Search results for "testability"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
13	Peter Wohl, John A. Waicukauski, Jonathon E. Colburn	Enhancing testability by structured partial scan.	VTS	2012	DBLP DOI BibTeX RDF
13	Kenneth P. Parker	Capacitive sensing testability in complex memory devices.	ITC	2012	DBLP DOI BibTeX RDF
13	Michael Viderman	A Combination of Testability and Decodability by Tensor Products.	APPROX-RANDOM	2012	DBLP DOI BibTeX RDF
13	Chung Chuang, Chun-Yen Wu, Chi-Chun Hsu, Li-Ren Huang, Wei-Min Cheng, Wen-Dar Hsieh	A design for testability of non-volatile memory reliability test for automotive embedded processor.	APCCAS	2012	DBLP DOI BibTeX RDF
13	Issam Rabhi	Testabilité des services Web. (Web services testability).		2012	RDF
13	Dean L. Lewis	Design for pre-bond testability in 3D integrated circuits.		2012	RDF
13	Zichu Qi, Hui Liu, Xiangku Li, Weiwu Hu	Design for Testability Features of Godson-3 Multicore Microprocessor.	J. Comput. Sci. Technol.	2011	DBLP DOI BibTeX RDF
13	Sheng-Chuan Liang, Hao-Chiao Hong	A Digitally Testable Sigma -Delta Modulator Using the Decorrelating Design-for-Digital-Testability.	IEEE Trans. Very Large Scale Integr. Syst.	2011	DBLP DOI BibTeX RDF
13	Tomohiko Ogawa, Haruo Kobayashi 0001, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu	Design for Testability That Reduces Linearity Testing Time of SAR ADCs.	IEICE Trans. Electron.	2011	DBLP DOI BibTeX RDF
13	Aymen Kout, Fadel Touré, Mourad Badri	An empirical analysis of a testability model for object-oriented programs.	ACM SIGSOFT Softw. Eng. Notes	2011	DBLP DOI BibTeX RDF
13	Michael Viderman	A Combination of Testability and Decodability by Tensor Products.	Electron. Colloquium Comput. Complex.	2011	DBLP BibTeX RDF
13	Chi-Hsuan Cheng, James Chien-Mo Li	An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology.	J. Electron. Test.	2011	DBLP DOI BibTeX RDF
13	Thomas O. Myers, Ian M. Bell	Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics.	J. Electron. Test.	2011	DBLP DOI BibTeX RDF
13	Michael Viderman	A Combination of Testability and Decodability by Tensor Products	CoRR	2011	DBLP BibTeX RDF
13	Steven R. Hetzler	System Impacts of Storage Trends: Hard Errors and Testability.	login Usenix Mag.	2011	DBLP BibTeX RDF
13	David W. Binkley, Mark Harman, Kiran Lakhotia	FlagRemover: A testability transformation for transforming loop-assigned flags.	ACM Trans. Softw. Eng. Methodol.	2011	DBLP DOI BibTeX RDF
13	Krishnendu Chakrabarty	Testing and design-for-testability solutions for 3D integrated circuits.	DDECS	2011	DBLP DOI BibTeX RDF
13	Rance Rodrigues, Israel Koren, Sandip Kundu	An Architecture to Enable Lifetime Full Chip Testability in Chip Multiprocessors.	PACT	2011	DBLP DOI BibTeX RDF
13	Mourad Badri, Fadel Touré	Empirical Analysis for Investigating the Effect of Control Flow Dependencies on Testability of Classes.	SEKE	2011	DBLP BibTeX RDF
13	Alberto González-Sanchez 0002, Rui Abreu 0001, Hans-Gerhard Groß, Arjan J. C. van Gemund	An empirical study on the usage of testability information to fault localization in software.	SAC	2011	DBLP DOI BibTeX RDF
13	Bibhash Sen, Divyam Saran, Mousumi Saha, Biplab K. Sikdar	Synthesis of Reversible Universal Logic around QCA with Online Testability.	ISED	2011	DBLP DOI BibTeX RDF
13	Michal Rumplík, Josef Strnadel	On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits.	DSD	2011	DBLP DOI BibTeX RDF
13	Debdeep Mukhopadhyay, Rajat Subhra Chakraborty	Testability of Cryptographic Hardware and Detection of Hardware Trojans.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
13	Brandon Noia, Krishnendu Chakrabarty	Testing and Design-for-Testability Techniques for 3D Integrated Circuits.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
13	Mel Ó Cinnéide, Dermot Boyle, Iman Hemati Moghadam	Automated Refactoring for Testability.	ICST Workshops	2011	DBLP DOI BibTeX RDF
13	Mark Harman	Refactoring as Testability Transformation.	ICST Workshops	2011	DBLP DOI BibTeX RDF
13	Ayda Saïdane, Nicolas Guelfi	Towards improving security testability of AADL architecture models.	NSS	2011	DBLP DOI BibTeX RDF
13	Yanchuan Li, Gordon Fraser 0001	Bytecode Testability Transformation.	SSBSE	2011	DBLP DOI BibTeX RDF
13	Yen-An Chen, Chun-Yao Wang, Ching-Yi Huang, Hsiu-Yi Lin	A register-transfer level testability analyzer.	SoCC	2011	DBLP DOI BibTeX RDF
13	Lei Wang, Jianhua Jiang, Yumei Zhou, Gaofeng Ren	A new scheme for testability improvement of ECC incorporated memory.	ASICON	2011	DBLP DOI BibTeX RDF
13	Weilu Su, Longzhao Shi	Design for testability of FFT/IFFT IP core for UWB systems.	ASICON	2011	DBLP DOI BibTeX RDF
13	Mouna Karmani, Ka Lok Man, Chiraz Khedhiri, Belgacem Hamdi	Design for testability in nano-CMOS analog integrated circuits using a new design analog checker.	ISOCC	2011	DBLP DOI BibTeX RDF
13	Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta	Low Coverage Analysis using dynamic un-testability debug in ATPG.	VTS	2011	DBLP DOI BibTeX RDF
13	Dilip K. Bhavsar, Steve Poehlman	Test access and the testability features of the Poulson multi-core Intel Itanium® processor.	ITC	2011	DBLP DOI BibTeX RDF
13	Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham	Testability driven statistical path selection.	DAC	2011	DBLP DOI BibTeX RDF
13	Arnab Bhattacharyya 0001	Testability of linear-invariant properties.		2011	RDF
13	Hongxia Fang	Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards.		2011	RDF
13	Parag K. Lala, Adam Mathews, James Patrick Parkerson	An Approach for Implementing State Machines with Online Testability.	VLSI Design	2010	DBLP DOI BibTeX RDF
13	Divya Ranjan, Anil Kumar Tripathi	Testability Models for Object-Oriented Frameworks.	J. Softw. Eng. Appl.	2010	DBLP DOI BibTeX RDF
13	Divya Ranjan, Anil Kumar Tripathi	Variability-Based Models for Testability Analysis of Frameworks.	J. Softw. Eng. Appl.	2010	DBLP DOI BibTeX RDF
13	Po-Yu Yeh, Bo-Yuan Ye, Sy-Yen Kuo, Ing-Yi Chen	Effective design-for-testability techniques for H.264 all-binary integer motion estimation.	IET Circuits Devices Syst.	2010	DBLP DOI BibTeX RDF
13	Jimson Mathew, Abusaleh M. Jabir, Ashutosh Kumar Singh 0001, Hafizur Rahaman 0001, Dhiraj K. Pradhan	A Galois field-based logic synthesis with testability.	IET Comput. Digit. Tech.	2010	DBLP DOI BibTeX RDF
13	Hafizur Rahaman 0001, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan	Simplified bit parallel systolic multipliers for special class of galois field (2m) with testability.	IET Comput. Digit. Tech.	2010	DBLP DOI BibTeX RDF
13	Yogesh Singh, Anju Saha	Improving the testability of object oriented software through software contracts.	ACM SIGSOFT Softw. Eng. Notes	2010	DBLP DOI BibTeX RDF
13	Eli Ben-Sasson, Michael Viderman	Low Rate Is Insufficient for Local Testability.	Electron. Colloquium Comput. Complex.	2010	DBLP BibTeX RDF
13	Luís Bica Oliveira, Chris van den Bos, Jorge R. Fernandes, Chris J. M. Verhoeven, Manuel M. Silva	A 5 GHz quadrature relaxation oscillator with mixing for improved testability or compact front-end implementation.	Int. J. Circuit Theory Appl.	2010	DBLP DOI BibTeX RDF
13	Widad Machmouchi	Local-Testability and Self-Correctability of q-ary Sparse Linear Codes	CoRR	2010	DBLP BibTeX RDF
13	Tim Austin, Terence Tao	Testability and repair of hereditary hypergraph properties.	Random Struct. Algorithms	2010	DBLP DOI BibTeX RDF
13	Chip-Hong Chang, Aijiao Cui	Synthesis-for-Testability Watermarking for Field Authentication of VLSI Intellectual Property.	IEEE Trans. Circuits Syst. I Regul. Pap.	2010	DBLP DOI BibTeX RDF
13	Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre	Ensuring high testability without degrading security: Embedded tutorial on "test and security".	DDECS	2010	DBLP DOI BibTeX RDF
13	Anna Bernasconi 0001, Valentina Ciriani	Logic synthesis and testability of D-reducible functions.	VLSI-SoC	2010	DBLP DOI BibTeX RDF
13	Homa Alemzadeh, Marco Cimei, Paolo Prinetto, Zainalabedin Navabi	Facilitating testability of TLM FIFO: SystemC implementations.	EWDTS	2010	DBLP DOI BibTeX RDF
13	Nguyen Thanh Binh 0002, Dang Thien Binh, Michel Delaunay, Chantal Robach	Testability Analysis Integrated into Scicos Development Environment.	RIVF	2010	DBLP DOI BibTeX RDF
13	Charles Jordan, Thomas Zeugmann	A Note on the Testability of Ramsey's Class.	TAMC	2010	DBLP DOI BibTeX RDF
13	Fernando Alonso, José L. Fuertes, Ángel Lucas González, Loïc Martínez	On the testability of WCAG 2.0 for beginners.	W4A	2010	DBLP DOI BibTeX RDF
13	Aminata Sabane	Improving System Testability and Testing with Microarchitectures.	WCRE	2010	DBLP DOI BibTeX RDF
13	Tung-Hua Yeh, Sying-Jyan Wang	Thermal Safe High Level Test Synthesis for Hierarchical Testability.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
13	Nikhil P. Rahagude, Maheshwar Chandrasekar, Michael S. Hsiao	DFT + DFD: An Integrated Method for Design for Testability and Diagnosability.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
13	Widad Machmouchi	Local-testability and self-correctability of q-ary sparse linear codes.	ISIT	2010	DBLP DOI BibTeX RDF
13	Sébastien Salva, Issam Rabhi	A Preliminary Study on BPEL Process Testability.	ICST Workshops	2010	DBLP DOI BibTeX RDF
13	Odile Laurent	Using Formal Methods and Testability Concepts in the Avionics Systems Validation and Verification (V&V) Process.	ICST	2010	DBLP DOI BibTeX RDF	Formal methods, testing strategy, validation and verification, automatic test case generation
13	Jianping Fu, Bin Liu, Minyan Lu	A Framework for Embedded Software Testability Measurement.	ISIA	2010	DBLP DOI BibTeX RDF
13	Giorgio Brajnik, Yeliz Yesilada, Simon Harper	Testability and validity of WCAG 2.0: the expertise effect.	ASSETS	2010	DBLP DOI BibTeX RDF
13	Alberto González-Sanchez 0002, Éric Piel, Hans-Gerhard Groß, Arjan J. C. van Gemund	Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics.	COMPSAC	2010	DBLP DOI BibTeX RDF
13	Julien Provost, Jean-Marc Roussel, Jean-Marc Faure	SIC-testability of sequential logic controllers.	WODES	2010	DBLP DOI BibTeX RDF
13	Lydie du Bousquet	A New Approach for Software Testability.	TAIC PART	2010	DBLP DOI BibTeX RDF
13	Irith Pomeranz, Sudhakar M. Reddy	Selecting state variables for improved on-line testability through output response comparison of identical circuits.	IOLTS	2010	DBLP DOI BibTeX RDF
13	Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar	Improving the testability and reliability of sequential circuits with invariant logic.	ACM Great Lakes Symposium on VLSI	2010	DBLP DOI BibTeX RDF	online error detection, test pattern reduction
13	Noriaki Takagi	A Study of eSRAM Testability.	DFT	2010	DBLP DOI BibTeX RDF
13	Linda Badri, Mourad Badri, Fadel Touré	Exploring Empirically the Relationship between Lack of Cohesion and Testability in Object-Oriented Systems.	FGIT-ASEA	2010	DBLP DOI BibTeX RDF
13	Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara	RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage.	ITC	2010	DBLP DOI BibTeX RDF
13	Matthew R. Hosking, Ferat Sahin	Testability of a swarm robot using a system of systems approach and discrete event simulation.	SoSE	2010	DBLP DOI BibTeX RDF
13	Eli Ben-Sasson, Michael Viderman	Low Rate Is Insufficient for Local Testability.	APPROX-RANDOM	2010	DBLP DOI BibTeX RDF
13	Isis Cabral, Myra B. Cohen, Gregg Rothermel	Improving the Testing and Testability of Software Product Lines.	SPLC	2010	DBLP DOI BibTeX RDF
13	Fassely Doumbia	Contribution à l'analyse de testabilité des systèmes réactifs temps-réel : Aide à la validation et à la vérification de systèmes. (Contribution to the testability analysis of reactive real-time systems: supporting systems validation and verification).		2010	RDF
13	Kazuteru Namba, Hideo Ito	Analysis of Path Delay Fault Testability for Two-Rail Logic Circuits.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2009	DBLP DOI BibTeX RDF
13	Kentaroh Katoh, Kazuteru Namba, Hideo Ito	Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths.	IEICE Trans. Inf. Syst.	2009	DBLP DOI BibTeX RDF
13	Kentaroh Katoh, Kazuteru Namba, Hideo Ito	Design for Delay Fault Testability of 2-Rail Logic Circuits.	IEICE Trans. Inf. Syst.	2009	DBLP DOI BibTeX RDF
13	Jaan Raik, Vineeth Govind, Raimund Ubar	Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips.	IET Comput. Digit. Tech.	2009	DBLP DOI BibTeX RDF
13	Daniel Steel	Testability and Ockham's Razor: How Formal and Statistical Learning Theory Converge in the New Riddle of Induction.	J. Philos. Log.	2009	DBLP DOI BibTeX RDF
13	Deepti Mishra 0001, Alok Mishra 0001	A discussion on design factors of client-server software testability.	ACM SIGSOFT Softw. Eng. Notes	2009	DBLP DOI BibTeX RDF
13	Sying-Jyan Wang, Tung-Hua Yeh	High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2009	DBLP DOI BibTeX RDF
13	Bo-Yuan Ye, Po-Yu Yeh, Sy-Yen Kuo, Ing-Yi Chen	Design-for-testability techniques for CORDIC design.	Microelectron. J.	2009	DBLP DOI BibTeX RDF
13	Giuseppe Lami	Analytic effectiveness evaluation of techniques for natural language sotware requirements testability.	Comput. Syst. Sci. Eng.	2009	DBLP BibTeX RDF
13	Hao-Chiao Hong, Sheng-Chuan Liang	A Decorrelating Design-for-Digital-Testability Scheme for Sigma-Delta Modulators.	IEEE Trans. Circuits Syst. I Regul. Pap.	2009	DBLP DOI BibTeX RDF
13	Cynthia Sturton, Susmit Jha, Sanjit A. Seshia, David A. Wagner 0001	On voting machine design for verification and testability.	CCS	2009	DBLP DOI BibTeX RDF
13	Qiang Guo 0001, John Derrick, Neil Walkinshaw	Applying Testability Transformations to Achieve Structural Coverage of Erlang Programs.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	FBT, Structural Coverage, Testing, Transformation, Erlang
13	Muhammad Rabee Shaheen, Lydie du Bousquet	Analysis of the Introduction of Testability Antipatterns during the Development Process.	ICSEA	2009	DBLP DOI BibTeX RDF
13	Anna Bernasconi 0001, Valentina Ciriani, Gabriella Trucco, Tiziano Villa	Logic Minimization and Testability of 2SPP-P-Circuits.	DSD	2009	DBLP DOI BibTeX RDF
13	Yu-Jen Huang, Jin-Fu Li 0001	Testability Exploration of 3-D RAMs and CAMs.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
13	Vishal Chowdhary	Practicing Testability in the Real World.	ICST	2009	DBLP DOI BibTeX RDF
13	Alberto González 0002, Éric Piel, Hans-Gerhard Gross	A Model for the Measurement of the Runtime Testability of Component-Based Systems.	ICST Workshops	2009	DBLP DOI BibTeX RDF
13	Nadia Alshahwan, Mark Harman, Alessandro Marchetto 0001, Paolo Tonella	Improving Web Application Testing using testability measures.	WSE	2009	DBLP DOI BibTeX RDF
13	Eduardo Ribeiro da Silva, F. Costa, Frank Herman Behrens, Remerson Stein Kickhofel, Ricardo Maltione	Analog test bus architecture for small die size and limited pin count devices with internal IPs testability emphasis.	LATW	2009	DBLP DOI BibTeX RDF
13	Tao Xu 0002, Krishnendu Chakrabarty	Design-for-Testability for Digital Microfluidic Biochips.	VTS	2009	DBLP DOI BibTeX RDF
13	Unni Chandran, Dan Zhao	SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration.	VTS	2009	DBLP DOI BibTeX RDF
13	Tolga Yurga	A metrics-based approach to the testing process and testability of object-oriented software systems ; Nesne-yönelimli yazılım sistemlerinin test sürecine ve test edilebilirliğine metrik tabanlı bir yaklaşım. (PDF / PS)		2009	RDF
13	Birgitta Lindström	Testability of Dynamic Real-Time Systems.		2009	RDF
13	Kentaroh Katoh, Kazuteru Namba, Hideo Ito	Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability.	IPSJ Trans. Syst. LSI Des. Methodol.	2008	DBLP DOI BibTeX RDF
13	Sayeeda Sultana, Shahriar Al-Imam, Katarzyna Radecka	Design for Testability of QCA Logic Under Stuck-at-value Fault Model.	J. Multiple Valued Log. Soft Comput.	2008	DBLP BibTeX RDF