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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 452 occurrences of 271 keywords
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Results
Found 1308 publication records. Showing 1308 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | R. Cantora, Ernesto Sánchez 0001, Matteo Sonza Reorda, Giovanni Squillero, Emanuele Valea |
On the optimization of SBST test program compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Alexander Schneider 0002, Paul Pop, Jan Madsen |
Volume management for fault-tolerant continuous-flow microfluidics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti |
On-line software-based self-test for ECC of embedded RAM memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler |
Machine learning based test pattern analysis for localizing critical power activity areas. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Mert Atamaner, Oguz Ergin, Marco Ottavi, Pedro Reviriego |
Detecting errors in instructions with bloom filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Satyadev Ahlawat, Darshit Vaghani, Virendra Singh |
Preventing scan-based side-channel attacks through key masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Vasileios Tenentes, Charles Leech, Graeme M. Bragg, Geoff V. Merrett, Bashir M. Al-Hashimi, Hussam Amrouch, Jörg Henkel, Shidhartha Das |
Hardware and software innovations in energy-efficient system-reliability monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-5, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Kedar Janardan Dhori, Hitesh Chawla, Ashish Kumar, Prashant Pandey, Promod Kumar, Lorenzo Ciampolini, Florian Cacho, Damien Croain |
High-yield design of high-density SRAM for low-voltage and low-leakage operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu |
A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Jyothish Soman, Timothy M. Jones 0001 |
High performance fault tolerance through predictive instruction re-execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Jain-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho |
Design-for-testability for paper-based digital microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Mihalis Psarakis, Aitzan Sari |
A scrubbing scheduling approach for reliable FPGA multicore processors with real-time constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Rishad A. Shafik, Qiaoyan Yu, S. Saqib Khursheed, Antonio Miele |
Welcome Message. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Lucas Weigel, Fernando Fernandes 0001, Philippe O. A. Navaux, Paolo Rech |
Kernel vulnerability factor and efficient hardening for histogram of oriented gradients. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Sebastian Huhn 0001, Stephan Eggersglüß, Rolf Drechsler |
Reconfigurable TAP controllers with embedded compression for large test data volume. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Bing Li 0005, Ulf Schlichtmann |
Reliability-aware synthesis and fault test of fully programmable valve arrays (FPVAs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | H. Junqi, T. Nandha Kumar, Haider Abbas, Fabrizio Lombardi |
Simulation-based evaluation of frequency upscaled operation of exact/approximate ripple carry adders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yu-Wei Lee, Nur A. Touba |
Improving test compression with multiple-polynomial LFSRs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Haider Alrudainy, Rishad A. Shafik, Andrey Mokhov, Alex Yakovlev |
Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Shoba Gopalakrishnan, Virendra Singh |
REMORA: A hybrid low-cost soft-error reliable fault tolerant architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Chiara Sandionigi, Maurício Altieri, Olivier Héron |
Early estimation of aging in the design flow of integrated circuits through a programmable hardware module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Mauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi 0001 |
Low cost error monitoring for improved maintainability of IoT applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yu Xie, Chen Yang 0003, Chuang-An Mao, He Chen, Yizhuang Xie |
A novel low-overhead fault tolerant parallel-pipelined FFT design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Xin Fan 0002, Jan Stuijt, Tobias Gemmeke |
Towards SRAM leakage power minimization by aggressive standby voltage scaling - Experiments on 40nm test chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Prashant D. Joshi, Arunabha Sen, D. Frank Hsu, Said Hamdioui, Koen Bertels |
Region based containers - A new paradigm for the analysis of fault tolerant networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Alessandro Baldassari, Cristiana Bolchini, Antonio Miele |
A dynamic reliability management framework for heterogeneous multicore systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Nguyen T. H. Nguyen, Ediz Cetin, Oliver Diessel |
Scheduling voter checks to detect configuration memory errors in FPGA-based TMR systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren |
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Gokulkrishnan Vadakkeveedu, V. Kamakoti 0001, Nitin Chandrachoodan, Seetal Potluri |
A scalable pseudo-exhaustive search for fault diagnosis in microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Lake Bu, Hien D. Nguyen, Michel A. Kinsy |
RASSS: A perfidy-aware protocol for designing trustworthy distributed systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Tiago A. O. Alves, Sandip Kundu, Leandro A. J. Marzulo, Felipe M. G. França |
A resilient scheduler for dataflow execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Amir Mahdi Hosseini Monazzah, Hamed Farbeh, Seyed Ghassem Miremadi |
Investigating the effects of process variations and system workloads on endurance of non-volatile caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Toshinori Hosokawa, Atsushi Hirai, Hiroshi Yamazaki, Masayuki Arai |
A dynamic test compaction method on low power test generation based on capture safe test vectors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Andrea Fedi, Marco Ottavi, Gianluca Furano, Antimo Bruno, Roberto Senesi, Carla Andreani, Carlo Cazzaniga |
High-energy neutrons characterization of a safety critical computing system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-4, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Leandro Santiago 0001, Vinay C. Patil, Charles B. Prado, Tiago A. O. Alves, Leandro A. J. Marzulo, Felipe M. G. França, Sandip Kundu |
Realizing strong PUF from weak PUF via neural computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Sina Boroumand, Hadi Parandeh-Afshar, Philip Brisk, Siamak Mohammadi |
CAL: Exploring cost, accuracy, and latency in approximate and speculative adder design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1-6, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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17 | Hyo-Jick Choi, Carlo D. Montemagno |
Convergence of Nanotechnology and Biotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Handbook of Science and Technology Convergence ![In: Handbook of Science and Technology Convergence, pp. 253-277, 2016, Springer, 978-3-319-07051-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Jo-Won Lee, Moonkyung Mark Kim |
Nanotechnology-Neuroscience Convergence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Handbook of Science and Technology Convergence ![In: Handbook of Science and Technology Convergence, pp. 293-306, 2016, Springer, 978-3-319-07051-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Priya Satalkar, Bernice Simone Elger, David M. Shaw |
Defining Nano, Nanotechnology and Nanomedicine: Why Should It Matter? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 22(5), pp. 1255-1276, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Shannon L. Spruit, Gordon D. Hoople, David A. Rolfe |
Just a Cog in the Machine? The Individual Responsibility of Researchers in Nanotechnology is a Duty to Collectivize. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 22(3), pp. 871-887, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Lotte Krabbenborg |
Creating Inquiry Between Technology Developers and Civil Society Actors: Learning from Experiences Around Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 22(3), pp. 907-922, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Elizabeth A. Corley, Youngjae Kim, Dietram A. Scheufele |
Scientists' Ethical Obligations and Social Responsibility for Nanotechnology Research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. Eng. Ethics ![In: Sci. Eng. Ethics 22(1), pp. 111-132, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Yansong Gao, Damith Chinthana Ranasinghe, Said F. Al-Sarawi, Omid Kavehei, Derek Abbott |
Emerging Physical Unclonable Functions With Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 4, pp. 61-80, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Zaida Chinchilla-Rodríguez, Kevin Ocaña-Rosa, Benjamín Vargas-Quesada |
How to Combine Research Guarantor and Collaboration Patterns to Measure Scientific Performance of Countries in Scientific Fields: Nanoscience and Nanotechnology as a Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Frontiers Res. Metrics Anal. ![In: Frontiers Res. Metrics Anal. 1, pp. 2, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Arnim Wiek, Rider W. Foley, David H. Guston, Michael J. Bernstein |
Broken promises and breaking ground for responsible innovation - intervention research to transform business-as-usual in nanotechnology innovation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technol. Anal. Strateg. Manag. ![In: Technol. Anal. Strateg. Manag. 28(6), pp. 639-650, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Vivek Kant, Catherine M. Burns |
Engaging nanotechnology: ethnography of lab-on-a-chip technology in small-scale fluidics research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Cogn. Technol. Work. ![In: Cogn. Technol. Work. 18(1), pp. 33-52, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Fazel Sharifi, Atiyeh Panahi, Hojjat Sharifi, Keivan Navi, Nader Bagherzadeh, Himanshu Thapliyal |
Design of quaternary 4-2 and 5-2 compressors for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Electr. Eng. ![In: Comput. Electr. Eng. 56, pp. 64-74, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Kasia Zalewska-Kurek |
Understanding researchers' strategic behaviour in knowledge production: a case of social science and nanotechnology researchers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Knowl. Manag. ![In: J. Knowl. Manag. 20(5), pp. 1148-1167, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Ebrahim Abiri, Abdolreza Darabi |
A novel design of low power and high read stability Ternary SRAM (T-SRAM), memory based on the modified Gate Diffusion Input (m-GDI) method in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 58, pp. 44-59, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Mohammad Hossein Moaiyeri, Elham Taherkhani, Shaahin Angizi |
A Novel Efficient Reversible Full Adder-Subtractor in QCA Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1610.09473, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
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17 | Hamid R. Darvish, Yasar Tonta |
Diffusion of nanotechnology knowledge in Turkey and its network structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 107(2), pp. 569-592, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Maria Karaulova, Abdullah Gök, Oliver Shackleton, Philip Shapira |
Science system path-dependencies and their influences: nanotechnology research in Russia. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 107(2), pp. 645-670, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Karmen Stopar, Damjana Drobne, Klemen Eler, Tomaz Bartol |
Citation analysis and mapping of nanoscience and nanotechnology: identifying the scope and interdisciplinarity of research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 106(2), pp. 563-581, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | |
Nanotechnology: Chlorine atom arrays store data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Nat. ![In: Nat. 535(7612), pp. 327, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | |
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE Computer Society, 978-1-5090-3623-3 The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
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17 | Tiannan Chen, Xiangyun Lei, Hakan Demir, Christopher J. Cramer, Laura Gagliardi, Stephen J. Guy |
MOF: creating an educational game on nanotechnology through simulation-driven optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIG ![In: Proceedings of the 9th International Conference on Motion in Games, MIG 2016, Burlingame, California, USA, October 10-12, 2016, pp. 39-48, 2016, ACM, 978-1-4503-4592-7. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Alis Pataquiva-Mateus, Edgar Ruiz Dorantes |
Teaching Nanotechnology as a Framework of Social Inclusion, Empowerment, and Deep Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICL (2) ![In: Interactive Collaborative Learning - Proceedings of the 19th ICL Conference - Volume 2, Belfast, UK, 21-23 September 2016., pp. 468-478, 2016, Springer, 978-3-319-50339-4. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Frits Dannenberg |
Modelling and verification for DNA nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2016 |
RDF |
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17 | Ke Chen 0018, Fabrizio Lombardi, Jie Han 0001 |
Design and analysis of an approximate 2D convolver. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 31-34, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Anirudh Iyengar, Swaroop Ghosh, Nitin Rathi, Helia Naeimi |
Side channel attacks on STTRAM and low-overhead countermeasures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 141-146, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Xiaolin Xu, Daniel E. Holcomb |
Reliable PUF design using failure patterns from time-controlled power gating. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 135-140, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Abdulaziz Eker, Oguz Ergin |
Error recovery through partial value similarity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 103-106, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren |
Experimental study and analysis of soft and permanent errors in digital cameras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 11-14, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Mojing Liu, Brett H. Meyer |
Bounding error detection latency in safety critical systems with enhanced Execution Fingerprinting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 47-52, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Gianluca Furano, Stefano Di Mascio, Tomasz Szewczyk, Alessandra Menicucci, Luigi Campajola, Francesco Di Capua, Andrea Fabbri, Marco Ottavi |
A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 131-134, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Adam Watkins, Spyros Tragoudas |
A Highly Robust Double Node Upset Tolerant latch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 15-20, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Ahmed Ibrahim 0001, Hans G. Kerkhoff |
Efficient utilization of hierarchical iJTAG networks for interrupts management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 97-102, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Vinay C. Patil, Arunkumar Vijayakumar, Sandip Kundu |
On meta-obfuscation of physical layouts to conceal design characteristics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 147-152, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Filippo Giuliani, Marco Ottavi, Gian Carlo Cardarilli, Marco Re, Luca Di Nunzio, Rocco Fazzolari, Antimo Bruno, Francesco Zuliani |
Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 111-114, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Luca Santinelli, Zhishan Guo, Laurent George 0001 |
Fault-aware sensitivity analysis for probabilistic real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 69-74, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Ronak Salamat, Masoumeh Ebrahimi, Nader Bagherzadeh, Freek Verbeek |
CoBRA: Low cost compensation of TSV failures in 3D-NoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 115-120, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff |
Detecting intermittent resistive faults in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 87-90, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Zaid Al-bayati, Brett H. Meyer, Haibo Zeng 0001 |
Fault-tolerant scheduling of multicore mixed-criticality systems under permanent failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 57-62, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Alexander Schöll, Claus Braun, Hans-Joachim Wunderlich |
Applying efficient fault tolerance to enable the preconditioned conjugate gradient solver on approximate computing hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 21-26, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Chao Chen, Jacopo Panerati, Giovanni Beltrame |
Effects of online fault detection mechanisms on Probabilistic Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 41-46, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Juexiao Su, Ju-Yueh Lee, Chang Wu, Lei He |
In-place LUT polarity inVersion to mitigate soft errors for FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 81-86, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Xiaotong Cui, Kaijie Wu 0001, Siddharth Garg, Ramesh Karri |
Can flexible, domain specific programmable logic prevent IP theft? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 153-157, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Juman Alshraiedeh, Avinash Kodi |
An adaptive routing algorithm to improve lifetime reliability in NoCs architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 127-130, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar 0001 |
Cross-layer fault-tolerant design of real-time systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 63-68, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Hananeh Aliee, Stefan Vitzethum, Michael Glaß, Jürgen Teich, Emanuele Borgonovo |
Guiding Genetic Algorithms using importance measures for reliable design of embedded systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 53-56, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
A new approach to deadlock-free fully adaptive routing for high-performance fault-tolerant NoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 121-126, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Naghmeh Karimi, Ke Huang 0001 |
Prognosis of NBTI aging using a machine learning scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 7-10, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Hardeep Chahal, Vasileios Tenentes, Daniele Rossi 0001, Bashir M. Al-Hashimi |
BTI aware thermal management for reliable DVFS designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 1-6, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Matteo Carminati, Tulika Mitra, Thannirmalai Somu Muthukaruppan |
Combined on-line lifetime-energy optimization for asymmetric multicores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 35-40, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Marcos T. Leipnitz, Eduardo Nunes de Souza, Gabriel L. Nazar |
Low cost resilient regular expression matching on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 75-80, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Omer Khan, Maria K. Michael, Antonio Miele, Qiaoyan Yu |
Foreword. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. iii, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Hiroki Ueno, Kazuteru Namba |
Construction of a soft error (SEU) hardened Latch with high critical charge. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 27-30, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Xabier Iturbe, Balaji Venu, Emre Ozer 0001 |
Soft error vulnerability assessment of the real-time safety-related ARM Cortex-R5 CPU. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 91-96, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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17 | Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti |
In-field functional test programs development flow for embedded FPUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, pp. 107-110, 2016, IEEE Computer Society, 978-1-5090-3623-3. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Koen Beumer |
Publics, Issues, and Nanotechnology in Indian News Media. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Sci. Res. ![In: J. Sci. Res. 4(3), pp. 143-152, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Sujit Bhattacharya 0001 |
Nanotechnology and Development: What’s in it for Emerging Countries? ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Sci. Res. ![In: J. Sci. Res. 4(3), pp. 210-212, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
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17 | Shan Jiang 0002, Qiang Gao, Hsinchun Chen, Mihail C. Roco |
The roles of sharing, transfer, and public funding in nanotechnology knowledge-diffusion networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Assoc. Inf. Sci. Technol. ![In: J. Assoc. Inf. Sci. Technol. 66(5), pp. 1017-1029, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Jade Yu-Chieh Lo, Mark Thomas Kennedy |
Approval in Nanotechnology Patents: Micro and Macro Factors That Affect Reactions to Category Blending. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Organ. Sci. ![In: Organ. Sci. 26(1), pp. 119-139, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Leila Tahmooresnejad, Catherine Beaudry, Andrea Schiffauerova |
The role of public funding in nanotechnology scientific production: Where Canada stands in comparison to the United States. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 102(1), pp. 753-787, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Xuan Liu 0004, Shan Jiang 0002, Hsinchun Chen, Catherine A. Larson, Mihail C. Roco |
Modeling knowledge diffusion in scientific innovation networks: an institutional comparison between China and US with illustration for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 105(3), pp. 1953-1984, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Michael S. Trachtengerts, Adilbek O. Erkimbaev, Vladimir Y. Zitserman, Georgii A. Kobzev |
Using a digital library instead of a traditional database: ABCD-based infrastructure for nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Electron. Libr. ![In: Electron. Libr. 33(5), pp. 916-927, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Jin-Ho Lee, Byung-Keun Oh, Jeong Woo Choi |
Development of a HIV-1 Virus Detection System Based on Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 15(5), pp. 9915-9927, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Gregory L. Damhorst, Maurine Murtagh, William R. Rodriguez, Rashid Bashir |
Microfluidics and Nanotechnology for Detection of Global Infectious Diseases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Proc. IEEE ![In: Proc. IEEE 103(2), pp. 150-160, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Luca Gaetano Amarù, Pierre-Emmanuel Gaillardon, Subhasish Mitra, Giovanni De Micheli |
New Logic Synthesis as Nanotechnology Enabler. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Proc. IEEE ![In: Proc. IEEE 103(11), pp. 2168-2195, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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17 | Jimmy G. Hester, Sangkil Kim, Jo Bito, Taoran Le, John Kimionis, Daniel L. Revier, Christy D. Saintsing, Wenjing Su, Bijan Tehrani, Anya Traille, Benjamin S. Cook, Manos M. Tentzeris |
Additively Manufactured Nanotechnology and Origami-Enabled Flexible Microwave Electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Proc. IEEE ![In: Proc. IEEE 103(4), pp. 583-606, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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