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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 11 occurrences of 8 keywords
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Results
Found 28 publication records. Showing 28 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
65 | Yongsheng Wang, Jinxiang Wang 0001, Fengchang Lai, Yizheng Ye |
Optimal Schemes for ADC BIST Based on Histogram. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 52-57, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
65 | Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann |
An on-chip solution for static ADC test and measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 81-86, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
ADC-BiST, code histogram, linearity measurements, test, system-on-chip, analog to digital converter |
56 | Hung-Kai Chen 0001, Chih-Hu Wang, Chau-Chin Su |
A Self Calibrated ADC BIST Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 117-122, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
38 | Xiankun Jin, Tao Chen 0006, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen 0001 |
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017, pp. 1-10, 2017, IEEE, 978-1-5386-3413-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
34 | Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong |
Multi-histogram ADC BIST System for ADC Linearity Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013, pp. 213-214, 2013, IEEE Computer Society, 978-0-7695-5080-0. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
30 | Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento |
Low Cost BIST for Static and Dynamic Testing of ADCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(3), pp. 283-290, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
ADC BIST, noise based testing, mixed-signal test |
26 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(2), pp. 139-147, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test |
24 | Senthil Sivakumar, S. P. Joy Vasantha Rani |
Efficient Design of ADC BIST with an Analog Ramp Signal Generation and Digital Error Estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 28(3), pp. 1950042:1-1950042:14, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
24 | Senthil Sivakumar, S. P. Joy Vasantha Rani |
An ADC BIST using on-chip ramp generation and digital ORA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 81, pp. 8-15, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
24 | Hao Meng, Degang Chen 0001 |
A simple ramp generator with level spreading for SEIR based ADC BIST circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: IEEE 58th International Midwest Symposium on Circuits and Systems, MWSCAS 2015, Fort Collins, CO, USA, August 2-5, 2015, pp. 1-4, 2015, IEEE, 978-1-4673-6558-1. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
24 | Yan Duan, Tao Chen 0006, Zhiqiang Liu, Xu Zhang, Degang Chen 0001 |
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015, pp. 3016-3019, 2015, IEEE, 978-1-4799-8391-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
24 | Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir, Manuel J. Barragán |
Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC (Selected Papers) ![In: VLSI-SoC: Internet of Things Foundations - 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised and Extended Selected Papers, pp. 129-148, 2014, Springer, 978-3-319-25278-0. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen 0001, Randall L. Geiger |
On Chip Signal Generators for Low Overhead ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 28(5), pp. 615-623, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
A low cost method for testing offset and gain error for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012, pp. 2023-2026, 2012, IEEE, 978-1-4673-0218-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Degang Chen 0001 |
SNR measurement based on linearity test for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil, pp. 269-272, 2011, IEEE, 978-1-4244-9473-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
24 | An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting |
A SAR ADC BIST for simplified linearity test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SoCC ![In: IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011, pp. 146-149, 2011, IEEE, 978-1-4577-1616-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Le Jin, Degang Chen 0001 |
INL based dynamic performance estimation for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France, pp. 3028-3031, 2010, IEEE, 978-1-4244-5308-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
Phase control of triangular stimulus generator for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France, pp. 1935-1938, 2010, IEEE, 978-1-4244-5308-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
24 | Jingbo Duan, Degang Chen 0001, Randall L. Geiger |
Cost Effective Signal Generators for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan, pp. 13-16, 2009, IEEE, 978-1-4244-3827-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh Chang |
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(6), pp. 549-558, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Reconfigurable oscillator, Sinusoidal signal generator, Sigma-delta modulator |
24 | Erdem Serkan Erdogan, Sule Ozev |
An ADC-BiST scheme using sequential code analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 713-718, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
24 | Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang |
Code-width testing-based compact ADC BIST circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. II Express Briefs ![In: IEEE Trans. Circuits Syst. II Express Briefs 51-II(11), pp. 603-606, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
24 | Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell |
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(4), pp. 469-479, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
24 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(3-4), pp. 255-266, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Built-In Self-Test (BIST), analog and mixed-signal testing, ADC test |
24 | Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell |
On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SOC ![In: SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC'01), December 3-5, 2001, Montpellier, France, pp. 425-436, 2001, Kluwer, 1-4020-7148-5. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP BibTeX RDF |
|
24 | Florence Azaïs, Serge Bernard, Y. Betrand, Michel Renovell |
Towards an ADC BIST scheme using the histogram test technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETW ![In: 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000, pp. 53-58, 2000, IEEE Computer Society, 0-7695-0701-8. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
24 | Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand |
Hardware Resource Minimization for Histogram-Based ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 247-254, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
24 | Stephen K. Sunter, Naveena Nagi |
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, pp. 389-395, 1997, IEEE Computer Society, 0-7803-4209-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
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