Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
44 | Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka |
Investigation of multi cell upset in sequential logic and validity of redundancy technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 7-12, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Josef Haid |
A side channel attack countermeasure using system-on-chip power profile scrambling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 222-227, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Matthias Sauer 0002, Victor Tomashevich, Jörg Müller 0004, Matthew Lewis 0004, Andreas Spilla, Ilia Polian, Bernd Becker 0001, Wolfram Burgard |
An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 182-185, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian |
Generic BIST architecture for testing of content addressable memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 86-91, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Marco Paolieri, Riccardo Mariani |
Towards functional-safe timing-dependable real-time architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 31-36, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Rance Rodrigues, Sandip Kundu |
On graceful degradation of microprocessors in presence of faults via resource banking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 61-66, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Renato P. Ribas, Yuyang Sun, André Inácio Reis, André Ivanov |
Self-checking test circuits for latches and flip-flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 210-213, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Yuriy Shiyanovskii, Aravind Rajendran, Christos A. Papachristou |
A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 139-144, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Rshdee Alhakim, Emmanuel Simeu, Kosai Raoof |
Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 121-126, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Nivard Aymerich, A. Asenov, Andrew R. Brown, Ramon Canal, Binjie Cheng, Joan Figueras, Antonio González 0001, Enric Herrero, S. Markov, Miguel Miranda, Peyman Pouyan, Tanausú Ramírez, Antonio Rubio 0001, Elena I. Vatajelu, Xavier Vera, Xingsheng Wang, Paul Zuber |
New reliability mechanisms in memory design for sub-22nm technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 111-114, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Matthias Sauer 0002, Alejandro Czutro, Ilia Polian, Bernd Becker 0001 |
Estimation of component criticality in early design steps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 104-110, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Michael E. Imhof, Hans-Joachim Wunderlich |
Soft error correction in embedded storage elements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 169-174, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Cédric Killian, Camel Tanougast, Fabrice Monteiro, Abbas Dandache |
Loopback output router for reliable Network on Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 206-207, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Jaume Abella 0001, Francisco J. Cazorla, Eduardo Quiñones, Arnaud Grasset, Sami Yehia, Philippe Bonnot 0001, Dimitris Gizopoulos, Riccardo Mariani, Guillem Bernat |
Towards improved survivability in safety-critical systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 240-245, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Ingrid Verbauwhede |
The cost of cryptography: Is low budget possible? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 133, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Ronak Salamat, Hamid R. Zarandi |
Fault-tolerance assessment and enhancement in SoCWire interface: A system-on-chip wire. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 196-197, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Enrico Costenaro, Massimo Violante, Dan Alexandrescu |
A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 49-54, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | V. Prasanth, Virendra Singh, Rubin A. Parekhji |
Reduced overhead soft error mitigation using error control coding techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 163-168, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh |
Variability-aware task mapping strategies for many-cores processor chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 55-60, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez 0001, Matteo Sonza Reorda |
An effective methodology for on-line testing of embedded microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 270-275, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Navid Khoshavi, Hamid R. Zarandi, Mohammad Maghsoudloo |
Control-flow error recovery using commodity multi-core architecture features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 190-191, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty |
A BIST scheme for testing and repair of multi-mode power switches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 115-120, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Kedar Karmarkar, Spyros Tragoudas |
Error correction encoding for multi-threshold capture mechanism. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 157-162, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Gabriele Boschi, Riccardo Mariani, Stefano Lorenzini |
A verification strategy for fault-detection and fault-tolerance circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 177-178, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Taiga Takata, Yusuke Matsunaga |
A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 246-251, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas 0001 |
An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 19-24, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Wang 0001, Mark G. Karpovsky |
Algebraic manipulation detection codes and their applications for design of secure cryptographic devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 234-239, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Shusuke Yoshimoto, Takuro Amashita, D. Kozuwa, Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Hiroshi Kawaguchi 0001, Masahiko Yoshimoto |
Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 151-156, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Seyab Khan, Said Hamdioui |
Modeling and mitigating NBTI in nanoscale circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 1-6, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Aravind Rajendran, Yuriy Shiyanovskii, Frank Wolff, Christos A. Papachristou |
Noise margin, critical charge and power-delay tradeoffs for SRAM design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 145-150, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Lilia Zaourar, Yann Kieffer, Arnaud Wenzel |
A multi-objective optimization for memory BIST sharing using a genetic algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 73-78, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Honorio Martín, Enrique San Millán, Luis Entrena, Julio César Hernández Castro, Pedro Peris-Lopez |
AKARI-X: A pseudorandom number generator for secure lightweight systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 228-233, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Daniel Sánchez 0004, Yiannakis Sazeides, Juan L. Aragón, José M. García 0001 |
An analytical model for the calculation of the Expected Miss Ratio in faulty caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 252-257, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Jayaram Natarajan, Shreyas Sen, Abhijit Chatterjee |
Real time cross-layer adaptation for minimum energy wireless image transport using bit error rate control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 127-132, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Paolo Maistri |
Countermeasures against fault attacks: The good, the bad, and the ugly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 134-137, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Luke Pierce, Spyros Tragoudas |
Multi-level secure JTAG architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 208-209, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Josep Torras Flaquer, Jean-Marc Daveau, Lirida A. B. Naviner, Philippe Roche |
An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 98-103, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Rafal Baranowski, Hans-Joachim Wunderlich |
Fail-safety in core-based system design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 276-281, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Cristiana Bolchini, Chiara Sandionigi, Luca Fossati, David Merodio Codinachs |
A reliable fault classifier for dependable systems on SRAM-based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 92-97, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Mikhail Baklashov |
An on-line memory state validation using shadow memory cloning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 186-189, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Berk Sunar |
Rise of the hardware Trojans. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 138, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Aymen Fradi, Michael Nicolaidis, Lorena Anghel |
Memory BIST with address programmability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 79-85, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Ronaldo Rodrigues Ferreira, Álvaro Freitas Moreira, Luigi Carro |
Matrix control-flow algorithm-based fault tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 37-42, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Dan Alexandrescu |
A comprehensive soft error analysis methodology for SoCs/ASICs memory instances. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 175-176, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Osnat Keren, Ilya Levin, Vladimir Sinelnikov |
Detection of Trojan HW by using hidden information on the system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 192-193, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Michael Augustin, Michael Gössel, Rolf Kraemer |
Selective fault tolerance for finite state machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 43-48, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Michael Linder, Alfred Eder, Klaus Oberländer, Martin Huch |
Variations of fault manifestation during Burn-In - A case study on industrial SRAM test results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 218-221, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Anna Vaskova, Celia López-Ongil, Enrique San Millán, Alejandro Jiménez-Horas, Luis Entrena |
Accelerating secure circuit design with hardware implementation of Diehard Battery of tests of randomness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 179-181, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Anna Vaskova, Celia López-Ongil, Mario García-Valderas, Marta Portela-García, Luis Entrena |
Evaluation techniques for on-line testing of robust systems based on critical tasks distribution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 258-263, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Jaume Abella 0001, Eduardo Quiñones, Francisco J. Cazorla, Mateo Valero, Yanos Sazeides |
RVC-based time-predictable faulty caches for safety-critical systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 25-30, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Eberhard Böhl, Paul Duplys |
Fault attack resistant deterministic random bit generator usable for key randomization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 194-195, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Madalin Neagu, Liviu Miclea, Joan Figueras |
Unidirectional error detection, localization and correction for DRAMs: Application to on-line DRAM repair strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 264-269, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | Rance Rodrigues, Sandip Kundu |
On graceful degradation of chip multiprocessors in presence of faults via flexible pooling of critical execution units. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, pp. 67-72, 2011, IEEE Computer Society, 978-1-4577-1053-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
44 | |
16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![IEEE Computer Society, 978-1-4244-7724-1 The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
44 | Irith Pomeranz, Sudhakar M. Reddy |
Selecting state variables for improved on-line testability through output response comparison of identical circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 179-184, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Ali Shahabi, S. Behdad Hosseini, Hasan Sohofi, Zainalabedin Navabi |
A partitioning approach to improve reconfigurable neuron-inspired online BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 173-178, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Steffen Zeidler 0001, Alexandre V. Bystrov, Milos Krstic, Rolf Kraemer |
On-line testing of bundled-data asynchronous handshake protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 261-267, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio |
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 135, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos |
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 83-87, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni |
Timing error tolerance in nanometer ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 283-288, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Samuel Evain, Yannick Bonhomme, Valentin Gherman |
Programmable restricted SEC codes to mask permanent faults in semiconductor memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 147-153, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
A software-based self-test methodology for in-system testing of processor cache tag arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 159-164, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michael N. Skoufis, Spyros Tragoudas |
On-line detection of random voltage perturbations in buses with multiple-threshold receivers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 249-254, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michael Nicolaidis, Vladimir Pasca, Lorena Anghel |
Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 218, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Zhang, Alain Greiner, Mounir Benabdenbi |
Fully distributed initialization procedure for a 2D-Mesh NoC, including off-line BIST and partial deactivation of faulty components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 194-196, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Steffen Tarnick |
Design of embedded constant weight code checkers based on averaging operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 255-260, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Sreenivas Gangadhar, Spyros Tragoudas |
Probabilistic methods for the impact of an SET in combinational logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 41-46, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Long Wang 0003, Zbigniew Kalbarczyk, Ravishankar K. Iyer, Arun Iyengar |
Checkpointing virtual machines against transient errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 97-102, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Salvatore Campagna, Massimo Violante |
A framework to support the design of COTS-based reliable space computers for on-board data handling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 91-96, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee |
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 77-82, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | A. Richardson |
Concepts for fault tolerant sensor systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 137, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Vitaly Ocheretny |
Self-checking arithmetic logic unit with duplicated outputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 202-203, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura 0001 |
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 141-146, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Paul Duplys, Eberhard Böhl, Wolfgang Rosenstiel |
Key randomization using a power analysis resistant deterministic random bit generator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 229-234, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Josep Rius 0001 |
A method for detecting resistive opens in buses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 187-189, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Martin Rozkovec, Jiri Jenícek, Ondrej Novák |
Application dependent FPGA testing method using compressed deterministic test vectors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 192-193, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | V. Prasanth, Virendra Singh, Rubin A. Parekhji |
Robust detection of soft errors using delayed capture methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 277-282, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis 0001, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira 0001 |
Predictive error detection by on-line aging monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 9-14, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Tiago R. Balen, Marcelo Lubaszewski |
Radiation effects on programmable analog devices and mitigation techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 136, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Georgios Karakonstantis, Charles Augustine, Kaushik Roy 0001 |
A self-consistent model to estimate NBTI degradation and a comprehensive on-line system lifetime enhancement technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 3-8, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
Evaluation of concurrent error detection techniques on the advanced encryption standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 223-228, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Seyab Khan, Said Hamdioui |
Temperature dependence of NBTI induced delay. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 15-20, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Yervant Zorian |
Test and reliability concerns for 3D-ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 219, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Nikolaos Minas, Ingrid De Wolf, Erik Jan Marinissen, Michele Stucchi, Herman Oprins, Abdelkarim Mercha, Geert Van der Plas, Dimitrios Velenis, Pol Marchal |
3D integration: Circuit design, test, and reliability challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 217, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michel Pignol, Florence Malou, Corinne Aicardi |
Qualification and relifing testing for space applications applied to the agilent G-Link components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 103-108, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Rodrigo Possamai Bastos, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis 0001 |
Evaluating transient-fault effects on traditional C-element's implementations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 35-40, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Etienne Faure, Mounir Benabdenbi, François Pêcheux |
Distributed online software monitoring of manycore architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 56-61, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Andreas Merentitis, Dionisis Margaris, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
SBST for on-line detection of hard faults in multiprocessor applications under energy constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 62-67, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, Yiorgos Makris |
An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 71-76, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara |
Aging test strategy and adaptive test scheduling for SoC failure prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 21-26, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | David R. McIntyre, Francis G. Wolff, Christos A. Papachristou, Swarup Bhunia |
Trustworthy computing in a multi-core system using distributed scheduling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 211-213, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Zhen Wang 0001, Mark G. Karpovsky |
Robust FSMs for cryptographic devices resilient to strong fault injection attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 240-245, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Claudia Rusu, Lorena Anghel, Dimiter Avresky |
RILM: Reconfigurable inter-layer routing mechanism for 3D multi-layer networks-on-chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 121-126, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Michael Augustin, Michael Gössel, Rolf Kraemer |
Reducing the area overhead of TMR-systems by protecting specific signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 268-273, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Olivier Héron, Julien Guilhemsang, Nicolas Ventroux, Alain Giulieri |
Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 49-55, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue |
An FPGA-based fail-soft system with adaptive reconfiguration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 127-132, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Vladimir Pasca, Lorena Anghel, Claudia Rusu, Mounir Benabdenbi |
Configurable serial fault-tolerant link for communication in 3D integrated systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 115-120, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Niccolò Battezzati, Davide Serrone, Massimo Violante |
A new framework for the automatic insertion of mitigation structures in circuits netlists. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 190-191, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu |
Reconfigurable low-power Concurrent Error Detection in logic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 206-207, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
44 | Nicholas Axelos, Kiamal Z. Pekmestzi |
A bit level area aware cache-based architecture for memory repairs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 154-158, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|