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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 220 occurrences of 191 keywords
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Results
Found 5411 publication records. Showing 5411 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng |
Variation and failure characterization through pattern classification of test data from multiple test stages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Phillip Fynan, Zeye Liu 0001, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton |
Logic characterization vehicle design reflection via layout rewiring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge |
Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-8, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak |
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar |
Statistical outlier screening as a test solution health monitor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Kamran Saleem, Nur A. Touba |
Using symbolic canceling to improve diagnosis from compacted response. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-7, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Ran Wang 0002, Krishnendu Chakrabarty |
Testing of interposer-based 2.5D integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
Test point insertion in hybrid test compression/LBIST architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Tianjian Li, Li Jiang 0002, Xiaoyao Liang, Qiang Xu 0001, Krishnendu Chakrabarty |
Defect tolerance for CNFET-based SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-9, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Cheng-Hung Wu, Kuen-Jong Lee |
Transformation of multiple fault models to a unified model for ATPG efficiency enhancement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Insik Yoon, Ashwin Chintaluri, Arijit Raychowdhury |
EMACS: Efficient MBIST architecture for test and characterization of STT-MRAM arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Ken Hansen |
Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 11, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson |
Upper-bound computation for optimal retargeting in IEEE1687 networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Anastasis Keliris, Hossein Salehghaffari, Brian R. Cairl, Prashanth Krishnamurthy, Michail Maniatakos, Farshad Khorrami |
Machine learning-based defense against process-aware attacks on Industrial Control Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Shalini Arora, Aman Aflaki, Sounil Biswas, Masashi Shimanouchi |
SERDES external loopback test using production parametric-test hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-7, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Chih-Sheng Hou, Yong-Xiao Chen, Jin-Fu Li 0001, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou |
A built-in self-repair scheme for DRAMs with spare rows, columns, and bits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-7, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Jyotsna Sequeira, Suriyaprakash Natarajan, Prashant Goteti, Nitin Chaudhary |
Fault simulation for analog test coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-7, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
Automated measurement of defect tolerance in mixed-signal ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-8, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath |
A suite of IEEE 1687 benchmark networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Md. Mahbub Alam, Mark M. Tehranipoor, Domenic Forte |
Recycled FPGA detection using exhaustive LUT path delay characterization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Panagiota Papavramidou |
Memory repair for high fault rates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Chih-Chieh Zheng, Shi-Yu Huang, Shyue-Kung Lu, Ting-Chi Wang, Kun-Han Tsai, Wu-Tung Cheng |
Online slack-time binning for IO-registered die-to-die interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-8, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Walden C. Rhines |
Plenary keynote address Tuesday: The business of test: Test and semiconductor economics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 9, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |
A novel diagnostic test generation methodology and its application in production failure isolation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Wei-Cheng Lien, Kuen-Jong Lee |
Output bit selection methodology for test response compaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Gurunath Kadam, Markus Rudack, Krishnendu Chakrabarty, Juergen Alt |
Supply-voltage optimization to account for process variations in high-volume manufacturing testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-9, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli |
Pylon: Towards an integrated customizable volume diagnosis infrastructure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-9, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Soumya Mittal, Zeye Liu 0001, Ben Niewenhuis, R. D. (Shawn) Blanton |
Test chip design for optimal cell-aware diagnosability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-8, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada |
Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-8, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee |
DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | |
2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-1-4673-8773-6 The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
|
1 | Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen |
Analog fault coverage improvement using final-test dynamic part average testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-9, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Y. Fan, A. Verma, Y. Su, L. Rose, J. Janney, V. Do, S. Kumar |
RF test accuracy and capacity enhancement on ATE for silicon TV tuners. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Rob A. Rutenbar |
Keynote address Wednesday: Hardware inference accelerators for machine learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 10, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | V. R. Devanathan, Sumant Kale |
A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, pp. 1-6, 2016, IEEE, 978-1-4673-8773-6. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
1 | Salah-Eddine Elayoubi, James Roberts |
Performance Evaluation of Video Transcoding and Caching Solutions in Mobile Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 55-63, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Stanislav Lange, Steffen Gebert, Joachim Spoerhase, Piotr Rygielski, Thomas Zinner, Samuel Kounev, Phuoc Tran-Gia |
Specialized Heuristics for the Controller Placement Problem in Large Scale SDN Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 210-218, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Arpan Mukhopadhyay, Ravi R. Mazumdar, Fabrice Guillemin |
The Power of Randomized Routing in Heterogeneous Loss Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 125-133, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Nico Becker, Markus Fidler |
A Non-stationary Service Curve Model for Performance Analysis of Transient Phases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 116-124, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Riccardo Ravaioli, Guillaume Urvoy-Keller, Chadi Barakat |
Towards a General Solution for Detecting Traffic Differentiation at the Internet Access. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Pierdomenico Fiadino, Alessandro D'Alconzo, Mirko Schiavone, Pedro Casas |
RCATool - A Framework for Detecting and Diagnosing Anomalies in Cellular Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 194-202, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Florian Metzger, Christoph Steindl, Tobias Hoßfeld |
A Simulation Framework for Evaluating the QoS and QoE of TCP-based Streaming in an LTE Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 168-176, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Christian Vitale, Gianluca Rizzo, Balaji Rengarajan, Vincenzo Mancuso |
An Analytical Approach to Performance Analysis of Coupled Processor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 89-97, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Esa Hyytiä, Rhonda Righter |
Fairness through Linearly Increasing Holding Costs in Systems of Parallel Servers with Setup Delays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 143-151, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Shuo Wang 0004, Xing Zhang 0001, Jiaxin Zhang 0001, Jian Feng, Wenbo Wang 0007, Ke Xin |
An Approach for Spatial-Temporal Traffic Modeling in Mobile Cellular Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 203-209, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Thomas Bonald |
Traffic Models for User-Level Performance Evaluation in Data Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 107-115, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Noriaki Kamiyama, Yousuke Takahashi, Keisuke Ishibashi, Kohei Shiomoto, Tatsuya Otoshi, Yuichi Ohsita, Masayuki Murata 0001 |
Optimizing Cache Location and Route on CDN Using Model Predictive Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 37-45, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | |
27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-1-4673-8422-3 The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
1 | Fabrice Guillemin, Salah-Eddine Elayoubi, Philippe Robert, Christine Fricker, Bruno Sericola |
Controlling Impatience in Cellular Networks Using QoE-aware Radio Resource Allocation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 159-167, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Hadrien Hours, Ernst W. Biersack, Patrick Loiseau, Alessandro Finamore, Marco Mellia |
A Study of the Impact of DNS Resolvers on Performance Using a Causal Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 10-18, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Huaming Wu, William J. Knottenbelt, Katinka Wolter |
Analysis of the Energy-Response Time Tradeoff for Mobile Cloud Offloading Using Combined Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 134-142, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Mathieu Boussard, Dinh Thai Bui, Laurent Ciavaglia, Richard Douville, Michel Le Pallec, Nicolas Le Sauze, Ludovic Noirie, Serge Papillon, Pierre Peloso, Francesco Santoro |
Software-Defined LANs for Interconnected Smart Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 219-227, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Danny De Vleeschauwer, Bart Feyaerts, Herwig Bruneel, Sabine Wittevrongel |
Scheduling Announced Requests for Streamed Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 64-72, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Maialen Larrañaga, Onno J. Boxma, R. Núñez Queija, Mark S. Squillante |
Efficient Content Delivery in the Presence of Impatient Jobs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 73-81, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Abinesh Ramakrishnan, Cédric Westphal, Athina Markopoulou |
An Efficient Delivery Scheme for Coded Caching. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 46-54, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Danilo Giordano, Stefano Traverso, Luigi Grimaudo, Marco Mellia, Elena Baralis, Alok Tongaonkar, Sabyasachi Saha |
YouLighter: An Unsupervised Methodology to Unveil YouTube CDN Changes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 19-27, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Jan Willem Kleinrouweler, Sergio Cabrero, Rob van der Mei, Pablo César |
Modeling Stability and Bitrate of Network-Assisted HTTP Adaptive Streaming Players. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 177-184, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Vincent J. Maccio, Douglas G. Down |
On Optimal Control for Energy-Aware Queueing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 98-106, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Joost Bosman 0002, Hans van den Berg, Rob van der Mei |
Real-Time QoS Control for Service Orchestration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 152-158, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Kurt Van Hautegem, Wouter Rogiest, Herwig Bruneel |
Fill the Void: Improved Scheduling for Optical Switching. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 82-88, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Mathieu Leconte, Marc Lelarge, Laurent Massoulié |
Designing Adaptive Replication Schemes in Distributed Content Delivery Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 28-36, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sami Akin, Markus Fidler |
Backlog and Delay Reasoning in HARQ System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 27th International Teletraffic Congress, ITC 2015, Ghent, Belgium, September 8-10, 2015, pp. 185-193, 2015, IEEE, 978-1-4673-8422-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Erik Jan Marinissen, Bart De Wachter, Teng Wang, Jens Fiedler, Jorg Kiesewetter, Karsten Stoll |
Automated testing of bare die-to-die stacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Li Jiang 0002, Qiang Xu 0001 |
Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-11, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Yu Liu, Georgios Volanis, Ke Huang 0001, Yiorgos Makris |
Concurrent hardware Trojan detection in wireless cryptographic ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak 0001, Jedrzej Solecki, Jerzy Tyszer |
A deterministic BIST scheme based on EDT-compressed test patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Abhishek Basak, Fengchao Zhang, Swarup Bhunia |
PiRA: IC authentication utilizing intrinsic variations in pin resistance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | R. D. (Shawn) Blanton, Benjamin Niewenhuis, Zeye (Dexter) Liu |
Design reflection for optimal test-chip implementation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sergej Deutsch, Krishnendu Chakrabarty |
Test and debug solutions for 3D-stacked integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Jerry Backer, David Hély, Ramesh Karri |
Secure design-for-debug for Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao |
Testing methods for quaternary content addressable memory using charge-sharing sensing scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Xijiang Lin, Sudhakar M. Reddy |
On generating high quality tests based on cell functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Kelly A. Ockunzzi, Michael R. Ouellette, Kevin W. Gorman |
Optimizing delay tests at the memory boundary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Li Jiang 0002, Pu Pang, Naifeng Jing, Sung Kyu Lim, Xiaoyao Liang, Qiang Xu 0001 |
On diagnosable and tunable 3D clock network design for lifetime reliability enhancement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Masahiro Ishida, Kiyotaka Ichiyama |
An ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Meng-Ting Tsai, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
Monitoring the delay of long interconnects via distributed TDC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Haralampos-G. D. Stratigopoulos, Manuel J. Barragán, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal |
Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-7, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Nicole Fern, Shrikant Kulkarni, Kwang-Ting (Tim) Cheng |
Hardware Trojans hidden in RTL don't cares - Automated insertion and prevention methodologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Fotios Vartziotis, Xrysovalantis Kavousianos, Panagiotis Georgiou, Krishnendu Chakrabarty |
Test-access-mechanism optimization for multi-Vdd SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Bruce Querbach, Tan Peter Yanyang, Lovelace Van, David Blankenbeckler, Rahul Khanna, Sudeep Puligundla, Patrick Chiang 0001 |
Platform IO and system memory test using L3 cache based test (CBT) and parallel execution of CPGC Intel BIST engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | William R. Bottoms |
Can we ensure reliability in the era of heterogeneous integration? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak |
A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
Stepped parity: A low-cost multiple bit upset detection technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang 0001, Yiorgos Makris |
A comparative study of one-shot statistical calibration methods for analog / RF ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Zipeng Li, Sandeep Kumar Goel, Frank Lee, Krishnendu Chakrabarty |
Efficient observation-point insertion for diagnosability enhancement in digital circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sriram Karunagaran, Karuna P. Sahoo, Masahiro Fujita |
Hardware in loop testing of an insulin pump. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sergej Deutsch, Krishnendu Chakrabarty |
Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Nektarios Georgios Tsoutsos, Michail Maniatakos |
Extending residue-based fault tolerance to encrypted computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Stephen K. Sunter, Jean-Francois Cote, Jeff Rearick |
Streaming fast access to ADCs and DACs for mixed-signal ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Adrian I. Voinea, Stefan Kampfer |
Rapid prototyping and test before silicon of integrated pressure sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch |
Generalization of an outlier model into a "global" perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
AdaTest: An efficient statistical test framework for test escape screening. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma |
A new method for measuring alias-free aperture jitter in an ADC output. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-6, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
A self-compensating built-in self-test solution for RF phased array mismatch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-9, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Sarmad Tanwir, Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan |
Information-theoretic and statistical methods of failure log selection for improved diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Hideo Okawara |
eRNA: Refining of reconstructed digital waveform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Song Yao, Xiaoming Chen 0003, Jie Zhang 0046, Qiaoyi Liu, Jia Wang, Qiang Xu 0001, Yu Wang 0002, Huazhong Yang |
FASTrust: Feature analysis for third-party IP trust verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | |
2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-1-4673-6578-9 The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
1 | Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
Embedded deterministic test points for compact cell-aware tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-8, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
1 | Fabian Oboril, Mehdi Baradaran Tahoori |
Cross-layer approaches for an aging-aware design of nanoscale microprocessors: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, pp. 1-10, 2015, IEEE, 978-1-4673-6578-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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