|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 13 occurrences of 13 keywords
|
|
|
Results
Found 11 publication records. Showing 11 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
139 | Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn |
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 151-166, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
known good die, bare die test, multichip modules |
60 | Larry Gilg |
Known Good Die. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 15-25, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in |
57 | Joel A. Jorgenson, Russell J. Wagner |
Design-For-Test in a Multiple Substrate Multichip Module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 97-107, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Multichip Module (MCM) Test, Known-Good Die (KGD), Ball Grid Array (BGA), Built-In-Self-Test (BIST), boundary-scan |
56 | Anne E. Gattiker, Wojciech Maly |
Smart Substrate MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 39-53, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
smart substrate, testing, cost model, MCM |
36 | Kexin Wang, Zhixu Li, Jiaan Wang, Jianfeng Qu, Ying He 0010, An Liu 0002, Lei Zhao 0001 |
RT-KGD: Relation Transition Aware Knowledge-Grounded Dialogue Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2207.08212, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
36 | Kexin Wang, Zhixu Li, Jiaan Wang, Jianfeng Qu, Ying He 0010, An Liu 0002, Lei Zhao 0001 |
RT-KGD: Relation Transition Aware Knowledge-Grounded Dialogue Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISWC ![In: The Semantic Web - ISWC 2022 - 21st International Semantic Web Conference, Virtual Event, October 23-27, 2022, Proceedings, pp. 319-335, 2022, Springer, 978-3-031-19432-0. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
36 | D. Kasprowicz, Pawel Gluchowski, K. Jaroszewski, Maciej Chrunik, Andrzej Majchrowski |
Up-conversion luminescence and µ-Raman investigations of KGd(WO4)2 crystalline powders doped with rare earth ions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTON ![In: 18th International Conference on Transparent Optical Networks, ICTON 2016, Trento, Italy, July 10-14, 2016, pp. 1-3, 2016, IEEE, 978-1-5090-1467-5. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
36 | Hervé Minoux, Christophe Chipot, David Brown 0001, Bernard Maigret |
Structural analysis of the KGD sequence loop of barbourin, an alpha-IIb-beta-3-specific disintegrin. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Aided Mol. Des. ![In: J. Comput. Aided Mol. Des. 14(4), pp. 317-327, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
36 | Adit D. Singh, Phil Nigh, C. Mani Krishna 0001 |
Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, pp. 362-369, 1997, IEEE Computer Society, 0-7803-4209-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
36 | Uwe Höhne |
DIAMOND: Der Einsatz von innovativen Informationstechnologien in der Produktion am Beispiel der KGD AG, Köln. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GI Jahrestagung ![In: Informatik - Wirtschaft - Gesellschaft, 23. Gi-Jahrestagung, Dresden, Germany, 27. September - 1. Oktober 1993, pp. 130-137, 1993, Springer, 3-540-57192-2. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
30 | Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda |
System-in-Package Testing: Problems and Solutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(3), pp. 203-211, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
IEEE1500 SECT, KGD, System-on-Chip, SoC, test access mechanism, SiP, System-in-Package, System-on-Package |
Displaying result #1 - #11 of 11 (100 per page; Change: )
|
|