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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 292 occurrences of 178 keywords
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Results
Found 654 publication records. Showing 643 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
11 | Cheng-Yue Chang, Ming-Syan Chen |
Exploring Aggregate Effect with Weighted Transcoding Graphs for Efficient Cache Replacement in Transcoding Proxies. |
ICDE |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Tosbiyuki Satoh, Takebiko Takahashi |
Design of discrete-time robust servo systems via the principle of matching. |
ICARCV |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek |
Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Lihong Tong, Kazuki Suzuki, Hideo Ito |
Optimal Seed Generation for Delay Fault Detection BIST. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Rochit Rajsuman |
Extending EDA Environment From Design to Test. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Miron Abramovici, Charles E. Stroud |
BIST-Based Delay-Fault Testing in FPGAs. |
IOLTW |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges |
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch |
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Stephen K. Sunter, Benoit Nadeau-Dostie |
Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Sandeep Kumar Goel, Erik Jan Marinissen |
Effective and Efficient Test Architecture Design for SOCs. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Peter C. Maxwell |
Wafer/Package Test Mix for Optimal Defect Detection. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Gregory A. Maston |
Considerations for STIL Data Application. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | David E. McFeely |
The Process and Challenges of a High-Speed DUT Board Project. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Paul Okino |
Test Time Impact of Redundancy Repair in Embedded Flash Memory. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Xiao Liu 0010, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran |
Techniques to Reduce Data Volume and Application Time for Transition Test. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | John Ferrario, Randy Wolf, Steve Moss |
Architecting Millisecond Test Solutions for Wireless Phone RFIC's. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Thomas P. Warwick |
What a Device Interface Board Really Costs: An Evaluation of Technical Considerations for Testing Products Operating in the Gigabit Region. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Ronald W. Ritchey, Brian O'Berry, Steven Noel |
Representing TCP/IP Connectivity For Topological Analysis of Network Security. |
ACSAC |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Said Elnaffar |
A methodology for auto-recognizing DBMS workloads. |
CASCON |
2002 |
DBLP BibTeX RDF |
|
11 | David M. Kristol |
HTTP Cookies: Standards, privacy, and politics. |
ACM Trans. Internet Techn. |
2001 |
DBLP DOI BibTeX RDF |
privacy, World Wide Web, HTTP, Cookies, state management |
11 | Janusz Rajski |
DFT for High-Quality Low Cost Manufacturing Test. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda |
A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater |
A SmartBIST Variant with Guaranteed Encoding. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Lutz M. Wegner, Morad Ahmad, Stefan Fröhlich, Christian Schmidt 0012, Wilfried Evers |
A Collaborative Infrastructure for Mobile and Wireless Systems. |
Infrastructure for Mobile and Wireless Systems |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Ioan Alfred Letia, Doina Precup |
Developing Collaborative Golog Agents by Reinforcement Learning. |
ICTAI |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Muhammad Nummer, Manoj Sachdev |
A Methodology for Testing High-Performance Circuits at Arbitrarily Low Test Frequency. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
high-performance testing, controlled-delay flip-flop, built-in self test, Delay-fault testing, design for delay testability |
11 | Ulf Pillkahn |
Evaluation of Interconnects with TDR. |
DATE |
2000 |
DBLP DOI BibTeX RDF |
|
11 | Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. |
IOLTW |
2000 |
DBLP DOI BibTeX RDF |
BIST, Random Testing, Delay Testing, Bridging Faults |
11 | Tom Ngo, Doug Cutrell, Jenny Dana, Bruce Randall Donald, Lorie Loeb, Shunhui Zhu |
Accessible animation and customizable graphics via simplicial configuration modeling. |
SIGGRAPH |
2000 |
DBLP DOI BibTeX RDF |
weird math, geometric modeling, animation with constraints, WWW applications |
11 | Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone |
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. |
Asian Test Symposium |
1999 |
DBLP DOI BibTeX RDF |
|
11 | Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival |
A Successful Distance-Learning Experience for IC Test Education. |
MSE |
1999 |
DBLP DOI BibTeX RDF |
|
11 | M. Svajda, B. Straka, Hans A. R. Manhaeve |
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. |
DATE |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Perfecto Mariño, Miguel Angel Domínguez |
Integration of Image Processing and Automated Testing in a Manufacturing Client-Server Network. |
EUROMICRO |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Wajih Dalal, Daniel A. Rosenthal |
Measuring jitter of high speed data channels using undersampling techniques. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Nilanjan Mukherjee 0001, Tapan J. Chakraborty, Sudipta Bhawmik |
A BIST scheme for the detection of path-delay faults. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Jim Anderson |
Integrated probe card/interface solutions for specific test applications. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Prab Varma |
System Chip Test Challenges, Are There Solutions Today? (Panel). |
DAC |
1998 |
DBLP DOI BibTeX RDF |
|
11 | Debargha Mukherjee, Sanjit K. Mitra |
Combined Mode Selection and Macroblock Quantization Step Adaptation for the H.263 Video Encoder. |
ICIP (2) |
1997 |
DBLP DOI BibTeX RDF |
|
11 | J. Webb, Karen L. Oehler |
A Simple Rate-Distortion Model, Parameter Estimation, and Application to Real-Time Rate Control with DCT-Based Coders. |
ICIP (2) |
1997 |
DBLP DOI BibTeX RDF |
|
11 | M. Svajda, B. Straka, Hans A. R. Manhaeve |
A monolithic off-chip IDDQ monitor. |
ED&TC |
1997 |
DBLP DOI BibTeX RDF |
|
11 | Javier Argüelles, María José López, J. Blanco, Mar Martínez, Salvador Bracho |
Iddt testing of continuous-time filters. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
continuous time filters, continuous-time filters, design-for-test methodology, dynamic supply current consumption, dynamic current, partitioning methodology, test reliability, built-in self test, integrated circuit testing, design for testability, automatic testing, CMOS, automatic test equipment, built-in current sensor, CMOS analogue integrated circuits |
11 | Oscar H. Ibarra, Tao Jiang 0001, Nicholas Q. Trân, Hui Wang 0008 |
On the Equivalence of Two-way Pushdown Automata and Counter Machines over Bounded Languages. |
STACS |
1993 |
DBLP DOI BibTeX RDF |
|
11 | Andrea Maggiolo-Schettini, Józef Winkowski |
A Programming Language for Deriving Hypergraphs. |
CAAP |
1992 |
DBLP DOI BibTeX RDF |
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