Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
13 | Luca Guglielmo, Andrea Riboni, Giovanni Denaro |
Towards Evidence-Based Testability Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE (NIER) ![In: 43rd IEEE/ACM International Conference on Software Engineering: New Ideas and Emerging Results, ICSE (NIER) 2021, Madrid, Spain, May 25-28, 2021, pp. 76-80, 2021, IEEE, 978-1-6654-0140-1. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
13 | Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich |
Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021, pp. 20-29, 2021, IEEE, 978-1-6654-1695-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
13 | Min Li 0019, Zhengyuan Shi, Zezhong Wang 0006, Weiwei Zhang, Yu Huang, Qiang Xu 0001 |
Testability-Aware Low Power Controller Design with Evolutionary Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021, pp. 324-328, 2021, IEEE, 978-1-6654-1695-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
13 | Guoli Zhao, Chang Liu, Shaofang Li, Zenghao Tian, Xi Liu, Haifeng Li 0013 |
Radar System Testability Design and Demonstration based on Fault Modes and Software Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSA ![In: 8th International Conference on Dependable Systems and Their Applications, DSA 2021, Yinchuan, China, August 5-6, 2021, pp. 307-314, 2021, IEEE, 978-1-6654-4391-3. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
13 | Victor Takashi Hayashi, Cairo Mateus Neves Ribeiro, Artino Quintino Filho, Matheus Ancelmo Bonfim Pita, Bruno Manias Trazzi, Júlio Cezar Estrella, Wilson Vicente Ruggiero |
Improving IoT Module Testability with Test-Driven Development and Machine Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FiCloud ![In: 8th International Conference on Future Internet of Things and Cloud, FiCloud 2021, Rome, Italy, August 23-25, 2021, pp. 406-412, 2021, IEEE, 978-1-6654-2574-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
13 | Mohammad Taherifard, Mahdi Fazeli, Ahmad Patooghy |
Scan-based attack tolerance with minimum testability loss: a gate-level approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Inf. Secur. ![In: IET Inf. Secur. 14(4), pp. 459-469, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Peng Wang 0074, Yongli Yu, Xingxin Li |
Testability Modeling and Test Point Optimization Method of Multi-State System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 155011-155019, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Wenhao Qiu, Guangyao Lian, Peng Zhou, Kaoli Huang |
Test sample allocation method for testability verification test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 36(5), pp. 1592-1603, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Junyou Shi, Qingjie He, Zili Wang |
Integrated Stateflow-based simulation modelling and testability evaluation for electronic built-in-test (BIT) systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 202, pp. 107066, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Sreeja Rajendran, Mary Lourde Regeena |
Sensitivity analysis of testability parameters for secure IC design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 14(4), pp. 158-165, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik |
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microprocess. Microsystems ![In: Microprocess. Microsystems 77, pp. 103117, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | A. N. Trahtman |
Polynomial time algorithm for left [right] local testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2011.04236, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | A. N. Trahtman |
Reducing the time complexity of testing for local threshold testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2011.06262, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | A. N. Trahtman |
Precise estimation on the order of local testability of deterministic finite automaton. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2011.06253, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | Isolde Adler, Noleen Köhler, Pan Peng 0001 |
On Testability of First-Order Properties in Bounded-Degree Graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2008.05800, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | Oren Becker, Alexander Lubotzky, Jonathan Mosheiff |
Stability and testability: equations in permutations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2011.05234, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | Leticia Morales-Trujillo, Miguel Angel Olivero, Francisco José Domínguez Mayo, Julián Alberto García-García, Manuel Mejías Risoto |
A Testability and Observability Framework to Assure Traceability Requirements on System of Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Web Eng. ![In: J. Web Eng. 19(2), pp. 297-318, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Alessandro Chiesa, Peter Manohar, Igor Shinkar |
On Local Testability in the Non-Signaling Setting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITCS ![In: 11th Innovations in Theoretical Computer Science Conference, ITCS 2020, January 12-14, 2020, Seattle, Washington, USA., pp. 26:1-26:37, 2020, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-134-4. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Li Qu, Xiaole Cui, Xiaoxin Cui |
A Testability Enhancement Method for the Memristor Ratioed Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-7467-9. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Valerio Terragni, Pasquale Salza, Mauro Pezzè |
Measuring Software Testability Modulo Test Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPC ![In: ICPC '20: 28th International Conference on Program Comprehension, Seoul, Republic of Korea, July 13-15, 2020, pp. 241-251, 2020, ACM, 978-1-4503-7958-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Andrea Arcuri, Juan P. Galeotti |
Testability Transformations For Existing APIs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: 13th IEEE International Conference on Software Testing, Validation and Verification, ICST 2020, Porto, Portugal, October 24-28, 2020, pp. 153-163, 2020, IEEE, 978-1-7281-5778-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Joshua Immanuel, Spencer K. Millican |
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NATW ![In: 29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9699-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Lu Han, Xianjun Shi, Yuyao Zhai, Jiapeng Lv, Yufeng Qin, Taoyu Wang |
Testability modeling method based on MSFG-BN composite model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CACRE ![In: 5th International Conference on Automation, Control and Robotics Engineering, CACRE 2020, Dalian, China, September 19-20, 2020, pp. 212-215, 2020, IEEE, 978-1-7281-9888-0. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Ayan Palchaudhuri, Anindya Sundar Dhar |
Primitive Instantiation for Speed-Area Efficient Architecture Design of Cellular Automata based Mageto Logic on FPGA with Built-In Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FCCM ![In: 28th IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, FCCM 2020, Fayetteville, AR, USA, May 3-6, 2020, pp. 207, 2020, IEEE, 978-1-7281-5803-7. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Francisco Gutenberg S. Filho, Valéria Lelli, Ismayle de Sousa Santos, Rossana M. C. Andrade |
Correlations among Software Testability Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBQS ![In: 19th Brazilian Symposium on Software Quality, SBQS 2020, São Luís, Brazil, December, 2020, pp. 11, 2020, ACM, 978-1-4503-8923-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Priyanka Naskar, Tapobrata Dhar, Surajit Kumar Roy |
Hardware Trojan Detection Using Improved Testability Measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISDCS ![In: 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020, Howrah, India, March 4-6, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-6564-6. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Ning Zhang, Zhiqiang Lv, Yanlin Zhang, Haiyang Li, Yixin Zhang, Weiqing Huang |
Novel design of Hardware Trojan: A generic approach for defeating testability based detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TrustCom ![In: 19th IEEE International Conference on Trust, Security and Privacy in Computing and Communications, TrustCom 2020, Guangzhou, China, December 29, 2020 - January 1, 2021, pp. 162-173, 2020, IEEE, 978-1-6654-0392-4. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Natsuda Kasisopha, Songsakdi Rongviriyapanish, Panita Meananeatra |
Method Evaluation for Software Testability on Object Oriented Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SICE ![In: 59th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2020, Chiang Mai, Thailand, September 23-26, 2020, pp. 308-313, 2020, IEEE, 978-1-7281-1089-9. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
|
13 | Dave W. Binkley, James Glenn, Abdullah Alsharif, Phil McMinn |
An Investigation into the Effect of Control and Data Dependence Paths on Predicate Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCAM ![In: 20th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2020, Adelaide, Australia, September 28 - October 2, 2020, pp. 160-170, 2020, IEEE, 978-1-7281-9248-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
13 | Sebastian Huhn 0001 |
Next generation design for testability, debug and reliability using formal techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2020 |
RDF |
|
13 | Josef Kinseher, Moritz Völker, Ilia Polian |
Improving Testability and Reliability of Advanced SRAM Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Emerg. Top. Comput. ![In: IEEE Trans. Emerg. Top. Comput. 7(3), pp. 456-467, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Nobutaka Kito, Naofumi Takagi |
Concurrent Error Detectable Carry Select Adder with Easy Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 68(7), pp. 1105-1110, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz |
Invisible-Scan: A Design-for-Testability Approach for Functional Test Sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(12), pp. 2357-2365, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Alessandro Chiesa, Peter Manohar, Igor Shinkar |
On Local Testability in the Non-Signaling Setting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Electron. Colloquium Comput. Complex. ![In: Electron. Colloquium Comput. Complex. TR19, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
13 | Ayan Palchaudhuri, Anindya Sundar Dhar |
Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 35(6), pp. 779-796, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Anthony Leverrier, Vivien Londe, Gilles Zémor |
Towards local testability for quantum coding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1911.03069, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
13 | Mohammad Ghafari, Markus Eggiman, Oscar Nierstrasz |
Testability First! ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1908.01476, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
13 | Tomás Masopust, Markus Krötzsch |
Partially Ordered Automata and Piecewise Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1907.13115, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
13 | Igor N. Aizenberg, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli |
A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Artif. Intell. Soft Comput. Res. ![In: J. Artif. Intell. Soft Comput. Res. 9(1), pp. 5-19, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Hari Mohan Gaur, Ashutosh Kumar Singh 0001, Umesh Ghanekar |
Design of Reversible Arithmetic Logic Unit with Built-In Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 36(5), pp. 54-61, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Seetal Potluri, Paul Pop, Jan Madsen |
Design-for-Testability of On-Chip Control in mVLSI Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 36(1), pp. 48-56, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Vahid Garousi, Michael Felderer, Feyza Nur Kilicaslan |
A survey on software testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Softw. Technol. ![In: Inf. Softw. Technol. 108, pp. 35-64, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | G. Naveen Balaji, S. Chenthur Pandian |
Design of test pattern generator (TPG) by an optimized low power design for testability (DFT) for scan BIST circuits using transmission gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Clust. Comput. ![In: Clust. Comput. 22(6), pp. 15231-15244, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Hubie Chen, Matt Valeriote, Yuichi Yoshida |
Constant-Query Testability of Assignments to Constraint Satisfaction Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIAM J. Comput. ![In: SIAM J. Comput. 48(3), pp. 1022-1045, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Kai-Hsun Chen, Ching-Yuan Chen, Jiun-Lang Huang |
Testability Measures Considering Circuit Reconvergence to Reduce ATPG Runtime. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2019, Cluj-Napoca, Romania, April 24-26, 2019, pp. 1-2, 2019, IEEE, 978-1-7281-0073-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Raimund Ubar, Lembit Jürimägi, Adeniyi Olanrewaju Adekoya, Maksim Jenihhin |
True Path Tracing in Structurally Synthesized BDDs for Testability Analysis of Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 22nd Euromicro Conference on Digital System Design, DSD 2019, Kallithea, Greece, August 28-30, 2019, pp. 492-499, 2019, IEEE, 978-1-7281-2862-7. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Anna Bernasconi 0001, Valentina Ciriani, Luca Frontini |
Testability of Switching Lattices in the Cellular Fault Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 22nd Euromicro Conference on Digital System Design, DSD 2019, Kallithea, Greece, August 28-30, 2019, pp. 320-327, 2019, IEEE, 978-1-7281-2862-7. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Chee Hoo Kok, Chia Yee Ooi, Michiko Inoue, Mehrdad Moghbel, Sreedharan Baskara Dass, Hau Sim Choo, Nordinah Ismail, Fawnizu Azmadi Hussin |
Net Classification Based on Testability and Netlist Structural Features for Hardware Trojan Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019, pp. 105-110, 2019, IEEE, 978-1-7281-2695-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Mark Fosberry, Ben McMahon |
Matlab JTAG AXI Master opens new dimensions for development and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NATW ![In: 28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019, pp. 1-2, 2019, IEEE, 978-1-7281-3382-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Igor N. Aizenberg, Marco Bindi, Francesco Grasso, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli |
Testability Analysis in Neural Network Based Fault Diagnosis of DC-DC Converter. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RTSI ![In: 5th IEEE International forum on Research and Technology for Society and Industry, RTSI 2019, Florence, Italy, September 9-12, 2019, pp. 265-268, 2019, IEEE, 978-1-7281-3815-2. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Wang Xuan, Di Peng, Ni Zichun |
An Approach to Testability Evaluation Based on Improved D-S Evidence Theory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IMMS ![In: Proceedings of the 2019 2nd International Conference on Information Management and Management Sciences, IMMS 2019, Chengdu, China, August 23-25, 2019, pp. 155-159, 2019, ACM, 978-1-4503-7144-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Andrea Riboni, Luca Guglielmo, Matteo Orrù, Pietro Braione, Giovanni Denaro |
Design for Testability of ERMTS Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE Workshops ![In: IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops 2019, Berlin, Germany, October 27-30, 2019, pp. 128-136, 2019, IEEE, 978-1-7281-5138-0. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Hubie Chen, Yuichi Yoshida |
Testability of Homomorphism Inadmissibility: Property Testing Meets Database Theory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PODS ![In: Proceedings of the 38th ACM SIGMOD-SIGACT-SIGAI Symposium on Principles of Database Systems, PODS 2019, Amsterdam, The Netherlands, June 30 - July 5, 2019., pp. 365-382, 2019, ACM, 978-1-4503-6227-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Rajit Karmakar, Santanu Chattopadhyay, Mrityunjoy Chakraborty |
Improving Security of Logic Encryption in Presence of Design-for-Testability Infrastructure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: IEEE International Symposium on Circuits and Systems, ISCAS 2019, Sapporo, Japan, May 26-29, 2019, pp. 1-5, 2019, IEEE, 978-1-7281-0397-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki |
A Design for Testability Method for k-Cycle Capture Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019, pp. 40-43, 2019, IEEE, 978-1-7281-2490-2. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Mohammad Ghafari, Markus Eggiman, Oscar Nierstrasz |
Testability First! ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2019, Porto de Galinhas, Recife, Brazil, September 19-20, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-2968-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Abhishek Koneru, Krishnendu Chakrabarty |
Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 2019 on Great Lakes Symposium on VLSI, GLSVLSI 2019, Tysons Corner, VA, USA, May 9-11, 2019, pp. 457-462, 2019, ACM, 978-1-4503-6252-8. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Eder Mateus Nunes Gonçalves, Bruno Coelho Rodrigues, Ricardo Arend Machado |
Assessment of Testability on Multiagent Systems Developed with Organizational Model Moise. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EPIA (2) ![In: Progress in Artificial Intelligence, 19th EPIA Conference on Artificial Intelligence, EPIA 2019, Vila Real, Portugal, September 3-6, 2019, Proceedings, Part II., pp. 581-592, 2019, Springer, 978-3-030-30243-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Yuzhe Ma, Haoxing Ren, Brucek Khailany, Harbinder Sikka, Lijuan Luo, Karthikeyan Natarajan, Bei Yu 0001 |
High Performance Graph Convolutional Networks with Applications in Testability Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019, Las Vegas, NV, USA, June 02-06, 2019, pp. 18, 2019, ACM, 978-1-4503-6725-7. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
13 | Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht |
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 6, pp. 42566-42577, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Fara Ashikin, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu, Zvi Roth |
A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Inf. Syst. ![In: IEICE Trans. Inf. Syst. 101-D(8), pp. 2053-2063, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Xiaofeng Tang, Aiqiang Xu, Ruifeng Li, Min Zhu, Jinling Dai |
Simulation-Based Diagnostic Model for Automatic Testability Analysis of Analog Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7), pp. 1483-1493, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Yonatan Nakar, Dana Ron |
On the Testability of Graph Partition Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Electron. Colloquium Comput. Complex. ![In: Electron. Colloquium Comput. Complex. TR18, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
13 | Toral Shah, Anzhela Yu. Matrosova, Masahiro Fujita, Virendra Singh |
Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 34(1), pp. 53-65, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Devarshi Mrinal Das, Aman Gupta, Abhishek Srivastava 0002, Amogh Vidwans, Meraj Ahmad, Aniruddha Shelke, Salil Kale, J. Ananthapadmanabhan, Dinesh Kumar Sharma, Maryam Shojaei Baghini |
A pulse oximeter system, OxiSense, with embedded signal processing using an ultra-low power ASIC designed for testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 72, pp. 1-10, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz |
Dynamically Determined Preferred Values and a Design-for-Testability Approach for Multiplexer Select Inputs under Functional Test Sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 23(5), pp. 59:1-59:16, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Vahid Garousi, Michael Felderer, Feyza Nur Kilicaslan |
What we know about software testability: a survey. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1801.02201, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
13 | Michael Felderer, Bogdan Marculescu, Francisco Gomes de Oliveira Neto, Robert Feldt, Richard Torkar |
A Testability Analysis Framework for Non-Functional Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1802.07140, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
13 | Durba Chatterjee, Aritra Hazra, Debdeep Mukhopadhyay |
Testability Analysis of PUFs Leveraging Correlation-Spectra in Boolean Functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1810.08821, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
13 | Kazuo Iwama, Yuichi Yoshida |
Parameterized Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Comput. Theory ![In: ACM Trans. Comput. Theory 9(4), pp. 16:1-16:16, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Sergey G. Mosin |
Analogue Integrated Circuits Design-for-Testability Flow Oriented onto OBIST Strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Technol. Control. ![In: Inf. Technol. Control. 47(3), pp. 521-531, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | O. Golubeva |
Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AQTR ![In: IEEE International Conference on Automation, Quality and Testing, Robotics, AQTR 2018, Cluj-Napoca, Romania, May 24-26, 2018, pp. 1-5, 2018, IEEE, 978-1-5386-2205-6. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Anna Bernasconi 0001, Valentina Ciriani, Luca Frontini |
Testability of Switching Lattices in the Stuck at Fault Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC ![In: IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018, pp. 213-218, 2018, IEEE, 978-1-5386-4756-1. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Michael Felderer, Bogdan Marculescu, Francisco Gomes de Oliveira Neto, Robert Feldt, Richard Torkar |
A Testability Analysis Framework for Non-functional Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: 2018 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops, Västerås, Sweden, April 9-13, 2018, pp. 54-58, 2018, IEEE Computer Society, 978-1-5386-6352-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Giuseppe Fontana 0001, Francesco Grasso, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli, Alberto Reatti |
Testability Analysis Based on Complex-Field Fault Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SMACD ![In: 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018, pp. 33-36, 2018, IEEE, 978-1-5386-5153-7. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Xi Chen, Omid Aramoon, Gang Qu 0001, Aijiao Cui |
Balancing Testability and Security by Configurable Partial Scan Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 145-150, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Antonio Sanchez-Clemente, Luis Entrena, Fernanda Lima Kastensmidt |
Approximate TMR for selective error mitigation in FPGAs based on testability analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AHS ![In: 2018 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2018, Edinburgh, United Kingdom, August 6-9, 2018, pp. 112-119, 2018, IEEE, 978-1-5386-7753-7. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Armin Beer, Michael Felderer |
Measuring and improving testability of system requirements in an industrial context by applying the goal question metric approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RET@ICSE ![In: Proceedings of the 5th International Workshop on Requirements Engineering and Testing, RET@ICSE 2018, Gothenburg, Sweden, June 2, 2018, pp. 25-32, 2018, ACM, 978-1-4503-5749-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Yonatan Nakar, Dana Ron |
On the Testability of Graph Partition Properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX-RANDOM ![In: Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques, APPROX/RANDOM 2018, August 20-22, 2018 - Princeton, NJ, USA, pp. 53:1-53:13, 2018, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-085-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Chunfeng Liu, Bing Li 0005, Tsung-Yi Ho, Krishnendu Chakrabarty, Ulf Schlichtmann |
Design-for-testability for continuous-flow microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 55th Annual Design Automation Conference, DAC 2018, San Francisco, CA, USA, June 24-29, 2018, pp. 164:1-164:6, 2018, ACM, 978-1-5386-4114-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Mark Harman |
We Need a Testability Transformation Semantics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEFM ![In: Software Engineering and Formal Methods - 16th International Conference, SEFM 2018, Held as Part of STAF 2018, Toulouse, France, June 27-29, 2018, Proceedings, pp. 3-17, 2018, Springer, 978-3-319-92969-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
13 | Michael Winikoff |
BDI agent testability revisited. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Auton. Agents Multi Agent Syst. ![In: Auton. Agents Multi Agent Syst. 31(5), pp. 1094-1132, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Zhiao Zhao, Yong Zhang, Guanjun Liu, Jing Qiu |
Statistical Analysis of Time-Varying Characteristics of Testability Index Based on NHPP. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 5, pp. 4759-4768, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Julia Plass, Marco E. G. V. Cattaneo, Georg Schollmeyer, Thomas Augustin |
On the testability of coarsening assumptions: A hypothesis test for subgroup independence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Approx. Reason. ![In: Int. J. Approx. Reason. 90, pp. 292-306, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Giovanna Guaiana |
Local testability from words to traces, a suitable definition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Theor. Comput. Sci. ![In: Theor. Comput. Sci. 658, pp. 175-189, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Ateeq-Ur-Rehman Shaheen, Fawnizu Azmadi Hussin, Nor Hisham Hamid |
A Hybrid Delay Design-for-Testability for Nonseparable RTL Controller-Data Path Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 26(2), pp. 1750021:1-1750021:26, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Lei Ma 0003, Cheng Zhang, Bing Yu, Hiroyuki Sato |
An empirical study on the effects of code visibility on program testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 25(3), pp. 951-978, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Giuseppe Fontana 0001, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli |
A Fast Algorithm for Testability Analysis of Large Linear Time-Invariant Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(6), pp. 1564-1575, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Joyati Mondal, Debesh Kumar Das |
Design for Testability Technique of Reversible Logic Circuits Based on Exclusive Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017, pp. 248-253, 2017, IEEE Computer Society, 978-1-5386-2437-1. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Bao Li 0003, Long Zhao, Yuhua Cheng |
Auxiliary testability design schemes for CMOS DACs with ultrahigh sampling rates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017, pp. 36-39, 2017, IEEE, 978-1-5090-6625-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Jain-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho |
Design-for-testability for paper-based digital microfluidic biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017, pp. 1, 2017, IEEE Computer Society, 978-1-5386-0362-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Bao-hua Wei, Ming-ze Gou, Bao-chen Li, Hui-xia Jiang |
The Analysis and Optimization of Anti-jamming Performance Testability for Electronic Equipment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSPS ![In: Communications, Signal Processing, and Systems - Proceedings of the 2017 International Conference on Communications, Signal Processing, and Systems, CSPS 2017, Harbin, China, 14-16 July 2017., pp. 1389-1395, 2017, Springer, 978-981-10-6570-5. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Robinson Crusoé da Cruz, Marcelo Medeiros Eler |
Using a cluster analysis method for grouping classes according to their inferred testability: An investigation of CK metrics, code coverage and mutation score. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCCC ![In: 36th International Conference of the Chilean Computer Science Society, SCCC 2017, Arica, Chile, October 16-20, 2017, pp. 1-11, 2017, IEEE, 978-1-5386-3483-7. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
13 | Michael Winikoff |
BDI Agent Testability Revisited (JAAMAS Extended Abstract). ![Search on Bibsonomy](Pics/bibsonomy.png) |
AAMAS ![In: Proceedings of the 16th Conference on Autonomous Agents and MultiAgent Systems, AAMAS 2017, São Paulo, Brazil, May 8-12, 2017, pp. 260-261, 2017, ACM. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
13 | Jebreel M. Salem, Dong Sam Ha |
Dual Use of Power Lines for Design-for-Testability - A CMOS Receiver Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 24(3), pp. 1118-1125, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Farhad Alibeygi Parsan, Scott C. Smith, Waleed K. Al-Assadi |
Design for Testability of Sleep Convention Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 24(2), pp. 743-753, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Giuseppe Fontana 0001, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli |
A Testability Measure for DC-Excited Periodically Switched Networks With Applications to DC-DC Converters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 65(10), pp. 2321-2341, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Chenxu Zhao, Krishna R. Pattipati, Guanjun Liu, Jing Qiu, Kehong Lv, Tianmei Li 0001 |
A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Syst. Man Cybern. Syst. ![In: IEEE Trans. Syst. Man Cybern. Syst. 46(4), pp. 524-534, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Giuseppe Fontana 0001, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli |
An unconditionally sound algorithm for testability analysis in linear time-invariant electrical networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Circuit Theory Appl. ![In: Int. J. Circuit Theory Appl. 44(6), pp. 1308-1340, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
13 | Masood ul-Hasan, Yanqing Zhu, Yichuang Sun |
Design for testability of high-order OTA-C filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Circuit Theory Appl. ![In: Int. J. Circuit Theory Appl. 44(10), pp. 1859-1873, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|