Search results for "Self-testability"

Found 12 publication records. Showing 12 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
64	Xiaowei Li 0001, Toshimitsu Masuzawa, Hideo Fujiwara	Strong self-testability for data paths high-level synthesis.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	self-testability, testability constraints, interconnection assignment, test resources reusability, high level synthesis, high-level synthesis, design for testability, register transfer level, data flow graphs, data paths, register assignment
40	Sami Beydeda	Self-Metamorphic-Testing Components.	COMPSAC (2)	2006	DBLP DOI BibTeX RDF
28	Xiaowei Li 0001, Paul Y. S. Cheung	Data Path Synthesis for BIST with Low Area Overhead.	ASP-DAC	1999	DBLP DOI BibTeX RDF
27	Sami Beydeda	Self-Testability in Unit Testing.	COMPSAC (2)	2005	DBLP DOI BibTeX RDF
20	Andrzej Krasniewski	Design of Dependable Hardware: What BIST is most Efficient?	EDCC	1996	DBLP DOI BibTeX RDF
17	Tianjia Sun, Li Guo 0004	One New In-Operation Self-Testability Mechanism Designed for SoC Microchips following IEEE STD 1500.	ICPP Workshops	2007	DBLP DOI BibTeX RDF
17	Manoj Singh Gaur, Mark Zwolinski	Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique.	VLSI Design	2004	DBLP DOI BibTeX RDF
17	Ian G. Harris, Alex Orailoglu	SYNCBIST: SYNthesis for Concurrent Built-In-Self-Testability.	ICCD	1994	DBLP DOI BibTeX RDF
17	Christos A. Papachristou, Scott Chiu, Haidar Harmanani	SYNTEST: A Method for High-Level SYNthesis with Self-TESTability.	ICCD	1991	DBLP DOI BibTeX RDF
17	Sami Beydeda	STECC: Selbsttestende Software-Komponenten.	Inform. Forsch. Entwickl.	2007	DBLP DOI BibTeX RDF	Self-testability, Control flow graph generation, Path-oriented testing, Component-based development
12	Steve Hodgson, Len Theobald, W. B. Hughes, Richard Illman	ASTA: an integrated system for bist analysis & automatic test generation.	EURO-DAC	1990	DBLP DOI BibTeX RDF
10	Mahsa Vahidi, Alex Orailoglu	Testability metrics for synthesis of self-testable designs and effective test plans.	VTS	1995	DBLP DOI BibTeX RDF	testability metrics, self-testable designs, effective test plans, unified metrics, synthesis phases, VLSI, VLSI, built-in self test, high level synthesis, high level synthesis, design for testability, BIST, DFT, logic CAD, integrated circuit design, benchmark designs

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