Search results for "F-STAFAN"

Found 10 publication records. Showing 9 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
224	C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal	A STAFAN-like functional testability measure for register-level circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
58	Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges	Statistical estimation of delay fault detectabilities and fault grading.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	delay fault detectabilities, fault grading, STAFAN, transition observabilities, fanout stems, fanout free region, gate line transition controllabilities, VLSI, fault diagnosis, logic testing, logic testing, statistical analysis, fault coverage, benchmark circuits, statistical estimation
51	Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi	Probabilistic fault grading based on activation checking and observability analysis.	J. Electron. Test.	1990	DBLP DOI BibTeX RDF	activation checking, fault-free simulation, fault grading, statistical fault analysis, controllability, observability, detectability
51	Michael Brühan, Reinhold Kröger, Stafan Ruppert	Monitoring verteilter CORBA-Anwendungen.	MMB (Kurzbeiträge)	1997	DBLP BibTeX RDF
39	Joan Villoldo, Prathima Agrawal, Vishwani D. Agrawal	Stafan Algorithms for MOS Circuits.	ICCD	1991	DBLP DOI BibTeX RDF
39	Vishwani D. Agrawal	STAFAN Takes a Middle Course.	ITC	1985	DBLP BibTeX RDF
39	Sunil K. Jain, Vishwani D. Agrawal	STAFAN: An alternative to fault simulation.	DAC	1984	DBLP BibTeX RDF
25	Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges	Statistical estimation of delay fault detectabilities and fault grading.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	transition delay and path delay faults, statistical delay fault analysis, fault detectabilities, fault coverage, random patterns
25	Peter Odryna, Kevin Nazareth, Carl Christensen	A workstation-mixed model circuit simulator.	DAC	1986	DBLP DOI BibTeX RDF