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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 5 occurrences of 5 keywords
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Results
Found 16 publication records. Showing 16 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
71 | Alireza Ejlali, Bashir M. Al-Hashimi, Marcus T. Schmitz, Paul M. Rosinger, Seyed Ghassem Miremadi |
Combined time and information redundancy for SEU-tolerance in energy-efficient real-time systems. |
IEEE Trans. Very Large Scale Integr. Syst. |
2006 |
DBLP DOI BibTeX RDF |
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62 | Rajesh Garg, Sunil P. Khatri |
Efficient analytical determination of the SEU-induced pulse shape. |
ASP-DAC |
2009 |
DBLP DOI BibTeX RDF |
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60 | Ahmad Patooghy, Mahdi Fazeli, Seyed Ghassem Miremadi |
A Low-Power and SEU-Tolerant Switch Architecture for Network on Chips. |
PRDC |
2007 |
DBLP DOI BibTeX RDF |
SEU-Tolerance, Power Consumption, NoC |
45 | Rajesh Garg, Sunil P. Khatri |
A novel, highly SEU tolerant digital circuit design approach. |
ICCD |
2008 |
DBLP DOI BibTeX RDF |
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35 | Chong Zhao, Sujit Dey |
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO). |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
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29 | Rui Gong, Wei Chen 0009, Fang Liu 0002, Kui Dai, Zhiying Wang 0003 |
A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
SEE tolerance, SEU tolerance, SET tolerance, Asynchronous circuit |
28 | Takashi Yoshida, Kazutoshi Kobayashi, Jun Furuta |
Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process. |
IOLTS |
2019 |
DBLP DOI BibTeX RDF |
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28 | Ahmed S. Sajit, Michael A. Turi |
SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells. |
CCWC |
2017 |
DBLP DOI BibTeX RDF |
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28 | Igor Villata, Unai Bidarte, Uli Kretzschmar, Armando Astarloa, Jesús Lázaro 0001 |
Fast and accurate SEU-tolerance characterization method for Zynq SoCs. |
FPL |
2014 |
DBLP DOI BibTeX RDF |
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28 | Wei Wei 0034, Fabrizio Lombardi, Kazuteru Namba |
Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance. |
DFT |
2014 |
DBLP DOI BibTeX RDF |
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28 | Seokjoong Kim, Matthew R. Guthaus |
Dynamic voltage scaling for SEU-tolerance in low-power memories. |
VLSI-SoC |
2012 |
DBLP DOI BibTeX RDF |
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28 | Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato |
A routing architecture exploration for coarse-grained reconfigurable architecture with automated seu-tolerance evaluation. |
SoCC |
2010 |
DBLP DOI BibTeX RDF |
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28 | Toshimasa Funaki, Toshinori Sato |
Formulating MITF for a Multicore Processor with SEU Tolerance. |
DSD |
2008 |
DBLP DOI BibTeX RDF |
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28 | Costas Argyrides, Fabian Vargas 0001, Marlon Moraes, Dhiraj K. Pradhan |
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
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28 | Alireza Ejlali, Marcus T. Schmitz, Bashir M. Al-Hashimi, Seyed Ghassem Miremadi, Paul M. Rosinger |
Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy. |
ISLPED |
2005 |
DBLP DOI BibTeX RDF |
single event upset (SEU), dynamic voltage scaling (DVS), information redundancy |
22 | Chong Zhao, Yi Zhao, Sujit Dey |
Intelligent Robustness Insertion for Optimal Transient Error Tolerance Improvement in VLSI Circuits. |
IEEE Trans. Very Large Scale Integr. Syst. |
2008 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #16 of 16 (100 per page; Change: )
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