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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 16 occurrences of 10 keywords
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Results
Found 33 publication records. Showing 33 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
37 | Mandeep Singh, Israel Koren |
Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002, pp. 286-291, 2002, IEEE Computer Society, 0-7695-1561-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters |
29 | Anita J. Crompton, Kelum A. A. Gamage, Alex Jenkins, C. James Taylor |
Alpha Particle Detection Using Alpha-Induced Air Radioluminescence: A Review and Future Prospects for Preliminary Radiological Characterisation for Nuclear Facilities Decommissioning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 18(4), pp. 1015, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
29 | Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee |
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 69, pp. 100-108, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
25 | Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra |
Model for Transient Fault Susceptibility of Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(5), pp. 501-509, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
transient fault modeling, transient fault susceptibility, alpha-particle, soft error, transient fault |
25 | Mandeep Singh, Israel Koren |
Reliability Enhancement of Analog-to-Digital Converters (ADCs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 347-, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters |
24 | Mandeep Singh, Israel Koren |
Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 11(5), pp. 839-852, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
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18 | Hadi Shahabinejad, Davorin Sudac, Miltiadis Alamaniotis, Karlo Nad, Jasmina Objodas |
Bulk Sample Analysis Using Associated Alpha Particle Neutron Generator and Artificial Neural Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IISA ![In: 14th International Conference on Information, Intelligence, Systems & Applications, IISA 2023, Volos, Greece, July 10-12, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1806-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill |
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, pp. 1-5, 2019, IEEE, 978-1-5386-9504-3. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
18 | Jesse Tanguay, François Bénard, Anna Celler, Thomas Ruth, Paul Schaffer |
Spatial resolution properties of digital autoradiography systems for pre-clinical alpha particle imaging (Conference Presentation). ![Search on Bibsonomy](Pics/bibsonomy.png) |
Medical Imaging: Biomedical Applications in Molecular, Structural, and Functional Imaging ![In: Medical Imaging 2017: Biomedical Applications in Molecular, Structural, and Functional Imaging, Orlando, Florida, United States, 11-16 February 2017, pp. 1013716, 2017, SPIE, 9781510607194. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
18 | Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg |
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 13(17), pp. 20160627, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
18 | Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg |
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 13(19), pp. 20168001, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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18 | Ezzat G. Bakhoum, Marvin H. M. Cheng, Kevin M. Van Landingham |
Alpha-Particle-Based Icing Detector for Aircraft. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 63(1), pp. 185-191, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
18 | Mingzhe Liu, Xianguo Tuo, Jun Ren, Zhe Li, Lei Wang, Jianbo Yang |
A PSO-SVM Based Model for Alpha Particle Activity Prediction Inside Decommissioned Channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (1) ![In: Advances in Neural Networks - ISNN 2012 - 9th International Symposium on Neural Networks, Shenyang, China, July 11-14, 2012. Proceedings, Part I, pp. 517-523, 2012, Springer, 978-3-642-31345-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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18 | Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta |
Alpha-particle-induced effects in partially depleted silicon on insulator device: With and without body contact. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 5(1), pp. 52-58, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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18 | Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo |
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 50(9-11), pp. 1822-1831, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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18 | Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt |
Single-event-upset and alpha-particle emission rate measurement techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IBM J. Res. Dev. ![In: IBM J. Res. Dev. 52(3), pp. 265-274, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang |
Alpha-particle-induced upsets in advanced CMOS circuits and technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IBM J. Res. Dev. ![In: IBM J. Res. Dev. 52(3), pp. 225-232, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | G. E. Zardas, P. H. Yannakopoulos, Chrys I. Symeonides, Marián Veselý, P. C. Euthymiou |
A study of electron transition in the energy gap of SI-GaAs with photoconductivity spectra and under alpha-particle irradiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 39(5), pp. 737-739, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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18 | Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana |
Alpha particle radiation effects in RF MEMS capacitive switches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 48(8-9), pp. 1241-1244, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Tino Heijmen |
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 131-136, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
18 | G. E. Zardas, P. H. Yannakopoulos, M. Ziska, Chrys I. Symeonides, P. C. Euthymiou, O. Csabay |
Dependence of GaAs: Si persistent photoconductivity on temperature and alpha-particle irradiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 36(1), pp. 1-4, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi |
A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 45(11), pp. 1248-1256, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
transient fault injection, transient fault modeling, transient fault simulation, fault-tolerance, Single event upset |
18 | Richard M. King, Robert A. Wagner |
Combining Speed with Alpha-Particle Induced Memory Error Tolerance in a Large Boolean Vector Machine (Extended Abstract). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCA ![In: Proceedings of the 11th Annual Symposium on Computer Architecture, Ann Arbor, USA, June 1984, pp. 251-253, 1984, ACM, 0-8186-0538-3. The full citation details ...](Pics/full.jpeg) |
1984 |
DBLP DOI BibTeX RDF |
|
12 | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh |
Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 14(5), pp. 514-524, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Navid Azizi, Farid N. Najm |
A family of cells to reduce the soft-error-rate in ternary-CAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 779-784, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
soft-error rate, content-addressable memory |
12 | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee |
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 288-293, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Jie S. Hu, Greg M. Link, Johnsy K. John, Shuai Wang 0006, Sotirios G. Ziavras |
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asia-Pacific Computer Systems Architecture Conference ![In: Advances in Computer Systems Architecture, 10th Asia-Pacific Conference, ACSAC 2005, Singapore, October 24-26, 2005, Proceedings, pp. 200-214, 2005, Springer, 3-540-29643-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 298-303, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Arijit Biswas, Paul Racunas, Razvan Cheveresan, Joel S. Emer, Shubhendu S. Mukherjee, Ram Rangan |
Computing Architectural Vulnerability Factors for Address-Based Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCA ![In: 32st International Symposium on Computer Architecture (ISCA 2005), 4-8 June 2005, Madison, Wisconsin, USA, pp. 532-543, 2005, IEEE Computer Society, 978-0-7695-2270-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Ketan N. Patel, Igor L. Markov |
Error-correction and crosstalk avoidance in DSM busses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 12(10), pp. 1076-1080, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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12 | Shubhendu S. Mukherjee, Joel S. Emer, Tryggve Fossum, Steven K. Reinhardt |
Cache Scrubbing in Microprocessors: Myth or Necessity? ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2004), 3-5 March 2004, Papeete, Tahiti, pp. 37-42, 2004, IEEE Computer Society, 0-7695-2076-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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12 | Christopher T. Weaver, Joel S. Emer, Shubhendu S. Mukherjee, Steven K. Reinhardt |
Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCA ![In: 31st International Symposium on Computer Architecture (ISCA 2004), 19-23 June 2004, Munich, Germany, pp. 264-275, 2004, IEEE Computer Society, 0-7695-2143-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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12 | Ketan N. Patel, Igor L. Markov |
Error-correction and crosstalk avoidance in DSM busses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SLIP ![In: The 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), Monterey, CA, USA, April 5-6, 2003, Proceedings, pp. 9-14, 2003, ACM, 1-58113-627-7. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
DSM busses, error-correction, crosstalk noise, bus encoding |
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