Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
13 | Peter Wohl, John A. Waicukauski, Jonathon E. Colburn |
Enhancing testability by structured partial scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012, pp. 152-157, 2012, IEEE Computer Society, 978-1-4673-1074-1. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Kenneth P. Parker |
Capacitive sensing testability in complex memory devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, pp. 1-6, 2012, IEEE Computer Society, 978-1-4673-1594-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Michael Viderman |
A Combination of Testability and Decodability by Tensor Products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX-RANDOM ![In: Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques - 15th International Workshop, APPROX 2012, and 16th International Workshop, RANDOM 2012, Cambridge, MA, USA, August 15-17, 2012. Proceedings, pp. 651-662, 2012, Springer, 978-3-642-32511-3. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Chung Chuang, Chun-Yen Wu, Chi-Chun Hsu, Li-Ren Huang, Wei-Min Cheng, Wen-Dar Hsieh |
A design for testability of non-volatile memory reliability test for automotive embedded processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012, Kaohsiung, Taiwan, December 2-5, 2012, pp. 372-375, 2012, IEEE, 978-1-4577-1728-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
13 | Issam Rabhi |
Testabilité des services Web. (Web services testability). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2012 |
RDF |
|
13 | Dean L. Lewis |
Design for pre-bond testability in 3D integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2012 |
RDF |
|
13 | Zichu Qi, Hui Liu, Xiangku Li, Weiwu Hu |
Design for Testability Features of Godson-3 Multicore Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 26(2), pp. 302-313, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Sheng-Chuan Liang, Hao-Chiao Hong |
A Digitally Testable Sigma -Delta Modulator Using the Decorrelating Design-for-Digital-Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 19(3), pp. 503-507, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Tomohiko Ogawa, Haruo Kobayashi 0001, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu |
Design for Testability That Reduces Linearity Testing Time of SAR ADCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 94-C(6), pp. 1061-1064, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Aymen Kout, Fadel Touré, Mourad Badri |
An empirical analysis of a testability model for object-oriented programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 36(4), pp. 1-5, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Michael Viderman |
A Combination of Testability and Decodability by Tensor Products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Electron. Colloquium Comput. Complex. ![In: Electron. Colloquium Comput. Complex. TR11, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
13 | Chi-Hsuan Cheng, James Chien-Mo Li |
An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 27(2), pp. 193-201, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Thomas O. Myers, Ian M. Bell |
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 27(3), pp. 363-373, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Michael Viderman |
A Combination of Testability and Decodability by Tensor Products ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1105.5806, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
13 | Steven R. Hetzler |
System Impacts of Storage Trends: Hard Errors and Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
login Usenix Mag. ![In: login Usenix Mag. 36(3), 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
13 | David W. Binkley, Mark Harman, Kiran Lakhotia |
FlagRemover: A testability transformation for transforming loop-assigned flags. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Softw. Eng. Methodol. ![In: ACM Trans. Softw. Eng. Methodol. 20(3), pp. 12:1-12:33, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Krishnendu Chakrabarty |
Testing and design-for-testability solutions for 3D integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011, pp. 5, 2011, IEEE Computer Society, 978-1-4244-9755-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Rance Rodrigues, Israel Koren, Sandip Kundu |
An Architecture to Enable Lifetime Full Chip Testability in Chip Multiprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PACT ![In: 2011 International Conference on Parallel Architectures and Compilation Techniques, PACT 2011, Galveston, TX, USA, October 10-14, 2011, pp. 219, 2011, IEEE Computer Society, 978-1-4577-1794-9. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Mourad Badri, Fadel Touré |
Empirical Analysis for Investigating the Effect of Control Flow Dependencies on Testability of Classes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEKE ![In: Proceedings of the 23rd International Conference on Software Engineering & Knowledge Engineering (SEKE'2011), Eden Roc Renaissance, Miami Beach, USA, July 7-9, 2011, pp. 475-480, 2011, Knowledge Systems Institute Graduate School, 1-891706-29-2. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
13 | Alberto González-Sanchez 0002, Rui Abreu 0001, Hans-Gerhard Groß, Arjan J. C. van Gemund |
An empirical study on the usage of testability information to fault localization in software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011, pp. 1398-1403, 2011, ACM, 978-1-4503-0113-8. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Bibhash Sen, Divyam Saran, Mousumi Saha, Biplab K. Sikdar |
Synthesis of Reversible Universal Logic around QCA with Online Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISED ![In: International Symposium on Electronic System Design, ISED 2011, Kochi, Kerala, India, December 19-21, 2011, pp. 236-241, 2011, IEEE Computer Society, 978-1-4577-1880-9. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Michal Rumplík, Josef Strnadel |
On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland, pp. 367-374, 2011, IEEE Computer Society, 978-1-4577-1048-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Debdeep Mukhopadhyay, Rajat Subhra Chakraborty |
Testability of Cryptographic Hardware and Detection of Hardware Trojans. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011, pp. 517-524, 2011, IEEE Computer Society, 978-1-4577-1984-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Brandon Noia, Krishnendu Chakrabarty |
Testing and Design-for-Testability Techniques for 3D Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011, pp. 474-479, 2011, IEEE Computer Society, 978-1-4577-1984-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Mel Ó Cinnéide, Dermot Boyle, Iman Hemati Moghadam |
Automated Refactoring for Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: Fourth IEEE International Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings, pp. 437-443, 2011, IEEE Computer Society, 978-0-7695-4345-1. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Mark Harman |
Refactoring as Testability Transformation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: Fourth IEEE International Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings, pp. 414-421, 2011, IEEE Computer Society, 978-0-7695-4345-1. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Ayda Saïdane, Nicolas Guelfi |
Towards improving security testability of AADL architecture models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NSS ![In: 5th International Conference on Network and System Security, NSS 2011, Milan, Italy, September 6-8, 2011, pp. 353-357, 2011, IEEE, 978-1-4577-0458-1. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Yanchuan Li, Gordon Fraser 0001 |
Bytecode Testability Transformation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSBSE ![In: Search Based Software Engineering - Third International Symposium, SSBSE 2011, Szeged, Hungary, September 10-12, 2011. Proceedings, pp. 237-251, 2011, Springer, 978-3-642-23715-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Yen-An Chen, Chun-Yao Wang, Ching-Yi Huang, Hsiu-Yi Lin |
A register-transfer level testability analyzer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoCC ![In: IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011, pp. 219-224, 2011, IEEE, 978-1-4577-1616-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Lei Wang, Jianhua Jiang, Yumei Zhou, Gaofeng Ren |
A new scheme for testability improvement of ECC incorporated memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011, pp. 240-243, 2011, IEEE, 978-1-61284-192-2. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Weilu Su, Longzhao Shi |
Design for testability of FFT/IFFT IP core for UWB systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011, pp. 914-917, 2011, IEEE, 978-1-61284-192-2. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Mouna Karmani, Ka Lok Man, Chiraz Khedhiri, Belgacem Hamdi |
Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISOCC ![In: International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011, pp. 317-320, 2011, IEEE, 978-1-4577-0709-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta |
Low Coverage Analysis using dynamic un-testability debug in ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA, pp. 291-296, 2011, IEEE Computer Society, 978-1-61284-657-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Dilip K. Bhavsar, Steve Poehlman |
Test access and the testability features of the Poulson multi-core Intel Itanium® processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011, pp. 1-8, 2011, IEEE Computer Society, 978-1-4577-0153-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham |
Testability driven statistical path selection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011, pp. 417-422, 2011, ACM, 978-1-4503-0636-2. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
13 | Arnab Bhattacharyya 0001 |
Testability of linear-invariant properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2011 |
RDF |
|
13 | Hongxia Fang |
Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2011 |
RDF |
|
13 | Parag K. Lala, Adam Mathews, James Patrick Parkerson |
An Approach for Implementing State Machines with Online Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2010, pp. 639747:1-639747:7, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Divya Ranjan, Anil Kumar Tripathi |
Testability Models for Object-Oriented Frameworks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Softw. Eng. Appl. ![In: J. Softw. Eng. Appl. 3(6), pp. 536-540, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Divya Ranjan, Anil Kumar Tripathi |
Variability-Based Models for Testability Analysis of Frameworks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Softw. Eng. Appl. ![In: J. Softw. Eng. Appl. 3(5), pp. 455-459, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Po-Yu Yeh, Bo-Yuan Ye, Sy-Yen Kuo, Ing-Yi Chen |
Effective design-for-testability techniques for H.264 all-binary integer motion estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 4(5), pp. 403-413, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Jimson Mathew, Abusaleh M. Jabir, Ashutosh Kumar Singh 0001, Hafizur Rahaman 0001, Dhiraj K. Pradhan |
A Galois field-based logic synthesis with testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 4(4), pp. 263-273, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Hafizur Rahaman 0001, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan |
Simplified bit parallel systolic multipliers for special class of galois field (2m) with testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 4(5), pp. 428-437, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Yogesh Singh, Anju Saha |
Improving the testability of object oriented software through software contracts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 35(1), pp. 1-4, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Eli Ben-Sasson, Michael Viderman |
Low Rate Is Insufficient for Local Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Electron. Colloquium Comput. Complex. ![In: Electron. Colloquium Comput. Complex. TR10, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
13 | Luís Bica Oliveira, Chris van den Bos, Jorge R. Fernandes, Chris J. M. Verhoeven, Manuel M. Silva |
A 5 GHz quadrature relaxation oscillator with mixing for improved testability or compact front-end implementation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Circuit Theory Appl. ![In: Int. J. Circuit Theory Appl. 38(4), pp. 359-366, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Widad Machmouchi |
Local-Testability and Self-Correctability of q-ary Sparse Linear Codes ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1012.3506, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
13 | Tim Austin, Terence Tao |
Testability and repair of hereditary hypergraph properties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Random Struct. Algorithms ![In: Random Struct. Algorithms 36(4), pp. 373-463, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Chip-Hong Chang, Aijiao Cui |
Synthesis-for-Testability Watermarking for Field Authentication of VLSI Intellectual Property. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(7), pp. 1618-1630, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
Ensuring high testability without degrading security: Embedded tutorial on "test and security". ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010, pp. 6, 2010, IEEE Computer Society, 978-1-4244-6612-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Anna Bernasconi 0001, Valentina Ciriani |
Logic synthesis and testability of D-reducible functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC ![In: 18th IEEE/IFIP VLSI-SoC 2010, IEEE/IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Madrid, Spain, 27-29 September 2010, pp. 280-285, 2010, IEEE. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Homa Alemzadeh, Marco Cimei, Paolo Prinetto, Zainalabedin Navabi |
Facilitating testability of TLM FIFO: SystemC implementations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EWDTS ![In: 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010, pp. 428-431, 2010, IEEE Computer Society, 978-1-4244-9555-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Nguyen Thanh Binh 0002, Dang Thien Binh, Michel Delaunay, Chantal Robach |
Testability Analysis Integrated into Scicos Development Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RIVF ![In: 2010 IEEE RIVF International Conference on Computing & Communication Technologies, Research, Innovation, and Vision for the Future (RIVF), Hanoi, Vietnam, 1-4 November, 2010, pp. 1-4, 2010, IEEE, 978-1-4244-8074-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Charles Jordan, Thomas Zeugmann |
A Note on the Testability of Ramsey's Class. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TAMC ![In: Theory and Applications of Models of Computation, 7th Annual Conference, TAMC 2010, Prague, Czech Republic, June 7-11, 2010. Proceedings, pp. 296-307, 2010, Springer, 978-3-642-13561-3. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Fernando Alonso, José L. Fuertes, Ángel Lucas González, Loïc Martínez |
On the testability of WCAG 2.0 for beginners. ![Search on Bibsonomy](Pics/bibsonomy.png) |
W4A ![In: Proceedings of the International Cross-Disciplinary Conference on Web Accessibility, W4A 2010, Raleigh, NC, USA, April 26 - 27, 2010, pp. 9, 2010, ACM, 978-1-4503-0045-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Aminata Sabane |
Improving System Testability and Testing with Microarchitectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WCRE ![In: 17th Working Conference on Reverse Engineering, WCRE 2010, 13-16 October 2010, Beverly, MA, USA, pp. 309-312, 2010, IEEE Computer Society, 978-0-7695-4123-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Tung-Hua Yeh, Sying-Jyan Wang |
Thermal Safe High Level Test Synthesis for Hierarchical Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China, pp. 337-342, 2010, IEEE Computer Society, 978-0-7695-4248-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Nikhil P. Rahagude, Maheshwar Chandrasekar, Michael S. Hsiao |
DFT + DFD: An Integrated Method for Design for Testability and Diagnosability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China, pp. 218-223, 2010, IEEE Computer Society, 978-0-7695-4248-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Widad Machmouchi |
Local-testability and self-correctability of q-ary sparse linear codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISIT ![In: IEEE International Symposium on Information Theory, ISIT 2010, June 13-18, 2010, Austin, Texas, USA, Proceedings, pp. 1203-1207, 2010, IEEE. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Sébastien Salva, Issam Rabhi |
A Preliminary Study on BPEL Process Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: Third International Conference on Software Testing, Verification and Validation, ICST 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, pp. 62-71, 2010, IEEE Computer Society, 978-0-7695-4050-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Odile Laurent |
Using Formal Methods and Testability Concepts in the Avionics Systems Validation and Verification (V&V) Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: Third International Conference on Software Testing, Verification and Validation, ICST 2010, Paris, France, April 7-9, 2010, pp. 1-10, 2010, IEEE Computer Society, 978-0-7695-3990-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Formal methods, testing strategy, validation and verification, automatic test case generation |
13 | Jianping Fu, Bin Liu, Minyan Lu |
A Framework for Embedded Software Testability Measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISIA ![In: Information and Automation - International Symposium, ISIA 2010, Guangzhou, China, November 10-11, 2010. Revised Selected Papers, pp. 105-111, 2010, Springer, 978-3-642-19852-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Giorgio Brajnik, Yeliz Yesilada, Simon Harper |
Testability and validity of WCAG 2.0: the expertise effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASSETS ![In: Proceedings of the 12th International ACM SIGACCESS Conference on Computers and Accessibility, ASSETS 2010, Orlando, FL, USA, October 25 - 27, 2010, pp. 43-50, 2010, ACM, 978-1-60558-881-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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13 | Alberto González-Sanchez 0002, Éric Piel, Hans-Gerhard Groß, Arjan J. C. van Gemund |
Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: Proceedings of the 34th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2010, Seoul, Korea, 19-23 July 2010, pp. 419-424, 2010, IEEE Computer Society, 978-0-7695-4085-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Julien Provost, Jean-Marc Roussel, Jean-Marc Faure |
SIC-testability of sequential logic controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WODES ![In: 10th International Workshop on Discrete Event Systems, WODES 2010, Berlin, Germany, August 30 - September 01, 2010., pp. 193-198, 2010, International Federation of Automatic Control, 978-3-902661-79-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Lydie du Bousquet |
A New Approach for Software Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TAIC PART ![In: Testing - Practice and Research Techniques, 5th International Academic and Industrial Conference, TAIC PART 2010, Windsor, UK, September 3-5, 2010. Proceedings, pp. 207-210, 2010, Springer, 978-3-642-15584-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz, Sudhakar M. Reddy |
Selecting state variables for improved on-line testability through output response comparison of identical circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 179-184, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar |
Improving the testability and reliability of sequential circuits with invariant logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 131-134, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
online error detection, test pattern reduction |
13 | Noriaki Takagi |
A Study of eSRAM Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010, pp. 369, 2010, IEEE Computer Society, 978-1-4244-8447-8. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Linda Badri, Mourad Badri, Fadel Touré |
Exploring Empirically the Relationship between Lack of Cohesion and Testability in Object-Oriented Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FGIT-ASEA ![In: Advances in Software Engineering - International Conference, ASEA 2010, Held as Part of the Future Generation Information Technology Conference, FGIT 2010, Jeju Island, Korea, December 13-15, 2010. Proceedings, pp. 78-92, 2010, Springer, 978-3-642-17577-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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13 | Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara |
RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, pp. 625-634, 2010, IEEE Computer Society, 978-1-4244-7206-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Matthew R. Hosking, Ferat Sahin |
Testability of a swarm robot using a system of systems approach and discrete event simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoSE ![In: 5th International Conference on System of Systems Engineering, SoSE 2010, Loughborough, UK, 22-24 June, 2010, pp. 1-6, 2010, IEEE, 978-1-4244-8197-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Eli Ben-Sasson, Michael Viderman |
Low Rate Is Insufficient for Local Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX-RANDOM ![In: Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques, 13th International Workshop, APPROX 2010, and 14th International Workshop, RANDOM 2010, Barcelona, Spain, September 1-3, 2010. Proceedings, pp. 420-433, 2010, Springer, 978-3-642-15368-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Isis Cabral, Myra B. Cohen, Gregg Rothermel |
Improving the Testing and Testability of Software Product Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SPLC ![In: Software Product Lines: Going Beyond - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Proceedings, pp. 241-255, 2010, Springer, 978-3-642-15578-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
13 | Fassely Doumbia |
Contribution à l'analyse de testabilité des systèmes réactifs temps-réel : Aide à la validation et à la vérification de systèmes. (Contribution to the testability analysis of reactive real-time systems: supporting systems validation and verification). ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2010 |
RDF |
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13 | Kazuteru Namba, Hideo Ito |
Analysis of Path Delay Fault Testability for Two-Rail Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(9), pp. 2295-2303, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Kentaroh Katoh, Kazuteru Namba, Hideo Ito |
Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Inf. Syst. ![In: IEICE Trans. Inf. Syst. 92-D(3), pp. 433-442, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Kentaroh Katoh, Kazuteru Namba, Hideo Ito |
Design for Delay Fault Testability of 2-Rail Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Inf. Syst. ![In: IEICE Trans. Inf. Syst. 92-D(2), pp. 336-341, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Jaan Raik, Vineeth Govind, Raimund Ubar |
Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 3(5), pp. 476-486, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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13 | Daniel Steel |
Testability and Ockham's Razor: How Formal and Statistical Learning Theory Converge in the New Riddle of Induction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Philos. Log. ![In: J. Philos. Log. 38(5), pp. 471-489, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Deepti Mishra 0001, Alok Mishra 0001 |
A discussion on design factors of client-server software testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 34(5), pp. 1-5, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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13 | Sying-Jyan Wang, Tung-Hua Yeh |
High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(10), pp. 1583-1596, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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13 | Bo-Yuan Ye, Po-Yu Yeh, Sy-Yen Kuo, Ing-Yi Chen |
Design-for-testability techniques for CORDIC design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 40(10), pp. 1436-1440, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Giuseppe Lami |
Analytic effectiveness evaluation of techniques for natural language sotware requirements testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Syst. Sci. Eng. ![In: Comput. Syst. Sci. Eng. 24(2), 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
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13 | Hao-Chiao Hong, Sheng-Chuan Liang |
A Decorrelating Design-for-Digital-Testability Scheme for Sigma-Delta Modulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(1), pp. 60-73, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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13 | Cynthia Sturton, Susmit Jha, Sanjit A. Seshia, David A. Wagner 0001 |
On voting machine design for verification and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCS ![In: Proceedings of the 2009 ACM Conference on Computer and Communications Security, CCS 2009, Chicago, Illinois, USA, November 9-13, 2009, pp. 463-476, 2009, ACM, 978-1-60558-894-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Qiang Guo 0001, John Derrick, Neil Walkinshaw |
Applying Testability Transformations to Achieve Structural Coverage of Erlang Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 81-96, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
FBT, Structural Coverage, Testing, Transformation, Erlang |
13 | Muhammad Rabee Shaheen, Lydie du Bousquet |
Analysis of the Introduction of Testability Antipatterns during the Development Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: The Fourth International Conference on Software Engineering Advances, ICSEA 2009, 20-25 September 2009, Porto, Portugal, pp. 128-133, 2009, IEEE Computer Society, 978-0-7695-3777-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Anna Bernasconi 0001, Valentina Ciriani, Gabriella Trucco, Tiziano Villa |
Logic Minimization and Testability of 2SPP-P-Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2009, 27-29 August 2009, Patras, Greece, pp. 773-780, 2009, IEEE Computer Society, 978-0-7695-3782-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Yu-Jen Huang, Jin-Fu Li 0001 |
Testability Exploration of 3-D RAMs and CAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan, pp. 397-402, 2009, IEEE Computer Society, 978-0-7695-3864-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Vishal Chowdhary |
Practicing Testability in the Real World. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: Second International Conference on Software Testing Verification and Validation, ICST 2009, Denver, Colorado, USA, April 1-4, 2009, pp. 260-268, 2009, IEEE Computer Society, 978-0-7695-3601-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Alberto González 0002, Éric Piel, Hans-Gerhard Gross |
A Model for the Measurement of the Runtime Testability of Component-Based Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST Workshops ![In: Second International Conference on Software Testing Verification and Validation, ICST 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings, pp. 19-28, 2009, IEEE Computer Society, 978-0-7695-3671-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Nadia Alshahwan, Mark Harman, Alessandro Marchetto 0001, Paolo Tonella |
Improving Web Application Testing using testability measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WSE ![In: Proceedings of the 11th IEEE International Symposium on Web Systems Evolution, WSE 2009, 25-26 September 2009, Edmonton, Alberta, Canada, pp. 49-58, 2009, IEEE Computer Society, 978-1-4244-5124-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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13 | Eduardo Ribeiro da Silva, F. Costa, Frank Herman Behrens, Remerson Stein Kickhofel, Ricardo Maltione |
Analog test bus architecture for small die size and limited pin count devices with internal IPs testability emphasis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009, pp. 1-6, 2009, IEEE, 978-1-4244-4206-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Tao Xu 0002, Krishnendu Chakrabarty |
Design-for-Testability for Digital Microfluidic Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, pp. 309-314, 2009, IEEE Computer Society, 978-0-7695-3598-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Unni Chandran, Dan Zhao |
SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, pp. 321-326, 2009, IEEE Computer Society, 978-0-7695-3598-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
13 | Tolga Yurga |
A metrics-based approach to the testing process and testability of object-oriented software systems ; Nesne-yönelimli yazılım sistemlerinin test sürecine ve test edilebilirliğine metrik tabanlı bir yaklaşım. (PDF / PS) ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2009 |
RDF |
|
13 | Birgitta Lindström |
Testability of Dynamic Real-Time Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2009 |
RDF |
|
13 | Kentaroh Katoh, Kazuteru Namba, Hideo Ito |
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPSJ Trans. Syst. LSI Des. Methodol. ![In: IPSJ Trans. Syst. LSI Des. Methodol. 1, pp. 91-103, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
13 | Sayeeda Sultana, Shahriar Al-Imam, Katarzyna Radecka |
Design for Testability of QCA Logic Under Stuck-at-value Fault Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Multiple Valued Log. Soft Comput. ![In: J. Multiple Valued Log. Soft Comput. 14(1-2), pp. 145-176, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|