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Publication years (Num. hits)
1984-1997 (9)
Publication types (Num. hits)
article(2) inproceedings(7)
Venues (Conferences, Journals, ...)
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The graphs summarize 30 occurrences of 25 keywords

Results
Found 10 publication records. Showing 9 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
224C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal A STAFAN-like functional testability measure for register-level circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 1995 DBLP  DOI  BibTeX  RDF functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
58Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges Statistical estimation of delay fault detectabilities and fault grading. Search on Bibsonomy Great Lakes Symposium on VLSI The full citation details ... 1995 DBLP  DOI  BibTeX  RDF delay fault detectabilities, fault grading, STAFAN, transition observabilities, fanout stems, fanout free region, gate line transition controllabilities, VLSI, fault diagnosis, logic testing, logic testing, statistical analysis, fault coverage, benchmark circuits, statistical estimation
51Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi Probabilistic fault grading based on activation checking and observability analysis. Search on Bibsonomy J. Electron. Test. The full citation details ... 1990 DBLP  DOI  BibTeX  RDF activation checking, fault-free simulation, fault grading, statistical fault analysis, controllability, observability, detectability
51Michael Brühan, Reinhold Kröger, Stafan Ruppert Monitoring verteilter CORBA-Anwendungen. Search on Bibsonomy MMB (Kurzbeiträge) The full citation details ... 1997 DBLP  BibTeX  RDF
39Joan Villoldo, Prathima Agrawal, Vishwani D. Agrawal Stafan Algorithms for MOS Circuits. Search on Bibsonomy ICCD The full citation details ... 1991 DBLP  DOI  BibTeX  RDF
39Vishwani D. Agrawal STAFAN Takes a Middle Course. Search on Bibsonomy ITC The full citation details ... 1985 DBLP  BibTeX  RDF
39Sunil K. Jain, Vishwani D. Agrawal STAFAN: An alternative to fault simulation. Search on Bibsonomy DAC The full citation details ... 1984 DBLP  BibTeX  RDF
25Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges Statistical estimation of delay fault detectabilities and fault grading. Search on Bibsonomy J. Electron. Test. The full citation details ... 1996 DBLP  DOI  BibTeX  RDF transition delay and path delay faults, statistical delay fault analysis, fault detectabilities, fault coverage, random patterns
25Peter Odryna, Kevin Nazareth, Carl Christensen A workstation-mixed model circuit simulator. Search on Bibsonomy DAC The full citation details ... 1986 DBLP  DOI  BibTeX  RDF
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