Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
62 | Ho Fai Ko, Nicola Nicolici |
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Skewed-load, Scan division, At-speed test, Low-power test |
58 | Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
On Common-Mode Skewed-Load and Broadside Tests. |
VLSI Design |
2008 |
DBLP DOI BibTeX RDF |
|
49 | Jacob Savir, Srinivas Patil |
Scan-based transition test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
36 | Zhen Chen, Boxue Yin, Dong Xiang |
Conflict driven scan chain configuration for high transition fault coverage and low test power. |
ASP-DAC |
2009 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2008 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
Scan-Based Delay Fault Tests for Diagnosis of Transition Faults. |
DFT |
2006 |
DBLP DOI BibTeX RDF |
|
34 | Ho Fai Ko, Nicola Nicolici |
Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. |
Asian Test Symposium |
2004 |
DBLP DOI BibTeX RDF |
High-level DFT, Delay-fault testing |
28 | Seongmoon Wang, Wenlong Wei |
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Transition delay fault, broadside, skewed-load, enhanced scan |
28 | Jacob Savir |
Delay Test Generation: A Hardware Perspective. |
J. Electron. Test. |
1997 |
DBLP DOI BibTeX RDF |
transition test, skewed-load delay test, shift dependency, cellular automata, linear feedback shift register, delay test, pseudo-random test |
28 | Jacob Savir |
Generator choices for delay test. |
Asian Test Symposium |
1995 |
DBLP DOI BibTeX RDF |
BIST based delay test, generator choices, delay test vector generator, nonscan designs, transition test, skewed-load delay test, shift dependency, digital logic circuits, performance, VLSI, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, automatic testing, flexibility, linear feedback shift register, cost, shift registers, scan designs, boundary scan testing, test vectors, timing requirement, pseudo-random test |
27 | Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar |
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. |
DATE |
2004 |
DBLP DOI BibTeX RDF |
|
24 | Jacob Savir, Srinivas Patil |
Broad-side delay test. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1994 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz, Xijiang Lin |
Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults. |
IEEE Trans. Very Large Scale Integr. Syst. |
2021 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Multicycle Broadside and Skewed-Load Tests for Test Compaction. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2020 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Padding of Multicycle Broadside and Skewed-Load Tests. |
IEEE Trans. Very Large Scale Integr. Syst. |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Skewed-Load Tests for Transition and Stuck-at Faults. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Boundary-Functional Broadside and Skewed-Load Tests. |
ACM Trans. Design Autom. Electr. Syst. |
2019 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Combined input test data volume reduction for mixed broadside and skewed-load test sets. |
IET Comput. Digit. Tech. |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set. |
IEEE Trans. Very Large Scale Integr. Syst. |
2015 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Low-power skewed-load tests based on functional broadside tests. |
ACM Trans. Design Autom. Electr. Syst. |
2014 |
DBLP DOI BibTeX RDF |
|
22 | Roland Dobai, Marcel Baláz |
Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations. |
Comput. Informatics |
2013 |
DBLP BibTeX RDF |
|
22 | Irith Pomeranz |
On Test Compaction of Broadside and Skewed-Load Test Cubes. |
IEEE Trans. Very Large Scale Integr. Syst. |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Broadside and Skewed-Load Tests Under Primary Input Constraints. |
IEEE Trans. Very Large Scale Integr. Syst. |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Static test compaction for mixed broadside and skewed-load transition fault test sets. |
IET Comput. Digit. Tech. |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Roland Dobai, Marcel Baláz |
SAT-based generation of compressed skewed-load tests for transition delay faults. |
Microprocess. Microsystems |
2013 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
On the Computation of Common Test Data for Broadside and Skewed-Load Tests. |
IEEE Trans. Computers |
2012 |
DBLP DOI BibTeX RDF |
|
22 | Roland Dobai, Marcel Baláz |
Genetic method for compressed skewed-load delay test generation. |
DDECS |
2012 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Generation and compaction of mixed broadside and skewed-load n-detection test sets for transition faults. |
DFT |
2012 |
DBLP DOI BibTeX RDF |
|
22 | Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue |
Hybrid Test Application in Partial Skewed-Load Scan Design. |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. |
2011 |
DBLP DOI BibTeX RDF |
|
22 | Roland Dobai, Marcel Baláz |
SAT-Based Generation of Compressed Skewed-Load Tests for Transition Delay Faults. |
DSD |
2011 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Static test compaction for delay fault test sets consisting of broadside and skewed-load tests. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz |
Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults. |
PRDC |
2011 |
DBLP DOI BibTeX RDF |
|
22 | Irith Pomeranz, Sudhakar M. Reddy |
Functional and partially-functional skewed-load tests. |
ASP-DAC |
2010 |
DBLP DOI BibTeX RDF |
|
22 | Sying-Jyan Wang, Kuo-Lin Peng, Katherine Shu-Min Li |
Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage. |
ATS |
2006 |
DBLP DOI BibTeX RDF |
|
22 | Ho Fai Ko, Nicola Nicolici |
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints. |
ICCD |
2006 |
DBLP DOI BibTeX RDF |
|
22 | Srinivas Patil, Jacob Savir |
Skewed-Load Transition Test: Part 2, Coverage. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
22 | Jacob Savir |
Skewed-Load Transition Test: Part 1, Calculus. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
21 | Jun Gao, Peter Steenkiste |
Design and evaluation of a distributed scalable content discovery system. |
IEEE J. Sel. Areas Commun. |
2004 |
DBLP DOI BibTeX RDF |
|
21 | Michele Colajanni, Philip S. Yu, Daniel M. Dias |
Analysis of Task Assignment Policies in Scalable Distributed Web-Server Systems. |
IEEE Trans. Parallel Distributed Syst. |
1998 |
DBLP DOI BibTeX RDF |
Internet, Distributed systems, WWW, load balancing, performance analysis, scheduling algorithms, Web servers |
12 | Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy |
Scan BIST Targeting Transition Faults Using a Markov Source. |
ISQED |
2004 |
DBLP DOI BibTeX RDF |
|