Search results for "skewed-load"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
62	Ho Fai Ko, Nicola Nicolici	Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Skewed-load, Scan division, At-speed test, Low-power test
58	Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu	On Common-Mode Skewed-Load and Broadside Tests.	VLSI Design	2008	DBLP DOI BibTeX RDF
49	Jacob Savir, Srinivas Patil	Scan-based transition test.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
36	Zhen Chen, Boxue Yin, Dong Xiang	Conflict driven scan chain configuration for high transition fault coverage and low test power.	ASP-DAC	2009	DBLP DOI BibTeX RDF
36	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
36	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Fault Tests for Diagnosis of Transition Faults.	DFT	2006	DBLP DOI BibTeX RDF
34	Ho Fai Ko, Nicola Nicolici	Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF	High-level DFT, Delay-fault testing
28	Seongmoon Wang, Wenlong Wei	Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns.	ETS	2008	DBLP DOI BibTeX RDF	Transition delay fault, broadside, skewed-load, enhanced scan
28	Jacob Savir	Delay Test Generation: A Hardware Perspective.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	transition test, skewed-load delay test, shift dependency, cellular automata, linear feedback shift register, delay test, pseudo-random test
28	Jacob Savir	Generator choices for delay test.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	BIST based delay test, generator choices, delay test vector generator, nonscan designs, transition test, skewed-load delay test, shift dependency, digital logic circuits, performance, VLSI, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, automatic testing, flexibility, linear feedback shift register, cost, shift registers, scan designs, boundary scan testing, test vectors, timing requirement, pseudo-random test
27	Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar	Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets.	DATE	2004	DBLP DOI BibTeX RDF
24	Jacob Savir, Srinivas Patil	Broad-side delay test.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
22	Irith Pomeranz, Xijiang Lin	Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults.	IEEE Trans. Very Large Scale Integr. Syst.	2021	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Multicycle Broadside and Skewed-Load Tests for Test Compaction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2020	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Padding of Multicycle Broadside and Skewed-Load Tests.	IEEE Trans. Very Large Scale Integr. Syst.	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Skewed-Load Tests for Transition and Stuck-at Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Boundary-Functional Broadside and Skewed-Load Tests.	ACM Trans. Design Autom. Electr. Syst.	2019	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Combined input test data volume reduction for mixed broadside and skewed-load test sets.	IET Comput. Digit. Tech.	2016	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set.	IEEE Trans. Very Large Scale Integr. Syst.	2015	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2014	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Low-power skewed-load tests based on functional broadside tests.	ACM Trans. Design Autom. Electr. Syst.	2014	DBLP DOI BibTeX RDF
22	Roland Dobai, Marcel Baláz	Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations.	Comput. Informatics	2013	DBLP BibTeX RDF
22	Irith Pomeranz	On Test Compaction of Broadside and Skewed-Load Test Cubes.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Broadside and Skewed-Load Tests Under Primary Input Constraints.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Static test compaction for mixed broadside and skewed-load transition fault test sets.	IET Comput. Digit. Tech.	2013	DBLP DOI BibTeX RDF
22	Roland Dobai, Marcel Baláz	SAT-based generation of compressed skewed-load tests for transition delay faults.	Microprocess. Microsystems	2013	DBLP DOI BibTeX RDF
22	Irith Pomeranz	On the Computation of Common Test Data for Broadside and Skewed-Load Tests.	IEEE Trans. Computers	2012	DBLP DOI BibTeX RDF
22	Roland Dobai, Marcel Baláz	Genetic method for compressed skewed-load delay test generation.	DDECS	2012	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Generation and compaction of mixed broadside and skewed-load n-detection test sets for transition faults.	DFT	2012	DBLP DOI BibTeX RDF
22	Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue	Hybrid Test Application in Partial Skewed-Load Scan Design.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2011	DBLP DOI BibTeX RDF
22	Roland Dobai, Marcel Baláz	SAT-Based Generation of Compressed Skewed-Load Tests for Transition Delay Faults.	DSD	2011	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Static test compaction for delay fault test sets consisting of broadside and skewed-load tests.	VTS	2011	DBLP DOI BibTeX RDF
22	Irith Pomeranz	Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults.	PRDC	2011	DBLP DOI BibTeX RDF
22	Irith Pomeranz, Sudhakar M. Reddy	Functional and partially-functional skewed-load tests.	ASP-DAC	2010	DBLP DOI BibTeX RDF
22	Sying-Jyan Wang, Kuo-Lin Peng, Katherine Shu-Min Li	Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage.	ATS	2006	DBLP DOI BibTeX RDF
22	Ho Fai Ko, Nicola Nicolici	RTL Scan Design for Skewed-Load At-speed Test under Power Constraints.	ICCD	2006	DBLP DOI BibTeX RDF
22	Srinivas Patil, Jacob Savir	Skewed-Load Transition Test: Part 2, Coverage.	ITC	1992	DBLP DOI BibTeX RDF
22	Jacob Savir	Skewed-Load Transition Test: Part 1, Calculus.	ITC	1992	DBLP DOI BibTeX RDF
21	Jun Gao, Peter Steenkiste	Design and evaluation of a distributed scalable content discovery system.	IEEE J. Sel. Areas Commun.	2004	DBLP DOI BibTeX RDF
21	Michele Colajanni, Philip S. Yu, Daniel M. Dias	Analysis of Task Assignment Policies in Scalable Distributed Web-Server Systems.	IEEE Trans. Parallel Distributed Syst.	1998	DBLP DOI BibTeX RDF	Internet, Distributed systems, WWW, load balancing, performance analysis, scheduling algorithms, Web servers
12	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	Scan BIST Targeting Transition Faults Using a Markov Source.	ISQED	2004	DBLP DOI BibTeX RDF