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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 6 occurrences of 6 keywords
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Results
Found 10 publication records. Showing 10 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
64 | Aniruddha N. Udipi, Naveen Muralimanohar, Niladrish Chatterjee, Rajeev Balasubramonian, Al Davis, Norman P. Jouppi |
Rethinking DRAM design and organization for energy-constrained multi-cores. |
ISCA |
2010 |
DBLP DOI BibTeX RDF |
chipkill, dram architecture, subarrays, energy-efficiency, locality |
36 | Thomas Mittelholzer, Milos Stanisavljevic, Nikolaos Papandreou, Haralampos Pozidis |
High-Throughput ECC with Integrated Chipkill Protection for Nonvolatile Memory Arrays. |
ISCAS |
2021 |
DBLP DOI BibTeX RDF |
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36 | Xianwei Zhang, Rujia Wang, Youtao Zhang, Jun Yang 0002 |
Boosting chipkill capability under retention-error induced reliability emergency. |
ASP-DAC |
2019 |
DBLP DOI BibTeX RDF |
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36 | Da Zhang 0004, Vilas Sridharan, Xun Jian 0002 |
Exploring and Optimizing Chipkill-Correct for Persistent Memory Based on High-Density NVRAMs. |
MICRO |
2018 |
DBLP DOI BibTeX RDF |
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36 | Xun Jian 0002, John Sartori, Henry Duwe, Rakesh Kumar 0002 |
High Performance, Energy Efficient Chipkill Correct Memory with Multidimensional Parity. |
IEEE Comput. Archit. Lett. |
2013 |
DBLP DOI BibTeX RDF |
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36 | Xun Jian 0002, Rakesh Kumar 0002 |
Adaptive Reliability Chipkill Correct (ARCC). |
HPCA |
2013 |
DBLP DOI BibTeX RDF |
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36 | Xun Jian 0002, Henry Duwe, John Sartori, Vilas Sridharan, Rakesh Kumar 0002 |
Low-power, low-storage-overhead chipkill correct via multi-line error correction. |
SC |
2013 |
DBLP DOI BibTeX RDF |
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36 | Xun Jian 0002, Nathan DeBardeleben, Sean Blanchard, Vilas Sridharan, Rakesh Kumar 0002 |
Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/Correct. |
PRDC |
2013 |
DBLP DOI BibTeX RDF |
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28 | Doe Hyun Yoon, Mattan Erez |
Virtualized and flexible ECC for main memory. |
ASPLOS |
2010 |
DBLP DOI BibTeX RDF |
fault tolerance, reliability, error correction, memory systems |
28 | Jung Ho Ahn, Norman P. Jouppi, Christos Kozyrakis, Jacob Leverich, Robert S. Schreiber |
Future scaling of processor-memory interfaces. |
SC |
2009 |
DBLP DOI BibTeX RDF |
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