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Found 817 publication records. Showing 817 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | |
Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![IEEE, 978-1-4673-1707-8 The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
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1 | Vita Pi-Ho Hu, Ming-Long Fan, Pin Su, Ching-Te Chuang |
Stability and performance optimization of InGaAs-OI and GeOI hetero-channel SRAM cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 77-80, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Eric A. G. Webster, Richard J. Walker, Robert K. Henderson, Lindsay Grant |
A silicon photomultiplier with >30% detection efficiency from 450-750nm and 11.6μm pitch NMOS-only pixel with 21.6% fill factor in 130nm CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 238-241, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich |
Unified characterization of RTN and BTI for circuit performance and variability simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 266-269, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Quentin Hubert, Carine Jahan, Alain Toffoli, Gabriele Navarro, S. Chandrashekar, Pierre Noe, Veronique Sousa, Luca Perniola, J.-F. Nodin, A. Persico, S. Maitrejean, A. Roule, E. Henaff, M. Tessaire, P. Zuliani, Roberto Annunziata, Gilles Reimbold, G. Pananakakis, Barbara De Salvo |
Carbon-doped Ge2Sb2Te5 phase-change memory devices featuring reduced RESET current and power consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 286-289, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Takamasa Kawanago, Kuniyuki Kakushima, Parhat Ahmet, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kazuo Tsutsui, Kenji Natori, Takeo Hattori, Hiroshi Iwai |
(100)- and (110)-oriented nMOSFETs with highly scaled EOT in La-silicate/Si interface for multi-gate architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 89-92, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Michal Zaborowski, Daniel Tomaszewski, Piotr Dumania, Piotr Grabiec |
From FinFET to nanowire ISFET. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 165-168, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Romain Ritzenthaler, Tom Schram, Erik Bury, Jérôme Mitard, L.-Å. Ragnarsson, Guido Groeseneken, N. Horiguchi, Aaron Thean, Alessio Spessot, Christian Caillat, V. Srividya, Pierre Fazan |
Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 242-245, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Eddy Simoen, Marc Aoulaiche, Anabela Veloso, M. Jurczak, Cor Claeys, L. Mendes Almeida, Maria Glória Caño de Andrade, A. Luque Rodriguez, J. A. Jimenez Tejada, Christian Caillat, Pierre Fazan |
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 338-341, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Sameh G. Khalil, Rongming Chu, Ray Li, Danny Wong, Scott Newell, Xu Chen, M. Chen, D. Zehnder, S. Kim, A. Corrion, Brian Hughes, Karim Boutros, C. Namuduri |
Critical gate module process enabling the implementation of a 50A/600V AlGaN/GaN MOS-HEMT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 310-313, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
1 | Marc Belleville, Olivier Thomas, Alexandre Valentian, Fabien Clermidy |
Design challenges for nano-scale devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 69-72, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Emanuele Verrelli, Dimitris Tsoukalas, Pascal Normand, Nikos Boukos, A. H. Kean |
Resistive switching memory using titanium-oxide nanoparticle films. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 258-261, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Youngseung Cho, Yoosang Hwang, Huijung Kim, Eunok Lee, Soojin Hong, Hyun-Woo Chung, Daeik Kim, Jinyoung Kim, Yong Chul Oh, Hyeongsun Hong, Gyo-Young Jin, Chilhee Chung |
Novel Deep Trench Buried-Body-Contact (DBBC) of 4F2 cell for sub 30nm DRAM technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 193-196, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Evangelos A. Angelopoulos, Muhammad S. Al-Shahed, Wolfgang Appel, Stefan Endler 0002, Saleh Ferwana, Christine Harendt, Mahadi-Ul Hassan, Horst Rempp, Martin Zimmermann 0004, Joachim N. Burghartz |
Manufacturing aspects of an ultra-thin chip technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 141-144, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Abel Fontserè, Amador Pérez-Tomás, Philippe Godignon, José Millán, J. M. Parsey, Peter Moens |
High voltage low Ron in-situ SiN/Al0.35GaN0.65/GaN-on-Si power HEMTs operation up to 300°C. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 306-309, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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1 | Christoph Jungemann, Sung-Min Hong, Bernd Meinerzhagen, Anh-Tuan Pham |
Deterministic simulation of 3D and quasi-2D electron and hole systems in SiGe devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 318-321, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
1 | Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck |
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012, pp. 221-225, 2012, IEEE, 978-1-4673-1707-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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