Search results for "ATE"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma	A wideband low-noise ATE-based method for measuring jitter in GHz signals.	ITC	2005	DBLP DOI BibTeX RDF
18	Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi	Analysis and measurement of fault coverage in a combined ATE and BIST environment.	IEEE Trans. Instrum. Meas.	2004	DBLP DOI BibTeX RDF
18	Joe D. Chase, Dennie Templeton, Michael Peterson, Carlotta Eaton, Diane Wolff, Edward G. Okie	Articulation through a body of knowledge: a report on an NSF ATE project involving Radford University and the Virginia Community College System.	SIGCSE	2004	DBLP DOI BibTeX RDF	community college articulation, curriculum, CC2001, body of knowledge
18	Robert Madge	ATE Value Add through Open Data Collection.	ITC	2004	DBLP DOI BibTeX RDF
18	Ilia Polian, Bernd Becker 0001	Reducing ATE Cost in System-on-Chip Test.	VLSI-SOC	2003	DBLP BibTeX RDF
18	Marten Seth	RF ATE equipment benefit from advanced network analyzer technology.	ETW	2003	DBLP DOI BibTeX RDF
18	Takahiro J. Yamaguchi	Open Architecture ATE and 250 Consecutive UIs.	ITC	2003	DBLP DOI BibTeX RDF
18	Fidel Muradali	Future ATE: Perspectives & Requirements.	ITC	2003	DBLP DOI BibTeX RDF
18	Tom Newsom	Future ATE for System on a Chip... Some Perspectives.	ITC	2003	DBLP DOI BibTeX RDF
18	Lee Y. Song	Future ATE: Perspectives & Requirements.	ITC	2003	DBLP DOI BibTeX RDF
18	Donald L. Wheater	ATE-Customer Perspectives & Requirements Panel.	ITC	2003	DBLP DOI BibTeX RDF
18	Bill Bottoms, Lee Song, Paul Patton, Wilhelm Radermacher	A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution?	VTS	2002	DBLP DOI BibTeX RDF
18	Dale E. Hoffman	Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.	ITC	2002	DBLP DOI BibTeX RDF
18	Maurizio Gavardoni	Use of Pipeline Converters for ATE Applications.	ITC	2002	DBLP DOI BibTeX RDF
18	Alex d'Arbeloff	Managing in the ATE Business - Postcards from the Past, Lessons for the Future.	ITC	2002	DBLP DOI BibTeX RDF
18	Bill Bottoms	Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.	ITC	2002	DBLP DOI BibTeX RDF
18	Sergio M. Perez	The Consequences of an Open ATE Architecture.	ITC	2002	DBLP DOI BibTeX RDF
18	Dennis R. Conti	Mission Impossible? Open Architecture ATE.	ITC	2002	DBLP DOI BibTeX RDF
18	Gregory S. Spirakis	Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.	ITC	2002	DBLP DOI BibTeX RDF
18	Mike Tripp	On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms).	ITC	2002	DBLP DOI BibTeX RDF
18	Burnell G. West	Open ATE Architecture: Key Challenges.	ITC	2002	DBLP DOI BibTeX RDF
18	Bozena Kaminska	Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.	ITC	2002	DBLP DOI BibTeX RDF
18	Paul F. Scrivens	Mission Possible? Open Architecture ATE.	ITC	2002	DBLP DOI BibTeX RDF
18	Yervant Zorian, Paolo Prinetto, João Paulo Teixeira 0001, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher	Embedded tutorial: TRP: integrating embedded test and ATE.	DATE	2001	DBLP BibTeX RDF
18	Andrew Moran, Jim Teisher, Andrew Gill, Emir Pasalic, John Veneruso	Automated translation of legacy code for ATE.	ITC	2001	DBLP DOI BibTeX RDF
18	Bruce R. Parnas	Doing it in STIL: intelligent conversion from STIL to an ATE format.	ITC	2000	DBLP DOI BibTeX RDF
18	Martin Bell, Givargis Danialy 0001, Michael C. Howells, Stephen Pateras	Bridging the gap between embedded test and ATE.	ITC	2000	DBLP DOI BibTeX RDF
18	A. Cutler	J.C. Herz (edited by Michael Pietsch), Joystick Nation: How Video Games Ate Our Quarters, Stole Our Hearts, and Rewired Our Minds [Book Review].	IEEE Ann. Hist. Comput.	1999	DBLP DOI BibTeX RDF
18	Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner	An accurate simulation model of the ATE test environment for very high speed devices.	ITC	1999	DBLP DOI BibTeX RDF
18	Dean A. Gahagan	RF (gigahertz) ATE production testing on wafer: options and tradeoffs.	ITC	1999	DBLP DOI BibTeX RDF
18	Tagashi Kitagaki	Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test].	ITC	1999	DBLP DOI BibTeX RDF
18	Mark G. Faust	ATE Features for IDDQ Testing.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
18	John Oonk	Leveraging new standards in ATE software.	ITC	1998	DBLP DOI BibTeX RDF
18	Neil Kelly	BIST vs. ATE for testing system-on-a-chip.	ITC	1998	DBLP DOI BibTeX RDF
18	Todd E. Rockoff	The rise and fall of the ATE industry.	ITC	1998	DBLP DOI BibTeX RDF
18	Stephen K. Sunter	BIST vs. ATE: need a different vehicle?	ITC	1998	DBLP DOI BibTeX RDF
18	Burnell G. West	Functional ATE can meet the challenges.	ITC	1998	DBLP DOI BibTeX RDF
18	D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu	ATE for VLSI: What Challenges Lie Ahead?	VTS	1997	DBLP DOI BibTeX RDF
18	Steve Westfall	Memory Test-Debugging Test Vectors Without ATE.	ITC	1997	DBLP DOI BibTeX RDF
18	David C. Keezer, R. J. Wenzel	Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test.	ITC	1997	DBLP DOI BibTeX RDF
18	Dick Price	The toad that ate Australia.	IEEE Expert	1996	DBLP DOI BibTeX RDF
18	Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima	Scan Design Oriented Test Technique for VLSI's Using ATE.	ITC	1996	DBLP DOI BibTeX RDF
18	Barry D. Kulp	Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System.	ITC	1996	DBLP DOI BibTeX RDF
18	Xiaoming Wang, Qiaolin Yang	Using virtual ATE model to migrate test programs.	J. Comput. Sci. Technol.	1995	DBLP DOI BibTeX RDF
18	Jim Chapman, Jeff Currin, Steve Payne	A Low-Cost High-Performance CMOS Timing Vernier for ATE.	ITC	1995	DBLP DOI BibTeX RDF
18	Gerald H. Johnson, Jan B. Wilstrup	A General Purpose ATE Based IDDQ Measurement Circuit.	ITC	1995	DBLP DOI BibTeX RDF
18	Michael T. Freeman	Development of an ATE Test Station for Mixed CATV/TELCO Products.	ITC	1995	DBLP DOI BibTeX RDF
18	Dennis Petrich	Achieving +/-30ps Accuracy in the ATE Environment.	ITC	1994	DBLP DOI BibTeX RDF
18	Shinichi Kimura, Makoto Kimura, Takayuki Nakatani, Masao Sugai	A New Approach for PLL Characterization on Mixed Signal ATE.	ITC	1993	DBLP DOI BibTeX RDF
18	Christophe Vaucher, Louis Balme	The Standard Mirror Boards (SMBs) Concept - An Innovative Improvement of Traditional ATE for up to 10 Mil Bare Board Testing.	ITC	1993	DBLP DOI BibTeX RDF
18	Herbert Thaler, Lee Holt	A Suite of Novel Digital ATE Timing Calibration Methods.	ITC	1992	DBLP DOI BibTeX RDF
18	Richard S. Levy	Does Object-Oriented Programming Fit in the Real World of ATE?	ITC	1992	DBLP DOI BibTeX RDF
18	Andrew Rappaport	The Great ATE Robbery.	ITC	1992	DBLP BibTeX RDF
18	James R. Ward	The Reality of Object Oriented Solutions for ATE.	ITC	1992	DBLP DOI BibTeX RDF
18	R. Wade Williams	Integrating Emulation Techniques into General Purpose ATE.	ITC	1991	DBLP DOI BibTeX RDF
18	Arthur E. Downey	Industry Graphic Standards and ATE Windowing Software.	ITC	1991	DBLP DOI BibTeX RDF
18	Kenneth Lanier	ATE-based functional ISDN testing.	ITC	1990	DBLP DOI BibTeX RDF
18	Anthony Taylor	An analysis of ATE computational architecture.	ITC	1990	DBLP DOI BibTeX RDF
18	Steve Barton	Characterization of High-Speed (Above 50 MHz) Devices Using Advance ATE-Techniques, Results and Device Problems.	ITC	1989	DBLP DOI BibTeX RDF
18	Michael W. Salter, Kemon P. Taschioglou	Mainstream ATE: To Reduce LSI and VLSI Test Cost.	ITC	1989	DBLP DOI BibTeX RDF
18	Peter Hansen	Testing Conventional Logic and Memory Clusters Using Boundary Scan Devices as Virtual ATE Channels.	ITC	1989	DBLP DOI BibTeX RDF
18	Phil Collins	Boundary Scan: The ATE Vendors' View.	ITC	1988	DBLP DOI BibTeX RDF
18	Neil Hutchinson	CIM , Electronics Manufacturing and ATE.	ITC	1988	DBLP DOI BibTeX RDF
18	Marc Mydill	Standardization of ATE Timing Accuracy Specifications.	ITC	1988	DBLP DOI BibTeX RDF
18	Mark R. Barber, Walter I. Satre	Timing Accuracy in Modern ATE.	IEEE Des. Test	1987	DBLP DOI BibTeX RDF
18	Fred Cox, Lloyd K. Konneker, Douglas Moreland	Visual Programming for Analog/Hybrid ATE.	ITC	1986	DBLP BibTeX RDF
18	James D. Bray	ATE Test Head Requirements for Low-Cost VLSI Testing.	ITC	1986	DBLP BibTeX RDF
18	Al Mostacciuolo	Transmission Problems Encountered When Testing Memory Devices in Parallel on Memory ATE.	ITC	1986	DBLP BibTeX RDF
18	Noah Morgan	An Automated Menu Screen Generation Software Tool for VLSI ATE Programming and Operation.	ITC	1986	DBLP BibTeX RDF
18	Mark D. Winkel	Using a Relational Database to Develop a Statistical Quality Control System for ATE.	ITC	1986	DBLP BibTeX RDF
18	Tohru Kazamaki	Milestones of New-Generation ATE.	IEEE Des. Test	1985	DBLP DOI BibTeX RDF
18	William P. Allaire	Case Study: ATE Networking Using Peripheral Emulation.	ITC	1985	DBLP BibTeX RDF
18	William Corley, David S. Curry	RF Calibration in ATE Systems.	ITC	1985	DBLP BibTeX RDF
18	Jim Healy, Gary Ure	A Method of Reducing ATE System Error Components and Guaranteeing Subnanosecond Measurement Accuracies.	ITC	1985	DBLP BibTeX RDF
18	James Congdon	Driver/Sensor Design for High-Performance ATE.	ITC	1985	DBLP BibTeX RDF
18	Patricia M. Ryan, A. Jesse Wilkinson	Knowledge Acquisition for ATE Diagnosis.	ITC	1985	DBLP BibTeX RDF
18	Peter Nystrom, Steven Cosgrove	Power Conditioning Provides Documented Productivity Gains in Semiconductor Fabrication and ATE.	ITC	1985	DBLP BibTeX RDF
18	Scott T. Jones	Flexible Inspection Systems (FIS) for Printed Circuit Board Production: ATE Finds a Quality Partner.	ITC	1985	DBLP BibTeX RDF
18	David Florcik, David Low, Martin Roche	Prototype Debug using ATE.	IEEE Des. Test	1984	DBLP DOI BibTeX RDF
18	Rudy Garcia	The Fairchild Sentry 50 Tester: Establishing New ATE Performance Limits.	IEEE Des. Test	1984	DBLP DOI BibTeX RDF
18	Mark R. Barber	Fundamental Timing Problems in Testing MOS VLSI on Modern ATE.	IEEE Des. Test	1984	DBLP DOI BibTeX RDF
18	James T. Healy	An Information Processing Software System for ATE.	ITC	1984	DBLP BibTeX RDF
18	Gerry Schmid	Software Solutions Enhance ATE Networking Capabilities.	ITC	1983	DBLP BibTeX RDF
18	Robert E. Huston	An Analysis of ATE Testing Costs.	ITC	1983	DBLP BibTeX RDF
18	Mark P. Skrzynski, Neal Shea	An ETHERNET Based Solution to ATE Networking.	ITC	1983	DBLP BibTeX RDF
18	Kemon P. Taschioglou	A Convenient Algebra of Quality for Interpreting ATE Test Data.	ITC	1983	DBLP BibTeX RDF
18	G. F. Meravi, J. J. Bell, Joseph C. Bernier	Analysis of Gate Array Failures Using Functional ATE.	ITC	1983	DBLP BibTeX RDF
18	Larry C. Sollman	An Information-Rich ATE Architecture.	ITC	1983	DBLP BibTeX RDF
18	Matthew V. Mahoney 0002	Closing the Loop: An Expanding Role for ATE in Semiconductor Manufacturing.	ITC	1982	DBLP BibTeX RDF
18	Wayne Bryant, Charles Furry, Jim Hahn	Benefits of ATE and Host Computer Networking.	ITC	1982	DBLP BibTeX RDF
18	David W. Malas, Stephen C. Hagan	Test Data Automation: An ATE Distributed Processing Application in a Multi-Vendor Environment.	ITC	1982	DBLP BibTeX RDF
18	Gerald C. Goshaw	DIAL : An Automated ATE Service Support System.	ITC	1981	DBLP BibTeX RDF
18	Joseph A. Ruggieri	Hidden Cost Considerations in Long Term Use of ATE Programs.	ITC	1981	DBLP BibTeX RDF
18	Arthur E. Downey	A "Three Mode" Command Language for ATE.	ITC	1981	DBLP BibTeX RDF
11	Anton Chichkov	Challenges for test and design for test.	DDECS	2009	DBLP DOI BibTeX RDF
11	Michael Scott, Naomi Benger, Manuel Charlemagne, Luis J. Dominguez Perez, Ezekiel J. Kachisa	On the Final Exponentiation for Calculating Pairings on Ordinary Elliptic Curves.	Pairing	2009	DBLP DOI BibTeX RDF	addition sequences, Tate pairing, addition chains
11	Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang	Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing.	CSE (2)	2009	DBLP DOI BibTeX RDF
11	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita	Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing
11	Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos	Hybrid-SBST Methodology for Efficient Testing of Processor Cores.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	H-SBST, RTPG, computer architecture, ATPG, functional testing, microprocessor testing, software-based self-test
11	Scott Davidson 0001, Nur A. Touba	Guest Editors' Introduction: Progress in Test Compression.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	tester memory, don't-care bits, X values, test compression, test vectors, test data volume