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Searching for Electromigration with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1987-1995 (17) 1996-2000 (15) 2001-2002 (26) 2003-2004 (33) 2005-2006 (30) 2007 (20) 2008-2009 (24) 2010-2011 (26) 2012-2013 (26) 2014 (20) 2015 (25) 2016 (18) 2017 (20) 2018 (28) 2019-2020 (27) 2021 (16) 2022 (17) 2023 (20)
Publication types (Num. hits)
article(168) book(1) inproceedings(237) phdthesis(2)
Venues (Conferences, Journals, ...)
Microelectron. Reliab.(76) IRPS(38) IEEE Trans. Comput. Aided Des....(30) ICCAD(29) ISQED(21) DAC(18) IEEE Trans. Very Large Scale I...(16) ASP-DAC(15) ISPD(10) DATE(9) SLIP(9) ACM Great Lakes Symposium on V...(8) ISCAS(7) DFT(6) Integr.(6) SMACD(6) More (+10 of total 82)
Authors
Sheldon X.-D. Tan(39) Valeriy Sukharev(21) Sachin S. Sapatnekar(20) Farid N. Najm(18) Jens Lienig(17) Zeyu Sun 0001(16) Malgorzata Marek-Sadowska(13) Cher Ming Tan(12) Vivek Mishra(11) Kristof Croes(10) Liang Chen 0025(10) Taeyoung Kim 0001(10) Chase Cook(9) Houman Zahedmanesh(9) Nestor E. Evmorfopoulos(9) Palkesh Jain(9) More (+10 of total 904)
GrowBag graphs for keyword ? (Num. hits/coverage)

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The graphs summarize 100 occurrences of 61 keywords
Results
Found 408 publication records. Showing 408 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
14Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric R. Minami, Khandker N. Quader, Ping K. Ko, Chenming Hu Berkeley reliability tools-BERT. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
14Farid N. Najm Transition density: a new measure of activity in digital circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
14Farid N. Najm, Ibrahim N. Hajj, Ping Yang 0001 An extension of probabilistic simulation for reliability analysis of CMOS VLSI circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
14Reiner Kolla A dynamic programming approach to the power supply net sizing problem. Search on Bibsonomy EURO-DAC The full citation details ... 1990 DBLP  DOI  BibTeX  RDF
14Rajiv Dutta, Malgorzata Marek-Sadowska Automatic Sizing of Power/Ground (P/G) Networks in VLSI. Search on Bibsonomy DAC The full citation details ... 1989 DBLP  DOI  BibTeX  RDF
14Salim U. Chowdhury, Melvin A. Breuer Optimum design of IC power/ground nets subject to reliability constraints. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1988 DBLP  DOI  BibTeX  RDF
14Richard Burch, Farid N. Najm, Ping Yang 0001, Dale E. Hocevar Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits. Search on Bibsonomy DAC The full citation details ... 1988 DBLP  BibTeX  RDF
14S. Chowdhury An Automated Design of Minimum-Area IC Power/Ground Nets. Search on Bibsonomy DAC The full citation details ... 1987 DBLP  DOI  BibTeX  RDF
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