Search results for "alpha-particle"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
37	Mandeep Singh, Israel Koren	Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs).	ISQED	2002	DBLP DOI BibTeX RDF	Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters
29	Anita J. Crompton, Kelum A. A. Gamage, Alex Jenkins, C. James Taylor	Alpha Particle Detection Using Alpha-Induced Air Radioluminescence: A Review and Future Prospects for Preliminary Radiological Characterisation for Nuclear Facilities Decommissioning.	Sensors	2018	DBLP DOI BibTeX RDF
29	Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee	An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
25	Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra	Model for Transient Fault Susceptibility of Combinational Circuits.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	transient fault modeling, transient fault susceptibility, alpha-particle, soft error, transient fault
25	Mandeep Singh, Israel Koren	Reliability Enhancement of Analog-to-Digital Converters (ADCs).	DFT	2001	DBLP DOI BibTeX RDF	Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters
24	Mandeep Singh, Israel Koren	Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters.	IEEE Trans. Very Large Scale Integr. Syst.	2003	DBLP DOI BibTeX RDF
18	Hadi Shahabinejad, Davorin Sudac, Miltiadis Alamaniotis, Karlo Nad, Jasmina Objodas	Bulk Sample Analysis Using Associated Alpha Particle Neutron Generator and Artificial Neural Network.	IISA	2023	DBLP DOI BibTeX RDF
18	Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill	Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.	IRPS	2019	DBLP DOI BibTeX RDF
18	Jesse Tanguay, François Bénard, Anna Celler, Thomas Ruth, Paul Schaffer	Spatial resolution properties of digital autoradiography systems for pre-clinical alpha particle imaging (Conference Presentation).	Medical Imaging: Biomedical Applications in Molecular, Structural, and Functional Imaging	2017	DBLP DOI BibTeX RDF
18	Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg	Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation.	IEICE Electron. Express	2016	DBLP DOI BibTeX RDF
18	Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg	Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627].	IEICE Electron. Express	2016	DBLP DOI BibTeX RDF
18	Ezzat G. Bakhoum, Marvin H. M. Cheng, Kevin M. Van Landingham	Alpha-Particle-Based Icing Detector for Aircraft.	IEEE Trans. Instrum. Meas.	2014	DBLP DOI BibTeX RDF
18	Mingzhe Liu, Xianguo Tuo, Jun Ren, Zhe Li, Lei Wang, Jianbo Yang	A PSO-SVM Based Model for Alpha Particle Activity Prediction Inside Decommissioned Channels.	ISNN (1)	2012	DBLP DOI BibTeX RDF
18	Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta	Alpha-particle-induced effects in partially depleted silicon on insulator device: With and without body contact.	IET Circuits Devices Syst.	2011	DBLP DOI BibTeX RDF
18	Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo	Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
18	Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt	Single-event-upset and alpha-particle emission rate measurement techniques.	IBM J. Res. Dev.	2008	DBLP DOI BibTeX RDF
18	David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang	Alpha-particle-induced upsets in advanced CMOS circuits and technology.	IBM J. Res. Dev.	2008	DBLP DOI BibTeX RDF
18	G. E. Zardas, P. H. Yannakopoulos, Chrys I. Symeonides, Marián Veselý, P. C. Euthymiou	A study of electron transition in the energy gap of SI-GaAs with photoconductivity spectra and under alpha-particle irradiation.	Microelectron. J.	2008	DBLP DOI BibTeX RDF
18	Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana	Alpha particle radiation effects in RF MEMS capacitive switches.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
18	Tino Heijmen	Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs.	IOLTS	2007	DBLP DOI BibTeX RDF
18	G. E. Zardas, P. H. Yannakopoulos, M. Ziska, Chrys I. Symeonides, P. C. Euthymiou, O. Csabay	Dependence of GaAs: Si persistent photoconductivity on temperature and alpha-particle irradiation.	Microelectron. J.	2005	DBLP DOI BibTeX RDF
18	Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi	A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults.	IEEE Trans. Computers	1996	DBLP DOI BibTeX RDF	transient fault injection, transient fault modeling, transient fault simulation, fault-tolerance, Single event upset
18	Richard M. King, Robert A. Wagner	Combining Speed with Alpha-Particle Induced Memory Error Tolerance in a Large Boolean Vector Machine (Extended Abstract).	ISCA	1984	DBLP DOI BibTeX RDF
12	Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh	Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance.	IEEE Trans. Very Large Scale Integr. Syst.	2006	DBLP DOI BibTeX RDF
12	Navid Azizi, Farid N. Najm	A family of cells to reduce the soft-error-rate in ternary-CAM.	DAC	2006	DBLP DOI BibTeX RDF	soft-error rate, content-addressable memory
12	Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee	Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits.	DATE	2005	DBLP DOI BibTeX RDF
12	Jie S. Hu, Greg M. Link, Johnsy K. John, Shuai Wang 0006, Sotirios G. Ziavras	Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures.	Asia-Pacific Computer Systems Architecture Conference	2005	DBLP DOI BibTeX RDF
12	Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh	Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance.	VTS	2005	DBLP DOI BibTeX RDF
12	Arijit Biswas, Paul Racunas, Razvan Cheveresan, Joel S. Emer, Shubhendu S. Mukherjee, Ram Rangan	Computing Architectural Vulnerability Factors for Address-Based Structures.	ISCA	2005	DBLP DOI BibTeX RDF
12	Ketan N. Patel, Igor L. Markov	Error-correction and crosstalk avoidance in DSM busses.	IEEE Trans. Very Large Scale Integr. Syst.	2004	DBLP DOI BibTeX RDF
12	Shubhendu S. Mukherjee, Joel S. Emer, Tryggve Fossum, Steven K. Reinhardt	Cache Scrubbing in Microprocessors: Myth or Necessity?	PRDC	2004	DBLP DOI BibTeX RDF
12	Christopher T. Weaver, Joel S. Emer, Shubhendu S. Mukherjee, Steven K. Reinhardt	Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor.	ISCA	2004	DBLP DOI BibTeX RDF
12	Ketan N. Patel, Igor L. Markov	Error-correction and crosstalk avoidance in DSM busses.	SLIP	2003	DBLP DOI BibTeX RDF	DSM busses, error-correction, crosstalk noise, bus encoding