Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
A branch-&-bound algorithm for TAM optimization in multi-Vdd SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | |
20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![IEEE, 978-1-4799-7603-4 The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
1 | Charalambos Konstantinou, Michail Maniatakos, Fareena Saqib, Shiyan Hu, Jim Plusquellic, Yier Jin |
Cyber-physical systems: A security perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-8, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue |
A fault tolerant response analyzer with self-error-correction capability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
Automatic generation of autonomous built-in observability structures for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori |
Re-using BIST for circuit aging monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Kohei Miyase, Matthias Sauer 0002, Bernd Becker 0001, Xiaoqing Wen, Seiji Kajihara |
Identification of high power consuming areas with gate type and logic level information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Zebo Peng |
Is adaptive testing the panacea for the future test problems? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Flavius Opritoiu, Mircea Vladutiu |
Evaluating the self-testing property of AES' finite field inversion units. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
Branch guided functional test generation at the RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen |
Variability-aware aging modeling for reliability analysis of an analog neural measurement system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Liang Chen 0014, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
Reliability-aware operation chaining in high level synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
Aging guardband reduction through selective flip-flop optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Shuo Li, Hong Wang, Shiyuan Yang |
Reliability analysis for power MOSFET based on multi-physics simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase |
A soft-error tolerant TCAM using partial don't-care keys. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Hervé Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu |
High frequency jitter estimator for SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Trung Anh Dinh, Shigeru Yamashita, Tsung-Yi Ho, Krishnendu Chakrabarty |
Testing of digital microfluidic biochips with arbitrary layouts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-2, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Hans-Joachim Wunderlich |
Testing visions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Gildas Léger |
Boundary cost optimization for Alternate Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Stephan Eggersglüß |
Compact test set generation for test compression-based designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015, pp. 1-6, 2015, IEEE, 978-1-4799-7603-4. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Marcus Wagner, Hans-Joachim Wunderlich |
Incremental computation of delay fault detection probability for variation-aware test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Amr A. R. Sayed-Ahmed, Hossam A. H. Fahmy, Ulrich Kühne |
Verification of the decimal floating-point square root operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Marco Indaco, Paolo Prinetto, Elena I. Vatajelu |
On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-10, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Christian Badack, Michael Gössel |
Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh |
Output-bit selection with X-avoidance using multiple counters for test-response compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus |
Systematic generation of diagnostic software-based self-test routines for processor components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Elena Dubrova, Mats Näslund, Göran Selander |
Secure and efficient LBIST for feedback shift register-based cryptographic systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard 0001, P. Debaud, S. Guilhot |
iBoX - Jitter based Power Supply Noise sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Alireza Rohani, Hans G. Kerkhoff |
Two soft-error mitigation techniques for functional units of DSP processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Álvaro Gómez-Pau, Luz Balado, Joan Figueras |
M-S specification binning based on digitally coded indirect measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski |
Cell-aware experiences in a high-quality automotive test suite. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Shi-Yu Huang, Zeng-Fu Zeng, Kun-Han Tsai, Wu-Tung Cheng |
On-the-fly timing-aware built-in self-repair for high-speed interposer wires in 2.5-D ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras |
Post-bond test of Through-Silicon Vias with open defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere |
Optimization of analog fault coverage by exploiting defect-specific masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Arezoo Kamran, Zainalabedin Navabi |
Homogeneous many-core processor system test distribution and execution mechanism. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Jia Li 0022, Zhuolei Huang, Weibing Wang |
Built-in self-calibration of CMOS-compatible thermopile sensor with on-chip electrical stimulus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Anthi Anastasiou, Yiorgos Tsiatouhas |
Power efficient scan testing by exploiting existing error tolerance circuitry in a design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Eberhard Böhl, Matthew Lewis 0003, S. Galkin |
A true random number generator with on-line testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Xijiang Lin, Mark Kassab, Janusz Rajski |
Using dynamic shift to reduce test data volume in high-compression designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, James Chien-Mo Li, Michael S. Hsiao, Laung-Terng Wang |
GPU-based timing-aware test generation for small delay defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Ioannis Voyiatzis |
Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Orlando Ferrante, Alberto Ferrari, Marco Marazza |
Model based generation of high coverage test suites for embedded systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz |
A distance-based test cube merging procedure for compatible and incompatible test cubes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Thomas Herrmann, Shobhit Malik, Sriram Madhavan |
Quantified contribution of design for manufacturing to yield at 28nm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Horst Schirmeier, Lars Rademacher, Olaf Spinczyk |
Smart-hopping: Highly efficient ISA-level fault injection on real hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Davide Sabena, Luca Sterpone, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus, S. Wong, Robért Glein, Florian Rittner, C. Stender, Mario Porrmann, Jens Hagemeyer |
Reconfigurable high performance architectures: How much are they ready for safety-critical applications? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-8, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Thomas Lehner, Andreas Kuhr, Michael G. Wahl, Rainer Brück 0001 |
Site dependencies in a multisite testing environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Dmitri Mironov, Raimund Ubar, Jaan Raik |
Logic simulation and fault collapsing with shared structurally synthesized bdds. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis 0001, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost 0002 |
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Sébastien Sarrazin, Samuel Evain, Ivan Miro Panades, Alexandre Valentian, Suresh Pajaniradja, Lirida Alves de Barros Naviner, Valentin Gherman |
Shadow-scan design with low latency overhead and in-situ slack-time monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Giorgio Di Natale (eds.) |
19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![IEEE, 978-1-4799-3415-7 The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
1 | Somayeh Sadeghi Kohan, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, Zainalabedin Navabi |
Improving polynomial datapath debugging with HEDs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Asen Asenov |
Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee |
Design of low cost fault tolerant analog circuits using real-time learned error compensation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Sarvesh Prabhu, Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
Property-checking based LBIST for improved diagnosability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Alejandro Cook, Hans-Joachim Wunderlich |
Diagnosis of multiple faults with highly compacted test responses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Luca Sterpone, Boyang Du |
Analysis and mitigation of single event effects on flash-based FPGAS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Dan Alexandrescu, Luca Sterpone, Celia López-Ongil |
Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Ilia Polian, Jie Jiang 0018, Adit D. Singh |
Detection conditions for errors in self-adaptive better-than-worst-case designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Payman Behnam, Bijan Alizadeh, Zainalabedin Navabi |
Automatic correction of certain design errors using mutation technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Luca Cassano, Alberto Bosio, Giorgio Di Natale |
A novel adaptive fault tolerant flip-flop architecture based on TMR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Richard Swanson, Anna Wong, Suraj Ethirajan, Amitava Majumdar 0002 |
Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Marzieh Mohammadi, Somayeh Sadeghi Kohan, Nasser Masoumi, Zainalabedin Navabi |
An off-line MDSI interconnect BIST incorporated in BS 1149.1. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Eberhard Böhl, Matthew Lewis 0003, Klaus Damm |
A collision resistant deterministic random bit generator with fault attack detection possibilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Walden C. Rhines |
Major eras of Design for Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Madalin Neagu, Liviu Miclea, Salvador Manich |
Interleaved scrambling technique: A novel low-power security layer for cache memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Matthias Sauer 0002, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker 0001 |
Variation-aware deterministic ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Adit D. Singh |
Error detection and recovery in better-than-worst-case timing designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Thiago Santini, Paolo Rech, Gabriel L. Nazar, Luigi Carro, Flávio Rech Wagner |
Reducing embedded software radiation-induced failures through cache memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Sk Subidh Ali, Ozgur Sinanoglu, Ramesh Karri |
Test-mode-only scan attack using the boundary scan chain. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler |
Optimization-based multiple target test generation for highly compacted test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Athul Prabhu, Vlado Vorisek, Helmut Lang, Thomas Schumann |
Analysis of cell-aware test pattern effectiveness - A case study using a 32-bit automotive microcontroller. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Yaara Neumeier, Osnat Keren |
A new efficiency criterion for security oriented error correcting codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Mehdi Dehbashi, Görschwin Fey |
Sat-based speedpath debugging using waveforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Eduardo J. Peralías, Antonio Jose Ginés, Adoración Rueda |
INL systematic reduced-test technique for Pipeline ADCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Liang Chen 0014, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
Quantitative evaluation of register vulnerabilities in RTL control paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Ioannis Voyiatzis |
Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Shudong Lin, Gordon W. Roberts |
Towards a general purpose mixed-signal instrumentation layer in the die stack of a 3D-SIC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, pp. 1-2, 2014, IEEE, 978-1-4799-3415-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
1 | Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui |
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Nikil D. Dutt |
Outlook for many-core systems: Cloudy with a chance of virtualization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Jeff Rearick |
Magical thinking applied to test engineering reality (and vice versa). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Samuel Evain, Valentin Gherman |
Error-correction schemes with erasure information for fast memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Jeremy Dubeuf, David Hély, Ramesh Karri |
Run-time detection of hardware Trojans: The processor protection unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
Variability-aware and fault-tolerant self-adaptive applications for many-core chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
Bias temperature instability analysis in SRAM decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Panagiota Papavramidou, Michael Nicolaidis |
Reducing power dissipation in memory repair for high defect densities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-7, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir |
Efficient minimization of test frequencies for linear analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
Implementing model redundancy in predictive alternate test to improve test confidence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello |
Current testing: Dead or alive? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Giuseppe Di Guglielmo, Davide Ferraretto, Franco Fummi, Graziano Pravadelli |
Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Álvaro Gómez-Pau, Luz Balado, Joan Figueras |
M-S test based on specification validation using octrees in the measure space. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Matteo Sonza Reorda, Luca Sterpone, Anees Ullah |
An error-detection and self-repairing method for dynamically and partially reconfigurable systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-7, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski |
New test compression scheme based on low power BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
A software-based self test of CUDA Fermi GPUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Jie Han 0001, Michael Orshansky |
Approximate computing: An emerging paradigm for energy-efficient design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Omid Sarbishei, Atena Roshan Fekr, Majid Janidarmian, Benjamin Nahill, Katarzyna Radecka |
A minimum MSE sensor fusion algorithm with tolerance to multiple faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Christophe Kelma, Sébastien Darfeuille, Andreas Neuburger, Andreas Lobnig |
RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
1 | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
Adaptive quality binning for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013, pp. 1-6, 2013, IEEE Computer Society, 978-1-4673-6376-1. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|