Search results for "ATE"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
11	Cheng-Yue Chang, Ming-Syan Chen	Exploring Aggregate Effect with Weighted Transcoding Graphs for Efficient Cache Replacement in Transcoding Proxies.	ICDE	2002	DBLP DOI BibTeX RDF
11	Tosbiyuki Satoh, Takebiko Takahashi	Design of discrete-time robust servo systems via the principle of matching.	ICARCV	2002	DBLP DOI BibTeX RDF
11	Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek	Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
11	Lihong Tong, Kazuki Suzuki, Hideo Ito	Optimal Seed Generation for Delay Fault Detection BIST.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
11	Rochit Rajsuman	Extending EDA Environment From Design to Test.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
11	Miron Abramovici, Charles E. Stroud	BIST-Based Delay-Fault Testing in FPGAs.	IOLTW	2002	DBLP DOI BibTeX RDF
11	Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges	Test Economics for Multi-site Test with Modern Cost Reduction Techniques.	VTS	2002	DBLP DOI BibTeX RDF
11	Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch	Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.	VTS	2002	DBLP DOI BibTeX RDF
11	Stephen K. Sunter, Benoit Nadeau-Dostie	Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost.	ITC	2002	DBLP DOI BibTeX RDF
11	Sandeep Kumar Goel, Erik Jan Marinissen	Effective and Efficient Test Architecture Design for SOCs.	ITC	2002	DBLP DOI BibTeX RDF
11	Peter C. Maxwell	Wafer/Package Test Mix for Optimal Defect Detection.	ITC	2002	DBLP DOI BibTeX RDF
11	Gregory A. Maston	Considerations for STIL Data Application.	ITC	2002	DBLP DOI BibTeX RDF
11	David E. McFeely	The Process and Challenges of a High-Speed DUT Board Project.	ITC	2002	DBLP DOI BibTeX RDF
11	Paul Okino	Test Time Impact of Redundancy Repair in Embedded Flash Memory.	ITC	2002	DBLP DOI BibTeX RDF
11	Xiao Liu 0010, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran	Techniques to Reduce Data Volume and Application Time for Transition Test.	ITC	2002	DBLP DOI BibTeX RDF
11	John Ferrario, Randy Wolf, Steve Moss	Architecting Millisecond Test Solutions for Wireless Phone RFIC's.	ITC	2002	DBLP DOI BibTeX RDF
11	Thomas P. Warwick	What a Device Interface Board Really Costs: An Evaluation of Technical Considerations for Testing Products Operating in the Gigabit Region.	ITC	2002	DBLP DOI BibTeX RDF
11	Ronald W. Ritchey, Brian O'Berry, Steven Noel	Representing TCP/IP Connectivity For Topological Analysis of Network Security.	ACSAC	2002	DBLP DOI BibTeX RDF
11	Said Elnaffar	A methodology for auto-recognizing DBMS workloads.	CASCON	2002	DBLP BibTeX RDF
11	David M. Kristol	HTTP Cookies: Standards, privacy, and politics.	ACM Trans. Internet Techn.	2001	DBLP DOI BibTeX RDF	privacy, World Wide Web, HTTP, Cookies, state management
11	Janusz Rajski	DFT for High-Quality Low Cost Manufacturing Test.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
11	Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda	A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
11	Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater	A SmartBIST Variant with Guaranteed Encoding.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
11	Lutz M. Wegner, Morad Ahmad, Stefan Fröhlich, Christian Schmidt 0012, Wilfried Evers	A Collaborative Infrastructure for Mobile and Wireless Systems.	Infrastructure for Mobile and Wireless Systems	2001	DBLP DOI BibTeX RDF
11	Ioan Alfred Letia, Doina Precup	Developing Collaborative Golog Agents by Reinforcement Learning.	ICTAI	2001	DBLP DOI BibTeX RDF
11	Muhammad Nummer, Manoj Sachdev	A Methodology for Testing High-Performance Circuits at Arbitrarily Low Test Frequency.	VTS	2001	DBLP DOI BibTeX RDF	high-performance testing, controlled-delay flip-flop, built-in self test, Delay-fault testing, design for delay testability
11	Ulf Pillkahn	Evaluation of Interconnects with TDR.	DATE	2000	DBLP DOI BibTeX RDF
11	Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel	Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults.	IOLTW	2000	DBLP DOI BibTeX RDF	BIST, Random Testing, Delay Testing, Bridging Faults
11	Tom Ngo, Doug Cutrell, Jenny Dana, Bruce Randall Donald, Lorie Loeb, Shunhui Zhu	Accessible animation and customizable graphics via simplicial configuration modeling.	SIGGRAPH	2000	DBLP DOI BibTeX RDF	weird math, geometric modeling, animation with constraints, WWW applications
11	Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone	Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF
11	Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival	A Successful Distance-Learning Experience for IC Test Education.	MSE	1999	DBLP DOI BibTeX RDF
11	M. Svajda, B. Straka, Hans A. R. Manhaeve	IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit.	DATE	1998	DBLP DOI BibTeX RDF
11	Perfecto Mariño, Miguel Angel Domínguez	Integration of Image Processing and Automated Testing in a Manufacturing Client-Server Network.	EUROMICRO	1998	DBLP DOI BibTeX RDF
11	Wajih Dalal, Daniel A. Rosenthal	Measuring jitter of high speed data channels using undersampling techniques.	ITC	1998	DBLP DOI BibTeX RDF
11	Nilanjan Mukherjee 0001, Tapan J. Chakraborty, Sudipta Bhawmik	A BIST scheme for the detection of path-delay faults.	ITC	1998	DBLP DOI BibTeX RDF
11	Jim Anderson	Integrated probe card/interface solutions for specific test applications.	ITC	1998	DBLP DOI BibTeX RDF
11	Prab Varma	System Chip Test Challenges, Are There Solutions Today? (Panel).	DAC	1998	DBLP DOI BibTeX RDF
11	Debargha Mukherjee, Sanjit K. Mitra	Combined Mode Selection and Macroblock Quantization Step Adaptation for the H.263 Video Encoder.	ICIP (2)	1997	DBLP DOI BibTeX RDF
11	J. Webb, Karen L. Oehler	A Simple Rate-Distortion Model, Parameter Estimation, and Application to Real-Time Rate Control with DCT-Based Coders.	ICIP (2)	1997	DBLP DOI BibTeX RDF
11	M. Svajda, B. Straka, Hans A. R. Manhaeve	A monolithic off-chip IDDQ monitor.	ED&TC	1997	DBLP DOI BibTeX RDF
11	Javier Argüelles, María José López, J. Blanco, Mar Martínez, Salvador Bracho	Iddt testing of continuous-time filters.	VTS	1995	DBLP DOI BibTeX RDF	continuous time filters, continuous-time filters, design-for-test methodology, dynamic supply current consumption, dynamic current, partitioning methodology, test reliability, built-in self test, integrated circuit testing, design for testability, automatic testing, CMOS, automatic test equipment, built-in current sensor, CMOS analogue integrated circuits
11	Oscar H. Ibarra, Tao Jiang 0001, Nicholas Q. Trân, Hui Wang 0008	On the Equivalence of Two-way Pushdown Automata and Counter Machines over Bounded Languages.	STACS	1993	DBLP DOI BibTeX RDF
11	Andrea Maggiolo-Schettini, Józef Winkowski	A Programming Language for Deriving Hypergraphs.	CAAP	1992	DBLP DOI BibTeX RDF