moni Naor, Lior Rotem, Gil Segev 0001 |
Out-Of-Band Authenticated Group Key Exchange: From Strong Authentication to Immediate Key Delivery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 9:1-9:25, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Anat Paskin-Cherniavsky, Artiom Radune |
On Polynomial Secret Sharing Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 12:1-12:21, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Victor Balcer, Albert Cheu |
Separating Local & Shuffled Differential Privacy via Histograms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 1:1-1:14, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Reo Eriguchi, Noboru Kunihiro |
d-Multiplicative Secret Sharing for Multipartite Adversary Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 2:1-2:16, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Martin Hirt, Marta Mularczyk |
Efficient MPC with a Mixed Adversary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 1st Conference on Information-Theoretic Cryptography, ITC 2020, June 17-19, 2020, Boston, MA, USA., pp. 3:1-3:23, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-151-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | M. Casarsa, Gurgen Harutyunyan, Yervant Zorian |
Test and Diagnosis Solution for Functional Safety. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Wei-Hao Chen, Chu-Chun Hsu, Shi-Yu Huang |
Rapid PLL Monitoring By A Novel min-MAX Time-to-Digital Converter. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-8, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Siyuan Chen, Jinwook Jung, Peilin Song, Krishnendu Chakrabarty, Gi-Joon Nam |
BISTLock: Efficient IP Piracy Protection using BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen |
Logic Fault Diagnosis of Hidden Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Fei Su, Prashant Goteti, Min Zhang |
Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin |
Test Challenges of Intel IA Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz |
Selecting Close-to-Functional Path Delay Faults for Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Trevor Kroeger, Wei Cheng 0003, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi |
Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Safa Mhamdi, Patrick Girard 0001, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob A. Abraham |
Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa |
Learning A Wafer Feature With One Training Sample. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Steven J. Frederiksen, John Aromando, Michael S. Hsiao |
Automated Assertion Generation from Natural Language Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Richard Bramley, Yanxiang Huang, Guangshan Duan, Nirmal R. Saxena, Paul Racunas |
On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy 0001, Martin Keim, Lori Schramm |
IJTAG Through a Two-Pin Chip Interface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Riccardo Cantoro, Dario Foti, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan |
New Perspectives on Core In-field Path Delay Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton |
Knowledge Transfer for Diagnosis Outcome Preview with Limited Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Hüseyin Sagirkaya, Gökhan Durgun |
Avionics Simulation Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-3, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick |
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chen He, Yanyao Yu |
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero |
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty |
Functional Criticality Classification of Structural Faults in AI Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Ussama Zahid, Giulio Gambardella, Nicholas J. Fraser, Michaela Blott, Kees A. Vissers |
FAT: Training Neural Networks for Reliable Inference Under Hardware Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton |
LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan |
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Mingye Li, Fangzhou Wang, Sandeep Gupta 0001 |
Data-driven fault model development for superconducting logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Mitchell A. Thornton |
Introduction to Quantum Computation Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | David Brauchler, Jennifer Dworak |
Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, James Chien-Mo Li |
qATG: Automatic Test Generation for Quantum Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
Machine Intelligence for Efficient Test Pattern Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne |
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Hanbin Hu, Nguyen Nguyen, Chen He, Peng Li 0001 |
Advanced Outlier Detection Using Unsupervised Learning for Screening Potential Customer Returns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang 0005, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang 0014, Justyna Zawada |
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | |
IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-1-7281-9113-3 The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Adriana C. Sanabria-Borbon, Nithyashankari Gummidipoondi Jayasankaran, S. Y. Lee, Edgar Sánchez-Sinencio, Jiang Hu, Jeyavijayan (JV) Rajendran |
Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Andrew Stern, Dhwani Mehta, Shahin Tajik, Farimah Farahmandi, Mark M. Tehranipoor |
SPARTA: A Laser Probing Approach for Trojan Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee |
Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Mengyun Liu, Krishnendu Chakrabarty |
Online Fault Detection in ReRAM-Based Computing Systems by Monitoring Dynamic Power Consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang 0005, Wu Yang |
Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Cesar A. Sánchez-Martínez, Paulo López-Meyer, Esdras Juárez-Hernández, Aaron Desiga-Orenday, Andrés Viveros-Wacher |
High Speed Serial Links Risk Assessment in Industrial Post-Silicon Validation Exploiting Machine Learning Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim |
Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Srikanth Venkataraman, Pongpachara Limpisathian, Pascal Meinerzhagen, Suriyaprakash Natarajan, Eric Yang |
Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Bharath Nandakumar, Sameer Chillarige, Anil Malik, Atul Chabbra, Nicholai L'Esperance, Robert Redburn |
Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang |
Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Maxim Ladnushkin |
Flip-flops fanout splitting in scan designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen 0053, Min-Jer Wang |
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Ricardo Aquino Guazzelli, Laurent Fesquet |
At-speed DfT Architecture for Bundled-data Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal |
Automated Socket Anomaly Detection through Deep Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee |
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Benoit Nadeau-Dostie, Luc Romain |
Memory repair logic sharing techniques and their impact on yield. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong |
Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak |
X-Tolerant Tunable Compactor for In-System Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Vadim Geurkov, Lev Kirischian |
A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto |
Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Marampally Saikiran, Mona Ganji, Degang Chen 0001 |
Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Natalia Lylina, Ahmed Atteya, Chih-Hao Wang, Hans-Joachim Wunderlich |
Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Hayoung Lee, Keewon Cho, Sungho Kang 0001, Wooheon Kang, Seungtaek Lee, Woosik Jeong |
Fail Memory Configuration Set for RA Estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Sreeja Chowdhury, Rabin Yu Acharya, William Boullion, Andrew Felder, Mark Howard, Jia Di, Domenic Forte |
A Weak Asynchronous RESet (ARES) PUF Using Start-up Characteristics of Null Conventional Logic Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Jun Chen, Masanori Hashimoto |
Proactive Supply Noise Mitigation with Low-Latency Minor Voltage Regulator and Lightweight Current Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-8, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Renjian Pan, Zhaobo Zhang, Xin Li 0001, Krishnendu Chakrabarty, Xinli Gu |
Unsupervised Root-Cause Analysis for Integrated Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda |
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Wei Gao, Tao Jing |
Modeling Accuracy of Wideband Power Amplifiers with Memory effects via Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-7, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Rafael B. Schvittz, Paulo F. Butzen, Leomar S. da Rosa |
Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-9, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Sarah Azimi, Luca Sterpone |
Digital Design Techniques for Dependable High Performance Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Muslum Emir Avci, Sule Ozev |
Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Zeye Liu 0001, R. D. Shawn Blanton |
High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Rajit Karmakar, Santanu Chattopadhyay |
Hardware IP Protection Using Logic Encryption and Watermarking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Mohammad Nasim Imtiaz Khan, Swaroop Ghosh |
Assuring Security and Reliability of Emerging Non-Volatile Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Jean-François Côté, Mark Kassab, Wojciech Janiszewski, Ricardo Rodrigues 0008, Reinhard Meier, Bartosz Kaczmarek, Peter Orlando, Geir Eide, Janusz Rajski, Glenn Colón-Bonet, Naveen Mysore, Ya Yin, Pankaj Pant |
Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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1 | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Chen He, Stephen Traynor, Gayathri Bhagavatheeswaran, Hector Sanchez |
Stress, Test, and Simulation of Analog IOs on Automotive ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Suhasini Komarraju, Abhijit Chatterjee |
Fast EVM Tuning of MIMO Wireless Systems Using Collaborative Parallel Testing and Implicit Reward Driven Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
1 | Bart Post, Sem C. Borst |
Joint Load-Driven Frequency Allocation and User Association in Dense Cellular Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 75-83, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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1 | Akshay Mete, D. Manjunath, Jayakrishnan Nair 0001, Balakrishna J. Prabhu |
Partial Server Pooling in Redundancy Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 106-114, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Sukhpreet Kaur Khangura, Sami Akin |
Measurement-Based Online Available Bandwidth Estimation Employing Reinforcement Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 95-103, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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1 | Ana Paula Couto da Silva, Daniela Renga, Michela Meo, Marco Ajmone Marsan |
Small Solar Panels Can Drastically Reduce the Carbon Footprint of Radio Access Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 64-65, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | György Dán, Ravi Mazumdar (eds.) |
31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-0-9883045-7-4 The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
1 | Susanna Schwarzmann, Paula Breitbach, Thomas Zinner, Matthias Rost |
Modeling Adaptive Video Streaming Using Discrete-Time Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 121-129, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Andrea Baiocchi, Domenico Garlisi, Giuseppe Santaromita, Ilenia Tinnirello |
Moving RTS/CTS to the Frequency Domain: an Efficient Contention Scheme for 802.11ax Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 140-148, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Haritha K, Chandramani Singh |
Max Weight Scheduling with Base Station Running and Switching Costs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 93-94, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Tatsuaki Kimura, Hiroshi Saito |
Theoretical Performance Analysis of Vehicular Broadcast Communications at Intersection and Their Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 37-45, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Ehsan Aryafar, Alireza Keshavarz-Haddad, Carlee Joe-Wong |
Proportional Fair RAT Aggregation in HetNets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 84-92, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Antonia Maria Masucci, Salah-Eddine Elayoubi |
Offloading Capability of D2D Communications on Moving Nodes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 31st International Teletraffic Congress, ITC 2019, Budapest, Hungary, August 27-29, 2019, pp. 55-63, 2019, IEEE, 978-0-9883045-7-4. The full citation details ...](Pics/full.jpeg) |
2019 |
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