Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma |
A wideband low-noise ATE-based method for measuring jitter in GHz signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 10, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi |
Analysis and measurement of fault coverage in a combined ATE and BIST environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 53(2), pp. 300-307, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Joe D. Chase, Dennie Templeton, Michael Peterson, Carlotta Eaton, Diane Wolff, Edward G. Okie |
Articulation through a body of knowledge: a report on an NSF ATE project involving Radford University and the Virginia Community College System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGCSE ![In: Proceedings of the 35th SIGCSE Technical Symposium on Computer Science Education, SIGCSE 2004, Norfolk, Virginia, USA, March 3-7, 2004, pp. 149-150, 2004, ACM, 1-58113-798-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
community college articulation, curriculum, CC2001, body of knowledge |
18 | Robert Madge |
ATE Value Add through Open Data Collection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1430, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Ilia Polian, Bernd Becker 0001 |
Reducing ATE Cost in System-on-Chip Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SOC ![In: IFIP VLSI-SoC 2003, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Darmstadt, Germany, 1-3 December 2003, pp. 337-342, 2003, Technische Universität Darmstadt, Insitute of Microelectronic Systems, 3-901882-17-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP BibTeX RDF |
|
18 | Marten Seth |
RF ATE equipment benefit from advanced network analyzer technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETW ![In: 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003, pp. 129-131, 2003, IEEE Computer Society, 0-7695-1908-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Takahiro J. Yamaguchi |
Open Architecture ATE and 250 Consecutive UIs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1307, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Fidel Muradali |
Future ATE: Perspectives & Requirements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1297, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Tom Newsom |
Future ATE for System on a Chip... Some Perspectives. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1301, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Lee Y. Song |
Future ATE: Perspectives & Requirements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1300, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Donald L. Wheater |
ATE-Customer Perspectives & Requirements Panel. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1298, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Bill Bottoms, Lee Song, Paul Patton, Wilhelm Radermacher |
A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 129-132, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Dale E. Hoffman |
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 26, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Maurizio Gavardoni |
Use of Pipeline Converters for ATE Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 879-884, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Alex d'Arbeloff |
Managing in the ATE Business - Postcards from the Past, Lessons for the Future. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 12, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Bill Bottoms |
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 24, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Sergio M. Perez |
The Consequences of an Open ATE Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1210, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Dennis R. Conti |
Mission Impossible? Open Architecture ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1207, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Gregory S. Spirakis |
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 25, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Mike Tripp |
On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1232, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Burnell G. West |
Open ATE Architecture: Key Challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1212-1213, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Bozena Kaminska |
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 23, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Paul F. Scrivens |
Mission Possible? Open Architecture ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1208, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Yervant Zorian, Paolo Prinetto, João Paulo Teixeira 0001, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher |
Embedded tutorial: TRP: integrating embedded test and ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2001, Munich, Germany, March 12-16, 2001, pp. 34-37, 2001, IEEE Computer Society, 0-7695-0993-2. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP BibTeX RDF |
|
18 | Andrew Moran, Jim Teisher, Andrew Gill, Emir Pasalic, John Veneruso |
Automated translation of legacy code for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, pp. 148-156, 2001, IEEE Computer Society, 0-7803-7169-0. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
18 | Bruce R. Parnas |
Doing it in STIL: intelligent conversion from STIL to an ATE format. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000, pp. 64-71, 2000, IEEE Computer Society, 0-7803-6546-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Martin Bell, Givargis Danialy 0001, Michael C. Howells, Stephen Pateras |
Bridging the gap between embedded test and ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000, pp. 55-63, 2000, IEEE Computer Society, 0-7803-6546-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
18 | A. Cutler |
J.C. Herz (edited by Michael Pietsch), Joystick Nation: How Video Games Ate Our Quarters, Stole Our Hearts, and Rewired Our Minds [Book Review]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Ann. Hist. Comput. ![In: IEEE Ann. Hist. Comput. 21(3), pp. 77-78, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
18 | Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner |
An accurate simulation model of the ATE test environment for very high speed devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 524-531, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
18 | Dean A. Gahagan |
RF (gigahertz) ATE production testing on wafer: options and tradeoffs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 388-395, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
18 | Tagashi Kitagaki |
Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 940-946, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
18 | Mark G. Faust |
ATE Features for IDDQ Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, pp. 153-, 1998, IEEE Computer Society, 0-8186-8277-9. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | John Oonk |
Leveraging new standards in ATE software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 606-611, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Neil Kelly |
BIST vs. ATE for testing system-on-a-chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 1147, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Todd E. Rockoff |
The rise and fall of the ATE industry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 1154, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Stephen K. Sunter |
BIST vs. ATE: need a different vehicle? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 1148, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Burnell G. West |
Functional ATE can meet the challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 1155, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu |
ATE for VLSI: What Challenges Lie Ahead? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 318-319, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
18 | Steve Westfall |
Memory Test-Debugging Test Vectors Without ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, pp. 663-669, 1997, IEEE Computer Society, 0-7803-4209-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
18 | David C. Keezer, R. J. Wenzel |
Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, pp. 94-100, 1997, IEEE Computer Society, 0-7803-4209-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
18 | Dick Price |
The toad that ate Australia. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Expert ![In: IEEE Expert 11(6), pp. 13-15, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
18 | Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima |
Scan Design Oriented Test Technique for VLSI's Using ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996, pp. 453-460, 1996, IEEE Computer Society, 0-7803-3541-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
18 | Barry D. Kulp |
Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996, pp. 104-111, 1996, IEEE Computer Society, 0-7803-3541-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
18 | Xiaoming Wang, Qiaolin Yang |
Using virtual ATE model to migrate test programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 10(4), pp. 289-297, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Jim Chapman, Jeff Currin, Steve Payne |
A Low-Cost High-Performance CMOS Timing Vernier for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 459-468, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Gerald H. Johnson, Jan B. Wilstrup |
A General Purpose ATE Based IDDQ Measurement Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 97-105, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Michael T. Freeman |
Development of an ATE Test Station for Mixed CATV/TELCO Products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 966-972, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Dennis Petrich |
Achieving +/-30ps Accuracy in the ATE Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994, pp. 691-700, 1994, IEEE Computer Society, 0-7803-2103-0. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
18 | Shinichi Kimura, Makoto Kimura, Takayuki Nakatani, Masao Sugai |
A New Approach for PLL Characterization on Mixed Signal ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993, pp. 697-704, 1993, IEEE Computer Society, 0-7803-1430-1. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
18 | Christophe Vaucher, Louis Balme |
The Standard Mirror Boards (SMBs) Concept - An Innovative Improvement of Traditional ATE for up to 10 Mil Bare Board Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993, pp. 672-679, 1993, IEEE Computer Society, 0-7803-1430-1. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
18 | Herbert Thaler, Lee Holt |
A Suite of Novel Digital ATE Timing Calibration Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, pp. 520-529, 1992, IEEE Computer Society, 0-7803-0760-7. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
18 | Richard S. Levy |
Does Object-Oriented Programming Fit in the Real World of ATE? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, pp. 255-256, 1992, IEEE Computer Society, 0-7803-0760-7. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
18 | Andrew Rappaport |
The Great ATE Robbery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, pp. 18, 1992, IEEE Computer Society, 0-7803-0760-7. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP BibTeX RDF |
|
18 | James R. Ward |
The Reality of Object Oriented Solutions for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992, pp. 257-258, 1992, IEEE Computer Society, 0-7803-0760-7. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
18 | R. Wade Williams |
Integrating Emulation Techniques into General Purpose ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991, pp. 994-1003, 1991, IEEE Computer Society, 0-8186-9156-5. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
18 | Arthur E. Downey |
Industry Graphic Standards and ATE Windowing Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991, pp. 1087-1095, 1991, IEEE Computer Society, 0-8186-9156-5. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
18 | Kenneth Lanier |
ATE-based functional ISDN testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990, pp. 86-94, 1990, IEEE Computer Society, 0-8186-9064-X. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
18 | Anthony Taylor |
An analysis of ATE computational architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990, pp. 514-519, 1990, IEEE Computer Society, 0-8186-9064-X. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
18 | Steve Barton |
Characterization of High-Speed (Above 50 MHz) Devices Using Advance ATE-Techniques, Results and Device Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989, pp. 860-868, 1989, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
18 | Michael W. Salter, Kemon P. Taschioglou |
Mainstream ATE: To Reduce LSI and VLSI Test Cost. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989, pp. 591-596, 1989, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
18 | Peter Hansen |
Testing Conventional Logic and Memory Clusters Using Boundary Scan Devices as Virtual ATE Channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989, pp. 166-173, 1989, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
18 | Phil Collins |
Boundary Scan: The ATE Vendors' View. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, pp. 195-196, 1988, IEEE Computer Society, 0-8186-0870-6. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
18 | Neil Hutchinson |
CIM , Electronics Manufacturing and ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, pp. 816-822, 1988, IEEE Computer Society, 0-8186-0870-6. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
18 | Marc Mydill |
Standardization of ATE Timing Accuracy Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, pp. 193-194, 1988, IEEE Computer Society, 0-8186-0870-6. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
18 | Mark R. Barber, Walter I. Satre |
Timing Accuracy in Modern ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 4(2), pp. 22-30, 1987. The full citation details ...](Pics/full.jpeg) |
1987 |
DBLP DOI BibTeX RDF |
|
18 | Fred Cox, Lloyd K. Konneker, Douglas Moreland |
Visual Programming for Analog/Hybrid ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 631-636, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
18 | James D. Bray |
ATE Test Head Requirements for Low-Cost VLSI Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 568-591, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
18 | Al Mostacciuolo |
Transmission Problems Encountered When Testing Memory Devices in Parallel on Memory ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 808-818, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
18 | Noah Morgan |
An Automated Menu Screen Generation Software Tool for VLSI ATE Programming and Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 612-620, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
18 | Mark D. Winkel |
Using a Relational Database to Develop a Statistical Quality Control System for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 74-79, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
18 | Tohru Kazamaki |
Milestones of New-Generation ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 2(5), pp. 83-89, 1985. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP DOI BibTeX RDF |
|
18 | William P. Allaire |
Case Study: ATE Networking Using Peripheral Emulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 954-961, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | William Corley, David S. Curry |
RF Calibration in ATE Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 180-184, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | Jim Healy, Gary Ure |
A Method of Reducing ATE System Error Components and Guaranteeing Subnanosecond Measurement Accuracies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 191-202, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | James Congdon |
Driver/Sensor Design for High-Performance ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 629-633, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | Patricia M. Ryan, A. Jesse Wilkinson |
Knowledge Acquisition for ATE Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 848-856, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | Peter Nystrom, Steven Cosgrove |
Power Conditioning Provides Documented Productivity Gains in Semiconductor Fabrication and ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 19-22, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | Scott T. Jones |
Flexible Inspection Systems (FIS) for Printed Circuit Board Production: ATE Finds a Quality Partner. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 403-412, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
|
18 | David Florcik, David Low, Martin Roche |
Prototype Debug using ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 1(2), pp. 94-99, 1984. The full citation details ...](Pics/full.jpeg) |
1984 |
DBLP DOI BibTeX RDF |
|
18 | Rudy Garcia |
The Fairchild Sentry 50 Tester: Establishing New ATE Performance Limits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 1(2), pp. 101-109, 1984. The full citation details ...](Pics/full.jpeg) |
1984 |
DBLP DOI BibTeX RDF |
|
18 | Mark R. Barber |
Fundamental Timing Problems in Testing MOS VLSI on Modern ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 1(3), pp. 90-97, 1984. The full citation details ...](Pics/full.jpeg) |
1984 |
DBLP DOI BibTeX RDF |
|
18 | James T. Healy |
An Information Processing Software System for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984, pp. 497-505, 1984, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1984 |
DBLP BibTeX RDF |
|
18 | Gerry Schmid |
Software Solutions Enhance ATE Networking Capabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 254-259, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | Robert E. Huston |
An Analysis of ATE Testing Costs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 396-411, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | Mark P. Skrzynski, Neal Shea |
An ETHERNET Based Solution to ATE Networking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 497-507, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | Kemon P. Taschioglou |
A Convenient Algebra of Quality for Interpreting ATE Test Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 796-803, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | G. F. Meravi, J. J. Bell, Joseph C. Bernier |
Analysis of Gate Array Failures Using Functional ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 676-681, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | Larry C. Sollman |
An Information-Rich ATE Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983, pp. 532-537, 1983, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP BibTeX RDF |
|
18 | Matthew V. Mahoney 0002 |
Closing the Loop: An Expanding Role for ATE in Semiconductor Manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982, pp. 12-23, 1982, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1982 |
DBLP BibTeX RDF |
|
18 | Wayne Bryant, Charles Furry, Jim Hahn |
Benefits of ATE and Host Computer Networking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982, pp. 331-338, 1982, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1982 |
DBLP BibTeX RDF |
|
18 | David W. Malas, Stephen C. Hagan |
Test Data Automation: An ATE Distributed Processing Application in a Multi-Vendor Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982, pp. 346-349, 1982, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1982 |
DBLP BibTeX RDF |
|
18 | Gerald C. Goshaw |
DIAL : An Automated ATE Service Support System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981, pp. 425-432, 1981, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP BibTeX RDF |
|
18 | Joseph A. Ruggieri |
Hidden Cost Considerations in Long Term Use of ATE Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981, pp. 368-369, 1981, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP BibTeX RDF |
|
18 | Arthur E. Downey |
A "Three Mode" Command Language for ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981, pp. 489-496, 1981, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP BibTeX RDF |
|
11 | Anton Chichkov |
Challenges for test and design for test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic, pp. 3, 2009, IEEE Computer Society, 978-1-4244-3341-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
11 | Michael Scott, Naomi Benger, Manuel Charlemagne, Luis J. Dominguez Perez, Ezekiel J. Kachisa |
On the Final Exponentiation for Calculating Pairings on Ordinary Elliptic Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2009, Third International Conference, Palo Alto, CA, USA, August 12-14, 2009, Proceedings, pp. 78-88, 2009, Springer, 978-3-642-03297-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
addition sequences, Tate pairing, addition chains |
11 | Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang |
Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSE (2) ![In: Proceedings of the 12th IEEE International Conference on Computational Science and Engineering, CSE 2009, Vancouver, BC, Canada, August 29-31, 2009, pp. 698-702, 2009, IEEE Computer Society, 978-1-4244-5334-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
11 | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(4), pp. 379-391, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing |
11 | Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos |
Hybrid-SBST Methodology for Efficient Testing of Processor Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 25(1), pp. 64-75, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
H-SBST, RTPG, computer architecture, ATPG, functional testing, microprocessor testing, software-based self-test |
11 | Scott Davidson 0001, Nur A. Touba |
Guest Editors' Introduction: Progress in Test Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 25(2), pp. 112-113, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
tester memory, don't-care bits, X values, test compression, test vectors, test data volume |