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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 1714 occurrences of 747 keywords
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Results
Found 4157 publication records. Showing 4157 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
27 | Frank Sill Torres, Pedro Fausto Rodrigues Leite, Rolf Drechsler |
Unintrusive aging analysis based on offline learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Taniya Siddiqua, Vilas Sridharan, Steven E. Raasch, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Elisabeth Baseman, Qiang Guan |
Lifetime memory reliability data from the field. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Pai-Shun Ting, John P. Hayes |
Eliminating a hidden error source in stochastic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | R. Cantora, Ernesto Sánchez 0001, Matteo Sonza Reorda, Giovanni Squillero, Emanuele Valea |
On the optimization of SBST test program compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Alexander Schneider 0002, Paul Pop, Jan Madsen |
Volume management for fault-tolerant continuous-flow microfluidics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti |
On-line software-based self-test for ECC of embedded RAM memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler |
Machine learning based test pattern analysis for localizing critical power activity areas. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Mert Atamaner, Oguz Ergin, Marco Ottavi, Pedro Reviriego |
Detecting errors in instructions with bloom filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Satyadev Ahlawat, Darshit Vaghani, Virendra Singh |
Preventing scan-based side-channel attacks through key masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Vasileios Tenentes, Charles Leech, Graeme M. Bragg, Geoff V. Merrett, Bashir M. Al-Hashimi, Hussam Amrouch, Jörg Henkel, Shidhartha Das |
Hardware and software innovations in energy-efficient system-reliability monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-5, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Kedar Janardan Dhori, Hitesh Chawla, Ashish Kumar, Prashant Pandey, Promod Kumar, Lorenzo Ciampolini, Florian Cacho, Damien Croain |
High-yield design of high-density SRAM for low-voltage and low-leakage operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu |
A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Jyothish Soman, Timothy M. Jones 0001 |
High performance fault tolerance through predictive instruction re-execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Jain-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho |
Design-for-testability for paper-based digital microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Mihalis Psarakis, Aitzan Sari |
A scrubbing scheduling approach for reliable FPGA multicore processors with real-time constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Rishad A. Shafik, Qiaoyan Yu, S. Saqib Khursheed, Antonio Miele |
Welcome Message. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Lucas Weigel, Fernando Fernandes 0001, Philippe O. A. Navaux, Paolo Rech |
Kernel vulnerability factor and efficient hardening for histogram of oriented gradients. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Sebastian Huhn 0001, Stephan Eggersglüß, Rolf Drechsler |
Reconfigurable TAP controllers with embedded compression for large test data volume. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Bing Li 0005, Ulf Schlichtmann |
Reliability-aware synthesis and fault test of fully programmable valve arrays (FPVAs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | H. Junqi, T. Nandha Kumar, Haider Abbas, Fabrizio Lombardi |
Simulation-based evaluation of frequency upscaled operation of exact/approximate ripple carry adders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Yu-Wei Lee, Nur A. Touba |
Improving test compression with multiple-polynomial LFSRs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Haider Alrudainy, Rishad A. Shafik, Andrey Mokhov, Alex Yakovlev |
Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Shoba Gopalakrishnan, Virendra Singh |
REMORA: A hybrid low-cost soft-error reliable fault tolerant architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Chiara Sandionigi, Maurício Altieri, Olivier Héron |
Early estimation of aging in the design flow of integrated circuits through a programmable hardware module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Mauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi 0001 |
Low cost error monitoring for improved maintainability of IoT applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Yu Xie, Chen Yang 0003, Chuang-An Mao, He Chen, Yizhuang Xie |
A novel low-overhead fault tolerant parallel-pipelined FFT design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Xin Fan 0002, Jan Stuijt, Tobias Gemmeke |
Towards SRAM leakage power minimization by aggressive standby voltage scaling - Experiments on 40nm test chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Prashant D. Joshi, Arunabha Sen, D. Frank Hsu, Said Hamdioui, Koen Bertels |
Region based containers - A new paradigm for the analysis of fault tolerant networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Alessandro Baldassari, Cristiana Bolchini, Antonio Miele |
A dynamic reliability management framework for heterogeneous multicore systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Nguyen T. H. Nguyen, Ediz Cetin, Oliver Diessel |
Scheduling voter checks to detect configuration memory errors in FPGA-based TMR systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren |
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Gokulkrishnan Vadakkeveedu, V. Kamakoti 0001, Nitin Chandrachoodan, Seetal Potluri |
A scalable pseudo-exhaustive search for fault diagnosis in microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Lake Bu, Hien D. Nguyen, Michel A. Kinsy |
RASSS: A perfidy-aware protocol for designing trustworthy distributed systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Tiago A. O. Alves, Sandip Kundu, Leandro A. J. Marzulo, Felipe M. G. França |
A resilient scheduler for dataflow execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Amir Mahdi Hosseini Monazzah, Hamed Farbeh, Seyed Ghassem Miremadi |
Investigating the effects of process variations and system workloads on endurance of non-volatile caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Toshinori Hosokawa, Atsushi Hirai, Hiroshi Yamazaki, Masayuki Arai |
A dynamic test compaction method on low power test generation based on capture safe test vectors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Andrea Fedi, Marco Ottavi, Gianluca Furano, Antimo Bruno, Roberto Senesi, Carla Andreani, Carlo Cazzaniga |
High-energy neutrons characterization of a safety critical computing system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Leandro Santiago 0001, Vinay C. Patil, Charles B. Prado, Tiago A. O. Alves, Leandro A. J. Marzulo, Felipe M. G. França, Sandip Kundu |
Realizing strong PUF from weak PUF via neural computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | Sina Boroumand, Hadi Parandeh-Afshar, Philip Brisk, Siamak Mohammadi |
CAL: Exploring cost, accuracy, and latency in approximate and speculative adder design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
27 | |
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-5090-3623-3 The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
|
27 | Ke Chen 0018, Fabrizio Lombardi, Jie Han 0001 |
Design and analysis of an approximate 2D convolver. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 31-34, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Anirudh Iyengar, Swaroop Ghosh, Nitin Rathi, Helia Naeimi |
Side channel attacks on STTRAM and low-overhead countermeasures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 141-146, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Xiaolin Xu, Daniel E. Holcomb |
Reliable PUF design using failure patterns from time-controlled power gating. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 135-140, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Abdulaziz Eker, Oguz Ergin |
Error recovery through partial value similarity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 103-106, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren |
Experimental study and analysis of soft and permanent errors in digital cameras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 11-14, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Mojing Liu, Brett H. Meyer |
Bounding error detection latency in safety critical systems with enhanced Execution Fingerprinting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 47-52, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Gianluca Furano, Stefano Di Mascio, Tomasz Szewczyk, Alessandra Menicucci, Luigi Campajola, Francesco Di Capua, Andrea Fabbri, Marco Ottavi |
A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 131-134, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Adam Watkins, Spyros Tragoudas |
A Highly Robust Double Node Upset Tolerant latch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 15-20, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Ahmed Ibrahim 0001, Hans G. Kerkhoff |
Efficient utilization of hierarchical iJTAG networks for interrupts management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 97-102, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Vinay C. Patil, Arunkumar Vijayakumar, Sandip Kundu |
On meta-obfuscation of physical layouts to conceal design characteristics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 147-152, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Filippo Giuliani, Marco Ottavi, Gian Carlo Cardarilli, Marco Re, Luca Di Nunzio, Rocco Fazzolari, Antimo Bruno, Francesco Zuliani |
Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 111-114, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Luca Santinelli, Zhishan Guo, Laurent George 0001 |
Fault-aware sensitivity analysis for probabilistic real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 69-74, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Ronak Salamat, Masoumeh Ebrahimi, Nader Bagherzadeh, Freek Verbeek |
CoBRA: Low cost compensation of TSV failures in 3D-NoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 115-120, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff |
Detecting intermittent resistive faults in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 87-90, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Zaid Al-bayati, Brett H. Meyer, Haibo Zeng 0001 |
Fault-tolerant scheduling of multicore mixed-criticality systems under permanent failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 57-62, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Alexander Schöll, Claus Braun, Hans-Joachim Wunderlich |
Applying efficient fault tolerance to enable the preconditioned conjugate gradient solver on approximate computing hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 21-26, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Chao Chen, Jacopo Panerati, Giovanni Beltrame |
Effects of online fault detection mechanisms on Probabilistic Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 41-46, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Juexiao Su, Ju-Yueh Lee, Chang Wu, Lei He |
In-place LUT polarity inVersion to mitigate soft errors for FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 81-86, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Xiaotong Cui, Kaijie Wu 0001, Siddharth Garg, Ramesh Karri |
Can flexible, domain specific programmable logic prevent IP theft? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 153-157, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Juman Alshraiedeh, Avinash Kodi |
An adaptive routing algorithm to improve lifetime reliability in NoCs architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 127-130, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar 0001 |
Cross-layer fault-tolerant design of real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 63-68, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Hananeh Aliee, Stefan Vitzethum, Michael Glaß, Jürgen Teich, Emanuele Borgonovo |
Guiding Genetic Algorithms using importance measures for reliable design of embedded systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 53-56, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
A new approach to deadlock-free fully adaptive routing for high-performance fault-tolerant NoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 121-126, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Naghmeh Karimi, Ke Huang 0001 |
Prognosis of NBTI aging using a machine learning scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 7-10, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Hardeep Chahal, Vasileios Tenentes, Daniele Rossi 0001, Bashir M. Al-Hashimi |
BTI aware thermal management for reliable DVFS designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 1-6, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Cristiana Bolchini, Matteo Carminati, Tulika Mitra, Thannirmalai Somu Muthukaruppan |
Combined on-line lifetime-energy optimization for asymmetric multicores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 35-40, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Marcos T. Leipnitz, Eduardo Nunes de Souza, Gabriel L. Nazar |
Low cost resilient regular expression matching on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 75-80, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Omer Khan, Maria K. Michael, Antonio Miele, Qiaoyan Yu |
Foreword. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. iii, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Hiroki Ueno, Kazuteru Namba |
Construction of a soft error (SEU) hardened Latch with high critical charge. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 27-30, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Xabier Iturbe, Balaji Venu, Emre Ozer 0001 |
Soft error vulnerability assessment of the real-time safety-related ARM Cortex-R5 CPU. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 91-96, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti |
In-field functional test programs development flow for embedded FPUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 107-110, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
27 | |
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-4799-6155-9 The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
27 | Ashkan Eghbal, Pooria M. Yaghini, Siavash S. Yazdi, Nader Bagherzadeh |
TSV-to-TSV inductive coupling-aware coding scheme for 3D Network-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 92-97, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Stavros Tzilis, Ioannis Sourdis |
A runtime manager for gracefully degrading SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 216-221, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Swapnil Bahl, Shreyans Rungta, Shray Khullar, Rohit Kapur, Anshuman Chandra, Salvatore Talluto 0001, Pramod Notiyath, Ajay Rajagopalan |
Unifying scan compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 191-196, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Jimson Mathew, Marco Ottavi, Yunfan Yang, Dhiraj K. Pradhan |
Using memristor state change behavior to identify faults in photovoltaic arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 86-91, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Cristiana Bolchini, Luca Cassano |
Machine learning-based techniques for incremental functional diagnosis: A comparative analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 246-251, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Mihalis Psarakis, Alexandros Vavousis, Cristiana Bolchini, Antonio Miele |
Design and implementation of a self-healing processor on SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 165-170, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Jerry Backer, David Hély, Ramesh Karri |
Reusing the IEEE 1500 design for test infrastructure for security monitoring of Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 52-56, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Thiago Berticelli Lo, Fernanda Lima Kastensmidt, Antonio Carlos Schneider Beck |
Towards an adaptable bit-width NMR voter for multiple error masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 258-263, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus |
Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 27-32, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Tsuyoshi Iwagaki, Tatsuya Nakaso, Ryoko Ohkubo, Hideyuki Ichihara, Tomoo Inoue |
Scheduling algorithm in datapath synthesis for long duration transient fault tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 128-133, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | In-Seok Jung, Yong-Bin Kim |
A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 276-280, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Domenico G. Sorrenti, Dario Cozzi, Sebastian Korf, Luca Cassano, Jens Hagemeyer, Mario Porrmann, Cinzia Bernardeschi |
Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 203-208, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Christopher Frost 0002 |
Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 153-158, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Stefano Di Carlo, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
A fault injection methodology and infrastructure for fast single event upsets emulation on Xilinx SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 159-164, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Cristian Constantinescu, Srini Krishnamoorthy, Tuyen Nguyen |
Estimating the effect of single-event upsets on microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 185-190, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Wisam Aljubouri, Ahish Mysore Somashekar, Themistoklis Haniotakis, Spyros Tragoudas |
Diagnosis of segment delay defects with current sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 122-127, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Michael A. Skitsas, Chrysostomos Nicopoulos, Maria K. Michael |
Exploration of system availability during software-based self-testing in many-core systems under test latency constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 33-39, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Victor Tomashevich, Yaara Neumeier, Raghavan Kumar, Osnat Keren, Ilia Polian |
Protecting cryptographic hardware against malicious attacks by nonlinear robust codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 40-45, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Jahanzeb Anwer, Marco Platzner |
Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 177-184, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Masoumeh Ebrahimi, Junshi Wang, Letian Huang, Masoud Daneshtalab, Axel Jantsch |
Rescuing healthy cores against disabled routers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 98-103, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Pilin Junsangsri, Jie Han 0001, Fabrizio Lombardi |
A system-level scheme for resistance drift tolerance of a multilevel phase change memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 63-68, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren |
Improved correction for hot pixels in digital imagers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 116-121, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Halit Dogan, Domenic Forte, Mark Mohammad Tehranipoor |
Aging analysis for recycled FPGA detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 171-176, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Paniz Foroutan, Mehdi Kamal, Zainalabedin Navabi |
A heuristic path selection method for small delay defects test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 252-257, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Anup Das 0001, Akash Kumar 0001, Bharadwaj Veeravalli |
Artificial intelligence based task mapping and pipelined scheduling for checkpointing on real time systems with imperfect fault detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 134-140, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Mohammad Hashem Haghbayan, Bijan Alizadeh, Amir-Mohammad Rahmani, Pasi Liljeberg, Hannu Tenhunen |
Automated formal approach for debugging dividers using dynamic specification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 264-269, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Ernesto Sánchez 0001, Matteo Sonza Reorda, Sergio de Luca, Renato Meregalli, Alessandro Sansonetti |
On the in-field functional testing of decode units in pipelined RISC processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 299-304, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
27 | Md. Tauhidur Rahman 0001, Domenic Forte, Quihang Shi, Gustavo K. Contreras, Mark Mohammad Tehranipoor |
CSST: Preventing distribution of unlicensed and rejected ICs by untrusted foundry and assembly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, pp. 46-51, 2014, IEEE Computer Society, 978-1-4799-6155-9. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
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