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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 15 occurrences of 12 keywords
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Results
Found 22 publication records. Showing 22 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
99 | Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp |
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 387-392, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
85 | Shi-Hao Chen, Ke-Cheng Chu, Jiing-Yuan Lin, Cheng-Hong Tsai |
DFM/DFY practices during physical designs for timing, signal integrity, and power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007, pp. 232-237, 2007, IEEE Computer Society, 1-4244-0629-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
0.13 micron, DFY, dynamic IR drop, process variation, physical designs, DFM, design for manufacturability, signal integrity, timing integrity, yield analysis, design for yield |
77 | Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki |
DFM/DFY: should you trust the surgeon or the family doctor? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 439-442, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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52 | Jamil Kawa, Charles C. Chiang |
DFM issues for 65nm and beyond. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007, pp. 318-322, 2007, ACM, 978-1-59593-605-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
DFY, DFM |
33 | Philipp V. Panitz, Markus Olbrich, Erich Barke, Jürgen Koehl |
Robust wiring networks for DfY considering timing constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007, pp. 43-48, 2007, ACM, 978-1-59593-605-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
redundant wiring, timing constraint aware, open defects, design for yield |
33 | Srikanth Venkataraman |
DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 5, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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33 | Rajesh Raina |
What is DFM & DFY and Why Should I Care ? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-9, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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33 | Robert C. Aitken |
The Design and Validation of IP for DFM/DFY Assurance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-7, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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33 | R. Scott Fetherston |
DFT, DFY, DFR: Who Cares? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 1144, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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33 | James A. Monzel |
DFT, DFY, and DFR; Which One(s) Do You Worry About? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 1145, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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33 | David M. Wu |
"DFY and DFR are more important than DFT". ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 1147, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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33 | Robert C. Aitken |
It Makes Sense to Combine DFT and DFR/DFY. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, pp. 1143, 1999, IEEE Computer Society, 0-7803-5753-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
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30 | Sylvain Guilley, Florent Flament, Philippe Hoogvorst, Renaud Pacalet, Yves Mathieu |
Secured CAD Back-End Flow for Power-Analysis-Resistant Cryptoprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(6), pp. 546-555, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
robust hardware, back-end design automation, power-constant architectures, DFY, side-channel attacks, DFM, mitigation |
30 | Sani R. Nassif, Vijay Pitchumani, Norma Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic |
Variation-aware analysis: savior of the nanometer era? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 411-412, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
DFY, variability, yield |
22 | Giuseppe Nicosia, Giovanni Stracquadanio |
A Design-for-Yield Algorithm to Assess and Improve the Structural and Energetic Robustness of Proteins and Drugs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEA ![In: Experimental Algorithms, 8th International Symposium, SEA 2009, Dortmund, Germany, June 4-6, 2009. Proceedings, pp. 245-256, 2009, Springer, 978-3-642-02010-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
22 | David Cross, Eric Nequist, Louis Scheffer |
A DFM aware, space based router. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 2007 International Symposium on Physical Design, ISPD 2007, Austin, Texas, USA, March 18-21, 2007, pp. 171-172, 2007, ACM, 978-1-59593-613-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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22 | Nagesh Nagapalli |
DFT and Test: Ensuring Product Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 5, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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22 | Resve A. Saleh, Pallab K. Chatterjee, Ivan Pesic, Robbert Dobkins, Mike Smayling, Joseph Sawicki |
DFM-EDA's Salvation or its Excuse for Being out of Touch with Engineering? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 7-8, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Shyue-Kung Lu, Jen-Sheng Shih, Shih-Chang Huang |
Design-for-testability and fault-tolerant techniques for FFT processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 13(6), pp. 732-741, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
22 | Thomas W. Williams |
Design for Testability: The Path to Deep Submicron. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
22 | Sanjiv Taneja |
DFT Aware Layout - Layout Aware DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
22 | Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu |
Failure Factor Based Yield Enhancement for SRAM Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 20-28, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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